| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 07/20/1993 | US5229607 Combination apparatus having a scanning electron microscope therein |
| 07/06/1993 | US5225683 Detachable specimen holder for transmission electron microscope |
| 07/06/1993 | US5224376 Atomic force microscope |
| 06/30/1993 | EP0548573A2 Electron beam apparatus |
| 06/22/1993 | US5222060 Accessing method, and information processing method and information processing device utilizing the same |
| 06/22/1993 | US5221844 Charged particle beam device |
| 06/09/1993 | EP0545713A1 Apparatus for adjustable correction of spherical aberration |
| 06/09/1993 | EP0545538A1 Scanning microscope comprising force-sensing means |
| 06/08/1993 | CA1318980C Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof |
| 05/26/1993 | EP0543502A1 Subpicosecond atomic motion detection and signal transmission |
| 05/25/1993 | US5214342 Two-dimensional walker assembly for a scanning tunneling microscope |
| 05/25/1993 | US5214282 Method and apparatus for processing a minute portion of a specimen |
| 05/19/1993 | EP0542094A1 Corpuscular beam test method using voltage control |
| 05/18/1993 | US5212383 Color synthesizing scanning electron microscope |
| 05/13/1993 | WO1993009396A1 Method for creating a three-dimensional corporeal model from a very small original |
| 05/11/1993 | US5210424 Cooling means for components in a vacuum chamber |
| 05/11/1993 | US5210410 Scanning probe microscope having scan correction |
| 05/04/1993 | US5208648 Apparatus and a method for high numerical aperture microscopic examination of materials |
| 04/28/1993 | EP0538938A1 Electron beam apparatus |
| 04/27/1993 | US5206702 Technique for canceling the effect of external vibration on an atomic force microscope |
| 04/21/1993 | EP0537961A1 Charged particle energy analysers |
| 04/14/1993 | EP0536827A1 Combined scanning force microscope and optical metrology tool |
| 04/13/1993 | US5202004 Determining contour of surface |
| 04/06/1993 | US5200617 PMN translator and linearization system in scanning probe microscope |
| 04/06/1993 | US5200616 Environment controllable scanning probe microscope |
| 04/06/1993 | CA1315898C Scanning tunneling microscope and surface topographic observation method |
| 03/18/1993 | WO1993005529A1 Magnetic electron lens and electron microscope using same |
| 03/16/1993 | US5193383 Using an Atomic Force Microscope to measure a surface property of a sample |
| 03/11/1993 | DE4229275A1 Sample position control in focussed ion beam system e.g. for faulty bit analysis of semiconductor memory - allows automatic movement of sample w.r.t. reference point calculated by detection of secondary electrons released by irradiation by ion beam |
| 03/10/1993 | EP0530640A1 Imaging system with mirror corrector for charged particle radiation |
| 03/09/1993 | US5192866 Sample-moving automatic analyzing apparatus |
| 03/03/1993 | EP0529846A1 Scanning probe microscope |
| 03/03/1993 | EP0529616A2 Information processing apparatus and scanning tunnel microscope |
| 02/18/1993 | WO1993003491A1 Color synthesizing scanning electron microscope |
| 02/17/1993 | EP0527601A1 Composite scanning tunnelling microscope and optical microscope |
| 02/17/1993 | EP0527448A2 Scanning tunnelling/atomic force microscope combined with optical microscope |
| 02/09/1993 | US5185572 Scanning tunneling potentio-spectroscopic microscope and a data detecting method |
| 02/03/1993 | EP0526228A1 Apparatus for detecting electrostatic force in solution |
| 01/20/1993 | EP0523676A2 Information recording/reproducing method for recording and/or reproducing information on information recording carrier by use of probe electrode, information recording/reproducing apparatus executing the method, and information recording carrier suitable for the method |
| 01/20/1993 | EP0523566A2 Apparatus for solid surface analysis using x-ray spectroscopy |
| 01/19/1993 | US5179954 Ultrasonic inspection and imaging instrument |
| 01/13/1993 | EP0407460A4 An integrated mass storage device |
| 01/12/1993 | CA1312672C Electron beam memory system with ultra-compact, high current density electron gun |
| 01/05/1993 | US5177361 Electron energy filter |
| 12/29/1992 | US5175495 Detection of semiconductor failures by photoemission and electron beam testing |
| 12/23/1992 | EP0519622A2 Evanescent wave sensor shell and apparatus |
| 12/15/1992 | US5172002 Optical position sensor for scanning probe microscopes |
| 12/15/1992 | US5171993 Method of correcting error arising in current-imaging tunneling spectroscopy |
| 12/09/1992 | EP0517270A1 Scanning probe microscope |
| 12/09/1992 | EP0517074A2 Information recording/reproduction apparatus and method for recording and/or reproducing information onto and/or from recording medium using probe electrodes |
| 12/08/1992 | CA2069538A1 Evanescent wave sensor shell and apparatus |
| 12/02/1992 | EP0516380A2 Micro-displacement element for a scanning tunneling microscope |
| 12/01/1992 | US5168159 Barrier height measuring apparatus including a conductive cantilever functioning as a tunnelling probe |
| 11/24/1992 | US5166919 Atomic scale electronic switch |
| 11/24/1992 | US5166519 Electron imaging band pass analyser for a photoelectron spectromicroscope |
| 11/19/1992 | EP0513776A2 Instrument and method for 3-dimensional atomic arrangement observation |
| 11/10/1992 | US5162653 Scanning tunneling microscope and surface topographic observation method |
| 11/10/1992 | US5162133 Process for fabricating silicon carbide films with a predetermined stress |
| 11/03/1992 | US5161201 Method of and apparatus for measuring pattern profile |
| 11/03/1992 | US5161149 Electron density storage device and method using STM |
| 11/03/1992 | US5161147 High speed information system utilizing scanning tunneling microscopy in conjunction with a modulated light source |
| 11/03/1992 | US5160884 Charged particle beam device |
| 10/29/1992 | WO1992018853A1 Imaging beta tracer microscope |
| 10/28/1992 | EP0510895A2 Information processor |
| 10/28/1992 | EP0510579A2 Apparatus for recording and/or reproducing information |
| 10/27/1992 | US5159196 Apparatus and method for discharging a specimen disposed in an evacuated chamber |
| 10/21/1992 | EP0509856A1 Scanning probe type microscope combined with an optical microscope |
| 10/20/1992 | US5157555 Apparatus for adjustable correction of spherical aberration |
| 10/20/1992 | US5156976 For spectrophotometric assays of fluid analytes; having shell with surfaces to propagate radiation between by internal reflection |
| 10/13/1992 | US5155361 Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
| 09/29/1992 | US5151594 Subpicosecond atomic and molecular motion detection and signal transmission by field emission |
| 09/22/1992 | US5149974 Gas delivery for ion beam deposition and etching |
| 09/16/1992 | EP0503236A2 Apparatus and a method for high numerical aperture microscopic examination of materials |
| 09/15/1992 | US5148026 Scanning probe microscopy |
| 09/08/1992 | US5146090 Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam |
| 09/01/1992 | US5144128 Surface microscope and surface microscopy |
| 08/26/1992 | EP0500179A1 Charged particle beam device |
| 08/25/1992 | US5142148 Field emission scanning electron microscope and method of controlling beam aperture angle |
| 08/25/1992 | US5142145 Composite scanning tunneling microscope |
| 08/19/1992 | EP0499490A2 Scanning reflection electron diffraction microscope |
| 08/12/1992 | EP0497788A1 Examination of objects of macromolecular size. |
| 08/11/1992 | US5138159 Scanning tunneling microscope |
| 08/04/1992 | US5136162 Measuring device in a scanning probe microscope |
| 07/21/1992 | US5132533 Method for forming probe and apparatus therefor |
| 07/14/1992 | US5130539 Imaging beta tracer microscope |
| 07/14/1992 | US5129132 Method of making an integrated scanning tunneling microscope |
| 07/07/1992 | US5128545 Method and apparatus for background correction in analysis of a specimen surface |
| 07/01/1992 | EP0492295A2 Electron energy filter, preferably from alpha or omega type |
| 07/01/1992 | EP0492218A1 Cooling arrangement for electronic devices within a vacuum chamber |
| 06/30/1992 | US5127064 High resolution image compression methods and apparatus |
| 06/24/1992 | EP0490958A1 Method and apparatus for imaging dislocations in materials using a scanning electron microscope. |
| 06/23/1992 | US5125017 Compton backscatter gage |
| 06/23/1992 | US5124645 Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor |
| 06/02/1992 | US5119411 X-ray optical apparatus |
| 05/27/1992 | EP0487300A1 Scanning probe microscopy |
| 05/26/1992 | US5116782 Method and apparatus for processing a fine pattern |
| 05/12/1992 | US5113072 Device having superlattice structure, and method of and apparatus for manufacturing the same |
| 05/06/1992 | EP0483517A2 Gas delivery for ion beam deposition and etching |
| 05/05/1992 | US5111043 Apparatus for material surface observation |
| 04/22/1992 | EP0481499A2 Recording/reproducing apparatus such as a memory apparatus |