Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
10/2006
10/03/2006US7116115 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate
10/03/2006US7115881 Positioning and motion control by electrons, ions, and neutrals in electric fields
10/03/2006US7115863 Probe for scanning probe lithography and making method thereof
09/2006
09/28/2006WO2006102600A2 Materials and methods for identifying biointeractive nanostructures and/or nanoparticles
09/28/2006US20060216814 Molecule detecting method, molecule counting method, molecule localization detecting method, and molecule detecting device used for them
09/28/2006US20060213877 Nanospot welder and method
09/28/2006US20060213261 Real Time Detection of Loss of Cantilever Sensing Loss
09/28/2006US20060213260 Atomic force microscope and method of energy dissipation imaging using the same
09/28/2006US20060213259 Sensors for electrochemical, electrical or topographical analysis
09/27/2006EP1705475A2 Optical waveguide probe and its manufacturing method
09/27/2006CN1838332A Method and system for putting magnetic nanometer on object and its formed device
09/26/2006US7112452 Method and sensor for detecting the binding of biomolecules by shear stress measurement
09/21/2006WO2006098123A1 Scanning probe microscope and its measuring method
09/21/2006WO2006097800A2 Method and device for determining material properties
09/21/2006US20060209432 Optical device, optical system, method of production of same, and mold for production of same
09/21/2006US20060207318 System for Sensing a Sample
09/21/2006US20060207317 Scanning probe microscope
09/21/2006DE20221635U1 Optical system for stimulating, measuring fluorescence on/in specimens treated with fluorescent paint has geometric axis at least partly identical with optic axis between mirror and detector
09/21/2006DE102005010363A1 Abbildender Mikrowellen-Prober The imaging microwave Prober
09/20/2006CN1835128A Cantilever holder and scanning probe microscope
09/19/2006US7109703 Magnetic carbon nanotube
09/19/2006US7107826 Scanning probe device and processing method by scanning probe
09/19/2006US7107825 Method and apparatus for the actuation of the cantilever of a probe-based instrument
09/14/2006WO2006029292A3 Method and apparatus of driving torsional resonance mode of a probe-based instrument
09/14/2006DE112004001001T5 Optische Messung von auf Halbleiterwafern gebildeten Strukturen unter Verwendung von Maschinenlernsystemen Optical measurement of formed on semiconductor wafers structures using machine learning systems
09/13/2006EP1022733B1 Information recording medium and information reproducing apparatus
09/12/2006US7107571 Visual analysis and verification system using advanced tools
09/12/2006US7106935 Apparatus for focusing plasmon waves
09/08/2006WO2006092109A1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip
09/07/2006US20060197021 Sensing apparatus
09/06/2006EP0948741B1 Method and apparatus for high spatial resolution spectroscopic microscopy
09/06/2006CN1273819C Biological total internal reflection type near-field scan microscope
09/05/2006US7100430 Dual stage instrument for scanning a specimen
08/2006
08/31/2006US20060191329 Dynamic activation for an atomic force microscope and method of use thereof
08/31/2006DE10033180B4 Verfahren zur Detektion von Farbstoffen in der Fluoreszenzmikroskopie A method for the detection of dyes in the fluorescence microscopy
08/30/2006EP0979414B1 Multi-probe test head and test method
08/30/2006CN1272619C Spin polarized channel atomic force microtechnic
08/29/2006US7098453 Scanning probe microscopy system and method of measurement by the same
08/29/2006US7098112 Forming metal catalyst layer on substrate and then growing plurality of nanostructures; coating with metal, alloy, oxide, nitride, carbide, sulfide and/or chloride thereof; isolating and placing on patterned metal electrode; heating, adhesion
08/29/2006US7098056 Apparatus, materials, and methods for fabrication and catalysis
08/29/2006US7097708 Substituted donor atoms in silicon crystal for quantum computer
08/24/2006US20060185424 Integrated measuring instrument
08/23/2006EP1692323A2 Method of producing nanostructure tips
08/23/2006CN1821743A Atomic force microscopic detecting method and device for moonscape environment locating measurement
08/22/2006US7095020 Sensing mode atomic force microscope
08/22/2006US7093509 Scanning probe microscopy apparatus and techniques
08/16/2006EP1543155A4 Methods and compositions for analyzing polymers using chimeric tags
08/16/2006CN1820193A Scanning probe inspection apparatus
08/15/2006US7091517 Patterned functionalized silicon surfaces
08/15/2006US7091476 Scanning probe microscope assembly
08/15/2006US7089787 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
08/10/2006WO2006083006A1 Optical fiber probe, optical detection device, and optical detection method
08/10/2006WO2006012124A3 Laser-based method and system for processing targeted surface material and article produced thereby
08/10/2006DE102004063980A1 Vorrichtung und Verfahren zur Rastersondenmikroskopie Apparatus and method for scanning probe microscopy
08/09/2006EP0996117B1 Near field optical head and reproduction method
08/09/2006CN2804851Y High precision atomic force microscope
08/09/2006CN1815181A Single-wall carbon nano-tube point and preparing method
08/08/2006US7088120 Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure
08/03/2006WO2006081240A1 Protein microscope
08/03/2006WO2006080257A1 Cantilever control device
08/02/2006EP1685391A2 An oscillating probe with a virtual probe tip
08/02/2006CN1811944A Semiconductor probe with resistive tip and method of fabricating the same
08/02/2006CN1267931C Carbon nano-pipe and magnetic detecting device and plumb magnetic recording head employing this
08/02/2006CN1267721C Fully optical fiber probe scan type near-field optical microscope
08/01/2006US7084990 Method and its apparatus for measuring size and shape of fine patterns
08/01/2006US7084661 Scanning kelvin microprobe system and process for analyzing a surface
08/01/2006US7084384 Diffractive optical position detector in an atomic force microscope having a moveable cantilever
08/01/2006US7082683 Method for attaching rod-shaped nano structure to probe holder
07/2006
07/27/2006US20060168703 Apparatus and method for a scanning probe microscope
07/27/2006US20060165957 Method for producing at least one small opening in a layer on a substrate and components produced according ot said method
07/27/2006US20060162455 Method and device for measuring vibration frequency of multi-cantilever
07/26/2006EP1684275A2 Near field optical memory head
07/25/2006US7081624 Scanning probe microscopy probes and methods
07/25/2006US7081619 Nanodosimeter based on single ion detection
07/20/2006US20060157440 Semiconductor probe with resistive tip and method of fabricating the same
07/20/2006US20060156798 Carbon nanotube excitation system
07/19/2006EP1681548A1 Semiconductor probe with resistive tip and method of fabricating the same
07/19/2006EP1680788A1 Cantilever assembly
07/18/2006US7078896 Spatially resolved electromagnetic property measurement
07/13/2006WO2006073068A1 Surface position measuring method and surface position measuring device
07/13/2006US20060150721 Fluid delivery for scanning probe microscopy
07/13/2006US20060150720 Probe for a scanning microscope
07/13/2006US20060150719 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope
07/12/2006EP1295119B1 Scanning kelvin microprobe system and process for analyzing a surface
07/12/2006CN1801399A Probe for scanning magnetic microscope and manufacturing method thereof, method for forming iron-magnetic alloy film on carbon nanopipe
07/11/2006US7075071 Conductive transparent probe and probe control apparatus
07/11/2006US7073937 Heat emitting probe and heat emitting probe apparatus
07/06/2006WO2006070946A1 A method for analyzing nucleobases on a single molecular basis
07/06/2006WO2005059514A3 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture
07/06/2006US20060146683 Method for forming optical aperture, near- field optical head, method for fabricating near-field optical head, and information recording/reading apparatus
07/05/2006CN1799045A Optical metrology of structures formed on semiconductor wafers using machine learning systems
07/05/2006CN1796989A Method and devices of biochemical detection by using micro semi girder
06/2006
06/29/2006US20060139026 Magnetic field generator device for magnetic force microscope
06/28/2006EP1674851A2 Near field analysis apparatus
06/28/2006EP1583845A4 Method and apparatus for molecular analysis in small sample volumes
06/28/2006CN2791672Y Co-axial lighting microscope optical system for observation apparatus
06/28/2006CN1795376A Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing method
06/28/2006CN1793834A Quantitative method for determining film pollution compactness extent
06/27/2006US7068911 Optical probe and optical pick-up apparatus
06/27/2006US7067806 Scanning probe microscope and specimen observation method
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