| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 03/19/2014 | CN103645348A Micro-nano scale coupling vibration high-resolution measurement method |
| 03/19/2014 | CN103645347A Micro-nano scale dynamic coupling vibration single-point tracking measurement method |
| 03/12/2014 | CN203479833U Modification device for pure metal probe of scanning tunnel microscope |
| 03/12/2014 | CN103630708A Method for distinguishing Si surface from C surface of SiC (silicon carbide) wafer |
| 03/12/2014 | CN102435785B Tilting AFM probe with huge aspect ratio and preparation method thereof |
| 03/12/2014 | CN101788571B Nanomanipulation method for compounding laser near-field optical tweezers and AFM probe |
| 03/06/2014 | WO2014034489A1 Discharge member for analysis |
| 03/06/2014 | WO2014033844A1 Scanning probe microscope and measuring method using same |
| 03/06/2014 | US20140068822 Method for Determining Local Resistivity and Carrier Concentration Using Scanning Spreading Resistance Measurement Set-Up |
| 02/27/2014 | DE102012107719A1 Standard auf DNA-Origami-Basis Standard on DNA origami base |
| 02/27/2014 | DE102012107718A1 Calibration sample for calibration of three-dimensional resolution of measurement device, e.g. fluorescence microscope for super-resolution fluorescence microscopy, comprises structures based on DNA origami, which have two marker molecules |
| 02/26/2014 | CN101855534B Method and apparatus of automatic scanning probe imaging |
| 02/25/2014 | US8661560 Microcantilever microwave probe |
| 02/20/2014 | WO2014027928A1 Nanoscopy method |
| 02/19/2014 | CN103592468A Ferromagnetic resonance magnet exchange force microscope test system |
| 02/18/2014 | US8656511 Method for attaching a particle to a scanning probe tip through eutectic bonding |
| 02/18/2014 | US8654340 Heterodyne detection device for imaging an object by re-injection |
| 02/13/2014 | WO2014023382A1 Method for optical near-field scanning by means of transmission probes |
| 02/12/2014 | CN103575934A AFM probe for single molecular force spectrum analysis and substrate functional modification method |
| 02/11/2014 | US8650661 Method and apparatus for characterizing a probe tip |
| 02/06/2014 | US20140041085 Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements |
| 02/06/2014 | US20140041084 Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy |
| 02/05/2014 | CN103562732A Scanning probe microscope with compact scanner |
| 02/05/2014 | CN103558419A Scanning near-field optical detecting table |
| 02/04/2014 | US8646110 Method to obtain absorption spectra from near-field infrared scattering using homodyne detection |
| 01/22/2014 | CN103529245A Atomic force microscope under-water needle tip bracket applicable to acid/alkali environment |
| 01/22/2014 | CN103529244A Method based on atomic force microscope for researching microscopic characteristics of asphalt |
| 01/21/2014 | US8635710 Scanning probe microscope and method of observing sample using the same |
| 01/16/2014 | US20140020141 Mode-synthesizing atomic force microscopy and mode-synthesizing sensing |
| 01/16/2014 | US20140020140 Multi-head probe and manufacturing and scanning methods thereof |
| 01/16/2014 | US20140014507 Hybrid microprobe for electrochemical and sers monitoring, scanning and feedback stimulation and the preparation method thereof |
| 01/16/2014 | DE102013107220A1 Vorrichtung und ein Verfahren zum Untersuchen einer Probe mittels mehrerer Untersuchungsmethoden An apparatus and a method for assaying a sample by means of several testing methods |
| 01/15/2014 | CN103513063A Microcosmic area charge injecting and quantitative analysis method in nanometer silicon floating gate structure |
| 01/15/2014 | CN103510148A Technique and device for preparing STM (Scanning Tunneling Microscope) probe with chemical corrosion and drawing method |
| 01/14/2014 | US8631510 Magnetic sensor and scanning microscope |
| 01/09/2014 | WO2014008456A1 Apparatus and method for atomic force microscopy |
| 01/09/2014 | WO2014006999A1 Scanning probe microscope |
| 01/09/2014 | WO2014006734A1 Force probe microscope and height distribution measurement method |
| 01/09/2014 | US20140010252 GaN-BASED LASER DEVICE |
| 01/08/2014 | CN102662087B Force tracing method for atomic force microscope (AFM) |
| 01/03/2014 | WO2014003901A1 Metallic nano-tip apparatus, methods, and applications |
| 01/03/2014 | WO2014003843A1 Method of forming individual metallic microstructures |
| 01/03/2014 | WO2014003547A1 High throughput scanning probe microscopy device |
| 01/02/2014 | US20140007309 Method for staging cancer progression by afm |
| 01/02/2014 | US20140007308 Scanned Probe Microscopy (SPM) Probe Having Angled Tip |
| 01/01/2014 | EP2680012A1 High throughput scanning probe microscopy device |
| 01/01/2014 | EP2678672A1 Biosensor and method of manufacturing such a biosensor |
| 01/01/2014 | CN103487603A Method for removing surface oxidation layer on point of atomic power nanoprobe |
| 01/01/2014 | CN103487453A Measuring method for dislocation density of heteroepitaxially grown gallium nitride |
| 12/31/2013 | US8621659 Cantilever for magnetic force microscope and method of manufacturing the same |
| 12/31/2013 | US8621658 Magnetic field observation device and magnetic field observation method |
| 12/27/2013 | WO2013192617A1 Method and apparatus of electrical property measurement using an afm operating in peak force tapping mode |
| 12/27/2013 | WO2013189112A1 Nano-thermoelectric multi-parameter in-situ quantitative characterization device based on atomic force microscope |
| 12/27/2013 | WO2013189111A1 Nano-thermoelectric seebeck coefficient in-situ quantitative characterization device based on atomic force microscope |
| 12/26/2013 | US20130347147 Method and Apparatus for Nanomechanical Measurement Using an Atomic Force Microscope |
| 12/25/2013 | CN103477231A Graphene domain measurement system and method using AFM friction mapping |
| 12/25/2013 | CN103472266A Atomic force microscope dynamic imaging method based on step response curve of piezoelectric scanning tube |
| 12/24/2013 | DE102009046267B4 Verfahren zur Messung magnetischer Informationen, insbesondere der magnetischen AC-Suszeptibilität, von magnetischen Nanopartikeln (Markern) Method for measuring magnetic information, especially the magnetic ac susceptibility of magnetic nanoparticles (markers) |
| 12/19/2013 | US20130340127 High spatial resolution non-contact temperature measurement |
| 12/19/2013 | US20130340126 Multiple Frequency Atomic Force Microscopy |
| 12/19/2013 | US20130340125 Band excitation method applicable to scanning probe microscopy |
| 12/19/2013 | DE112011104969T5 Rasterkraftmikroskopie-Steuerung und -Verfahren Atomic force microscopy control and procedures |
| 12/18/2013 | EP2673901A2 Nanomechanical testing system |
| 12/18/2013 | CN103460039A Method for staging cancer progression by AFM |
| 12/17/2013 | US8607622 High frequency deflection measurement of IR absorption |
| 12/12/2013 | US20130333076 Atomic force microscopy controller and method |
| 12/11/2013 | CN103443632A Magnetic force microscope and high spatial resolution magnetic field measuring method |
| 12/05/2013 | US20130319090 Testing of surface crystalline content in bulk amorphous alloy |
| 12/04/2013 | EP2668132A1 Method for obtaining hollow nano-structures |
| 12/04/2013 | CN203324302U Teaching-type atomic force microscope |
| 12/04/2013 | CN103424572A Manufacturing method for atomic power sensor, sensor, and atomic power sensor measuring apparatus and method thereof |
| 12/04/2013 | CN102707093B Method and system for double-tube scanner linkage tracking type atomic force microscopic detection |
| 12/03/2013 | US8601609 Friction force microscope |
| 12/03/2013 | US8601608 Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
| 12/03/2013 | US8601607 Generation of a frequency comb and applications thereof |
| 11/28/2013 | DE102012015923B3 Verfahren zur optischen Nahfeld-Messung mit Transmissionssonden A method for optical near-field measurement with transmission probes |
| 11/27/2013 | CN203310859U In-situ measurement device based on scanning tunneling effect |
| 11/27/2013 | CN103412150A Double-probe atomic power microscope and method for realizing nanometer structure operation by adopting microscope |
| 11/27/2013 | CN102735880B Scanning probe measuring system and method for large-range micro-nano structure |
| 11/26/2013 | US8595861 Thermal probe |
| 11/26/2013 | US8595860 Method of fabricating a probe device for a metrology instrument and a probe device produced thereby |
| 11/21/2013 | US20130312143 Scanning ion conductance microscopy using surface roughness for probe movement |
| 11/21/2013 | US20130305513 Silicon Optical Bench OCT Probe for Medical Imaging |
| 11/13/2013 | CN103389392A Preparation method for nano-probe capable of measuring AFM mechanical parameter |
| 11/13/2013 | CN103389391A Method for preparing different polymer film probes by bonding coating method |
| 11/13/2013 | CN103389390A Method for determining electric charge trapping center in semiconductor materials |
| 11/12/2013 | US8584261 Method of determining a spring constant of a cantilever and scanning probe microscope using the method |
| 11/07/2013 | WO2013164621A1 Scanning electrochemical microscopy |
| 11/07/2013 | US20130298295 Near-field optical probe manufacturing using organo-mineral material and sol-gel process |
| 11/06/2013 | CN103383335A Method for determination of effects of ectomycorrhizal fungi on surface characteristics and composition of soil colloid |
| 11/06/2013 | CN102590560B Method for manufacturing optical fiber probe by using focused ion beam technology |
| 11/06/2013 | CN101802588B Probe device for a metrology instrument and method of fabricating the same |
| 11/05/2013 | US8578511 Thermal probe |
| 11/05/2013 | US8574892 Methods and apparatus for nucleic acid sequencing by signal stretching and data integration |
| 10/30/2013 | EP2656085A1 Atomic force microscope probe, method for preparing same, and uses thereof |
| 10/30/2013 | CN103376339A Graphene crystal orientation rapid detection method based on atomic power microscopy |
| 10/30/2013 | CN102520212B Device for thinning multi-layer material and method for thinning to-be-detected sample |
| 10/30/2013 | CN102495043B Device and method for measuring surface defect of semiconductor material |
| 10/29/2013 | US8568598 Tip type probe manufacturing method, tip type probe and tip type probe manufacturing apparatus |
| 10/24/2013 | WO2013157419A1 Compound microscope |