Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
06/2006
06/27/2006US7067336 Electron-emitting device, electron source and image-forming apparatus, and manufacturing methods thereof
06/27/2006US7066015 Scanning probe microscope
06/27/2006US7066014 Method to transiently detect samples in atomic force microscopes
06/22/2006US20060131493 Near field analysis apparatus
06/21/2006EP1671625A1 Nanoparticles
06/21/2006EP1671171A1 Optical microscope and method for obtaining an optical image
06/21/2006CN1260721C AFM-based data storage and microscope
06/21/2006CN1260559C Scanning probe and scanning tunneling microscope possessing electron cloud enhancing action
06/21/2006CN1260071C Lithographic printing carrier, original edition and its production method
06/20/2006US7065423 Optical metrology model optimization for process control
06/20/2006US7065033 Dielectric recording medium, and method of and apparatus for producing the same
06/20/2006US7064542 Hybrid Hall vector magnetometer
06/20/2006US7064341 Coated nanotube surface signal probe
06/15/2006WO2006062048A1 Mechanical vibrator and production method therefor
06/15/2006US20060124834 Near-field light generating method, near-field exposure mask, and near-field exposure method and apparatus
06/15/2006US20060123895 Drive head and personal atomic force microscope having the same
06/14/2006EP1669734A1 Scanning type probe microscope and probe moving control method therefor
06/14/2006CN1259558C Modular atomic force microscope
06/13/2006US7061008 Single molecule array on silicon substrate for quantum computer
06/13/2006US7060448 Evaluating binding affinities by force stratification and force panning
06/08/2006US20060121190 Low-reflection glass article and method for manufacturing
06/08/2006US20060120228 Recording apparatus
06/08/2006US20060119373 Scanning probe inspection apparatus
06/07/2006EP1666867A1 Nanotube probe and method of manufacturing the same
06/07/2006EP1665360A2 Processes for fabricating conductive patterns using nanolithography as a patterning tool
06/06/2006US7057998 Near-field optical head
06/06/2006US7057740 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques
06/06/2006US7057171 Patch-clamping and its use in analyzing subcellular features
06/06/2006US7057135 Method of precise laser nanomachining with UV ultrafast laser pulses
06/06/2006US7056607 magnetic tapes having storage stability and durability comprising magnetic layer comprising ferromagnetic powders and binders on the surface of nonmagnetic supports having undercoatings comprising nonmagnetic powders, binders and water soluble cations and anions
06/06/2006US7055378 System for wide frequency dynamic nanomechanical analysis
06/01/2006WO2006056373A1 Near-field antenna
06/01/2006WO2005034206A3 Selective functionalization of carbon nanotube tips allowing fabrication of new classes of nanoscale sensing and manipulation tools
06/01/2006US20060113472 Scanning probe microscope and scanning method
06/01/2006US20060113469 Scanning probe microscope and sample observing method using this and semiconductor device production method
06/01/2006DE10035134B4 Verfahren und Vorrichtung zur optischen Nahfeldmikroskopie Method and apparatus for optical near-field microscopy
05/2006
05/31/2006EP1354234B1 Optical system and method for exciting and measuring of fluorescence on or in samples prepared with fluorescent colorants
05/31/2006EP1193274B1 Resin composition comprising hydrogenated polymers and process for producing substrate for information-recording medium
05/31/2006EP1157386B1 Nanocapsules containing charged particles, their uses and methods of forming the same
05/31/2006CN2784913Y Magnetizer dedicated for magnetic probe of magnetic microscope
05/30/2006US7054528 Plasmon-enhanced tapered optical fibers
05/30/2006US7054257 AFM-based data storage and microscopy
05/30/2006US7054234 Near-field high density magneto-optical recording head
05/30/2006US7051582 Actuating and sensing device for scanning probe microscopes
05/26/2006WO2006054771A1 Nano tweezers and scanning probe microscope having the same
05/25/2006US20060109480 Surface texture measuring instrument
05/24/2006EP1483595A4 High resolution scanning magnetic microscope operable at high temperature
05/24/2006DE102004056241A1 Nahfeldantenne Near-field antenna
05/24/2006DE102004048971B3 Apparatus for scanning probe microscopy for examining biological systems and which automatically analyzes measurements from the device according to predetermined analysis parameters
05/23/2006US7048988 Support for lithographic printing plate and presensitized plate
05/23/2006US7048901 production method of the electrical connection structure, and electric wiring; carbon nanotube as the electrode and contacting the electrode with the biopolymer (DNA, RNA, or a protein) then applying an electric current between the electrode and biopolymer
05/23/2006US7047796 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
05/18/2006WO2006051983A1 Surface status measuring method, surface status measuring device, microscope and information processor
05/18/2006WO2006033673A3 Apparatus and method for transverse characterization of materials
05/18/2006US20060103406 Cantilever
05/18/2006US20060101895 Lateral calibration device and method
05/17/2006EP1038171B8 Nanoelectrode arrays
05/17/2006CN1256752C Method for controlling electrostatic lens and ion implantation device
05/16/2006US7046357 Apparatus for microfluidic processing and reading of biochip arrays
05/16/2006US7045780 Scanning probe microscopy inspection and modification system
05/16/2006US7044839 Glass substrate for information recording medium and process for manufacturing the same
05/16/2006US7044007 Force scanning probe microscope
05/11/2006WO2006049120A1 Dynamic mode atomic force microscope probe vibration simulation method, program, recording medium, and vibration simulator
05/11/2006WO2006048683A1 Total internal reflectance fluorescence (tirf) microscope
05/11/2006WO2004098384A3 Parallel analysis of molecular interactions
05/11/2006US20060097164 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology
05/10/2006EP1655738A1 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device
05/10/2006EP1540661B1 Sensor with cantilever and optical resonator
05/10/2006CN1769860A Surface texture measuring probe and microscope utilizing the same
05/10/2006CN1769837A Surface texture measuring instrument
05/09/2006US7042829 Recording apparatus
05/09/2006US7042828 Nanometer scale data storage device and associated positioning system
05/09/2006US7041974 Conductive transparent probe and probe control apparatus
05/09/2006US7041963 Height calibration of scanning probe microscope actuators
05/09/2006US7040147 Method and apparatus for manipulating a sample
05/04/2006WO2006047337A2 Near-field aperture having a fractal iterate shape
05/04/2006WO2006046625A1 Measuring device with daisy type cantilever wheel
05/04/2006WO2006046509A1 Cantilever sensor, sensor system and method of detecting analyte in specimen liquid
05/04/2006US20060091322 Scanning probe-based lithography (SPL) method in which patterning of resist medium is produced by Atomic Force Microscope (AFM) probe-surface contact; in particular it relates to "writing" of pattern of lines and similar features in resist; resist polymer contains thermally reversible crosslinkages
05/04/2006US20060090550 Surface texture measuring probe and microscope utilizing the same
05/04/2006CA2585173A1 Measuring device with daisy type cantilever wheel
05/03/2006EP1653478A2 Surface texture measuring probe and microscope utilizing the same
05/03/2006EP1653477A2 Surface texture measuring instrument
05/03/2006EP1653476A2 Cantilever
05/03/2006EP1653213A1 Scanning-type probe microscope
05/03/2006EP1651948A1 Scanning probe inspection apparatus
05/02/2006US7038202 Conductive transparent probe and probe control apparatus
05/02/2006US7036357 Dynamic activation for an atomic force microscope and method of use thereof
04/2006
04/27/2006US20060089825 Scanning kelvin microprobe system and process for biomolecule microassay
04/27/2006DE10237477B4 Vorrichtung zur Messung von Oberflächendefekten An apparatus for measuring surface defects
04/26/2006CN1765011A Method of fabricating semiconductor probe with resistive tip
04/25/2006US7034277 Near-field light-generating element for producing localized near-field light, near-field optical recording device, and near-field optical microscope
04/25/2006US7032437 Directed growth of nanotubes on a catalyst
04/25/2006US7032427 Method for forming optical aperture, near-field optical head, method for fabricating near-field optical head, and information recording/reading apparatus
04/20/2006WO2006040025A1 Device and method for scanning probe microscopy
04/20/2006US20060082379 Parallel, individually addressable probes for nanolithography
04/20/2006US20060081776 Probe with hollow waveguide and method for producing the same
04/20/2006DE10230657B4 Verfahren und Vorrichtung zur Positionierung und Verformung von schmelzbaren Polymer-Partikeln an Messspitzen Method and apparatus for positioning and shaping of fusible polymer particles to measuring tips
04/20/2006DE10007617B4 Charakterisierung von Magnetfeldern Characterization of magnetic fields
04/19/2006CN1761729A Adhesive compositions and method for selection thereof
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