| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
|---|
| 02/28/1990 | EP0355241A1 Spin-polarized scanning tunneling microscope |
| 02/20/1990 | US4902967 Scanning electron microscopy by photovoltage contrast imaging |
| 02/13/1990 | US4900932 Cathodoluminescence detector utilizing a hollow tube for directing light radiation from the sample to the detector |
| 02/07/1990 | EP0354055A2 Disposable spray aperture |
| 02/07/1990 | EP0353633A2 Supersonic flaw detecting system |
| 01/25/1990 | WO1990000810A1 A charged particle energy filter |
| 01/25/1990 | WO1990000809A1 A device for energy filtering an imaging beam of charged particles |
| 01/24/1990 | EP0352085A2 Electron Microscope |
| 01/23/1990 | US4896045 Electron beam head and patterning apparatus including detection of secondary or reflected electrons |
| 01/23/1990 | US4896036 Detector objective for scanning microscopes |
| 01/23/1990 | US4896035 High mass ion detection system and method |
| 01/23/1990 | CA1264873A1 Electrostatic-magnetic lens for particle beam apparatus |
| 01/16/1990 | US4894541 Apparatus utilizing charged-particle beam |
| 01/16/1990 | US4894537 High stability bimorph scanning tunneling microscope |
| 01/03/1990 | EP0348992A2 Apparatus and method of pattern detection based on a scanning transmission electron microscope |
| 01/02/1990 | US4891523 Circuit for image displacement in a particle beam apparatus independently of magnification |
| 12/28/1989 | WO1989012818A1 Method and apparatus for the examination of structures on membrane surfaces |
| 12/27/1989 | EP0348239A1 Scanning tunneling microscope |
| 12/27/1989 | EP0347739A2 Scanning tunneling microscope and surface topographic observation method |
| 12/26/1989 | US4889990 Method and apparatus for recording and reproducing electron microscope image |
| 12/26/1989 | US4889988 Feedback control for scanning tunnel microscopes |
| 12/21/1989 | DE3820549A1 Verfahren und vorrichtung zur untersuchung von membranoberflaechen Method and device for investigation of membranoberflaechen |
| 12/20/1989 | EP0210182B1 Secondary ion collection and transport system for ion microprobe |
| 12/12/1989 | US4887031 Method and apparatus for detecting and imaging measuring points that have a defined signal progression |
| 12/12/1989 | US4886971 Ion beam irradiating apparatus including ion neutralizer |
| 12/05/1989 | US4885534 Direct measurement of photodiode impedance using electron beam probing |
| 12/05/1989 | US4885465 Spectrum display device for x-ray microanalyzer or the like |
| 11/28/1989 | US4883959 Scanning surface microscope using a micro-balance device for holding a probe-tip |
| 11/23/1989 | EP0342316A2 Method of electron beam lithography alignment |
| 11/21/1989 | US4882486 Electron detection with energy discrimination |
| 11/08/1989 | EP0340861A1 Auger spectrometry |
| 11/07/1989 | US4879473 Electron-beam exposure apparatus |
| 11/02/1989 | EP0339980A1 Magnetic micro-particles, method and apparatus for collecting specimens for use in labelling immune reactions, and method and device for preparing specimens |
| 10/31/1989 | US4877957 Scanning type tunnel microscope |
| 10/17/1989 | US4874947 Focused ion beam imaging and process control |
| 10/17/1989 | US4874946 Method and apparatus for analyzing the internal chemistry and compositional variations of materials and devices |
| 10/17/1989 | US4874945 Electron microscope equipped with scanning tunneling microscope |
| 10/05/1989 | WO1989009483A1 A variable temperature scanning tunneling microscope |
| 10/03/1989 | US4871938 Positioning device for a scanning tunneling microscope |
| 10/03/1989 | US4871919 Electron beam lithography alignment using electric field changes to achieve registration |
| 09/26/1989 | US4870352 Contactless current probe based on electron tunneling |
| 09/20/1989 | EP0333018A2 Objective lens for focusing charged particles |
| 09/19/1989 | US4868396 Cell and substrate for electrochemical STM studies |
| 09/19/1989 | US4868394 Charged particle detector |
| 09/08/1989 | WO1989008322A1 Focused ion beam imaging and process control |
| 09/08/1989 | WO1989007259A3 Integrated scanning tunneling microscope |
| 09/08/1989 | WO1989007258A3 Integrated scanning tunneling microscope |
| 09/06/1989 | EP0331148A2 Microscope apparatus |
| 09/05/1989 | US4864130 Photo ion spectrometer |
| 09/05/1989 | US4863226 Confocal laser scanning microscope |
| 08/29/1989 | US4861990 Tunneling susceptometry |
| 08/22/1989 | US4860224 Surface analysis spectroscopy apparatus |
| 08/15/1989 | US4857743 Disposable spray aperture |
| 08/15/1989 | US4857731 Instrument for analyzing specimen |
| 08/15/1989 | US4857730 Apparatus and method for local chemical analyses at the surface of solid materials by spectroscopy of X photoelectrons |
| 08/10/1989 | WO1989007259A2 Integrated scanning tunneling microscope |
| 08/10/1989 | WO1989007258A2 Integrated scanning tunneling microscope |
| 08/10/1989 | WO1989007256A1 An integrated mass storage device |
| 08/08/1989 | US4855596 Photo ion spectrometer |
| 08/01/1989 | US4853622 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location |
| 07/25/1989 | US4851768 Characteristic test apparatus for electronic device and method for using the same |
| 07/25/1989 | US4851676 Electron beam image recording using stimulable phosphor sheets of reduced thickness and/or with no protective layer |
| 07/25/1989 | US4851673 Secondary ion mass spectrometer |
| 07/25/1989 | US4851670 Energy-selected electron imaging filter |
| 07/11/1989 | US4847502 Dual cathode system for electron beam instruments |
| 07/11/1989 | US4847497 Apparatus for recording images produced by an electron microscope |
| 06/27/1989 | US4843330 Electron beam contactless testing system with grid bias switching |
| 06/27/1989 | US4843312 Test method for LCD elements |
| 06/27/1989 | CA1256587A1 Electron beam test probe system for analyzing integrated circuits |
| 06/20/1989 | US4841148 Variable temperature scanning tunneling microscope |
| 06/14/1989 | EP0320292A2 A process for forming a pattern |
| 06/13/1989 | US4839520 Production of pulsed electron beams |
| 06/06/1989 | US4837506 Apparatus including a focused UV light source for non-contact measuremenht and alteration of electrical properties of conductors |
| 06/06/1989 | US4837435 Tunneling scanning microscope having light source |
| 05/31/1989 | EP0318289A2 Apparatus and method for detecting tunnel current and electro-chemical reaction |
| 05/31/1989 | EP0317952A2 Device having superlattice structure, and method of and apparatus for manufacturing the same |
| 05/23/1989 | US4833323 Determining the composition of a solid body |
| 05/23/1989 | CA1254670A1 Method and apparatus for identifying points on a specimen having a defined time-dependent signal |
| 05/18/1989 | WO1989004493A1 Process and arrangement for measuring the variation of a signal at a measuring point of a probe |
| 05/16/1989 | US4831397 Photographic apparatus for transmission electron microscopes |
| 05/16/1989 | US4831328 Measurement processing arrangement |
| 05/16/1989 | US4831267 Detector for charged particles |
| 05/16/1989 | US4831266 Detector objective for particle beam apparatus |
| 05/10/1989 | EP0314947A1 Circuit allowing the magnification independant image shifting |
| 05/09/1989 | US4829240 Secondary electron measuring circuit |
| 05/09/1989 | US4829179 Surface analyzer |
| 05/09/1989 | US4829178 Apparatus for surface analysis |
| 04/18/1989 | US4823004 Method of interacting carriers |
| 04/18/1989 | CA1252918A1 Scanning tunneling microscope |
| 04/12/1989 | EP0310816A1 Automatic frequency following in a corpuscular beam-measuring method using a modulated primary beam |
| 04/11/1989 | US4820977 Method and apparatus for identifying points on a specimen having a defined time-dependent signal |
| 04/11/1989 | US4820927 Electron beam source employing a photo-emitter cathode |
| 04/04/1989 | US4817495 Defense system for discriminating between objects in space |
| 03/29/1989 | EP0308953A1 Charged particle detector |
| 03/29/1989 | EP0308427A1 Photo ion spectrometer |
| 03/21/1989 | US4814622 High speed scanning tunneling microscope |
| 03/15/1989 | EP0307211A2 Memory reading device |
| 03/15/1989 | EP0306790A2 Cathodoluminescence detector |
| 03/14/1989 | US4812650 Growth rate monitor for molecular beam epitaxy |
| 03/07/1989 | US4810880 Direct imaging monochromatic electron microscope |