| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 07/22/2008 | US7402849 Parallel, individually addressable probes for nanolithography |
| 07/22/2008 | US7402736 Method of fabricating a probe having a field effect transistor channel structure |
| 07/16/2008 | CN101221106A Nano material drawing device in scanning electron microscope driven by piezoelectric ceramic piece |
| 07/16/2008 | CN101220244A High surface quality GaN wafer and method of fabricating same |
| 07/15/2008 | US7400144 Magnetic resonance force microscope |
| 07/15/2008 | US7398678 Probe for a scanning microscope |
| 07/10/2008 | WO2008081044A1 Apparatus and method for the detection of forces in the sub-micronewton range |
| 07/10/2008 | US20080166560 surface of carbon nanotube is coated with a ferromagnetic alloy film consisting a Co Fe alloy or a Co Ni alloy; minimizing magnetic leakage, controlling surface smoothness; evaluate magnetic storage media on which data has been magnetically recorded at ultra-high density |
| 07/09/2008 | EP1942501A1 Distance control in optical near-field recording/reproducing apparatus |
| 07/09/2008 | CN101217063A A device for generation of near-field nanometer light beam |
| 07/09/2008 | CN101217062A A metal film and its making method |
| 07/03/2008 | US20080157077 Integrated Circuit and Methods of Measurement And Preparation of Measurement Structure |
| 07/02/2008 | EP1939871A1 Recording apparatus |
| 07/02/2008 | EP1938335A1 Reading/writing tip, head and device, and use thereof, and method for making same |
| 07/02/2008 | EP1938334A2 Oscillator and method of making for atomic force microscope and other applications |
| 07/01/2008 | US7395132 Optical metrology model optimization for process control |
| 07/01/2008 | US7393713 Method of fabricating near field optical probe |
| 06/26/2008 | US20080149822 Protein Microscope |
| 06/25/2008 | EP1934578A1 Method for examining a measurement object, and apparatus |
| 06/25/2008 | EP1535300A4 Improved method and system for scanning apertureless fluorescence microscope |
| 06/24/2008 | US7391564 Infrared focusing device |
| 06/19/2008 | WO2008071013A1 Scanning probe microscope with periodically phase-shifted ac excitation |
| 06/19/2008 | US20080145441 Core of metal atoms of gold, silver or copper covalently linked to a carbohydrate group and to at least 20 ligands |
| 06/19/2008 | US20080141764 Method of observing and method of working diamond stylus for working of atomic force microscope |
| 06/18/2008 | CN101202125A Active mode denoise method and device for scanning tunnel microscope |
| 06/17/2008 | US7387035 Method of making a force curve measurement on a sample |
| 06/17/2008 | US7387017 Digital Q control for enhanced measurement capability in cantilever-based instruments |
| 06/17/2008 | US7387016 Atomic force microscope and method of energy dissipation imaging using the same |
| 06/12/2008 | WO2007149534A3 Methods of polarization engineering and their applications |
| 06/12/2008 | US20080135749 Microscope probe having an ultra-tall tip |
| 06/12/2008 | US20080134771 Method and Device for Determining Material Properties |
| 06/05/2008 | WO2008066779A2 Near field scanning measurement-alternating current-scanning electrochemical microscopy devices and methods of use thereof |
| 06/05/2008 | WO2008066090A1 Pump probe measuring device, and scanning probe microscope apparatus using the device |
| 06/05/2008 | WO2007079269A3 Atomic force microscope tip arrays and methods of manufacturing same |
| 06/05/2008 | WO2007078979A3 Probe module with integrated actuator for a probe microscope |
| 06/05/2008 | US20080132151 Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method |
| 06/05/2008 | US20080128385 Oscillator and method of making for atomic force microscope and other applications |
| 06/05/2008 | CA2670948A1 Pump probe measuring device and scanning probe microscope apparatus using the device |
| 06/04/2008 | EP1927845A1 Cantilever holder and scanning probe microscope including the same |
| 06/03/2008 | US7381529 Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes |
| 06/03/2008 | US7381484 Flexible polyester support and back coat layer; surface protrusions measured with atomic force microscope; ratio protrusions 50 nm or more to 100 nm or more is 10 to 100; prevention of dropout by back imprinting, reduce friction coefficient, limit distribution of protrusion density to a specific range |
| 05/29/2008 | US20080121800 Cantilever holder and scanning probe microscope including the same |
| 05/29/2008 | US20080121614 Methods for manufacturing optical fiber probe and for processing micromaterial |
| 05/29/2008 | US20080121029 For Atomic Force Microscope (AFM); reproducibility, high resolution, reliability and durability |
| 05/29/2008 | US20080121028 Scanning Probe Microscopy Inspection and Modification System |
| 05/29/2008 | DE102006055528A1 Atomic force microscope for examining sample, has evaluation unit receiving measurement variable i.e. friction between probe tip and sample, as input besides force reciprocal effect for determining artifact |
| 05/28/2008 | CN201066335Y A testing device for the electric performance of nano line original position downward pull force in transmission electric lens |
| 05/28/2008 | CN100390526C Scanning-tunnel microscope needle-tip automatic controlled etching instrument |
| 05/27/2008 | US7379415 Head for recording and reading optical data and method of manufacturing the same |
| 05/22/2008 | WO2008060624A2 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 05/22/2008 | US20080116926 Semiconductor probe having resistive tip and method of fabricating the same |
| 05/21/2008 | EP1520292A4 Software synchronization of multiple scanning probes |
| 05/21/2008 | CN101183567A Method of producing probe of near-field optical microscope |
| 05/21/2008 | CN101183566A Semiconductor probe having resistive tip and method of fabricating the same |
| 05/20/2008 | US7375322 Cantilever holder and scanning probe microscope |
| 05/20/2008 | US7373806 Scanning probe microscope and scanning method |
| 05/15/2008 | US20080113099 controlling deposition from scanning probe microscope tips to substrates, using electrical, magnetic, chemical or analogous forces |
| 05/15/2008 | US20080110248 Scanning probe microscope |
| 05/15/2008 | DE102007049322A1 Probenbetriebseinrichtung Samples facility |
| 05/15/2008 | DE102007049321A1 Probenbetriebseinrichtung Samples facility |
| 05/14/2008 | EP1920249A2 Biomolecule interaction using atomic force microscope |
| 05/14/2008 | CN100387968C Atomic force microscope and driving method therefor |
| 05/14/2008 | CN100387967C Scanning probe microscope |
| 05/13/2008 | US7372013 Near field scanning microscope probe and method for fabricating same |
| 05/13/2008 | US7371563 Peelable and resealable devices for biochemical assays |
| 05/13/2008 | US7370515 Probes for use in scanning probe microscopes and methods of fabricating such probes |
| 05/08/2008 | WO2008054467A2 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 05/08/2008 | WO2007098028A3 Photoluminescent point light source |
| 05/08/2008 | US20080105044 Sample operation apparatus |
| 05/08/2008 | US20080105043 Sample Operation Apparatus |
| 05/08/2008 | CA2642875A1 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 05/07/2008 | CN101176167A Sensors for electrochemical, electrical or topographical analysis |
| 05/07/2008 | CN101173885A Near-field optical microscope system for micro-cell mesomeric state/transient state photoelectric detection and scanning image |
| 05/06/2008 | US7368712 Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography |
| 05/06/2008 | US7368305 High aspect ratio micromechanical probe tips and methods of fabrication |
| 04/30/2008 | EP1122722B1 Near field optical head and method for manufacturing the same |
| 04/30/2008 | DE102006004922B4 Miniaturisiertes Federelement und Verfahren zu dessen Herstellung, Balkensonde, Rasterkraftmikroskop sowie Verfahren zu dessen Betrieb Miniaturized spring element and method for its manufacture, probe beam, atomic force microscope and method for its operation |
| 04/30/2008 | CN101169361A Atomic force microscopic imaging method and device based on piezoelectric scanning tube dynamic property |
| 04/29/2008 | US7367008 Adjustment of masks for integrated circuit fabrication |
| 04/29/2008 | US7366704 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 04/29/2008 | US7366060 Method for forming optical aperture, near-field optical head, method for fabricating near-field optical head, and information recording/reading apparatus |
| 04/29/2008 | US7364919 Immobilization carbohydrates; calibration; diagnosis; antiinflammatory agents, bactericides |
| 04/29/2008 | US7363802 Measurement device for electron microscope |
| 04/24/2008 | US20080097621 Graphical automated machine control and metrology |
| 04/24/2008 | US20080092640 Surface Position Measuring Method And Surface Position Measuring Device |
| 04/23/2008 | EP1913362A2 Atom probe evaporation processes |
| 04/23/2008 | CN100383908C Defect and conductivity processing method for conductive nano-structure |
| 04/22/2008 | US7363099 Integrated circuit metrology |
| 04/22/2008 | US7361821 Using oligonucleotide probes for detection, identification and/or sequencing of nucleic acids and/or biomolecules; for use in medical diagnostics, forensics, toxicology, pathology, biological warfare |
| 04/22/2008 | US7360405 Method to transiently detect sample features using cantilevers |
| 04/22/2008 | US7360404 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope |
| 04/17/2008 | WO2008027601A3 Band excitation method applicable to scanning probe microscopy |
| 04/17/2008 | US20080088903 Near-Field Aperture Having A Fractal Iterate Shape |
| 04/17/2008 | US20080087077 Method and apparatus of scanning a sample using a scanning probe microscope |
| 04/16/2008 | EP1912055A1 Method of using an atomic force microscope and microscope |
| 04/16/2008 | EP1425595A4 Scanning squid microscope with improved spatial resolution |
| 04/15/2008 | US7359599 Optical near-field generator and near-field optical recording and reproduction apparatus |
| 04/10/2008 | WO2008040989A1 Scanning tunnelling microscope |
| 04/10/2008 | US20080083270 Carbon nanotube detection system |
| 04/10/2008 | DE102006002461B4 Spiegeloptik für nahfeldoptische Messungen Mirror optics for near-field measurements |