Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
10/2013
10/24/2013US20130283487 Image force microscopy of molecular resonance
10/23/2013CN103364595A Method for representing phase separation degree of polymer solar cell photosensitive layers
10/17/2013WO2013154524A1 Inelastic electron tunneling air monitor
10/17/2013WO2013153294A1 Optical measurement method and device
10/17/2013US20130276176 Atomic force microscope probe, method for preparing same, and uses thereof
10/17/2013US20130276175 Magnetic Actuation and Thermal Cantilevers for Temperature and Frequency Dependent Atomic Force Microscopy
10/15/2013US8555711 Material property measurements using multiple frequency atomic fore microscopy
10/09/2013EP2646838A2 Method and apparatus of using peak force tapping mode to measure physical properties of a sample
10/09/2013EP1520292B1 Software synchronization of multiple scanning probes
10/09/2013CN103344790A Nano thermoelectrical Seebeck coefficient in-situ characterization device based on scanning thermal microscope
10/09/2013CN102590559B Method for testing electric injection luminescence of nano structure quantum state
10/03/2013US20130263332 Inspection apparatus and method for a magnetic head
10/02/2013EP2643658A1 Mechanical testing instruments including onboard data
10/02/2013CN103336151A Magnetic microscope and measurement method thereof
10/02/2013CN103336150A A method for improving the conductivity of an atomic force nanometer probe
10/02/2013CN103336149A Atomic force microscopy micro cantilever and application based on nanometer particle lattice quantum transportation
10/02/2013CN103336147A High-frequency vibration clamp device for scanning ion conductance microscope
10/02/2013CN101819218B Light collection device for scanning tunnel microscope
10/01/2013US8549661 Apparatus for performing magnetic resonance force microscopy on large area samples
10/01/2013US8548019 GaN laser element
09/2013
09/25/2013CN103328984A Method and apparatus of using peak force tapping mode to measure physical properties of a sample
09/25/2013CN103323626A Single molecule chain length method for measuring polysaccharide relative molecular mass
09/25/2013CN102520213B Interface barrier measurement device and method
09/19/2013WO2013134853A1 Methods and systems for optimizing frequency modulation atomic force microscopy
09/18/2013CN103308726A Scanning electrochemical microscope experimental device for tests in various environments
09/18/2013CN102445568B Ultrahigh vacuum four-probe scanning tunneling microscope for multi-probe common imaging
09/18/2013CN102360028B Vacuum chamber of low-temperature scanning nearfield optical microscope
09/18/2013CN102072972B Coupling permeation efficiency optimization system of near field scanning optical microscope (NSOM)
09/17/2013US8539611 Scanned probe microscopy (SPM) probe having angled tip
09/17/2013US8536862 Apparatus and method of obtaining field by measurement
09/11/2013CN103299197A Image force microscopy of molecular resonance
09/11/2013CN103293341A Atomic force microscope probe
09/10/2013US8533861 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
09/05/2013US20130232648 In-liquid potential measurement device and atomic force microscope
09/04/2013CN103278662A Nano-nickel rod array atomic force microscope tip characterization sample and manufacturing method thereof
09/03/2013US8524488 Methods and devices for determining a cell characteristic, and applications employing the same
08/2013
08/29/2013US20130227749 Atomic force microscope probe
08/28/2013CN203164205U Surface plasma longitudinal field scanning near-field optic microscope device
08/28/2013CN103267876A Method for preparing working electrode of scanning electrochemical microscope
08/28/2013CN103267875A Method for building ion channel on liquid/liquid interfaces and method for detecting effect of size of ion channel on ion transferring
08/22/2013WO2013120153A1 Sensor device for scanning probe microscopy
08/22/2013DE10110933B4 Mikrosonde und Abtastsondenvorrichtung mit der Mikrosonde Microprobe and Abtastsondenvorrichtung with the microprobe
08/20/2013US8516611 Atomic force microscope probe
08/20/2013US8513625 Track-based metrology method and apparatus
08/15/2013US20130212751 Generation of a frequency comb and applications thereof
08/14/2013CN103245801A Tunnel-scanning nano-level precision gauge
08/08/2013WO2013116553A1 Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy
08/08/2013US20130205455 System and method of performing atomic force measurements
08/08/2013US20130205454 Scanning probe microscope
08/07/2013CN103235158A Electrochemical atomic force microscope probe carriage-electrolytic cell device
08/07/2013CN102012439B Method for preparing silicon-based self-sharpening AFM (antifrictional metal) probe
08/06/2013US8505110 Apparatus and process for controlled nanomanufacturing using catalyst retaining structures
08/06/2013US8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
08/06/2013US8503075 High-efficiency device for focusing light to subwavelength dimensions
08/06/2013US8499621 Scanning probe microscopy inspection and modification system
08/01/2013US20130198914 Apparatus for performing magnetic resonance force microscopy on large area samples
08/01/2013US20130198913 Apparatus for mechanically robust thermal isolation of components
07/2013
07/31/2013CN102353817B Probe of conducting atomic force microscope and measuring methods employing probe
07/30/2013US8499361 Prototyping station for atomic force microscope-assisted deposition of nanostructures
07/25/2013WO2013108060A1 Near-field scanning optical microscope
07/24/2013EP2617074A1 Electro-active microelectromechanical device and corresponding detection process
07/24/2013CN103217555A Method for measuring inter-monomolecular acting force
07/24/2013CN101952707B Tip type probe manufacturing method, tip type probe, and tip type probe manufacturing apparatus
07/23/2013US8495760 Atomic force microscope manipulation of living cells
07/17/2013CN103207287A Method for detecting irradiation internal damage of nuclear fusion material
07/17/2013CN102565460B Continuous direct-writing nano particle solution scanning probe and manufacturing method thereof
07/16/2013US8490211 Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging
07/16/2013US8490210 Contact type plasmonic nano optical probe, parallel probe constituted of the same, plasmonic optical apparatus including the parallel probe, and a method of fabricating the parallel probe
07/16/2013US8490209 Surface state measuring device, and surface state measuring method using the device
07/11/2013WO2013102561A1 Method for measuring the near-field signal
07/10/2013EP2613160A1 Magnetic field observation device and magnetic field observation method
07/10/2013EP2613159A1 Method for measuring the near-field signal
07/10/2013CN103197102A Single-cell/single-molecule imaging light/electricity comprehensive tester based on multifunctional probe
07/10/2013CN102519885B Material surface local spectral measuring apparatus and measuring method
07/09/2013US8484761 Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof
07/09/2013US8484759 Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy
07/09/2013US8484758 Apparatus and method for the functionalisation of AFM tips
07/09/2013US8484757 Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope
07/09/2013US8484756 Tip-mounted nanowire light source instrumentation
07/04/2013US20130174302 Magnetic field observation device and magnetic field observation method
07/04/2013US20130174301 Method and apparatus for in situ preparation of serial planar surfaces for microscopy
07/04/2013US20130172216 Arrays and Methods of Use
07/03/2013CN103185812A Physical property measurement system and method for material based on probe force curve
07/02/2013US8479311 Device and method for an atomic force microscope for the study and modification of surface properties
06/2013
06/27/2013DE102010026703B4 Vorrichtung zum Scannen von verschiedenartigen Oberflächen und Verwendung der Vorrichtung Apparatus for scanning different types of surfaces and use of the apparatus
06/26/2013CN203025209U Device for preparing pure-tungsten probe of tunnel scanning microscope
06/25/2013US8474061 Production scale fabrication method for high resolution AFM tips
06/19/2013EP2603801A1 Pipets containing electrolyte and electrodes
06/19/2013EP2603800A2 Image force microscopy of molecular resonance
06/19/2013CN101322030B Biomolecule interaction using atomic force microscope
06/18/2013US8468611 Thermochemical nanolithography components, systems, and methods
06/13/2013WO2013085888A1 Magnetic storage device
06/12/2013CN103149805A Super-diffraction nano-optical probe
06/11/2013US8459102 Digital Q control for enhanced measurement capability in cantilever-based instruments
06/06/2013WO2013080928A1 Photo scan device and scanning microscope device
06/06/2013US20130145507 Scanning probe microscope and sample observing method using the same
06/06/2013US20130145506 Systems And Methods For Performing Microscopy At Hyperbaric Pressures
06/06/2013US20130145505 Near field optical microscope with optical imaging system
06/06/2013DE102012024203A1 Method for determining sequence of biopolymers e.g. single stranded DNA, involves comparing signals of polymer strand with experimental determined signals until unique sequence with least significant average deviation is determined
06/05/2013CN102062787B Selective mode self-excitation method and device of MEM (Micro-Electrical Mechanical) sensor
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