| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 03/01/1989 | EP0304525A1 Pulsed microfocused ion beams |
| 02/28/1989 | US4808829 Mark position detection system for use in charged particle beam apparatus |
| 02/28/1989 | US4808821 Spectrometer objective for electron beam mensuration techniques |
| 02/23/1989 | WO1989001603A1 Scanning type tunnel microscope |
| 02/21/1989 | US4806766 Magnetic lens system |
| 02/09/1989 | WO1989000883A1 High mass ion detection system and method |
| 01/24/1989 | US4800512 Method and apparatus for determining and detecting data indicative of the condition of machines through a unique data probe including a test data probe portion and an identifying data sensing probe portion |
| 01/17/1989 | US4798989 Scanning tunneling microscope installed in electron microscope |
| 12/28/1988 | EP0296871A2 Tunnelling scanning microscope |
| 12/27/1988 | US4794259 Charged particle collection |
| 12/07/1988 | EP0293924A2 Direct imaging monochromatic electron microscope |
| 12/06/1988 | US4789780 Apparatus for energy-selective visualization |
| 11/29/1988 | US4788431 Specimen distance measuring system |
| 11/29/1988 | US4788426 Electronic read/write system |
| 11/22/1988 | US4786865 Method and apparatus for testing integrated circuit susceptibility to cosmic rays |
| 11/22/1988 | US4786806 Retarding field spectrometer |
| 11/15/1988 | US4785176 Electrostatic-magnetic lens for particle beam apparatus |
| 11/15/1988 | US4785173 Element analyzing apparatus |
| 11/15/1988 | US4785172 Secondary ion mass spectrometry system and method for focused ion beam with parallel ion detection |
| 11/09/1988 | EP0290066A1 Test method for LCD elements |
| 11/09/1988 | CN88102316A Test method for lcd elements |
| 11/08/1988 | US4783751 Analysis of pore complexes |
| 11/02/1988 | EP0289277A2 An electron beam head |
| 10/25/1988 | US4780669 Method and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuit |
| 10/18/1988 | US4779113 Film handling apparatus |
| 10/18/1988 | US4779046 Electron beam integrated circuit tester |
| 10/11/1988 | US4777523 Electron microscope with television observation apparatus |
| 10/05/1988 | EP0284683A2 Apparatus for surface analysis |
| 10/04/1988 | CA1242817A1 Low-abberation spectrometer objective with high secondary electron acceptance |
| 09/28/1988 | EP0284136A1 Confocal laser scanning microscope |
| 09/20/1988 | US4772847 Stroboscopic type potential measurement device |
| 09/14/1988 | EP0281743A2 Detector objective for a scanning microscope |
| 09/13/1988 | US4771235 Method and apparatus for detecting and imaging measuring points that have a defined signal progression |
| 08/30/1988 | US4768155 Supersonic flaw detecting system |
| 08/24/1988 | EP0279240A2 Charged-particles detector |
| 08/23/1988 | US4766313 Apparatus for quantitative secondary ion mass spectrometry |
| 08/23/1988 | US4766311 Method and apparatus for precision SEM measurements |
| 08/17/1988 | EP0278736A2 Secondary ion mass spectrometer |
| 08/16/1988 | US4764673 Electric electron energy analyzer |
| 08/09/1988 | US4762996 Coarse approach positioning device |
| 07/26/1988 | US4760567 Electron beam memory system with ultra-compact, high current density electron gun |
| 07/20/1988 | EP0274622A1 Detector assembly with detector objective for corpuscular ray instruments |
| 07/05/1988 | US4755749 Strobo electron beam apparatus |
| 07/05/1988 | US4755047 Photometric stereoscopic shape measuring method |
| 06/15/1988 | EP0270589A1 Apparatus and method for the chemical analysis of solids by spectroscopy of x photoelectrons |
| 05/31/1988 | US4748407 Method and apparatus for measuring time dependent signals with a particle probe |
| 05/31/1988 | US4748325 Method and device to discharge samples of insulating material during ion analysis |
| 05/24/1988 | US4746571 Spheres, particles, calibration |
| 05/17/1988 | US4745362 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location |
| 05/17/1988 | US4745360 Electron-beam probe system utilizing test device having interdigitated conductive pattern and associated method of using the test device |
| 05/11/1988 | EP0266535A1 Electron beam contactless testing system with grid bias switching |
| 04/26/1988 | US4740697 Secondary ion mass spectrometer |
| 04/19/1988 | US4739399 TV system for transmission electron microscopes |
| 04/06/1988 | EP0262855A2 Production of pulsed electron beams |
| 03/16/1988 | EP0259907A1 Electron detection with energy discrimination |
| 03/01/1988 | US4728790 Low-abberation spectrometer objective with high secondary electron acceptance |
| 02/25/1988 | WO1988001424A1 Electron beam memory system with ultra-compact, high current density electron gun |
| 02/24/1988 | EP0256337A1 Low pressure chemical vapor deposition method fpr forming tungsten silicide |
| 02/23/1988 | US4727029 Placing speciman in inert gas atmosphere, ionization to activate surface |
| 02/16/1988 | CA1232975A1 Noncontact full-line dynamic ac tester for integrated circuits |
| 02/11/1988 | WO1988001099A1 Multipurpose gaseous detector device for electron microscopes |
| 02/09/1988 | US4724318 Atomic force microscope and method for imaging surfaces with atomic resolution |
| 01/27/1988 | EP0254625A1 Procedure and device for discharging insulating samples in the course of an ionic analysis |
| 01/20/1988 | EP0253336A2 Surface analyzer |
| 01/20/1988 | EP0253098A1 Measuring arrangement for the evaluation of a sequence of signals generated by corpuscular radiation |
| 01/07/1988 | EP0251381A2 Magnetic lens system |
| 01/07/1988 | EP0113746B1 An elektrode system of a retarding-field spectrometer for a voltage measuring electron beam apparatus |
| 12/17/1987 | WO1987007762A1 Photo ion spectrometer |
| 12/16/1987 | EP0249214A2 Electrophotographic image recording system |
| 12/15/1987 | US4713687 Scan line type dynamic observation apparatus |
| 12/03/1987 | WO1987007429A1 Apparatus and method for the chemical analysis of solids by spectroscopy of x photoelectrons |
| 12/02/1987 | EP0247651A1 Electron-beam probe system utilizing test device having interdigitated conductive pattern and associated method of using the test device |
| 11/10/1987 | US4706019 Electron beam test probe system for analyzing integrated circuits |
| 10/28/1987 | EP0242993A1 Apparatus and method for collecting charged particles |
| 10/28/1987 | EP0242602A2 Electrostatic and magnetic lens for corpuscular beam apparatus |
| 10/27/1987 | US4703234 Charged-particle accelerator |
| 10/14/1987 | EP0241060A1 Apparatus for energy-selective visualisation |
| 10/13/1987 | US4700075 Detector for back-scattered electrons |
| 10/13/1987 | US4700071 Method of recording and reproducing an electron microscope image |
| 09/22/1987 | US4695725 Method of detecting a focus defect of an electron microscope image |
| 09/15/1987 | US4694170 Instrument for very high resolution ionic micro-analysis of a solid sample |
| 09/09/1987 | EP0235696A2 Optical proximity imaging method and apparatus |
| 08/19/1987 | EP0232790A1 Process and arrangement for measuring time-dependent signals with a corpuscular beam probe |
| 08/18/1987 | US4687930 Ion beam apparatus |
| 08/04/1987 | US4684542 Low pressure chemical vapor deposition of tungsten silicide |
| 07/28/1987 | US4683376 Opposing field spectrometer for electron beam mensuration technology |
| 07/21/1987 | US4681451 Optical proximity imaging method and apparatus |
| 07/15/1987 | EP0228502A1 Electron beam test apparatus for electronic device and method for using the same |
| 07/14/1987 | US4680467 Electron spectroscopy system for chemical analysis of electrically isolated specimens |
| 07/01/1987 | EP0226913A2 Method and device for situating and/or displaying probe points carrying a characteristic time-dependent signal |
| 06/24/1987 | EP0226494A2 Electron beam test probe system for analyzing integrated circuits |
| 06/16/1987 | US4673988 Electronic mosaic imaging process |
| 06/02/1987 | US4670710 Noncontact full-line dynamic AC tester for integrated circuits |
| 06/02/1987 | US4670651 Apparatus for performing the SNMS method |
| 05/26/1987 | US4668865 Scanning tunneling microscope |
| 04/28/1987 | US4661702 Primary ion beam raster gating technique for secondary ion mass spectrometer system |
| 03/17/1987 | US4651220 Method of recording and reproducing images produced by an electron microscope |
| 03/12/1987 | WO1987001452A1 Mass spectroscope |
| 03/11/1987 | EP0213871A1 Strobo electron beam apparatus |
| 02/25/1987 | EP0211212A2 Process and device for the determination and evaluation of machine parameters |