| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 11/17/1998 | US5836996 Artificial retina |
| 11/11/1998 | EP0877413A2 Method and apparatus for selectively marking a semiconductor wafer |
| 11/05/1998 | WO1998034092A3 Object inspection and/or modification system and method |
| 11/03/1998 | US5831961 Information processing apparatus with probe undergoing circular motion |
| 11/03/1998 | US5831153 Investigation and/or manipulation device for a sample in fluid |
| 10/22/1998 | WO1998026297A3 Method for testing semiconductor devices |
| 10/22/1998 | DE19816914A1 Scanning microscope with stage observing=evaluating parameters of sample surface |
| 10/21/1998 | CN1196481A Method of measuring exchange force and method of evaluating magnetism using exchange force |
| 10/20/1998 | US5825670 High precison calibration and feature measurement system for a scanning probe microscope |
| 10/15/1998 | DE19816480A1 Scanning microscope with orthogonally displaced scanning head |
| 10/14/1998 | EP0871166A1 Apparatus for machining, recording, or reproducing, using scanning probe microscope |
| 10/14/1998 | EP0871165A2 Information recording/reproducing apparatus and method for recording and/or reproducing information on information recording carrier by use of probe electrode |
| 10/14/1998 | EP0871006A1 Scanning probe microscope |
| 10/14/1998 | CN1040251C Method and apparatus for background correction in analysis of specimen surface |
| 10/13/1998 | US5821549 Through-the-substrate investigation of flip-chip IC's |
| 10/13/1998 | US5821545 Heated stage for a scanning probe microscope |
| 10/13/1998 | US5821410 Scanning tip microwave near field microscope |
| 10/13/1998 | US5821409 Scanning near-field optic/atomic-force microscope with observing function in liquid |
| 10/10/1998 | CA2231224A1 Apparatus for machining, recording, and reproducing, using scanning probe microscope |
| 10/09/1998 | CA2231310A1 Scanning probe microscope |
| 10/07/1998 | EP0869354A1 Method of measuring exchange force and method of evaluating magnetism using the exchange force |
| 10/06/1998 | US5818042 Apparatus for creating three-dimensional physical models of characteristics of microscopic objects |
| 09/30/1998 | EP0866944A2 Device for testing flat materials |
| 09/23/1998 | EP0866340A2 Torque magnetometer utilizing integrated piezoresistive levers |
| 09/22/1998 | US5812722 Optical fiber and method for manufacturing the same |
| 09/22/1998 | US5811802 Scanning probe microscope with hollow pivot assembly |
| 09/22/1998 | CA2116497C Information recording and reproducing apparatus using probe |
| 09/17/1998 | WO1998028776A3 Particle-optical apparatus including a low-temperature specimen holder |
| 09/16/1998 | EP0864899A2 Scanning near-field optical microscope |
| 09/15/1998 | US5808790 Integrated microscope providing near-field and light microscopy |
| 09/12/1998 | CA2229221A1 Scanning near-field optical microscope |
| 09/09/1998 | EP0863543A2 Through-the-substrate investigation of flip-chip IC's |
| 09/08/1998 | US5805448 Hybrid control system for scanning probe microscopes |
| 09/08/1998 | US5804709 For measuring a force used in atomic force microscopy |
| 09/03/1998 | WO1998038501A1 Scanning probe microscope providing unobstructed top down and bottom up views |
| 09/02/1998 | EP0862046A1 Scanning probe microscope |
| 09/02/1998 | EP0862045A2 Atomic force microscope with optional replaceable fluid cell. |
| 08/25/1998 | US5798641 Torque magnetometer utilizing integrated piezoresistive levers |
| 08/25/1998 | US5798529 Focused ion beam metrology |
| 08/25/1998 | US5798524 Automated adjustment of an energy filtering transmission electron microscope |
| 08/25/1998 | CA2050120C An apparatus and a method for positioning coarse movement of a probe |
| 08/18/1998 | US5796102 Measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 08/18/1998 | US5796101 For chemical analysis systems |
| 08/06/1998 | WO1998034092A2 Object inspection and/or modification system and method |
| 07/16/1998 | WO1998030866A1 Optical profilometer combined with stylus probe measurement device |
| 07/16/1998 | DE19700747A1 Raster probe microscope for determining parameters of object in liquid |
| 07/15/1998 | EP0853251A2 Microprobe chip for detecting evanescent waves and method for making the same, probe provided with the microprobe chip and method for making the same, and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip |
| 07/14/1998 | US5780859 Electrostatic-magnetic lens arrangement |
| 07/09/1998 | WO1998029707A1 Acoustic sensor as proximity detector |
| 07/07/1998 | US5778134 Apparatus for recording and reproducing image information in a recording medium wherein scanning probes are controlled based on editing information |
| 07/02/1998 | WO1998028776A2 Particle-optical apparatus including a low-temperature specimen holder |
| 06/30/1998 | US5773824 For determining topographical characteristics of a sample surface |
| 06/18/1998 | WO1998026297A2 Method for testing semiconductor devices |
| 06/17/1998 | EP0847590A1 A scanning probe microscope having automatic probe exchange and alignment |
| 06/16/1998 | US5767514 Sensing electron flow between a tip and a surface of a sample |
| 06/10/1998 | EP0846442A2 Ultrasonic diagnostic imaging system for analysis of left ventricular function |
| 06/10/1998 | EP0809858A4 Scanning probe microscope for use in fluids |
| 06/09/1998 | US5763767 For examining surface properties of a sample surface |
| 06/04/1998 | WO1998023796A1 Method for preparation of metal intercalated fullerene-like metal chalcogenides |
| 06/03/1998 | EP0813675A4 Magnetic modulation of force sensor for ac detection in an atomic force microscope |
| 06/02/1998 | US5760396 Scanning probe microscope |
| 06/02/1998 | US5760300 For measuring a profile of a sample |
| 05/26/1998 | US5756997 Scanning probe/optical microscope with modular objective/probe and drive/detector units |
| 05/20/1998 | EP0843175A1 Scanning probe microscope and signal processing apparatus |
| 05/19/1998 | US5753911 Electrostatic actuator, probe using the actuator, scanning probe microscope, processing apparatus, and recording/reproducing apparatus |
| 05/19/1998 | US5753814 Magnetically-oscillated probe microscope for operation in liquids |
| 05/12/1998 | US5751686 Scanning probe tip covered with an electrical resistance to limit recording/reproducing current |
| 05/12/1998 | US5751684 Recording/reproducing apparatus and method for recording/reproducing information using probe |
| 05/12/1998 | US5751683 Nanometer scale data storage device and associated positioning system |
| 05/12/1998 | US5750990 Method for measuring critical dimension of pattern on sample |
| 05/12/1998 | US5750989 Scanning probe microscope for use in fluids |
| 05/08/1998 | CA2217256A1 Ultrasonic diagnostic imaging system for analysis of left ventricular function |
| 05/06/1998 | EP0840308A1 Recording medium, information reproducing device, information recording device, and information recording/reproducing device |
| 05/06/1998 | EP0839312A1 Tapping atomic force microscope with phase or frequency detection |
| 05/05/1998 | US5747802 Automated non-visual method of locating periodically arranged sub-micron objects |
| 04/28/1998 | US5744704 Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy |
| 04/21/1998 | US5742172 Scanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution image |
| 04/08/1998 | EP0834186A1 Precision-controlled slit mechanism for electron microscope |
| 04/07/1998 | US5736745 Contamination evaluating apparatus |
| 04/01/1998 | EP0833125A2 Scanning probe microscope with hollow pivot assembly |
| 03/24/1998 | US5731587 Hot stage for scanning probe microscope |
| 03/19/1998 | WO1998011593A1 Energy filter, transmission electron microscope and associated method for filtering energy |
| 03/05/1998 | WO1998008892A1 Aromatic polyamide resin molding, process for preparing the same, and magnetic recording media prepared using the same |
| 03/05/1998 | CA2236178A1 Aromatic polyamide resin moldings, production methods thereof, and magnetic recording medium produced therefrom |
| 03/04/1998 | EP0827136A1 Magnetic recording medium and a manufacturing method thereof as well as a photo-printing apparatus using such a magnetic recording medium |
| 03/04/1998 | EP0826145A1 Data acquisition and control apparatus for scanning probe systems |
| 03/03/1998 | US5723982 Apparatus for analyzing thin film property |
| 03/03/1998 | US5723775 Atomic force microscope under high speed feedback control |
| 02/12/1998 | WO1998006125A1 Automated adjustment of an energy filtering transmissiion electron microscope |
| 02/04/1998 | EP0822435A1 Device and method for scanning near field optical microscopy of samples in fluids |
| 02/03/1998 | US5715054 Scanning force microscope with detector probe for the atomic resolution of a surface structure |
| 02/03/1998 | US5714756 Scanning probe microscope having a single viewing device for on-axis and oblique angle views |
| 02/03/1998 | US5714682 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 02/03/1998 | CA2195838A1 Method and device for optical near-field scanning microscopy of test specimens in liquids |
| 02/03/1998 | CA2069452C Information recording/reproduction apparatus and method for recording and/or reproducing information onto and/or from recording medium using probe electrodes |
| 01/14/1998 | EP0818814A2 Overlay alignment measurement of semiconductor wafers |
| 01/14/1998 | EP0818052A1 Combined scanning probe and scanning energy microscope |
| 01/07/1998 | EP0815583A1 A stress cell for a scanning probe microscope |
| 01/06/1998 | US5705814 Scanning probe microscope having automatic probe exchange and alignment |
| 12/30/1997 | US5702849 Mask for transferring a pattern for use in a semiconductor device and method of manufacturing the same |