Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
09/2012
09/26/2012CN102692524A Nano thermoelectric seebeck coefficient in-situ quantitative characterization device based on atomic force microscope
09/26/2012CN102692425A T/P91 steel ageing rating method based on precipitated phase fractional area
09/26/2012CN101473384B Method and apparatus for characterizing a probe tip
09/25/2012US8276210 Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses
09/19/2012CN102680743A Template fast approximation and in-situ detection device and method in micro-nano instruments and equipment
09/18/2012US8272068 Scanning probe microscope and sample observing method using the same
09/13/2012WO2012121308A1 Magnetic force microscope and high spatial resolution magnetic field measuring method
09/13/2012US20120230357 Gan laser element
09/12/2012CN102662088A Method for platelet morphology scan imagery and platelet activation function evaluation
09/12/2012CN102662087A Force tracing method for atomic force microscope (AFM)
09/12/2012CN102662086A Multiple-degree-of-freedom near-field optical microscope based on micro-nano motion arm
09/12/2012CN102662085A Sensor for noncontact profiling of a surface
09/11/2012US8266718 Modulated microwave microscopy and probes used therewith
09/04/2012CA2563843C Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope
08/2012
08/30/2012WO2012115653A1 Atomic force microscopy controller and method
08/30/2012WO2012114227A1 Biosensor and method of manufacturing such a biosensor
08/29/2012CN101300480B Scanning probe microscopy method and apparatus utilizing sample pitch
08/29/2012CN101061059B Nano tweezers and scanning probe microscope having the same
08/28/2012US8256018 Array and cantilever array leveling
08/23/2012US20120216322 Digital Q control for enhanced measurement capability in cantilever-based instruments
08/21/2012US8250668 Cantilever with paddle for operation in dual-frequency mode
08/21/2012US8248599 Methods of polarization engineering and their applications
08/21/2012US8246911 Apparatus for use in the detection preferential particles in sample
08/16/2012US20120207002 Magneto-optical device with an optically induced magnetization
08/16/2012DE102011004214A1 Vorrichtung und Verfahren zum Analysieren und Verändern einer Probenoberfläche Apparatus and method for analyzing and modifying a sample surface
08/14/2012US8245317 Atomic force microscope
08/14/2012US8245316 Scanning probe microscope with periodically phase-shifted AC excitation
08/09/2012WO2012076729A3 Method for staging cancer progression by afm
08/09/2012US20120204297 Scanning Probe Microscope and Method of Observing Sample Using the Same
08/09/2012DE19822286B4 Akustik-Mikroskop Acoustic microscope
08/07/2012US8239968 Athermal atomic force microscope probes
08/07/2012US8234913 Higher harmonics atomic force microscope
08/02/2012WO2012101595A1 Method for obtaining hollow nano-structures
08/02/2012US20120198591 Room temperature quantum field effect transistor comprising a 2-dimensional quantum wire array based on ideally conducting molecules
08/01/2012EP2480132A1 Optical probe system with increased scanning speed
08/01/2012CN102621353A Method for studying light induced electron transfer
08/01/2012CN102621352A Atomic force microscope probe and probe tip thereof and method for detecting capability of adhesion between helicobacter pylori and gastric mucus
08/01/2012CN102621351A Scanning near-field optical microscope
07/2012
07/31/2012CA2358215C Methods utilizing scanning probe microscope tips and products therefor or produced thereby
07/26/2012US20120192319 Fabrication of a microcantilever microwave probe
07/25/2012CN102183450B Characterization method of atomic force microscope for micro-pore structure of reservoir rock core
07/25/2012CN101915756B High-vacuum pinpoint enhanced Raman device
07/19/2012WO2012095376A1 Near-field optical probe manufacturing using organo-mineral material and sol-gel process
07/19/2012US20120182412 Inspection Instrument
07/18/2012EP2477038A1 Near-field optical probe manufacturing using organo-mineral material and sol-gel process
07/18/2012CN1624452B Scanning probe microscope and scanning method
07/18/2012CN102590560A Method for manufacturing optical fiber probe by using focused ion beam technology
07/18/2012CN102590559A Method for testing electric injection luminescence of nano structure quantum state
07/18/2012CN101960287B Fast-scanning spm and method of operating same
07/17/2012US8222905 Determination of field distribution
07/11/2012EP2473858A1 Method for measuring the force interaction that is caused by a sample
07/11/2012CN102565460A Continuous direct-writing nano particle solution scanning probe and manufacturing method thereof
07/10/2012US8220068 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
07/10/2012US8216746 Method of correcting defect in EUV mask
07/05/2012US20120172256 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection
07/04/2012CN202305565U 一种具有大范围和高深-宽比测量能力的扫描隧道显微镜 Having a large scope and profound - wider than the measurement capabilities of the scanning tunneling microscope
07/04/2012CN202305564U 一种拉曼原子力显微检测装置 An atomic force microscopy Raman detection device
07/04/2012CN102548471A Optical probe system with increased scanning speed
07/04/2012CN102539840A Magnetic force microscopy probe with low magnetic moment and high coercive force and manufacturing method thereof
07/04/2012CN102539839A Sample temperature changing device of atomic force microscope
07/04/2012CN101241087B Apparatus for observing a sample with a particle beam and an optical microscope
07/04/2012CN101136207B Metal layer having aperture, method of forming the same, light delivery module comprising metal layer having aperture and heat assisted magnetic recording head comprising the same
07/03/2012US8214918 Probes for enhanced magnetic force microscopy resolution
07/03/2012US8214915 Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
07/03/2012CA2462833C Protein and peptide nanoarrays
06/2012
06/28/2012WO2012084994A1 Atomic force microscope probe, method for preparing same, and uses thereof
06/27/2012CN102520213A Interface barrier measurement device and method
06/27/2012CN102520212A Device for thinning multi-layer material and method for thinning to-be-detected sample
06/27/2012CN102519885A Material surface local spectral measuring apparatus and measuring method
06/27/2012CN101435759B Automatic DNA molecule operating method based on atomic force microscope
06/26/2012US8205488 Fully digitally controller for cantilever-based instruments
06/26/2012US8205487 Probe microscope setup method
06/21/2012US20120159677 Near-field scanning optical microscope
06/21/2012DE102010019525B4 Nahfeldsensor zur lokalen Messung von dielektrischen Eigenschaften Near field for local measurement of dielectric properties
06/20/2012EP2465943A2 Linear polymer display
06/20/2012CN102507988A Intermittent-contact-mode measuring method of Kelvin probe force microscope
06/20/2012CN102507987A Integrated optical fiber probe type near-field optical tweezers and method for measuring near-field optical trapping force by AFM (Atomic Force Microscope)
06/20/2012CN102507986A Intermittent contact type measuring method for electrostatic force microscopy
06/19/2012US8205268 Cantilever with pivoting actuation
06/14/2012US20120151638 Method for measuring the force interaction that is caused by a sample
06/14/2012US20120147722 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
06/13/2012EP2463665A1 Cantilever excitation device and scanning probe microscope
06/13/2012EP1985991B1 Measuring probe, sample surface measuring apparatus and sample surface measuring method
06/13/2012EP1856701B1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip
06/13/2012EP1789853B1 A method of aligning a first article relative to a second article and an apparatus for aligning a first article relative to a second article.
06/13/2012CN102495238A Sixth harmonic imaging system based on tapping mode atomic force microscope
06/13/2012CN102495043A Device and method for measuring surface defect of semiconductor material
06/12/2012US8197701 Diamond film deposition and probes
06/07/2012WO2012072507A1 AFM-SECM sensor
06/06/2012CN102486478A Atomic force microscope imaging method capable of realizing dynamic adjustable height and aberration resolution
06/06/2012CN102053171B Micron-nano thermal detecting and sensing component
06/06/2012CN102053170B Micro/nano-scale thermal detection-based nonlinear amplifier
06/05/2012US8196218 System and methods for controlling properties of nanojunction devices
06/05/2012US8196217 Tip-enhanced resonant apertures
05/2012
05/31/2012WO2012069095A1 Monitoring changes in supra-cellular structures
05/31/2012WO2012021727A3 Image force microscopy of molecular resonance
05/31/2012US20120137396 Characterizing Dimensions of Structures Via Scanning Probe Microscopy
05/31/2012US20120137394 Atomic Force Microscope Manipulation of Living Cells
05/30/2012EP2458391A1 AFM-SECM sensor
05/30/2012CN202256386U Device for evaluating neuron-like differentiation degree of PC12 cells
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 ... 71