Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
07/2010
07/22/2010WO2010065131A3 High frequenct deflection measurement of ir absorption
07/22/2010WO2010037002A3 Methods of thermoreflectance thermography
07/21/2010EP2208044A2 Method for examining a sample
07/21/2010CN1957444B End-point detection for FIB circuit modification
07/21/2010CN101339816B Two-dimensional micro-motion platform for atomic force microscope and micro-mechanical parameter test method
07/20/2010US7759954 Semiconductor probe having resistive tip and method of fabricating the same
07/20/2010US7757544 Method and apparatus for measuring electrical properties in torsional resonance mode
07/15/2010US20100180356 Nanoindenter
07/15/2010US20100180355 Probe Sensor with Multi-Dimensional Optical Grating
07/14/2010CN101202125B Active mode noise-relieving method and device for scanning tunnel microscope
07/13/2010US7754114 Methods for manufacturing optical fiber probe and for processing micromaterial
07/13/2010US7752897 Molecule measuring device and molecule measuring method
07/08/2010US20100175155 Measurement and Mapping of Molecular Stretching and Rupture Forces
07/07/2010CN101769941A Electronic detection method of device structure of GaN base photovoltaic detector
07/06/2010US7751171 Nanoscale grasping device, method for fabricating the same, and method for operating the same
07/06/2010US7748260 Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe
07/06/2010CA2503957C Probe device and method of controlling the same
07/01/2010US20100170017 Magneto-Optical Detection of a Field Produced by a Sub-Resolution Magnetic Structure
07/01/2010US20100170016 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device intergrated in the measuring tip
06/2010
06/29/2010US7748052 Scanning probe microscope and method of operating the same
06/29/2010US7744963 Nanolithography methods and products therefor and produced thereby
06/24/2010WO2010069085A1 Scanning probe microscope with current controlled actuator
06/23/2010EP0839383B1 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities
06/17/2010WO2010067570A1 Method for processing output of scanning type probe microscope, and scanning type probe microscope
06/17/2010WO2010067129A1 Dynamic probe detection system
06/17/2010US20100154088 Magnetic sensor and scanning microscope
06/17/2010US20100154087 Method for growing a carbon nanotube on a nanometric tip
06/17/2010US20100154086 Novel enhanced processes for molecular screening and characterization
06/17/2010US20100154085 Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It
06/17/2010US20100154084 Method and apparatus for performing apertureless near-field scanning optical microscopy
06/17/2010CA2746147A1 Dynamic probe detection system
06/16/2010EP2195635A2 Method and apparatus of automatic scanning probe imaging
06/16/2010CN1854794B Method for producing near field optical generator
06/15/2010US7738115 Optical device for measuring modulated signal light
06/15/2010US7737414 Atomically sharp iridium tip
06/15/2010US7735358 Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
06/15/2010US7735357 SPM cantilever and manufacturing method thereof
06/10/2010WO2010065131A2 High frequenct deflection measurement of ir absorption
06/10/2010US20100146673 Apparatus and Method for Investigating Biological Systems and Solid Systems
06/10/2010US20100141939 Methods of polarization engineering and their applications
06/09/2010CN1963452B Offset current mode spectrograph for scan tunnel and microscope for scan tunnel
06/08/2010US7735146 Protein microscope
06/08/2010US7730770 Scanning probe microscope
06/03/2010WO2010042246A9 Carbon nanotube synthesis using refractory metal nanoparticles and manufacture of refractory metal nanoparticles
06/03/2010US20100138964 Probes for enhanced magnetic force microscopy resolution
06/03/2010US20100138028 Graphical automated machine control and metrology
06/02/2010CN101718802A Method for fixing mineral leaching rod-shaped bacteria for AFM analysis under strong acid condition
06/02/2010CN101303903B Apparatus for driving microminiature atomic force microscope
06/02/2010CN101183566B Semiconductor probe having resistive tip and method of fabricating the same
06/02/2010CN101109687B Testing device for force-electricity property under nanowire original position stretching in transmission electron microscope
06/01/2010US7728317 Optical heterodyne sampling device having probe and pump beams
05/2010
05/27/2010WO2010059446A2 Method of making and assembling capsulated nanostructures
05/27/2010WO2010057351A1 Method for detecting biological markers by an atomic force microscope
05/27/2010US20100132079 Polarization-modulated tip enhanced optical microscope
05/27/2010US20100132077 Surface analysis and measurement method based on flow resistance of fluid and atomic force microscope using the method
05/27/2010US20100132076 Fluid Delivery for Scanning Probe Microscopy
05/27/2010US20100128578 Near-field optical head having tapered hole for guiding light beam
05/27/2010DE102008057097A1 Objective arrangement for use in microscope arrangement for e.g. scanning near field optical microscope, has reflective element for focusing radiations on near field sensor, and observation objective observing sample and near field sensor
05/27/2010DE102008057093A1 Objective arrangement for e.g. performing Raman measurement, has near field probe unit fastened to refractive objective via adjustment unit for performing relative movement of probe unit towards objective
05/26/2010CN1835128B Cantilever holder and scanning probe microscope
05/25/2010US7722928 Nanolithography methods and products therefor and produced thereby
05/20/2010WO2010057052A2 Method and apparatus of operating a scanning probe microscope
05/20/2010DE112008001611T5 Positionssteuerung für die Rastersondenspektroskopie Position control for scanning probe spectroscopy
05/19/2010EP2187197A1 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program
05/19/2010EP2185975A1 Independently-addressable, self-correcting inking for cantilever arrays
05/19/2010CN101710135A Method for increasing AFM image contrast of single DNA molecules
05/18/2010US7721347 Scanning nanotube probe device and associated method
05/18/2010US7716970 Scanning probe microscope and sample observation method using the same
05/14/2010WO2010051580A1 Monitoring sample via quantum decoherence rate of probe
05/12/2010EP2183569A2 Fast-scanning spm and method of operating same
05/12/2010EP2183568A2 Heterodyne detection device for imaging an object by re-injection
05/12/2010DE102006021289B4 Verfahren und Vorrichtung zur Bestimmung einer Winkelteilung Method and apparatus for determining an angular pitch
05/12/2010CN1654230B Method for manufacturing nanometer pattern by nanometer etching technology dipping in dynamic combination mode
05/12/2010CN101173885B Near-field optical microscope system for micro-cell mesomeric state/transient state photoelectric detection and scanning image
05/06/2010US20100115674 Atomic force microscope apparatus
05/06/2010US20100115673 Near field scanning measurement-alternating current-scanning electrochemical microscopy devices and mehtods of use thereof
05/06/2010US20100115672 Scanning probe epitaxy
05/05/2010CN1801399B Probe for scanning magnetic microscope and manufacturing method thereof, method for forming iron-magnetic alloy film on carbon nanopipe
04/2010
04/29/2010US20100107285 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids
04/29/2010US20100107284 Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
04/29/2010DE102005043974B4 Mikromechanischer Abtastsensor A micromechanical scanning sensor
04/28/2010EP2179266A1 Miniaturized spring element and method for producing the latter
04/28/2010CN1629960B Contact probe storage sensor pod
04/27/2010US7707647 Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same
04/27/2010US7705999 Probe sensor with multi-dimensional optical grating
04/27/2010US7703314 Probe position control system and method
04/22/2010WO2010043746A1 Corrosion-resistant magnetostrictive micro-mechanical element
04/22/2010WO2010011186A9 A method of fabricating a cantilever structure and a cantilever structure
04/20/2010US7703147 Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe thereby
04/20/2010US7702195 Optical waveguide
04/20/2010US7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
04/13/2010US7697382 Near-field light generating method and near-field optical head using a light blocking metal film having a fine opening whose size is not more than a wavelength of irradiated light, and near-field optical microscope having the optical head
04/08/2010US20100088788 Stress micro mechanical test cell, device, system and methods
04/08/2010US20100088787 Pump probe measuring device and scanning probe microscope apparatus using the device
04/08/2010DE102008037890B3 Sequence analysis of nucleic acids e.g. DNA, comprises isolating and arranging, depositing nucleic acid on support, unwinding nucleic acid and determining unwinding of nucleic acid vibrations, over assigned vibrations of support
04/07/2010EP2171425A1 Apparatus and method for investigating surface properties of different materials
04/07/2010CN101692100A Method and device for preparing pinpoint of scanning tunnel microscope (STM)
04/06/2010US7694347 Measuring device with daisy type cantilever wheel
04/06/2010US7691541 Additive and subtractive correction using direct write nanolithography; fine control over lateral dimensions and height
04/01/2010WO2010037002A2 Methods of thermoreflectance thermography
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