| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 06/04/2013 | US8458811 Micro/nano devices fabricated from Cu-Hf thin films |
| 05/30/2013 | US20130139285 Chemical sensor with oscillating cantilevered probe |
| 05/28/2013 | US8448502 Band excitation method applicable to scanning probe microscopy |
| 05/28/2013 | US8448501 Multiple frequency atomic force microscopy |
| 05/23/2013 | WO2013073186A1 Sealed-type afm cell |
| 05/22/2013 | CN103116040A On-site measuring device and scanning probe automatic centering method based on scanning tunneling effects |
| 05/21/2013 | US8448261 Mode synthesizing atomic force microscopy and mode-synthesizing sensing |
| 05/16/2013 | WO2013071244A1 Method and apparatus of tuning a scanning probe microscope |
| 05/15/2013 | CN103105511A Surface plasma longitudinal field scanning near-field optic microscope device and detection method |
| 05/14/2013 | US8443461 Interatomic force measurements using passively drift compensated non-contact in situ calibrated atomic force microscopy—quantifying chemical bond forces between electronic orbitals by direct force measurements at subatomic lateral resolution |
| 05/14/2013 | US8443459 Fast-scanning SPM scanner and method of operating same |
| 05/09/2013 | US20130114389 Near-field optical head and method for manufacturing same |
| 05/08/2013 | CN103091513A Observation device and observation method for strong magnetic material dynamic micro-magnetic structure |
| 05/08/2013 | CN103091512A Scan method of micron-level or submicron-level fiber sample |
| 05/08/2013 | CN102426269B Low-temperature scanning near field optical microscope |
| 05/08/2013 | CN101710135B Method for increasing AFM image contrast of single DNA molecules |
| 05/02/2013 | WO2013062275A1 Nano electrode and manufacturing method thereof |
| 05/02/2013 | US20130111637 Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source |
| 05/02/2013 | US20130111636 Non-linear interaction imaging and spectroscopy |
| 05/02/2013 | DE102012217192A1 Automatische Abstimmung eines Atomkraftmikroskops Automatic tuning of an atomic force microscope |
| 05/02/2013 | DE102009008251B4 Flexibel verschiebbare Kopplungseinrichtung für die akustisch angeregte Rasterkraftmikroskopie mit akustischer Anregung der Probe Flexible movable coupling means for acoustically excited atomic force microscopy with acoustic excitation of the sample |
| 04/30/2013 | US8434159 AFM measuring method and system thereof |
| 04/30/2013 | US8430991 Apparatus for producing near field optical head |
| 04/25/2013 | WO2013057426A1 Device for measuring an atomic force |
| 04/24/2013 | CN103069279A Low drift scanning probe microscope |
| 04/23/2013 | US8429761 Photon induced near field electron microscope and biological imaging system |
| 04/18/2013 | WO2013054715A1 Scanning probe microscope and control method therefor |
| 04/18/2013 | WO2013053968A1 Method for controlling a scanning microscope |
| 04/18/2013 | US20130097740 Scanning probe microscopy-based metrology tool with a vacuum partition |
| 04/18/2013 | US20130097739 Cantilever of Scanning Probe Microscope and Method for Manufacturing the Same, Method for Inspecting Thermal Assist Type Magnetic Head Device and its Apparatus |
| 04/18/2013 | DE102011084434A1 Method for measuring force gradient at e.g. scanning force microscopy, involves attaching spacer at end of magnetic material filled nanotube |
| 04/18/2013 | DE102010052037B4 Sensor und Verfahren zum berührungslosen Abtasten einer Oberfläche Sensor and method for the contactless scanning a surface |
| 04/17/2013 | CN102486478B Atomic force microscope imaging method capable of realizing dynamic adjustable height, aberration and resolution |
| 04/17/2013 | CN102043070B Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument |
| 04/17/2013 | CN101880024B Preparation method of novel probe based on gold-silver nano-wire optical waveguide |
| 04/17/2013 | CN101769941B Electronic detection method of device structure of GaN base photovoltaic detector |
| 04/16/2013 | US8424111 Near-field optical microscope, near-field optical probe, and sample observation method |
| 04/16/2013 | US8423294 High resolution linear analysis of polymers |
| 04/16/2013 | US8418538 High frequency deflection measurement of IR absorption |
| 04/11/2013 | WO2013051094A1 Scanning probe microscope |
| 04/10/2013 | EP2577325A1 Device for topographical characterisation and chemical mapping of surfaces |
| 04/10/2013 | CN102426270B Optical system for low-temperature scanning near-field optical microscope |
| 04/09/2013 | US8415613 Method and apparatus for characterizing a sample with two or more optical traps |
| 04/04/2013 | WO2013047538A1 Ac magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 04/04/2013 | WO2013047537A1 Dc magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 04/04/2013 | WO2013047049A1 Reader, playback device and recording and playback device |
| 04/04/2013 | WO2013047003A1 Near-field optical device, recording device and sample substrate |
| 04/04/2013 | WO2012173343A3 Nanopositioning substrate preparation apparatus and preparation method using dip pen nanolithography with single or multiple tips using atomic force microscope (afm) |
| 04/04/2013 | WO2012078415A3 Method and apparatus of using peak force tapping mode to measure physical properties of a sample |
| 04/03/2013 | CN202854171U Scanning electrochemical microscope electrolytic tank used for plate-shaped load sample corrosion research |
| 04/03/2013 | CN103018493A Device and method for preparing PVDF (polyvinylidene fluoride) microparticle probe by using melting-sintering method |
| 04/03/2013 | CN103018492A Device and method for preparing PVDF (polyvinylidene fluoride) micro-particle probe by physical adhesion method |
| 04/03/2013 | CN103018491A Micro-flex loading device and method of film material for atomic force microscope |
| 03/28/2013 | US20130081159 Advanced atomic force microscopy scanning for obtaining a true shape |
| 03/27/2013 | CN102998635A Method and its apparatus for inspecting a magnetic head device |
| 03/27/2013 | CN102998483A Atomic force microscope system with quartz tuning fork |
| 03/27/2013 | CN101839924B Atomic-force acoustic microscopy cantilever beam contact resonance frequency tracking system |
| 03/26/2013 | US8407811 Scanning probe microscope and method of observing sample using the same |
| 03/26/2013 | US8402819 High frequency deflection measurement of IR absorption |
| 03/21/2013 | WO2013038659A1 Potential-measuring device, and atomic force microscope |
| 03/20/2013 | EP2570815A1 Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source |
| 03/20/2013 | CN102981023A Method for measuring surface potential by using electrostatic force microscope |
| 03/20/2013 | CN102980844A Method for detecting washed surface of optical substrate used for laser thin film element |
| 03/20/2013 | CN102243253B Scanning probe microscope body with isolated imaging scanning and rough approximation |
| 03/19/2013 | US8397555 Scanning probe devices |
| 03/13/2013 | EP2567245A1 Apparatus for measuring the local electrical resistance of a surface |
| 03/13/2013 | EP2567244A1 Methods of surface measurement and modification by local-probe microscopy operating in continuous curvilinear mode, local-probe microscope and device enabling the implementation of said methods |
| 03/13/2013 | CN202794222U Super-resolution microscopic imaging system based on microcantilever and microsphere combined probe |
| 03/13/2013 | CN102495238B Sixth harmonic imaging system based on tapping mode atomic force microscope |
| 03/13/2013 | CN102279288B Device and method for measuring sample interface potential barrier by atomic force microscope |
| 03/06/2013 | EP2564219A1 Photoconducting measuring tip, measurement arrangement, and method for producing and/or detecting electromagnetic field signals |
| 03/06/2013 | CN102955047A Biomolecule affinity constant determination method based on DNA (Deoxyribonucleic Acid) origami |
| 03/06/2013 | CN102347318B All-piezoelectric abreast pushing three-friction-force stepper and scanning probe microscope body |
| 03/05/2013 | US8393010 Near-field scanning optical microscope |
| 03/05/2013 | US8393009 Sensor for noncontact profiling of a surface |
| 02/28/2013 | DE102012001685A1 Tip for generating high, strong localized electromagnetic field strength, used in scanning near-field optical microscope, has Bragg reflectors that are arranged at predetermined distance from apex portion and shaft |
| 02/26/2013 | US8387161 Scanning probe microscope |
| 02/26/2013 | US8387160 Scanning probe-based lithography method |
| 02/21/2013 | US20130047302 Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods |
| 02/20/2013 | EP2558871A1 Scanning electrochemical microscopy |
| 02/20/2013 | CN102937657A Real-time correction method and system for high-speed atomic force microscopic imaging |
| 02/14/2013 | DE102012214181A1 Rastersondenmikroskop-Hebelarm mit einem elektromagnetischen Sensor Scanning probe microscope arm with an electromagnetic sensor |
| 02/13/2013 | CN102928625A Scanning electrochemical microscope electrolytic cell for plate-shaped load sample corrosion research and application thereof |
| 02/13/2013 | CN102928624A Radio-frequency single-electron transistor scanning probe and application thereof |
| 02/12/2013 | US8371184 Flow velocity and pressure measurement using a vibrating cantilever device |
| 02/07/2013 | WO2013018813A1 Pump-probe measurement device |
| 02/07/2013 | US20130032495 Scanning electrochemical microscopy |
| 02/06/2013 | CN101718802B Method for fixing mineral leaching rod-shaped bacteria for AFM analysis under strong acid condition |
| 02/05/2013 | US8370960 Modular atomic force microscope |
| 02/05/2013 | US8367426 Chemical sensor with oscillating cantilevered probe |
| 01/29/2013 | US8365311 Quantitative analysis of MRNA and protein expression |
| 01/24/2013 | WO2013011879A1 Analytical device and analytical system |
| 01/24/2013 | WO2013010857A1 Apparatus for tactile form determination |
| 01/24/2013 | DE10313046B4 Temperaturmesssonde und Temperaturmessvorrichtung Temperature probe and temperature measuring device |
| 01/24/2013 | DE102011079382A1 Verfahren und Vorrichtung zum Analysieren und zum Beseitigen eines Defekts einer EUV Maske Method and apparatus for analyzing and eliminating a defect of an EUV mask |
| 01/23/2013 | EP2548033A2 Low drift scanning probe microscope |
| 01/23/2013 | CN102893165A Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source |
| 01/23/2013 | CN101861513B Method for examining a sample using a scanning tunneling microscope |
| 01/22/2013 | US8359661 Magnetic device inspection apparatus and magnetic device inspection method |
| 01/17/2013 | WO2013007750A1 Connection apparatus for a sensor head comprising a sensor |