Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
---|
10/24/2013 | US20130283487 Image force microscopy of molecular resonance |
10/23/2013 | CN103364595A Method for representing phase separation degree of polymer solar cell photosensitive layers |
10/17/2013 | WO2013154524A1 Inelastic electron tunneling air monitor |
10/17/2013 | WO2013153294A1 Optical measurement method and device |
10/17/2013 | US20130276176 Atomic force microscope probe, method for preparing same, and uses thereof |
10/17/2013 | US20130276175 Magnetic Actuation and Thermal Cantilevers for Temperature and Frequency Dependent Atomic Force Microscopy |
10/15/2013 | US8555711 Material property measurements using multiple frequency atomic fore microscopy |
10/09/2013 | EP2646838A2 Method and apparatus of using peak force tapping mode to measure physical properties of a sample |
10/09/2013 | EP1520292B1 Software synchronization of multiple scanning probes |
10/09/2013 | CN103344790A Nano thermoelectrical Seebeck coefficient in-situ characterization device based on scanning thermal microscope |
10/09/2013 | CN102590559B Method for testing electric injection luminescence of nano structure quantum state |
10/03/2013 | US20130263332 Inspection apparatus and method for a magnetic head |
10/02/2013 | EP2643658A1 Mechanical testing instruments including onboard data |
10/02/2013 | CN103336151A Magnetic microscope and measurement method thereof |
10/02/2013 | CN103336150A A method for improving the conductivity of an atomic force nanometer probe |
10/02/2013 | CN103336149A Atomic force microscopy micro cantilever and application based on nanometer particle lattice quantum transportation |
10/02/2013 | CN103336147A High-frequency vibration clamp device for scanning ion conductance microscope |
10/02/2013 | CN101819218B Light collection device for scanning tunnel microscope |
10/01/2013 | US8549661 Apparatus for performing magnetic resonance force microscopy on large area samples |
10/01/2013 | US8548019 GaN laser element |
09/25/2013 | CN103328984A Method and apparatus of using peak force tapping mode to measure physical properties of a sample |
09/25/2013 | CN103323626A Single molecule chain length method for measuring polysaccharide relative molecular mass |
09/25/2013 | CN102520213B Interface barrier measurement device and method |
09/19/2013 | WO2013134853A1 Methods and systems for optimizing frequency modulation atomic force microscopy |
09/18/2013 | CN103308726A Scanning electrochemical microscope experimental device for tests in various environments |
09/18/2013 | CN102445568B Ultrahigh vacuum four-probe scanning tunneling microscope for multi-probe common imaging |
09/18/2013 | CN102360028B Vacuum chamber of low-temperature scanning nearfield optical microscope |
09/18/2013 | CN102072972B Coupling permeation efficiency optimization system of near field scanning optical microscope (NSOM) |
09/17/2013 | US8539611 Scanned probe microscopy (SPM) probe having angled tip |
09/17/2013 | US8536862 Apparatus and method of obtaining field by measurement |
09/11/2013 | CN103299197A Image force microscopy of molecular resonance |
09/11/2013 | CN103293341A Atomic force microscope probe |
09/10/2013 | US8533861 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy |
09/05/2013 | US20130232648 In-liquid potential measurement device and atomic force microscope |
09/04/2013 | CN103278662A Nano-nickel rod array atomic force microscope tip characterization sample and manufacturing method thereof |
09/03/2013 | US8524488 Methods and devices for determining a cell characteristic, and applications employing the same |
08/29/2013 | US20130227749 Atomic force microscope probe |
08/28/2013 | CN203164205U Surface plasma longitudinal field scanning near-field optic microscope device |
08/28/2013 | CN103267876A Method for preparing working electrode of scanning electrochemical microscope |
08/28/2013 | CN103267875A Method for building ion channel on liquid/liquid interfaces and method for detecting effect of size of ion channel on ion transferring |
08/22/2013 | WO2013120153A1 Sensor device for scanning probe microscopy |
08/22/2013 | DE10110933B4 Mikrosonde und Abtastsondenvorrichtung mit der Mikrosonde Microprobe and Abtastsondenvorrichtung with the microprobe |
08/20/2013 | US8516611 Atomic force microscope probe |
08/20/2013 | US8513625 Track-based metrology method and apparatus |
08/15/2013 | US20130212751 Generation of a frequency comb and applications thereof |
08/14/2013 | CN103245801A Tunnel-scanning nano-level precision gauge |
08/08/2013 | WO2013116553A1 Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy |
08/08/2013 | US20130205455 System and method of performing atomic force measurements |
08/08/2013 | US20130205454 Scanning probe microscope |
08/07/2013 | CN103235158A Electrochemical atomic force microscope probe carriage-electrolytic cell device |
08/07/2013 | CN102012439B Method for preparing silicon-based self-sharpening AFM (antifrictional metal) probe |
08/06/2013 | US8505110 Apparatus and process for controlled nanomanufacturing using catalyst retaining structures |
08/06/2013 | US8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope |
08/06/2013 | US8503075 High-efficiency device for focusing light to subwavelength dimensions |
08/06/2013 | US8499621 Scanning probe microscopy inspection and modification system |
08/01/2013 | US20130198914 Apparatus for performing magnetic resonance force microscopy on large area samples |
08/01/2013 | US20130198913 Apparatus for mechanically robust thermal isolation of components |
07/31/2013 | CN102353817B Probe of conducting atomic force microscope and measuring methods employing probe |
07/30/2013 | US8499361 Prototyping station for atomic force microscope-assisted deposition of nanostructures |
07/25/2013 | WO2013108060A1 Near-field scanning optical microscope |
07/24/2013 | EP2617074A1 Electro-active microelectromechanical device and corresponding detection process |
07/24/2013 | CN103217555A Method for measuring inter-monomolecular acting force |
07/24/2013 | CN101952707B Tip type probe manufacturing method, tip type probe, and tip type probe manufacturing apparatus |
07/23/2013 | US8495760 Atomic force microscope manipulation of living cells |
07/17/2013 | CN103207287A Method for detecting irradiation internal damage of nuclear fusion material |
07/17/2013 | CN102565460B Continuous direct-writing nano particle solution scanning probe and manufacturing method thereof |
07/16/2013 | US8490211 Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging |
07/16/2013 | US8490210 Contact type plasmonic nano optical probe, parallel probe constituted of the same, plasmonic optical apparatus including the parallel probe, and a method of fabricating the parallel probe |
07/16/2013 | US8490209 Surface state measuring device, and surface state measuring method using the device |
07/11/2013 | WO2013102561A1 Method for measuring the near-field signal |
07/10/2013 | EP2613160A1 Magnetic field observation device and magnetic field observation method |
07/10/2013 | EP2613159A1 Method for measuring the near-field signal |
07/10/2013 | CN103197102A Single-cell/single-molecule imaging light/electricity comprehensive tester based on multifunctional probe |
07/10/2013 | CN102519885B Material surface local spectral measuring apparatus and measuring method |
07/09/2013 | US8484761 Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof |
07/09/2013 | US8484759 Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy |
07/09/2013 | US8484758 Apparatus and method for the functionalisation of AFM tips |
07/09/2013 | US8484757 Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope |
07/09/2013 | US8484756 Tip-mounted nanowire light source instrumentation |
07/04/2013 | US20130174302 Magnetic field observation device and magnetic field observation method |
07/04/2013 | US20130174301 Method and apparatus for in situ preparation of serial planar surfaces for microscopy |
07/04/2013 | US20130172216 Arrays and Methods of Use |
07/03/2013 | CN103185812A Physical property measurement system and method for material based on probe force curve |
07/02/2013 | US8479311 Device and method for an atomic force microscope for the study and modification of surface properties |
06/27/2013 | DE102010026703B4 Vorrichtung zum Scannen von verschiedenartigen Oberflächen und Verwendung der Vorrichtung Apparatus for scanning different types of surfaces and use of the apparatus |
06/26/2013 | CN203025209U Device for preparing pure-tungsten probe of tunnel scanning microscope |
06/25/2013 | US8474061 Production scale fabrication method for high resolution AFM tips |
06/19/2013 | EP2603801A1 Pipets containing electrolyte and electrodes |
06/19/2013 | EP2603800A2 Image force microscopy of molecular resonance |
06/19/2013 | CN101322030B Biomolecule interaction using atomic force microscope |
06/18/2013 | US8468611 Thermochemical nanolithography components, systems, and methods |
06/13/2013 | WO2013085888A1 Magnetic storage device |
06/12/2013 | CN103149805A Super-diffraction nano-optical probe |
06/11/2013 | US8459102 Digital Q control for enhanced measurement capability in cantilever-based instruments |
06/06/2013 | WO2013080928A1 Photo scan device and scanning microscope device |
06/06/2013 | US20130145507 Scanning probe microscope and sample observing method using the same |
06/06/2013 | US20130145506 Systems And Methods For Performing Microscopy At Hyperbaric Pressures |
06/06/2013 | US20130145505 Near field optical microscope with optical imaging system |
06/06/2013 | DE102012024203A1 Method for determining sequence of biopolymers e.g. single stranded DNA, involves comparing signals of polymer strand with experimental determined signals until unique sequence with least significant average deviation is determined |
06/05/2013 | CN102062787B Selective mode self-excitation method and device of MEM (Micro-Electrical Mechanical) sensor |