| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 04/08/2008 | US7355710 Optical system and method for exciting and measuring fluorescence on or in samples treated with fluorescent pigments |
| 04/03/2008 | WO2008037427A1 Method and device for the locally resolved analysis of the elastic properties of a sample using an atomic force microscope |
| 04/03/2008 | US20080078932 Scanning probe microscope capable of measuring samples having overhang structure |
| 04/03/2008 | US20080078229 Caliper method, system, and apparatus |
| 04/03/2008 | DE102006045643A1 Verfahren und Vorrichtung zur ortsaufgelösten Untersuchung der elastischen Eigenschaften einer Probe mit einem Rasterkraftmikroskop Method and device for the spatially resolved investigation of the elastic properties of a sample using an atomic force microscope |
| 04/02/2008 | EP1362230A4 Balanced momentum probe holder |
| 04/02/2008 | EP0763742B1 Optical fiber and its manufacture |
| 04/01/2008 | US7353475 Electronic design for integrated circuits based on process related variations |
| 04/01/2008 | US7351646 Laser annealing method and laser annealing device |
| 04/01/2008 | US7351575 Methods for processing biological materials using peelable and resealable devices |
| 04/01/2008 | US7350404 Scanning type probe microscope and probe moving control method therefor |
| 03/27/2008 | US20080074656 Defining a pattern on a substrate |
| 03/27/2008 | US20080073554 Spin-polarized electron source and spin-polarized scanning tunneling microscope |
| 03/27/2008 | US20080073522 Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been used |
| 03/27/2008 | US20080073520 Tip structure for scanning devices, method of its preparation and devices thereon |
| 03/27/2008 | US20080073518 Optical Fiber Probe, Optical Detection Device, And Optical Detection Method |
| 03/27/2008 | US20080073438 Laser-based method and system for processing targeted surface material and article produced thereby |
| 03/27/2008 | US20080072665 Device and Method for Scanning Probe Microscopy |
| 03/27/2008 | DE102006043352A1 Einrichtung zum Abtasten einer von einer Flüssigkeit bedeckten Probenoberfläche Means for scanning a surface covered by a liquid sample surface |
| 03/26/2008 | CN201041541Y Tunnel current testing device of scanning tunnel microscope based on interconnected amplifier |
| 03/25/2008 | US7348079 Magnetic recording medium |
| 03/20/2008 | WO2008031618A1 Device for scanning a sample surface covered with a liquid |
| 03/19/2008 | EP1899107A2 Integrated displacement sensors for probe microscopy and force spectroscopy |
| 03/19/2008 | EP1685391A4 An oscillating probe with a virtual probe tip |
| 03/18/2008 | US7344908 Atomic force microscope cantilever including field effect transistor and method for manufacturing the same |
| 03/18/2008 | US7344832 Method and apparatus for molecular analysis in small sample volumes |
| 03/18/2008 | US7344756 Method for scanning probe contact printing |
| 03/13/2008 | WO2008031076A2 Atomic force microscope |
| 03/13/2008 | WO2008029562A1 Atomic force microscope |
| 03/13/2008 | WO2008028500A1 Method for testing active compounds |
| 03/13/2008 | US20080061798 Microcoaxial probes made from strained semiconductor bilayers |
| 03/13/2008 | US20080061230 Probe sensor with multi-dimensional optical grating |
| 03/13/2008 | US20080060426 Atomic force microscope |
| 03/12/2008 | EP1898204A1 Scan type probe microscope and cantilever drive device |
| 03/12/2008 | EP1896824A1 Higher harmonics atomic force microscope |
| 03/12/2008 | EP1307726B1 Method for detecting the wavelength-dependent behavior of an illuminated specimen |
| 03/12/2008 | CN201034908Y Open type atomic force microscope liquid pool capable of long time working |
| 03/12/2008 | CN100375295C Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication |
| 03/11/2008 | US7341681 Method of manufacturing optical fiber probe and for finishing micro material |
| 03/11/2008 | US7340944 Oscillator and method of making for atomic force microscope and other applications |
| 03/06/2008 | WO2008027601A2 Band excitation method applicable to scanning probe microscopy |
| 03/06/2008 | WO2008025491A1 Probe, especially for optical near field scanning microscopy |
| 03/06/2008 | WO2007135483A3 Biomolecule interaction using atomic force microscope |
| 03/06/2008 | WO2007133585A3 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 03/06/2008 | US20080055343 Metal layer having aperture, method of forming the same, light delivery module including metal layer having aperture, and heat assisted magnetic recording head including the same |
| 03/06/2008 | US20080054928 Electric potential difference detection method and scanning probe microscope |
| 03/06/2008 | US20080054168 Near-Field Scanning Optical Microscope Probe Having a Light Emitting Diode |
| 03/05/2008 | EP1756595A4 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 03/05/2008 | CN101136207A Metal layer having aperture, method of forming the same, light delivery module comprising metal layer having aperture and heat assisted magnetic recording head comprising the same |
| 03/05/2008 | CN100372794C Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 03/04/2008 | US7338831 Method of fabricating semiconductor probe with resistive tip |
| 03/04/2008 | US7337656 Surface characteristic analysis apparatus |
| 02/28/2008 | US20080049236 Optical Displacement Detection Mechanism and Surface Information Measurement Device Using the Same |
| 02/28/2008 | US20080049223 Optical displacement-detecting mechanism and probe microscope using the same |
| 02/28/2008 | US20080048114 Scanning Type Probe Microscope |
| 02/28/2008 | US20080047367 Quantum-based force realization apparatus and force measurer using the same |
| 02/28/2008 | US20080047335 Measuring apparatus |
| 02/28/2008 | US20080047334 Scanning Microscope With Shape Correction Means |
| 02/28/2008 | DE102006040057A1 Device for concentration of polarized light of area substantially smaller than light wave length, has slots to support excitation of automatic concentrated surface plasmon resonance in metal shield by light radiation in chamber |
| 02/27/2008 | EP1892727A1 Measuring apparatus |
| 02/27/2008 | EP1892499A2 Atomic force microscope for generating a small incident beam spot |
| 02/27/2008 | EP1850972A4 Thermal control of deposition in dip pen nanolithography |
| 02/27/2008 | EP1010983B1 Probe with optical waveguide and method of producing the same |
| 02/26/2008 | US7336591 Data storage medium |
| 02/26/2008 | US7335942 Field effect transistor sensor |
| 02/26/2008 | US7335873 Light condensing method and light condenser as well as near-field optical microscope and storage device formed by applying the same |
| 02/26/2008 | US7334460 Method and apparatus of manipulating a sample |
| 02/26/2008 | US7334459 Atomic force microscope and corrector thereof and measuring method |
| 02/21/2008 | US20080044924 Water quality evaluation method and substrate contacting apparatus used |
| 02/21/2008 | US20080041143 Atomic Force Microscope Using A Torsional Harmonic Cantilever |
| 02/20/2008 | EP1889031A1 Nanometric emitter/receiver guides |
| 02/20/2008 | EP1292361B1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 02/19/2008 | US7333191 Scanning probe microscope and measurement method using the same |
| 02/14/2008 | WO2007140497A8 Virus-nanoarray |
| 02/14/2008 | US20080038538 Method of Producing Nanostructure Tips |
| 02/13/2008 | CN100368792C In-situ micro area structure analysis and property detection combined system |
| 02/07/2008 | WO2008015916A1 Scanning probe microscope |
| 02/07/2008 | WO2008015865A1 Manufacturing method and manufacturing device of near-field light utilization head |
| 02/07/2008 | WO2008015428A1 Scanning ion conductance microscopy for the investigation of living cells |
| 02/06/2008 | EP1883932A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 02/06/2008 | EP1883849A2 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 02/05/2008 | US7327665 Optical fiber probe using an electrical potential difference and an optical recorder using the same |
| 01/31/2008 | WO2008011849A1 Method for operating a measuring arrangement having a scanning probe microscope device and a measuring arrangement |
| 01/31/2008 | WO2007016299A3 Atom probe evaporation processes |
| 01/31/2008 | DE112006000452T5 Rastersondenmikroskop und Messverfahren damit Scanning probe microscope and measuring procedures so |
| 01/31/2008 | DE102006035089A1 Method for determination of state charge electronic density, involves determining electronic density of charge from measured current, where transmission coefficient derivative is considered after voltage |
| 01/30/2008 | CN101113946A Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope |
| 01/29/2008 | US7325206 Electronic design for integrated circuits based process related variations |
| 01/29/2008 | US7323684 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 01/24/2008 | WO2006124572A3 Dual wavelength polarized near-field imaging apparatus |
| 01/24/2008 | US20080017809 Scanning Probe Microscope System |
| 01/24/2008 | US20080016953 Atomic force microscope cantilever including field effect transistor and method for manufacturing the same |
| 01/23/2008 | EP1881317A1 Scanning probe microscope system |
| 01/23/2008 | EP1427983A4 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 01/23/2008 | EP1404902A4 High surface quality gan wafer and method of fabricating same |
| 01/23/2008 | CN101109687A Testing device for force-electricity property under nanowire original position stretching in transmission electron microscope |
| 01/23/2008 | CN101109675A Virus example and its preparing method used for AFM research |
| 01/22/2008 | US7321125 Transverse magnetic field voltage isolator |
| 01/17/2008 | WO2008006229A1 Scanning probe microscope and method for operating the same |
| 01/17/2008 | WO2007011405A3 Device and method of use for detection and characterization of microorganisms and microparticles |