| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 08/16/2011 | CA2411198C Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 08/11/2011 | DE10106854B4 Mikro-Tastkopf und Vorrichtung zum Messen einer Probenoberfläche Micro-probe and apparatus for measuring a sample surface |
| 08/11/2011 | DE10084431B4 Aktive Sonde für ein Rasterkraftmikroskop mit atomarer Auflösung sowie Verfahren zur Verwendung derselben Active probe for an atomic force microscope with atomic resolution and methods of using same |
| 08/10/2011 | EP1370863B1 Patch-clamping and its use in analysing subcellular features |
| 08/10/2011 | CN1993609B A method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby |
| 08/09/2011 | US7992431 Piezoelectric microcantilevers and uses in atomic force microscopy |
| 08/03/2011 | EP1466182B1 Electrical feedback detection system for multi-point probes |
| 08/02/2011 | US7987703 Tweezer-equipped scanning probe microscope and transfer method |
| 07/21/2011 | US20110175627 Evanescent microwave microscopy probe and methodology |
| 07/20/2011 | EP1023623B1 Cantilevered glass structures for nanodelivery of chemicals |
| 07/14/2011 | WO2011012741A3 Microscopy device with tuning fork and rectilinear tip |
| 07/14/2011 | US20110170096 Probe for near-field light scattering and process for production thereof |
| 07/12/2011 | US7979916 Preamplifying cantilever and applications thereof |
| 07/07/2011 | US20110167525 Probe detection system |
| 07/06/2011 | EP1220585B1 Apparatus for charged-particle beam irradiation, and method of control thereof |
| 07/06/2011 | CN201892570U Contact resonance frequency detecting system for atomic force acoustic microscope cantilever beam |
| 07/05/2011 | US7975316 Atomic force microscope and interaction force measurement method using atomic force microscope |
| 07/05/2011 | US7975315 Atomic force microscope |
| 07/05/2011 | US7973942 Optical displacement detection mechanism and surface information measurement device using the same |
| 06/30/2011 | US20110162117 Device for scanning a sample surface covered with a liquid |
| 06/29/2011 | CN102109535A Controllable method for preparing atomic force microscope needlepoint with carbon nano tube |
| 06/28/2011 | US7971266 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope |
| 06/28/2011 | US7969650 Multiplex near-field microscopy with diffractive elements |
| 06/23/2011 | WO2011038470A4 Sensors for scanning probe microscopy, method for three-dimensional measurement and method for manufacturing such sensors |
| 06/23/2011 | US20110150022 Gan laser element |
| 06/22/2011 | CN102103050A Method for analyzing Cu distribution situation in Al-Cu conducting material |
| 06/21/2011 | US7963153 Non-destructive ambient dynamic mode AFM amplitude versus distance curve acquisition |
| 06/15/2011 | CN102095898A Optical microscopy-atomic force microscopy double-probe imaging method and device |
| 06/14/2011 | US7962867 Electronic design for integrated circuits based on process related variations |
| 06/14/2011 | US7961379 Pump probe measuring device and scanning probe microscope apparatus using the device |
| 06/09/2011 | WO2011068905A2 Method and apparatus of operating a scanning probe microscope |
| 06/07/2011 | US7958566 AFM probe with variable stiffness |
| 06/07/2011 | US7958565 Scan type probe microscope and cantilever drive device |
| 06/07/2011 | US7958564 Scanning measurement instrument |
| 06/07/2011 | US7958563 Method for using an atomic force microscope |
| 06/02/2011 | US20110131690 Scanning Ion Conductance Microscopy |
| 06/01/2011 | DE102009046267A1 Verfahren zur Messung magnetischer Informationen, insbesondere der magnetischen AC-Suszeptibilität, von magnetischen Nanopartikeln (Markern) Method for measuring magnetic information, especially the magnetic ac susceptibility of magnetic nanoparticles (markers) |
| 06/01/2011 | CN101685091B Method of manufacturing an ultra-microelectrode |
| 05/31/2011 | US7954166 Independently-addressable, self-correcting inking for cantilever arrays |
| 05/31/2011 | US7954165 Scanning probe microscope |
| 05/26/2011 | US20110126328 Methods and Apparatus for Nanolapping |
| 05/25/2011 | EP2325657A1 Scanning type probe microscope |
| 05/25/2011 | CN102072972A Coupling permeation efficiency optimization system of near field scanning optical microscope (NSOM) and optimization method thereof |
| 05/25/2011 | CN102072970A Method and device for lossless automatic approximation by facing nano observation and nano operation |
| 05/25/2011 | CN102071135A High resolution patch clamp based on scanning probe microscopy technology and operating method thereof |
| 05/18/2011 | CN102062787A Selective mode self-excitation method and device of MEM (Micro-Electrical Mechanical) sensor |
| 05/18/2011 | CN101377460B Method for analyzing specimen in liquid |
| 05/17/2011 | US7945966 Nanometric emitter/receiver guides |
| 05/17/2011 | US7945965 Sensor for observations in liquid environments and observation apparatus for use in liquid environments |
| 05/17/2011 | US7945964 Apparatus structure and scanning probe microscope including apparatus structure |
| 05/12/2011 | DE19681741B4 Verbesserter optischer Beanspruchungsgenerator und -detektor Improved optical stress generator and detector |
| 05/11/2011 | EP2318847A1 Method for measuring a piezoelectric response by means of a scanning probe microscope |
| 05/11/2011 | CN102053171A Micron-nano thermal detecting and sensing component |
| 05/11/2011 | CN102053170A Micro/nano-scale thermal detection-based nonlinear amplifier |
| 05/10/2011 | US7940477 Solid immersion lens and related method for making same |
| 05/10/2011 | US7937991 Fully digitally controller for cantilever-based instruments |
| 05/05/2011 | WO2011051449A1 Method for measuring magnetic information, in particular magnetic ac susceptibility, of magnetic nanoparticles (markers) |
| 05/04/2011 | CN102043070A Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument |
| 05/04/2011 | CN101438355B Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 05/03/2011 | US7936959 Apparatus for focusing plasmon waves |
| 04/27/2011 | EP1016868B1 Probe, method of its manufacturing, and probe-type memory |
| 04/26/2011 | US7933482 Optical fiber probe tips and methods for fabricating same |
| 04/26/2011 | US7933169 Optical head for near-field recording and reproducing device |
| 04/21/2011 | WO2011047336A1 Imaging devices for measuring the structure of a surface |
| 04/21/2011 | US20110093990 Method and structure for characterising an atomic force microscopy tip |
| 04/20/2011 | CN1795376B Sensor, method for producing sensor, and detection method |
| 04/20/2011 | CN101183567B Method of producing probe of near-field optical microscope |
| 04/19/2011 | US7930766 Fluid delivery for scanning probe microscopy |
| 04/19/2011 | US7926328 Sample manipulating apparatus |
| 04/14/2011 | WO2011002201A3 Method for measuring quantitative temperature and thermal conductivity using a scanning thermal microscope |
| 04/13/2011 | CN102012439A Method for preparing silicon-based self-sharpening AFM (antifrictional metal) probe |
| 04/13/2011 | CN102012438A Rotary dumping and flaking method of growth promoting medium for improving quality of GaAs microtip |
| 04/13/2011 | CN101595379B Pump probe measuring device, and scanning probe microscope apparatus and measuring device |
| 04/07/2011 | WO2011040065A1 Scanning probe microscope |
| 04/07/2011 | WO2011038470A1 Sensors for scanning probe microscopy, method for three-dimensional measurement and method for manufacturing such sensors |
| 04/05/2011 | US7921466 Method of using an atomic force microscope and microscope |
| 03/31/2011 | WO2011036598A1 Optical probe system with increased scanning speed |
| 03/30/2011 | CN201780308U Contact resonance frequency tracking system for cantilever beam of atomic force acoustic microscope (AFAM) |
| 03/29/2011 | US7916306 Optical device comprising a cantilever and method of fabrication and use thereof |
| 03/24/2011 | WO2011033925A1 Near-field probe and near-field introducing/detecting device |
| 03/24/2011 | US20110072543 Modular design of a scanning microscope attachment and accessories |
| 03/24/2011 | DE102009039840A1 Verfahren zur Messung der Kraftwechselwirkung, welche durch eine Probe hervorgerufen wird Method for measuring the force of interaction, which is caused by a sample |
| 03/22/2011 | US7908908 Materials and methods for identifying biointeractive nanostructures and/or nanoparticles |
| 03/17/2011 | US20110067150 Cantilever with paddle for operation in dual-frequency mode |
| 03/17/2011 | US20110063717 High-efficiency device for focusing light to subwavelength dimensions |
| 03/16/2011 | EP2296027A1 Optical microscope |
| 03/16/2011 | CN101313206B Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography |
| 03/15/2011 | US7907288 Shape measuring apparatus |
| 03/10/2011 | WO2011026464A1 Method for measuring the force interaction that is caused by a sample |
| 03/10/2011 | WO2010138904A3 Metrology probe and method of configuring a metrology probe |
| 03/10/2011 | US20110058177 Marker-free chromosome screening |
| 03/09/2011 | EP1543152B1 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading |
| 03/08/2011 | US7904966 Scanning probe microscope apparatus |
| 03/08/2011 | US7900506 Multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification |
| 03/03/2011 | US20110055987 Method to reduce wedge effects in molded trigonal tips |
| 03/03/2011 | US20110055986 Athermal Atomic Force Microscope Probes |
| 03/03/2011 | US20110055985 Device and method for an atomic force microscope for the study and modification of surface properties |
| 03/03/2011 | US20110055984 Tip-enhanced resonant apertures |
| 03/03/2011 | US20110055983 Dynamic mode afm apparatus |
| 03/03/2011 | US20110055981 Device for Positioning a Moveable Object of Submicron Scale |