| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 09/05/1995 | US5448514 Ultra high density dimer memory device |
| 09/05/1995 | US5448421 Method for positioning an information processing head by detecting a magnetization pattern on a magnetic material positioned relative to a recording medium and a process for forming a recording and/or reproducing cantilever type probe |
| 09/05/1995 | US5448399 Optical system for scanning microscope |
| 08/30/1995 | EP0669635A2 Scanning imaging high resolution electron spectroscopy |
| 08/30/1995 | CN1107577A Image dissection method and apparatus by photon tunnel scan |
| 08/29/1995 | US5446282 Scanning photoelectron microscope |
| 08/29/1995 | CA2046474C Information detection apparatus and displacement information measurement apparatus |
| 08/22/1995 | US5444244 Piezoresistive cantilever with integral tip for scanning probe microscope |
| 08/22/1995 | US5444242 Scanning and high resolution electron spectroscopy and imaging |
| 08/22/1995 | US5444191 Information processing apparatus and device for use in same |
| 08/15/1995 | US5442183 Charged particle beam apparatus including means for maintaining a vacuum seal |
| 08/15/1995 | US5442182 Electron lens |
| 08/15/1995 | US5440920 Scanning force microscope with beam tracking lens |
| 08/08/1995 | US5440122 Surface analyzing and processing apparatus |
| 08/02/1995 | EP0665541A2 Information recording and reproducing device |
| 08/02/1995 | EP0665417A2 Atomic force microscope combined with optical microscope |
| 08/01/1995 | US5438196 Scanning tunneling microscope |
| 07/25/1995 | US5436452 Uncooled tunneling infrared sensor |
| 07/18/1995 | US5434422 Sample position controller in focused ion beam system |
| 07/18/1995 | US5434420 Industrial material processing electron linear accelerator |
| 07/11/1995 | US5432345 Method and apparatus for control of surface potential |
| 07/06/1995 | WO1995018352A1 Scanning force microscopy process and scanning force microscope with detector probe |
| 06/28/1995 | EP0660183A2 Mask for transferring a pattern for use in a semiconductor device and method for manufacturing the same |
| 06/27/1995 | US5428548 Method of and apparatus for scanning the surface of a workpiece |
| 06/22/1995 | WO1995008181A3 A system for analyzing surfaces of samples |
| 05/17/1995 | EP0653628A1 Sample stage for scanning probe microscope head |
| 05/16/1995 | US5416024 Apparatus for releasing and determining the chemical composition of volatiles contained within sedimentary rock samples |
| 05/09/1995 | US5414260 Scanning probe microscope and method of observing samples by using the same |
| 05/09/1995 | US5412980 Tapping atomic force microscope |
| 05/02/1995 | US5412210 Scanning electron microscope and method for production of semiconductor device by using the same |
| 05/02/1995 | US5412209 For observing a specimen having a recess in its surface |
| 05/02/1995 | US5410910 Cryogenic atomic force microscope |
| 04/26/1995 | EP0650067A1 Electrooptic instrument |
| 04/26/1995 | EP0650029A2 Atomic force microscope with optional replaceable fluid cell |
| 04/19/1995 | EP0648999A1 Apparatus for measuring physical properties of micro area |
| 04/19/1995 | EP0648469A1 System and method for displaying 3-dimensional echographic data |
| 04/11/1995 | US5406087 Specimen-holding device for electron microscope |
| 04/11/1995 | US5406085 Apparatus and method for rapid and nondestructive determination of lattice defects in semiconductor materials |
| 04/11/1995 | US5406072 Method for microbeam ion radiation testing of photonic devices |
| 04/04/1995 | US5404349 Position displacement detecting apparatus |
| 04/04/1995 | US5404110 System using induced current for contactless testing of wiring networks |
| 03/28/1995 | US5401973 Industrial material processing electron linear accelerator |
| 03/28/1995 | US5401972 Layout overlay for FIB operations |
| 03/23/1995 | WO1995008181A2 A system for analyzing surfaces of samples |
| 03/23/1995 | WO1995008109A1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 03/14/1995 | US5397896 Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra |
| 03/07/1995 | US5396453 Recording/reproducing apparatus such as a memory apparatus |
| 03/01/1995 | EP0640829A2 Scanning probe microscope |
| 03/01/1995 | EP0490958B1 Method and apparatus for imaging dislocations in materials using a scanning electron microscope |
| 03/01/1995 | EP0407460B1 An integrated mass storage device |
| 02/28/1995 | US5394388 Multiple microprobe arrays for recording and reproducing encoded information |
| 02/28/1995 | US5393985 Apparatus for focusing an ion beam |
| 02/28/1995 | US5393983 Magnetic electron lens and elctron microscope using the same |
| 02/28/1995 | US5393980 Quality monitor and monitoring technique employing optically stimulated electron emmission |
| 02/28/1995 | US5393977 Charged particle beam apparatus and it's operating method |
| 02/21/1995 | US5391871 For measuring surface status of a sample by scanning with a probe |
| 02/14/1995 | US5389786 Method of quantitative determination of defect concentration on surfaces |
| 02/14/1995 | US5388323 Method of forming a probe for an atomic force microscope |
| 02/02/1995 | DE4403768A1 Analysis system for integrated circuits, electron-beam measuring sensor system, and associated fault isolation methods |
| 01/17/1995 | US5382796 Apparatus for morphological observation of a sample |
| 01/11/1995 | EP0633450A2 Method for detecting and examining slightly irregular surface states, and scanning probe microscope therefor |
| 01/10/1995 | US5381003 Auger electron spectroscopy |
| 01/05/1995 | DE4421517A1 Method for removing or depositing material by means of a particle beam and device for carrying out the method |
| 01/03/1995 | US5378984 EB type IC tester |
| 01/03/1995 | US5378983 Scanning tunneling potentio-spectroscopic microscope and a data detecting method |
| 12/27/1994 | US5376790 Scanning probe microscope |
| 12/22/1994 | WO1994029894A1 Piezoresistive cantilever with integral tip |
| 12/20/1994 | US5375114 Recording and reading space control between a read/write probe and a recording medium |
| 12/20/1994 | US5375087 Tunneling-stabilized magnetic reading and recording |
| 12/06/1994 | US5371366 Ion scattering spectroscope |
| 12/06/1994 | US5371365 Scanning probe microscopy |
| 11/29/1994 | US5369359 Particle beam testing method with countervoltage or retarding voltage follow-up or feedback |
| 11/29/1994 | US5369275 Apparatus for solid surface analysis using X-ray spectroscopy |
| 11/29/1994 | US5369274 Method and an apparatus for the examination of structures on membrane surfaces |
| 11/08/1994 | US5362653 Examination of objects of macromolecular size |
| 11/08/1994 | CA2039108C Method and apparatus for detecting trace contaminents |
| 11/08/1994 | CA2020707C Inclusion composition mapping of earth's subsurface using collective fluid inclusion volatile compositions |
| 11/01/1994 | US5360977 Compound type microscope |
| 10/27/1994 | WO1994024575A1 Electrooptic instrument |
| 10/18/1994 | US5357109 Probe for scanning tunneling microscope and manufacturing method thereof |
| 10/18/1994 | US5356218 Probe for providing surface images |
| 10/18/1994 | CA2024648C Accessing method, and information processing method and information processing device utilizing the same |
| 09/28/1994 | EP0617451A1 Imaging electron energy filter |
| 09/28/1994 | EP0617294A2 System using induced current for contactless testing of wiring networks |
| 09/28/1994 | EP0617257A1 Electron beam measuring apparatus |
| 09/27/1994 | US5349735 Information detection apparatus and displacement information measurement apparatus |
| 09/21/1994 | EP0616192A1 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 09/14/1994 | EP0615205A2 Image processing apparatus and recording/reproducing apparatus |
| 09/14/1994 | EP0573421B1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere |
| 09/07/1994 | EP0614177A2 Information recording and reproducing apparatus using probe |
| 09/07/1994 | EP0404799B1 Integrated scanning tunneling microscope |
| 08/31/1994 | EP0613130A1 Carbon material originating from graphite and method of producing same |
| 08/31/1994 | EP0397799B1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same |
| 08/30/1994 | USRE34708 Scanning ion conductance microscope |
| 08/23/1994 | US5340749 Immunocomplexing a specimen and magnetic labeled antibody, applying magetic field to concentrate complex to selected region, magnetic adsorption of immunocomplex; electronmicroscopy |
| 08/09/1994 | US5336885 Electron beam apparatus |
| 08/02/1994 | US5333495 Method and apparatus for processing a minute portion of a specimen |
| 07/26/1994 | CA2005407C Method and apparatus for determining distribution of mass density |
| 07/19/1994 | US5329808 Atomic force microscope |
| 07/12/1994 | US5329236 Apparatus for estimating charged and polarized states of functional groups in a solution |