| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 07/23/2014 | EP2757380A1 Potential-measuring device, and atomic force microscope |
| 07/23/2014 | CN203732563U 一种倒置管腐蚀法制备大锥角光纤探针的装置 One kind of inverted tube corrosion Preparation large cone angle fiber probe device |
| 07/23/2014 | CN103941044A 原子力显微镜跨尺度高精度进样机构 Cross-scale high-precision atomic force microscope injection mechanism |
| 07/22/2014 | US8789211 Mode-synthesizing atomic force microscopy and mode-synthesizing sensing |
| 07/22/2014 | US8787128 Near-field optical head having tapered hole for guiding light beam |
| 07/17/2014 | WO2014108135A1 An optically guided microdevice comprising a nanowire |
| 07/17/2014 | DE112011105207T5 Biomolekülinformationen-Analysevorrichtung Biomolekülinformationen analyzer |
| 07/15/2014 | CA2670948C Pump probe measuring device and scanning probe microscope apparatus using the device |
| 07/09/2014 | CN103913601A 一种水凝胶微孔阵列形貌表征的方法 An aqueous gel microwell array morphology characterization methods |
| 07/03/2014 | WO2014104172A1 Dynamic analysis method for polymer chain, manufacturing method for polymer, polymer, manufacturing method for synthetic polymer, and synthetic pollymer |
| 07/03/2014 | US20140184776 Micro or nano scope |
| 07/02/2014 | CN103901234A 多铁性材料纳米尺度畴结构的原位集成表征装置 Multiferroic material in situ nanoscale domain structure of the integrated device characterization |
| 07/02/2014 | CN103901233A 具有保偏特性的光纤探针及其制备方法 With a polarization maintaining fiber probe characteristics and its preparation method |
| 07/02/2014 | CN103901232A 一种利用闭循环制冷机致冷的低温扫描隧道显微镜 A use of closed cycle cryogenic refrigeration refrigerator scanning tunneling microscope |
| 07/01/2014 | US8769711 Method for examining a measurement object, and apparatus |
| 07/01/2014 | US8769710 Atomic force microscope system using selective active damping |
| 07/01/2014 | US8766630 Method and apparatus for monitoring a property of a sample |
| 06/26/2014 | US20140182021 A microdevice for emitting electromagnetic radiation |
| 06/26/2014 | DE112012004221T5 Verfahren zur Steuerung eines Rastermikroskops A method for controlling a scanning microscope |
| 06/25/2014 | EP2746721A2 Nanomechanical testing system |
| 06/24/2014 | US8763160 Measurement of the surface potential of a material |
| 06/24/2014 | US8760174 Evanescent microwave microscopy probe and methodology |
| 06/19/2014 | WO2014090938A1 Conductive atomic force microscope tips coated with graphene |
| 06/19/2014 | US20140173786 Electrochemically-grown nanowires and uses thereof |
| 06/18/2014 | CN103872943A Double-slider high-precision inertial piezoelectric motor, control method and scanning probe microscope |
| 06/18/2014 | CN103869103A AFM probe device |
| 06/17/2014 | US8756711 Method for staging cancer progression by AFM |
| 06/12/2014 | US20140165237 Scanning Probe Microscope and Measurement Method Using Same |
| 06/11/2014 | EP2741072A1 Pump-probe measurement device |
| 06/11/2014 | CN203643473U 具有二维扫描功能的原子力显微镜测头 AFM probe with a two-dimensional scanning function |
| 06/11/2014 | CN103858015A A microdevice for emitting electromagnetic radiation |
| 06/11/2014 | CN103852600A Atomic force microscope probe device |
| 06/11/2014 | CN103852461A Electrochemical needle point enhanced Raman spectrometry instrument based on scanning probe microscope |
| 06/10/2014 | US8752211 Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements |
| 06/10/2014 | US8746039 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 06/05/2014 | WO2014085630A1 Micromachined comb drive for quantitative nanoindentation |
| 06/05/2014 | WO2014082158A1 Method to obtain absorption spectra from near-field infrared scattering using homodyne detection |
| 06/04/2014 | CN103837807A Method for measuring carrier concentration distribution in deep trench |
| 06/04/2014 | CN103837709A Surface plasmon polariton enhancement needlepoint and needlepoint enhancement method |
| 05/30/2014 | WO2014079450A1 Super-resolution near field imaging device |
| 05/28/2014 | EP2734808A1 Apparatus for tactile form determination |
| 05/28/2014 | DE102012108707A1 Surface profile and/or roughness measuring device for detecting surface profile and/or roughness of surface of object, detects vibration characteristic of vibrating wand or cantilever during approach of wand to surface of object |
| 05/27/2014 | US8739311 Image force microscopy of molecular resonance |
| 05/22/2014 | US20140143912 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing |
| 05/21/2014 | CN103808968A 用于针尖增强拉曼光谱的金属修饰的afm针尖及其制法 For tip-enhanced Raman spectroscopy of metal modified afm tip Jiqizhifa |
| 05/21/2014 | CN103808967A 一种基于石英音叉探针的原子力显微镜的成像系统 An atomic force microscope, the quartz tuning fork probe imaging system based on |
| 05/21/2014 | CN103808966A 一种包含气流式反应仓的反应型扫描隧道显微镜 Reactive gas stream comprising a scanning tunneling microscope reactor compartment |
| 05/21/2014 | CN103808965A 可置于超高真空系统的具有耐高温高压可控反应仓的stm体系 Can be placed in an ultrahigh vacuum system with a high temperature high pressure system controlled reaction compartment stm |
| 05/21/2014 | CN102768292B 基于碳纳米管探针的超高真空快速扫描探针显微方法 Based on the ultra-high vacuum scanning probe microscopy CNT probes rapid method |
| 05/21/2014 | CN102707094B 一种三扫描器原子力显微扫描检测装置 A three-scanning atomic force microscopy scanner detection device |
| 05/20/2014 | US8728286 Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same |
| 05/14/2014 | EP2729817A1 Method for positioning an atomic force microscopy tip in a cell |
| 05/14/2014 | EP2729816A1 A microdevice for emitting electromagnetic radiation |
| 05/14/2014 | CN103792394A 一种用于粘接石英音叉探针的装置 Apparatus for bonding of quartz tuning fork probe |
| 05/14/2014 | CN103792393A 基于原子力显微镜的单粒子或单分子示踪装置及示踪方法 Based on a single particle or single tracer molecule tracer device and method of atomic force microscopy |
| 05/14/2014 | CN103792392A 原子力显微镜测量纳米薄膜材料电阻分布的装置及方法 AFM measuring device and method of nano-thin film materials resistance distribution |
| 05/13/2014 | US8726410 Atomic force microscopy system and method for nanoscale measurement |
| 05/13/2014 | US8724116 Scanning mirrors in near field optical microscope having super resolution |
| 05/08/2014 | WO2014051886A9 Nanoscale scanning sensors |
| 05/08/2014 | US20140130214 Monolithic interferometric atomic force microscopy device |
| 05/08/2014 | US20140130213 Interferometric atomic-force microscopy device and method |
| 05/07/2014 | CN102431954B 高频交流电加热技术应用于ZnO基底电化学微加工方法 High-frequency alternating current is applied to ZnO substrate heating technology of electrochemical micromachining method |
| 05/06/2014 | US8719961 Real space mapping of ionic diffusion and electrochemical activity in energy storage and conversion materials |
| 05/06/2014 | US8719960 Temperature-dependent nanoscale contact potential measurement technique and device |
| 05/06/2014 | US8716938 Thermionic emission device |
| 04/30/2014 | CN103760145A Ratio fluorescent probe for detecting hydroxyl radical and synthesis method and application of ratio fluorescent probe |
| 04/30/2014 | CN103757675A Method for preparing AFM (Atomic Force Microscope) silicon tip by pulse plating of compact gold thin film in nanometer thickness |
| 04/29/2014 | US8713710 Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus |
| 04/23/2014 | CN102662086B Multiple-degree-of-freedom near-field optical microscope based on micro-nano motion arm |
| 04/17/2014 | WO2014057849A1 Near field light detection method and heat assisted magnetic head element examination device |
| 04/16/2014 | EP2720040A2 Nanopositioning substrate preparation apparatus and preparation method using dip pen nanolithography with single or multiple tips using atomic force microscope (afm) |
| 04/16/2014 | CN203551595U Scanning near-field optical detection bench |
| 04/16/2014 | CN203551594U Part surface nondestructive testing device |
| 04/16/2014 | CN103733045A Pump-probe measurement device |
| 04/16/2014 | CN102817006B Method for gold film modification of atomic force microscope probe by magnetron sputtering |
| 04/15/2014 | US8701211 Method to reduce wedge effects in molded trigonal tips |
| 04/10/2014 | WO2014055046A1 Method for performing the local charge transient analysis |
| 04/10/2014 | WO2014054741A1 Scanning tunneling microscope and observation image display method |
| 04/09/2014 | CN103713160A Noble metal ultramicro electrode and preparation method thereof |
| 04/08/2014 | US8695110 Scanning probe microscope and sample observing method using the same |
| 04/08/2014 | US8695109 Method and system for near-field optical imaging |
| 04/08/2014 | US8693837 High resolution near field scanning optical microscopy |
| 04/03/2014 | WO2014051886A1 Nanoscale scanning sensors |
| 04/03/2014 | US20140096293 Method and apparatus for inspecting thermal assist type magnetic head |
| 04/02/2014 | CN203519647U Atomic force microscope under-liquid probe tip support applicable to acid-base environments |
| 04/02/2014 | CN102662088B Method for platelet morphology scan imagery and platelet activation function evaluation |
| 04/02/2014 | CN101532818B Contact type measuring instrument |
| 04/01/2014 | US8689361 Method of making thin film probe tip for atomic force microscopy |
| 04/01/2014 | US8689359 Apparatus and method for investigating surface properties of different materials |
| 04/01/2014 | US8686358 Sub-microsecond-resolution probe microscopy |
| 04/01/2014 | US8685496 Method of fabricating alignment layer of liquid crystal display device and testing the alignment layer |
| 04/01/2014 | CA2631179C Optical device comprising a cantilever and method of fabrication and use thereof |
| 03/27/2014 | WO2014045646A1 Scanning probe microscope and method for observing sample using same |
| 03/27/2014 | WO2014044966A1 Method for measuring surface potentials on polarised devices |
| 03/27/2014 | US20140090118 Probes for multidimensional nanospectroscopic imaging and methods of fabrication thereof |
| 03/25/2014 | US8683611 High resolution AFM tips containing an aluminum-doped semiconductor nanowire |
| 03/25/2014 | US8677809 Thermal measurements using multiple frequency atomic force microscopy |
| 03/20/2014 | WO2014043632A1 Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy |
| 03/20/2014 | WO2014041677A1 Force probe, measurement device, and measurement method |
| 03/20/2014 | US20140082776 Fluid Delivery for Scanning Probe Microscopy |