| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 08/18/2009 | US7574903 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 08/13/2009 | WO2009099619A2 Array and cantilever array leveling |
| 08/13/2009 | US20090205092 Method of fabricating a probe device for a metrology instrument and a probe device produced thereby |
| 08/13/2009 | US20090205091 Array and cantilever array leveling |
| 08/13/2009 | US20090205090 Optical component operating in near-field transmission |
| 08/13/2009 | US20090205089 Method for Examining a Measurement Object, and Apparatus |
| 08/13/2009 | US20090205088 Optical Scanning Probe |
| 08/13/2009 | US20090202190 Optical waveguide |
| 08/13/2009 | CA2714005A1 Array and cantilever array leveling |
| 08/12/2009 | CN100526206C Thermal movement sensor |
| 08/11/2009 | US7572300 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 08/06/2009 | WO2009095720A2 Scanning ion conductance microscopy |
| 08/06/2009 | WO2009001220A4 Functionalization of microscopy probe tips |
| 08/06/2009 | US20090198635 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 08/05/2009 | CN100523778C Fully digital controller for cantilever-based instruments |
| 08/04/2009 | US7570061 Cantilever control device |
| 07/30/2009 | WO2009093813A2 Methods for electrically detecting interactions between biomolecules using scanning tunneling microscope |
| 07/30/2009 | DE102008005248A1 Measuring probe i.e. cantilever, providing method for examining sample in e.g. atomic force microscope, involves processing measuring probe before or after measurement, where measuring probe is held at carrier device |
| 07/23/2009 | WO2009062631A3 Method for examining a sample by scanning tunneling microscopy using a contrast agent |
| 07/22/2009 | CN100516822C Near-field microscope of optical wave band |
| 07/21/2009 | US7564034 Terahertz sensing apparatus using a transmission line |
| 07/21/2009 | US7562564 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 07/16/2009 | WO2009063145A3 Heterodyne detection device for imaging an object by re-injection |
| 07/16/2009 | WO2009052338A3 Dual-tipped probe for atomic force microscopy |
| 07/14/2009 | US7560921 Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope |
| 07/14/2009 | US7559261 Device and method for measuring molecule using gel substrate material |
| 07/09/2009 | WO2009086534A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby |
| 07/09/2009 | WO2009085184A1 Protected metallic tip or metallized scanning probe microscopy tip for optical applications |
| 07/09/2009 | US20090178166 Method for microfabricating a probe with integrated handle, cantilever, tip and circuit |
| 07/09/2009 | US20090178165 Cantilever with pivoting actuation |
| 07/09/2009 | DE102008003291A1 Near field microscope for optical examination of sample, has point holder arranged axial symmetrically to reflector axis in focus of parabolic reflector and moves in three directions that are independent from each other |
| 07/08/2009 | EP1883849A4 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 07/07/2009 | US7557933 Measuring probe, sample surface measuring apparatus and sample surface measuring method |
| 07/07/2009 | US7556968 Scanning probe microscope and molecular structure change observation method |
| 07/02/2009 | WO2009014801A3 Scanning nanotube probe device and associated method |
| 07/02/2009 | US20090172846 Nanometric emitter/receiver guides |
| 07/02/2009 | US20090169754 Method of fabricating alignment layer of liquid crystal display device and testing the alignment layer |
| 07/01/2009 | EP2074404A1 Method for testing active compounds |
| 07/01/2009 | EP1994395B1 Method for determining a dopant concentration in a semiconductor sample |
| 07/01/2009 | EP1115113B1 Information recording medium, information reproducing device, and information recording/reproducing device |
| 07/01/2009 | CN101473384A Method and apparatus for characterizing a probe tip |
| 06/30/2009 | US7553776 Patterned functionalized silicon surfaces |
| 06/30/2009 | US7553335 Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer |
| 06/25/2009 | US20090158828 Scanning Probe Microscope |
| 06/24/2009 | CN101467021A Optical component operating in near-field transmission |
| 06/23/2009 | US7550311 Near-field optical probe based on SOI substrate and fabrication method thereof |
| 06/18/2009 | WO2009074617A1 Device and method for an atomic force microscope for the study and modification of surface properties |
| 06/18/2009 | WO2009036365A3 Method and apparatus of automatic scanning probe imaging |
| 06/18/2009 | US20090155917 Method for analyzing nucleobases on a single molecular basis |
| 06/18/2009 | DE102007060460A1 Vorrichtung und Verfahren zur Untersuchung und Modifikation von Oberflächeneigenschaften verschiedener Materialien Device and method for the examination and modification of surface properties of various materials |
| 06/17/2009 | EP1417448A4 Scanning interferometry with reference signal |
| 06/17/2009 | CN100501322C Surface texture measuring device |
| 06/11/2009 | US20090151030 Dual tip atomic force microscopy probe and method for producing such a probe |
| 06/11/2009 | US20090148652 Diamond Film Deposition and Probes |
| 06/11/2009 | US20090146081 Surface Plasmon Enhanced Radiation Methods and Apparatus |
| 06/10/2009 | EP2067016A1 Device for scanning a sample surface covered with a liquid |
| 06/10/2009 | CN201255715Y Nano-scale metallurgical microscope based on scanning tunneling microscope |
| 06/09/2009 | US7545592 Flying height measurement method and system |
| 06/09/2009 | US7545508 Interferometric apparatus utilizing a cantilever array to measure a surface |
| 06/09/2009 | US7543482 Carbon thin line probe |
| 06/04/2009 | WO2009070622A2 Cantilever with pivoting actuation |
| 06/04/2009 | WO2009068568A1 Intermodulation scanning force spectroscopy |
| 06/04/2009 | WO2009001220A3 Functionalization of microscopy probe tips |
| 06/04/2009 | US20090140142 Scanning probe microscope and measuring method thereby |
| 06/04/2009 | US20090140128 Methods, systems and apparatus for light concentrating mechanisms |
| 06/04/2009 | US20090139315 Non-destructive ambient dynamic mode afm amplitude versus distance curve acquisition |
| 06/04/2009 | CA2705130A1 Cantilever with pivoting actuation |
| 06/03/2009 | EP2064534A2 Band excitation method applicable to scanning probe microscopy |
| 06/03/2009 | CN101447235A Localized surface plasma resonance enhanced near-field optical probe |
| 06/03/2009 | CN100495109C Modularized scanning probe microscope |
| 06/03/2009 | CN100494971C Quantitative method for determining film pollution compactness extent |
| 06/02/2009 | US7541062 can turn deposition on or off while the tip maintains contact with the surface; control the ink deposition rate and limit the amount of excess ink diffusion; thermosensitive patterning compound is octadecylphosphonic acid, or 10-undecenyl tricholorosilane; ink deposition depend on heating or cooling |
| 05/28/2009 | WO2009066555A1 Scan probe microscope and probe unit for scan probe microscope |
| 05/28/2009 | US20090138995 Atom probe component treatments |
| 05/28/2009 | US20090138994 Optical measuring head positioned to correspond to the cantilever array for measuring movement of the cantilever, whereby measuring variations in vibration frequency and/or amplitude of the cantilevers according to the rotation the disk-like base plate:biological sampling; medical diagnosis; MERSA |
| 05/28/2009 | US20090134025 Scanning device with a probe having an organic material |
| 05/28/2009 | DE102007056992A1 Sub micrometer structures producing method for structuring of e.g. scanning tips, for micro or nano-technology, involves selectively etching layer to be structured, and removing upper masking layer afterwards |
| 05/27/2009 | EP2063250A1 Atomic force microscope |
| 05/27/2009 | CN101441160A Continuous imaging automatic area-selecting method suitable for atomic force microscope |
| 05/22/2009 | WO2009063145A2 Heterodyne detection device for imaging an object by re-injection |
| 05/22/2009 | WO2009062631A2 Method for examining a sample by scanning tunneling microscopy using a contrast agent |
| 05/21/2009 | US20090133169 Independently-addressable, self-correcting inking for cantilever arrays |
| 05/21/2009 | US20090133168 Scanning probe microscope |
| 05/20/2009 | EP1606598A4 Raman imaging and sensing apparatus employing nanoantennas |
| 05/20/2009 | CN101438355A Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 05/20/2009 | CN101435759A Automatic DNA molecule operating method based on atomic force microscope |
| 05/19/2009 | US7535817 Nanometer scale data storage device and associated positioning system |
| 05/19/2009 | US7534999 can simultaneously perform atomic-level configuration observation and elemental analysis; chemical state analysis of surface atoms |
| 05/19/2009 | US7533561 Oscillator for atomic force microscope and other applications |
| 05/13/2009 | EP2058643A2 Noncontact Measurement Probe |
| 05/12/2009 | US7531726 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (SPM) reading |
| 05/07/2009 | WO2009012765A3 Measurement probe apparatus for a probe microscope, measurement cell and scanning probe microscope |
| 05/07/2009 | US20090119808 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 05/07/2009 | US20090114024 Scanning near field ultrasound holography |
| 05/06/2009 | CN101424611A Probe-fixing and example-oscillating non-micro rod scanning force microscope lens |
| 05/05/2009 | US7529158 Optical near-field generator and recording apparatus using the optical near-field generator |
| 05/05/2009 | US7526949 High resolution coherent dual-tip scanning probe microscope |
| 04/30/2009 | WO2009054417A1 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program |
| 04/30/2009 | WO2009053020A1 Method and apparatus for analysis of force traces |
| 04/30/2009 | WO2009036365A9 Method and apparatus of automatic scanning probe imaging |