| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 11/05/2008 | CN101300480A Scanning probe microscopy method and apparatus utilizing sample pitch |
| 11/04/2008 | US7446324 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
| 11/04/2008 | US7444857 Software synchronization of multiple scanning probes |
| 11/04/2008 | US7444856 Sensors for electrochemical, electrical or topographical analysis |
| 10/30/2008 | DE112006003492T5 Sondermodul mit integriertem Stellglied für ein Rastersondenmikroskop Special module with integrated actuator for a scanning probe microscope |
| 10/29/2008 | EP1985991A1 Measuring probe, sample surface measuring apparatus and sample surface measuring method |
| 10/29/2008 | CN101294889A Low temperature scanning probe microscope system based on pulsatron refrigeration technology |
| 10/28/2008 | US7444054 Apparatus for focusing plasmon waves |
| 10/28/2008 | US7442925 Working method using scanning probe |
| 10/28/2008 | US7442922 Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
| 10/28/2008 | US7442571 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 10/28/2008 | US7441446 Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing |
| 10/28/2008 | US7441444 AFM cantilevers and methods for making and using same |
| 10/23/2008 | US20080258059 Scanning Probe Microscope System |
| 10/22/2008 | EP1410436B1 Parallel, individually addressable probes for nanolithography |
| 10/22/2008 | CN100427921C Thin-membrane section positioning method of scanning probe microscope |
| 10/21/2008 | US7439056 Peelable and resealable devices for arraying materials |
| 10/16/2008 | WO2008123432A1 Device and method for acquiring a field by measurement |
| 10/16/2008 | WO2008122800A1 Probe microscopy and probe position monitoring apparatus |
| 10/16/2008 | WO2008122799A1 Probe microscopy with small probe |
| 10/16/2008 | US20080253020 Read/Write Tip, Head and Device, and Use Thereof, and Method for Manufacturing Same |
| 10/16/2008 | US20080251740 Optical Heterodyne Sampling Device |
| 10/15/2008 | EP1588383B1 Probe for an optical near field microscope and method for producing the same |
| 10/15/2008 | EP1513957A4 Nucleic acid sequencing by signal stretching and data integration |
| 10/15/2008 | CN101286372A Method for eliminating optical fibre detecting probe surface honeycomb rough appearance during static corrosion |
| 10/14/2008 | US7436753 Contact probe storage FET sensor |
| 10/09/2008 | US20080245141 Digital Q Control for enhanced Measurement Capability in Cantilever-based Instruments |
| 10/09/2008 | DE10054142B4 Verfahren und Systeme zur Messung der Mikrorauhigkeit eines Substrates unter Kombination von Partikelzählung und Atomarkraft-Mikroskopmessungen Methods and systems for measuring the microroughness of a substrate on combination of particle counting and atomic force microscope measurements |
| 10/08/2008 | EP1978348A1 Scanning probe microscope |
| 10/01/2008 | EP1975598A2 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 10/01/2008 | EP1896824B1 Higher harmonics atomic force microscope |
| 10/01/2008 | EP1611607A4 Method of fabricating semiconductor probe with resistive tip |
| 10/01/2008 | CN101276620A Integration piezoelectricity movable micro-lens enhancement type conical second-wavelength near-field light probe array |
| 10/01/2008 | CN101275895A Sample platform system for in-situ measuring Na electronic device property in transmission electron microscope |
| 09/30/2008 | US7429732 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 09/25/2008 | US20080230856 Intermediate probe structures for atomic force microscopy |
| 09/25/2008 | US20080229813 Phase Feedback AFM and Control Method Therefor |
| 09/24/2008 | EP1972920A1 Scan type probe microscope |
| 09/24/2008 | CN100420934C Near-field scanning optical microscope poisitioned scanning-imaging method |
| 09/18/2008 | WO2008112713A1 Nanolithography with use of viewports |
| 09/18/2008 | WO2008111433A1 Atomic force microscope |
| 09/18/2008 | WO2008111390A1 Scanning probe microscope and method of observing sample using the same |
| 09/18/2008 | US20080223122 Scanning probe microscope |
| 09/18/2008 | US20080223120 Higher Harmonics Atomic Force Microscope |
| 09/18/2008 | US20080223117 Scanning probe microscope and sample observation method using the same and device manufacturing method |
| 09/18/2008 | CA2678943A1 Nanolithography with use of viewports |
| 09/17/2008 | CN100419411C Scanning device with buffer for tunnel scanning microscope |
| 09/16/2008 | US7425698 Feedback influenced increased-quality-factor scanning probe microscope |
| 09/11/2008 | US20080217302 Nanospot Welder and Method |
| 09/10/2008 | EP1967839A1 Delay time modulated and femtosecond time-resolved, scanning probe microscope apparatus |
| 09/10/2008 | EP1966586A1 Improved photon-emission scanning tunnel microscopy |
| 09/10/2008 | EP1548438B1 Hybridisation detecting method and bioassay device, and bioassay-use substrate |
| 09/10/2008 | EP1540378A4 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 09/10/2008 | CN100418083C Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 09/09/2008 | US7423954 Contact probe storage sensor pod |
| 09/09/2008 | US7423265 Near-field aperture having a fractal iterate shape |
| 09/09/2008 | US7423264 Atomic force microscope |
| 09/04/2008 | WO2008105919A2 Nanomechanical characterization of cellular activity |
| 09/04/2008 | WO2008104672A2 Method for growing a carbon nanotube on a nanometric tip |
| 09/04/2008 | US20080216027 Electronic Design for Integrated Circuits Based on Process Related Variations |
| 09/04/2008 | US20080213986 Laser annealing method and laser annealing device |
| 09/04/2008 | US20080213923 DNA-Based Memory Device and Method of Reading and Writing Same |
| 09/04/2008 | US20080210869 Apparatus for observing a sample with a particle beam and an optical microscope |
| 09/04/2008 | US20080210864 Local Injector of Spin-Polarized Electrons with Semiconductor Tip Under Light |
| 09/03/2008 | EP1963816A1 Optical device comprising a cantilever and method of fabrication and use thereof |
| 09/03/2008 | EP1089066B1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder |
| 09/03/2008 | CN201111298Y Hoisting device for scanning probe sensitivity of probe microscope in liquid |
| 09/03/2008 | CN101256133A Method for preparing colloid ball sample for three-dimensional calibration of scanning probe microscope |
| 08/27/2008 | EP1960307A1 Micro-electromechanical system comprising a deformable portion and a stress sensor |
| 08/26/2008 | US7416699 Carbon nanotube devices |
| 08/26/2008 | US7416698 Using flow through separation mixture to characterize a population of linear macromolecules and long chain branched macromolecules of interest; size exclusion chromatography |
| 08/21/2008 | WO2008099136A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 08/21/2008 | CA2715504A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 08/20/2008 | EP1957954A1 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 08/14/2008 | WO2008060624A3 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 08/14/2008 | US20080193963 Using force spectroscope to monitor variation of protein activation states pre/post modulator exposure |
| 08/14/2008 | US20080193752 Near-Field Antenna |
| 08/14/2008 | US20080190182 Afm probe with variable stiffness |
| 08/13/2008 | EP1956607A1 AFM probe with variable stiffness |
| 08/13/2008 | CN101241087A Apparatus for observing a sample with a particle beam and an optical microscope |
| 08/12/2008 | US7411210 Semiconductor probe with resistive tip having metal shield thereon |
| 08/12/2008 | US7411189 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 08/06/2008 | EP1953792A2 Apparatus for observing a sample with a particle beam and an optical microscope |
| 08/06/2008 | EP1953791A1 Apparatus for observing a sample with a particle beam and an optical microscope |
| 08/06/2008 | EP1953763A1 Scanning nanojet microscope and the operation method thereof |
| 08/06/2008 | EP1460410B1 Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
| 08/05/2008 | US7408835 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 08/05/2008 | US7408635 Optical measurement method and device |
| 07/31/2008 | WO2008089950A1 Mems sensor for in situ tem atomic force microscopy |
| 07/30/2008 | EP1950551A1 Probe and cantilever |
| 07/30/2008 | EP1949086A2 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 07/30/2008 | EP1949055A1 Optical heterodyne sampling device |
| 07/30/2008 | CN101231262A Method for unicell group logistics |
| 07/29/2008 | US7406021 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein |
| 07/29/2008 | US7404314 Atomic force microscope using a torsional harmonic cantilever |
| 07/29/2008 | US7404313 Scanning probe microscope |
| 07/24/2008 | WO2008087852A1 Atomic microscope and interactive force measuring method using atomic microscope |
| 07/24/2008 | WO2008066779A3 Near field scanning measurement-alternating current-scanning electrochemical microscopy devices and methods of use thereof |
| 07/23/2008 | EP0964251B1 Optical waveguide probe and its manufacturing method |
| 07/23/2008 | CN100405040C Film stretching loading device under scanning microscopy environment and film distortion measurement method |