Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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10/03/2006 | US7116115 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
10/03/2006 | US7115881 Positioning and motion control by electrons, ions, and neutrals in electric fields |
10/03/2006 | US7115863 Probe for scanning probe lithography and making method thereof |
09/28/2006 | WO2006102600A2 Materials and methods for identifying biointeractive nanostructures and/or nanoparticles |
09/28/2006 | US20060216814 Molecule detecting method, molecule counting method, molecule localization detecting method, and molecule detecting device used for them |
09/28/2006 | US20060213877 Nanospot welder and method |
09/28/2006 | US20060213261 Real Time Detection of Loss of Cantilever Sensing Loss |
09/28/2006 | US20060213260 Atomic force microscope and method of energy dissipation imaging using the same |
09/28/2006 | US20060213259 Sensors for electrochemical, electrical or topographical analysis |
09/27/2006 | EP1705475A2 Optical waveguide probe and its manufacturing method |
09/27/2006 | CN1838332A Method and system for putting magnetic nanometer on object and its formed device |
09/26/2006 | US7112452 Method and sensor for detecting the binding of biomolecules by shear stress measurement |
09/21/2006 | WO2006098123A1 Scanning probe microscope and its measuring method |
09/21/2006 | WO2006097800A2 Method and device for determining material properties |
09/21/2006 | US20060209432 Optical device, optical system, method of production of same, and mold for production of same |
09/21/2006 | US20060207318 System for Sensing a Sample |
09/21/2006 | US20060207317 Scanning probe microscope |
09/21/2006 | DE20221635U1 Optical system for stimulating, measuring fluorescence on/in specimens treated with fluorescent paint has geometric axis at least partly identical with optic axis between mirror and detector |
09/21/2006 | DE102005010363A1 Abbildender Mikrowellen-Prober The imaging microwave Prober |
09/20/2006 | CN1835128A Cantilever holder and scanning probe microscope |
09/19/2006 | US7109703 Magnetic carbon nanotube |
09/19/2006 | US7107826 Scanning probe device and processing method by scanning probe |
09/19/2006 | US7107825 Method and apparatus for the actuation of the cantilever of a probe-based instrument |
09/14/2006 | WO2006029292A3 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
09/14/2006 | DE112004001001T5 Optische Messung von auf Halbleiterwafern gebildeten Strukturen unter Verwendung von Maschinenlernsystemen Optical measurement of formed on semiconductor wafers structures using machine learning systems |
09/13/2006 | EP1022733B1 Information recording medium and information reproducing apparatus |
09/12/2006 | US7107571 Visual analysis and verification system using advanced tools |
09/12/2006 | US7106935 Apparatus for focusing plasmon waves |
09/08/2006 | WO2006092109A1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip |
09/07/2006 | US20060197021 Sensing apparatus |
09/06/2006 | EP0948741B1 Method and apparatus for high spatial resolution spectroscopic microscopy |
09/06/2006 | CN1273819C Biological total internal reflection type near-field scan microscope |
09/05/2006 | US7100430 Dual stage instrument for scanning a specimen |
08/31/2006 | US20060191329 Dynamic activation for an atomic force microscope and method of use thereof |
08/31/2006 | DE10033180B4 Verfahren zur Detektion von Farbstoffen in der Fluoreszenzmikroskopie A method for the detection of dyes in the fluorescence microscopy |
08/30/2006 | EP0979414B1 Multi-probe test head and test method |
08/30/2006 | CN1272619C Spin polarized channel atomic force microtechnic |
08/29/2006 | US7098453 Scanning probe microscopy system and method of measurement by the same |
08/29/2006 | US7098112 Forming metal catalyst layer on substrate and then growing plurality of nanostructures; coating with metal, alloy, oxide, nitride, carbide, sulfide and/or chloride thereof; isolating and placing on patterned metal electrode; heating, adhesion |
08/29/2006 | US7098056 Apparatus, materials, and methods for fabrication and catalysis |
08/29/2006 | US7097708 Substituted donor atoms in silicon crystal for quantum computer |
08/24/2006 | US20060185424 Integrated measuring instrument |
08/23/2006 | EP1692323A2 Method of producing nanostructure tips |
08/23/2006 | CN1821743A Atomic force microscopic detecting method and device for moonscape environment locating measurement |
08/22/2006 | US7095020 Sensing mode atomic force microscope |
08/22/2006 | US7093509 Scanning probe microscopy apparatus and techniques |
08/16/2006 | EP1543155A4 Methods and compositions for analyzing polymers using chimeric tags |
08/16/2006 | CN1820193A Scanning probe inspection apparatus |
08/15/2006 | US7091517 Patterned functionalized silicon surfaces |
08/15/2006 | US7091476 Scanning probe microscope assembly |
08/15/2006 | US7089787 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy |
08/10/2006 | WO2006083006A1 Optical fiber probe, optical detection device, and optical detection method |
08/10/2006 | WO2006012124A3 Laser-based method and system for processing targeted surface material and article produced thereby |
08/10/2006 | DE102004063980A1 Vorrichtung und Verfahren zur Rastersondenmikroskopie Apparatus and method for scanning probe microscopy |
08/09/2006 | EP0996117B1 Near field optical head and reproduction method |
08/09/2006 | CN2804851Y High precision atomic force microscope |
08/09/2006 | CN1815181A Single-wall carbon nano-tube point and preparing method |
08/08/2006 | US7088120 Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure |
08/03/2006 | WO2006081240A1 Protein microscope |
08/03/2006 | WO2006080257A1 Cantilever control device |
08/02/2006 | EP1685391A2 An oscillating probe with a virtual probe tip |
08/02/2006 | CN1811944A Semiconductor probe with resistive tip and method of fabricating the same |
08/02/2006 | CN1267931C Carbon nano-pipe and magnetic detecting device and plumb magnetic recording head employing this |
08/02/2006 | CN1267721C Fully optical fiber probe scan type near-field optical microscope |
08/01/2006 | US7084990 Method and its apparatus for measuring size and shape of fine patterns |
08/01/2006 | US7084661 Scanning kelvin microprobe system and process for analyzing a surface |
08/01/2006 | US7084384 Diffractive optical position detector in an atomic force microscope having a moveable cantilever |
08/01/2006 | US7082683 Method for attaching rod-shaped nano structure to probe holder |
07/27/2006 | US20060168703 Apparatus and method for a scanning probe microscope |
07/27/2006 | US20060165957 Method for producing at least one small opening in a layer on a substrate and components produced according ot said method |
07/27/2006 | US20060162455 Method and device for measuring vibration frequency of multi-cantilever |
07/26/2006 | EP1684275A2 Near field optical memory head |
07/25/2006 | US7081624 Scanning probe microscopy probes and methods |
07/25/2006 | US7081619 Nanodosimeter based on single ion detection |
07/20/2006 | US20060157440 Semiconductor probe with resistive tip and method of fabricating the same |
07/20/2006 | US20060156798 Carbon nanotube excitation system |
07/19/2006 | EP1681548A1 Semiconductor probe with resistive tip and method of fabricating the same |
07/19/2006 | EP1680788A1 Cantilever assembly |
07/18/2006 | US7078896 Spatially resolved electromagnetic property measurement |
07/13/2006 | WO2006073068A1 Surface position measuring method and surface position measuring device |
07/13/2006 | US20060150721 Fluid delivery for scanning probe microscopy |
07/13/2006 | US20060150720 Probe for a scanning microscope |
07/13/2006 | US20060150719 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope |
07/12/2006 | EP1295119B1 Scanning kelvin microprobe system and process for analyzing a surface |
07/12/2006 | CN1801399A Probe for scanning magnetic microscope and manufacturing method thereof, method for forming iron-magnetic alloy film on carbon nanopipe |
07/11/2006 | US7075071 Conductive transparent probe and probe control apparatus |
07/11/2006 | US7073937 Heat emitting probe and heat emitting probe apparatus |
07/06/2006 | WO2006070946A1 A method for analyzing nucleobases on a single molecular basis |
07/06/2006 | WO2005059514A3 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture |
07/06/2006 | US20060146683 Method for forming optical aperture, near- field optical head, method for fabricating near-field optical head, and information recording/reading apparatus |
07/05/2006 | CN1799045A Optical metrology of structures formed on semiconductor wafers using machine learning systems |
07/05/2006 | CN1796989A Method and devices of biochemical detection by using micro semi girder |
06/29/2006 | US20060139026 Magnetic field generator device for magnetic force microscope |
06/28/2006 | EP1674851A2 Near field analysis apparatus |
06/28/2006 | EP1583845A4 Method and apparatus for molecular analysis in small sample volumes |
06/28/2006 | CN2791672Y Co-axial lighting microscope optical system for observation apparatus |
06/28/2006 | CN1795376A Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing method |
06/28/2006 | CN1793834A Quantitative method for determining film pollution compactness extent |
06/27/2006 | US7068911 Optical probe and optical pick-up apparatus |
06/27/2006 | US7067806 Scanning probe microscope and specimen observation method |