| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 01/17/2013 | WO2012165791A3 Scanning thermal microscope and method for temperature profiling using same |
| 01/17/2013 | WO2012154012A3 Graphene domain measurement system and method using afm friction mapping |
| 01/17/2013 | US20130019353 Thermal probe |
| 01/17/2013 | US20130019352 Thermal probe |
| 01/17/2013 | US20130019351 Production scale fabrication method for high resolution afm tips |
| 01/17/2013 | DE102011107649A1 Micromechanical sensor for, e.g. analyzing topographies in grid force microscopy, has unilateral bendable cantilever in which gate electrode of FET is inserted, and is spaced at free space from semiconductor substrate |
| 01/17/2013 | DE102011051808A1 Anschlussvorrichtung für einen einen Sensor umfassenden Sensorkopf Connection device for a comprehensive one sensor sensor head |
| 01/16/2013 | CN202676735U Probe cantilever vibration device of atomic force microscope |
| 01/10/2013 | WO2013006607A1 Method for positioning an atomic force microscopy tip in a cell |
| 01/10/2013 | WO2012149453A3 Scanning probe microscope with compact scanner |
| 01/09/2013 | CN102866266A Three-dimensional micro-drive four-electrode replaceable probe |
| 01/09/2013 | CN102866265A Scanning probe microscope body with coarse approximation motor capable of being separated from scanning structure |
| 01/09/2013 | CN102175727B Method for measuring low background carrier concentration by utilizing optical excitation differential capacitance method |
| 01/08/2013 | US8353061 Near-field scanning optical microscopy with nanoscale resolution from microscale probes |
| 01/08/2013 | US8353059 Optical scanning probe |
| 01/08/2013 | US8347696 Microchannel forming method and nanotipped dispensing device having a microchannel |
| 01/03/2013 | WO2013003864A1 Mechanical detection of raman resonance |
| 01/02/2013 | EP2539962A1 System for illuminating an object with a wave or for imaging an object with a wave |
| 01/02/2013 | EP2539720A1 Method for spatially manipulating a microscopic object and device for conducting said method |
| 01/02/2013 | CN102854297A Characterization method for atomic force microscope for testing quality of purified water |
| 01/01/2013 | US8347411 Scanning probe microscope and method for operating the same |
| 01/01/2013 | US8347410 Method for examining a sample |
| 01/01/2013 | US8342008 Scanning probe microscope |
| 12/27/2012 | WO2012176948A1 Fusion measurement apparatus |
| 12/27/2012 | WO2012149449A3 Cleaning station for atomic force microscope |
| 12/27/2012 | US20120331593 Production scale fabrication method for high resolution afm tips |
| 12/26/2012 | EP2537037A1 Measurement of the surface potential of a material |
| 12/26/2012 | CN202631568U Micro-monitoring type optional area atomic force microimaging device |
| 12/26/2012 | CN102844666A Method and apparatus of operating scanning probe microscope |
| 12/26/2012 | CN102841221A Method for determining myofibrillar fragmentation index (MFI) by microscopy |
| 12/26/2012 | CN102279289B Method for manufacturing micro cantilever probe based on monocrystalline silicon (110) |
| 12/25/2012 | US8341760 Scanning probe microscope |
| 12/20/2012 | WO2012173343A2 Nanopositioning substrate preparation apparatus and preparation method using dip pen nanolithography with single or multiple tips using atomic force microscope (afm) |
| 12/19/2012 | EP2535725A1 A probe for scanning probe microscopy |
| 12/19/2012 | CN102830260A Method for measuring carrier concentration in semiconductor quantum well |
| 12/19/2012 | CN102183679B In-situ quasi synchronous detection method for detecting physicochemical properties of micro and nano structures |
| 12/12/2012 | CN202599978U Three-scanner atomic power microscan detecting device |
| 12/12/2012 | CN202599977U Twin-tube scanner linkage tracking type atomic force microscopy (AFM) detection system |
| 12/12/2012 | CN102817006A Method for gold film modification of atomic force microscope probe by magnetron sputtering |
| 12/11/2012 | US8332961 Platinum silicide tip apices for probe-based technologies |
| 12/11/2012 | US8332960 Device for scanning a sample surface covered with a liquid |
| 12/11/2012 | US8332187 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program |
| 12/06/2012 | WO2012165791A2 Scanning thermal microscope and method for temperature profiling using same |
| 12/05/2012 | CN102809672A Combining system of super-resolution confocal optical microscope and scanning probe microscope |
| 12/04/2012 | US8327461 High-speed scanning probe microscope |
| 12/04/2012 | US8323518 Fabrication method and fabrication apparatus of head using near field light |
| 11/29/2012 | US20120304343 Automatic gain tuning in atomic force microscopy |
| 11/29/2012 | US20120304342 Measurement of the surface potential of a material |
| 11/28/2012 | CN102798736A Method for manipulating DNA (Deoxyribose Nucleic Acid) molecules by utilizing physical wear AFM (Atomic Force Microscope) probe and probe |
| 11/28/2012 | CN102798735A Pinpoint enhanced dark-field microscope, electrochemical testing device and leveling system |
| 11/27/2012 | US8321961 Production scale fabrication method for high resolution AFM tips |
| 11/27/2012 | US8321959 Cantilevers with integrated piezoelectric actuators for probe microscopy |
| 11/27/2012 | US8320228 Near-field optical head having tapered hole for guiding light beam |
| 11/27/2012 | US8316713 Scanning near field ultrasound holography |
| 11/22/2012 | WO2012155919A1 A microdevice for emitting electromagnetic radiation |
| 11/21/2012 | CN1706002B Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 11/15/2012 | WO2012154012A2 Graphene domain measurement system and method using afm friction mapping |
| 11/14/2012 | CN102778589A Cantilever for magnetic force microscope and method of manufacturing the same |
| 11/14/2012 | CN101881786B Scanning near-field optical microscopy system based on micro-hole laser |
| 11/14/2012 | CN101379383B Miniaturized spring element and method for producing the spring element |
| 11/13/2012 | US8308968 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 11/08/2012 | US20120284882 Prototyping Station for Atomic Force Microscope-Assisted Deposition of Nanostructures |
| 11/07/2012 | CN102768292A Ultrahigh vacuum fast scanning microscopy method based on carbon nanotube probe |
| 11/06/2012 | US8307461 Fabrication of a microcantilever microwave probe |
| 11/06/2012 | US8305710 Metal layer having aperture, method of forming the same, light delivery module including metal layer having aperture, and heat assisted magnetic recording head including the same |
| 11/01/2012 | WO2012149453A2 Scanning probe microscope with compact scanner |
| 11/01/2012 | WO2012149449A2 Cleaning station for atomic force microscope |
| 11/01/2012 | WO2012145883A1 Light collection device |
| 11/01/2012 | US20120278958 Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid |
| 11/01/2012 | US20120278957 Scanning probe microscope with compact scanner |
| 10/31/2012 | CN102759638A Method for testing metal layer by utilizing atomic force nanoprobe |
| 10/30/2012 | US8299227 Method of immobilizing and stretching a nucleic acid on a substrate |
| 10/24/2012 | CN102749480A Method for improving vibration amplitude of electrostatic force driven atomic force microscope probe cantilever |
| 10/24/2012 | CN101540209B Spm-probe with shortened spring rod |
| 10/23/2012 | US8296861 Polarization-modulated tip enhanced optical microscope |
| 10/23/2012 | US8296859 Prototyping station for atomic force microscope-assisted deposition of nanostructures |
| 10/23/2012 | US8296858 Flexibly displaceable coupling device for acoustically excited atomic force microscopy with acoustic excitation of the sample |
| 10/18/2012 | US20120266336 Fully Digitally Controller for Cantilever-Based Instruments |
| 10/17/2012 | CN102735880A Scanning probe measuring system and method for large-range micro-nano structure |
| 10/17/2012 | CN102735879A Low-noise, high-bandwidth tunnel current preamplifier circuit |
| 10/17/2012 | CN102735878A Super-resolution microscopic imaging method and system based on microcantilever and microsphere combined probe |
| 10/16/2012 | US8291510 Tandem piezoelectric actuator and single drive circuit for atomic force microscopy |
| 10/16/2012 | US8289819 Information reproducing apparatus and information reproducing method |
| 10/11/2012 | WO2012137491A1 Scanning probe microscope and measurement method using same |
| 10/11/2012 | US20120260374 Scanning thermal twisting atomic force microscopy |
| 10/10/2012 | EP2507642A2 Method and apparatus of operating a scanning probe microscope |
| 10/10/2012 | CN102721834A 摩擦力显微镜 Friction force microscope |
| 10/10/2012 | CN102721833A Atomic force microscope imaging method and device of microscopic monitoring type selectable region |
| 10/10/2012 | CN102721832A Preparation method and application of metal tungsten nano-probe |
| 10/10/2012 | CN102279287B Sub-pixel division coding microscopic imaging device |
| 10/10/2012 | CN101517393B Scanning ion conductance microscopy for the investigation of living cells |
| 10/09/2012 | US8286261 Scanning probe in pulsed-force mode, digital and in real time |
| 10/09/2012 | US8286260 Protein microscope |
| 10/09/2012 | US8284483 Method and device for acquiring signals in laser scanning microscopy |
| 10/04/2012 | WO2012076729A9 Method for staging cancer progression by afm |
| 10/03/2012 | CN1662662B Nucleic acid sequencing by signal stretching and data integration |
| 10/03/2012 | CN102707094A Method and device for detecting atomic force microscopic scanning of tri-scanner atomic |
| 10/03/2012 | CN102707093A Method and system for double-tube scanner linkage tracking type atomic force microscopic detection |
| 09/27/2012 | US20120244038 Scanning Tunneling Microscope Assembly, Reactor, and System |
| 09/27/2012 | DE102011006106A1 Near field lens i.e. meta-material lens, for use in optical assembly for focusing electromagnetic waves with frequencies in e.g. UV region, has cooling medium exhibiting refraction index that is reverse-variable on output value |