| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 12/02/2009 | CN101595379A Pump probe measuring device, and scanning probe microscope apparatus using the device |
| 11/26/2009 | WO2009141353A1 Device for focusing light with sub-wavelength dimensions and high yield |
| 11/26/2009 | US20090293162 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 11/26/2009 | US20090293161 Cantilever device and cantilever controlling method |
| 11/26/2009 | US20090293160 Automatic Landing Method and Apparatus for Scanning Probe Microscope Using the Same |
| 11/25/2009 | CN100562582C Controlled alignment of nano-barcodes encoding specific information for scanning probe microscopy (SPM) reading |
| 11/24/2009 | US7621964 Near-field scanning optical microscope probe having a light emitting diode |
| 11/19/2009 | WO2009139238A1 Dynamic mode afm apparatus |
| 11/18/2009 | EP0847590B1 A scanning probe microscope having automatic probe exchange and alignment |
| 11/17/2009 | US7618465 Near-field antenna |
| 11/17/2009 | US7617720 Surface position measuring method and surface position measuring device |
| 11/17/2009 | CA2503953C Probe device |
| 11/12/2009 | US20090280497 Multiplex Detection Compositions, Methods, and Kits |
| 11/11/2009 | EP2115423A1 Apparatus and method for the detection of forces in the sub-micronewton range |
| 11/11/2009 | EP1435003B1 Dielectric constant measuring apparatus and dielectric constant measuring method |
| 11/11/2009 | CN100559512C Controllable device for preparing optical fiber probe and method therefor |
| 11/10/2009 | US7615738 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
| 11/05/2009 | US20090276923 Near-field scanning optical microscopy with nanoscale resolution from microscale probes |
| 11/03/2009 | US7610797 Carbon nanotube detection system |
| 10/29/2009 | WO2009130832A1 Noncontact scanning probe microscope |
| 10/29/2009 | WO2009095720A3 Scanning ion conductance microscopy |
| 10/27/2009 | US7609048 Probe microscope and measuring method using probe microscope |
| 10/27/2009 | US7608820 Spin microscope based on optically detected magnetic resonance |
| 10/27/2009 | US7607342 Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument |
| 10/22/2009 | WO2008099136A8 Flow velocity and pressure measurement using a vibrating cantilever device |
| 10/22/2009 | US20090265819 Sensor for observations in liquid environments and observation apparatus for use in liquid environments |
| 10/22/2009 | US20090262994 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 10/22/2009 | US20090261249 Scanning probe microscope apparatus |
| 10/21/2009 | EP2109760A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 10/21/2009 | CN100552829C A device for generation of near-field nanometer light beam |
| 10/20/2009 | US7606403 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 10/20/2009 | US7606132 Cantilever-type near-field probe for optical data storage and method of manufacturing the same |
| 10/20/2009 | US7605368 Vibration-type cantilever holder and scanning probe microscope |
| 10/20/2009 | US7603891 Multiple frequency atomic force microscopy |
| 10/15/2009 | WO2009125229A1 Imaging apparatus and method |
| 10/15/2009 | WO2009125138A2 Device for positioning a moveable object of submicron scale |
| 10/15/2009 | US20090260114 Scanning ion conductance microscopy for the investigation of living cells |
| 10/15/2009 | US20090260113 Probe Microscope Setup Method |
| 10/15/2009 | US20090255465 Thermal control of deposition in dip pen nanolithography |
| 10/13/2009 | US7602692 Near-field optical probe for reproducing information on a recording medium using near-field light |
| 10/13/2009 | US7602202 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same |
| 10/13/2009 | US7602170 Probe, manufacturing method of the probe, recording apparatus, and reproducing apparatus |
| 10/08/2009 | WO2009099619A3 Array and cantilever array leveling |
| 10/08/2009 | WO2009093813A3 Methods for electrically detecting interactions between biomolecules using scanning tunneling microscope |
| 10/08/2009 | US20090255016 Apparatus structure and scanning probe microscope including apparatus structure |
| 10/08/2009 | US20090253589 Method for Testing Active Compounds |
| 10/07/2009 | EP1012779B1 Method and system for lithographic mask inspection |
| 10/06/2009 | US7599277 Near-field optical head having tapered hole for guiding light beam |
| 10/06/2009 | US7597717 Rotatable multi-cantilever scanning probe microscopy head |
| 10/06/2009 | US7596990 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 10/06/2009 | US7596989 Probe for an atomic force microscope |
| 10/01/2009 | WO2009120327A1 Apparatus for atomic force microscope-assisted deposition of nanostructures |
| 10/01/2009 | WO2009118887A1 Magnetic sensor and scanning microscopy |
| 10/01/2009 | US20090249522 System and methods for controlling properties of nanojunction devices |
| 10/01/2009 | US20090249521 High frequency deflection measurement of IR absorption |
| 10/01/2009 | US20090249520 Method and system for near-field spectroscopy using targeted deposition of nanoparticles |
| 10/01/2009 | US20090246400 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 09/30/2009 | EP1264169B1 Improvement of spectral and/or spatial resolution in a laser scanning microscope |
| 09/30/2009 | CN100545985C Preparation of field emission array comprising nanostructures |
| 09/30/2009 | CN100545951C Microtip end-face array device |
| 09/24/2009 | US20090241233 Spm probe with shortened cantilever |
| 09/24/2009 | US20090241232 Prototyping station for atomic force microscope-assisted deposition of nanostructures |
| 09/23/2009 | EP2104111A1 SPM-probe with shortened cantilever |
| 09/23/2009 | CN101540209A Spm-probe with shortened spring rod |
| 09/23/2009 | CN100543448C United measuring system and its measuring technology for scanning channel microscope and scanning micro electrode |
| 09/22/2009 | US7591858 Mirror optic for near-field optical measurements |
| 09/22/2009 | US7591171 Atomic force microscope |
| 09/17/2009 | WO2009112861A1 Spm imaging apparatus, probe and method |
| 09/17/2009 | US20090235397 Contact type measuring instrument |
| 09/16/2009 | EP2101165A1 Method for creating and/or detecting a pyroelectric response, detector comprising a pyroelectric material and apparatus for investigating a sample comprising a pyroelectric material |
| 09/16/2009 | EP2101140A1 Contact type measuring instrument |
| 09/16/2009 | EP1844475B1 Near-field probe |
| 09/16/2009 | CN101532818A Contact type measuring instrument |
| 09/16/2009 | CN100541708C Overlay alignment method and device using atomic force microscope |
| 09/15/2009 | US7588605 Scanning type probe microscope |
| 09/15/2009 | CA2454963C Parallel, individually addressable probes for nanolithography |
| 09/11/2009 | WO2009110157A1 Scanning probe microscope and method of observing sample using the same |
| 09/10/2009 | US20090229020 Chemical sensor with oscillating cantilevered probe |
| 09/10/2009 | US20090229019 Method of Using an Atomic Force Microscope and Microscope |
| 09/09/2009 | CN100538913C Sensor with suspending arm and optical resonator |
| 09/08/2009 | US7586606 Near-field polarized-light measurement apparatus |
| 09/08/2009 | US7586084 Optical fiber probe, optical detection device, and optical detection method |
| 09/08/2009 | US7584653 System for wide frequency dynamic nanomechanical analysis |
| 09/03/2009 | US20090222958 Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument |
| 09/03/2009 | US20090218648 Near-field optical probe based on soi substrate and fabrication method thereof |
| 09/02/2009 | EP2096403A1 Optical scanning probe with a variable aperture at the light projector |
| 09/02/2009 | CN101521047A Technology for manufacturing miniature four-point probe working in ultra-high vacuum variable-temperature condition |
| 09/01/2009 | US7581438 Surface texture measuring probe and microscope utilizing the same |
| 08/27/2009 | WO2009104625A1 Tip type probe manufacturing method, tip type probe, and tip type probe manufacturing apparatus |
| 08/27/2009 | US20090217426 Scanning measurement instrument |
| 08/26/2009 | EP2093535A1 Coordinate measuring machine using mechanical scanning |
| 08/26/2009 | EP2092292A1 Scanning probe microscope with periodically phase-shifted ac excitation |
| 08/26/2009 | EP1651948B1 Scanning probe inspection apparatus |
| 08/26/2009 | CN101517393A Scanning ion conductance microscopy for the investigation of living cells |
| 08/25/2009 | US7578853 Scanning probe microscope system |
| 08/20/2009 | WO2009102238A1 System for comprehensively handling materials |
| 08/20/2009 | WO2009101991A1 Surface state measuring device, and surface state measuring method using the device |
| 08/20/2009 | US20090208641 Fabrication method and fabrication apparatus of head using near field light |
| 08/20/2009 | US20090207703 Optical near-field generator and recording apparatus using the optical near-field generator |
| 08/19/2009 | EP2090880A1 Pump probe measuring device, and scanning probe microscope apparatus using the device |