| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 03/05/2015 | US20150067931 Method and Means for Coupling High-Frequency Energy to and/or from the Nanoscale Junction of an Electrically-Conductive Tip with a Semiconductor |
| 03/05/2015 | US20150062561 Stress Analysis of 3-D Structures Using Tip-Enhanced Raman Scattering Technology |
| 03/04/2015 | EP2843422A1 Composite microscope combining scanning probe microscope and optical microscope; control device, control method, and control program therefor; and recording medium |
| 03/03/2015 | US8973161 Method and apparatus for nanomechanical measurement using an atomic force microscope |
| 02/25/2015 | EP2840399A1 Compound microscope |
| 02/12/2015 | WO2015019090A1 Probe and sample exchange mechanism for a scanning probe microscope |
| 02/12/2015 | WO2015018865A1 Sample holder for an afm |
| 02/11/2015 | EP2835653A1 Sample holder for an AFM |
| 02/11/2015 | EP2834651A1 Touch-screen based scanning probe microscopy (spm) |
| 02/11/2015 | CN204154647U 一种三位一体薄膜测试装置 A thin film of the Trinity test device |
| 02/10/2015 | US8955161 Peakforce photothermal-based detection of IR nanoabsorption |
| 02/04/2015 | EP2831600A1 Microscope objective mechanical testing instrument |
| 02/04/2015 | CN102109771B 一种半导体器件的检测方法 Detection method of a semiconductor device |
| 01/28/2015 | CN104316730A 一种制备扫描电子显微镜样品断面的低温脆断装置 A method for preparing a low temperature scanning electron microscope sample brittle fracture device cross section |
| 01/28/2015 | CN104316312A 零件破坏性检测装置 Part-destructive testing devices |
| 01/21/2015 | CN104297667A 检测晶格位错的方法 Detection methods of lattice dislocations |
| 01/21/2015 | CN102435784B 表面分析器 Surface Analyzer |
| 01/14/2015 | CN104280261A 截面样品的制备方法 Section of the sample preparation method |
| 01/13/2015 | US8935811 Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage |
| 01/13/2015 | US8934683 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 01/08/2015 | WO2015001119A1 Sample holder for an atomic force microscope |
| 01/08/2015 | US20150013036 Sample fixing member for atomic force microscope |
| 01/07/2015 | EP2821796A1 Sample holder for an atomic force microscope |
| 01/07/2015 | EP2820430A2 Interactive comparative display of information |
| 01/06/2015 | US8925376 Fully digitally controller for cantilever-based instruments |
| 12/30/2014 | US8925111 Scanning probe microscope and method of operating the same |
| 12/30/2014 | US8923595 Method of identification of cancerous and normal cells |
| 12/24/2014 | CN104237567A 一种超薄平面透射电镜样品的制备方法 Method for preparing ultrathin TEM samples plane |
| 12/18/2014 | US20140367570 Substrate inspection method and a substrate processing method |
| 12/16/2014 | US8914909 Frequency measuring and control apparatus with integrated parallel synchronized oscillators |
| 12/10/2014 | CN204008261U 高倾转样品台换样底座 High sample changers like tilting base |
| 12/10/2014 | CN104198767A 一种通过扫描电子显微镜检验鲜茧生丝的方法 A silk cocoon method tested by scanning electron microscopy |
| 12/10/2014 | CN104198766A 消除聚焦离子束扫描电镜成像时的景深假像的方法 Remedy focused ion beam scanning electron microscopy imaging artifacts of depth of field |
| 12/02/2014 | US8904560 Closed loop controller and method for fast scanning probe microscopy |
| 11/25/2014 | US8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzed |
| 11/18/2014 | US8893309 Scanning tunneling microscope assembly, reactor, and system |
| 11/11/2014 | US8887311 Scanning probe microscope |
| 11/11/2014 | US8884608 AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy |
| 11/04/2014 | US8878147 Method and apparatus for in situ preparation of serial planar surfaces for microscopy |
| 10/14/2014 | US8860260 High-scan rate positioner for scanned probe microscopy |
| 10/09/2014 | US20140304861 Leveling apparatus and atomic force microscope including the same |
| 10/02/2014 | WO2014156247A1 Heat-assisted magnetic head inspection device and heat-assisted magnetic head inspection method |
| 10/02/2014 | US20140298548 Scanning probe microscope |
| 09/30/2014 | US8849611 Intermodulation scanning force spectroscopy |
| 09/25/2014 | US20140289912 Peakforce Photothermal-Based Detection of IR Nanoabsorption |
| 09/25/2014 | US20140287958 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 09/24/2014 | EP2781925A1 Sealed-type afm cell |
| 09/24/2014 | EP2780726A1 Method and apparatus for signal path equalization in a scanning acoustic microscope |
| 09/23/2014 | US8844061 Scanning probe microscope |
| 09/18/2014 | WO2014143727A1 Method and apparatus for adaptive tracking using a scanning probe microscope |
| 09/16/2014 | US8835844 Sample electrification measurement method and charged particle beam apparatus |
| 09/09/2014 | US8832859 Probe alignment tool for the scanning probe microscope |
| 09/02/2014 | US8822919 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 08/21/2014 | US20140237690 Afm-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy |
| 08/19/2014 | US8813261 Scanning probe microscope |
| 08/13/2014 | CN103983808A 一种微纳颗粒双向传输和可控性定位的光学方法 A micro nano particles bidirectional transmission and control positioning of optical methods |
| 08/07/2014 | US20140223616 Apparatus of Analyzing a Sample and a Method for the Same |
| 08/06/2014 | EP2762896A1 Dc magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 08/05/2014 | US8798935 Imaging method and use thereof |
| 08/05/2014 | US8796651 Method and apparatus for specimen fabrication |
| 07/29/2014 | USRE45049 Electron beam exposure system |
| 07/29/2014 | US8793811 Method and apparatus for infrared scattering scanning near-field optical microscopy |
| 07/23/2014 | EP2757380A1 Potential-measuring device, and atomic force microscope |
| 07/23/2014 | CN203732562U 原子力显微镜低温观测系统 AFM cryogenic Observing System |
| 07/23/2014 | CN103941043A Scm样品横断面的制备方法 Scm cross section of the sample preparation method |
| 07/03/2014 | WO2014104172A1 Dynamic analysis method for polymer chain, manufacturing method for polymer, polymer, manufacturing method for synthetic polymer, and synthetic pollymer |
| 07/02/2014 | CN203688581U 用于原子力显微镜的气氛控制装置 Atmosphere for AFM control means |
| 07/02/2014 | CN103901231A 一种适用于原子力显微镜观测沥青试样制备方法 An atomic force microscope is suitable for preparation of asphalt samples |
| 07/01/2014 | US8769711 Method for examining a measurement object, and apparatus |
| 06/26/2014 | US20140182020 Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage |
| 06/24/2014 | US8763161 Zero thermal expansion, low heat transfer, variable temperature sample assembly for probe microscopy |
| 06/18/2014 | CN102778588B Laser detecting device for high-speed atomic force microscope and detecting method thereof |
| 06/12/2014 | US20140165236 Method and apparatus for analyzing and for removing a defect of an euv photomask |
| 06/11/2014 | CN103852599A Atomic force microscope low-temperature observing system |
| 06/10/2014 | US8746039 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 06/04/2014 | CN103837708A Horizontal detecting device, levelling device and levelling method of workpiece in electrochemical system |
| 05/27/2014 | USRE44908 Electron beam exposure system |
| 05/21/2014 | CN103808965A 可置于超高真空系统的具有耐高温高压可控反应仓的stm体系 Can be placed in an ultrahigh vacuum system with a high temperature high pressure system controlled reaction compartment stm |
| 05/21/2014 | CN103808538A 一种全新的包含耐高温高压结构单元的超高真空系统 A new high-temperature high-pressure structural unit contains ultra-high vacuum system |
| 05/08/2014 | US20140130212 Fusion measurement apparatus |
| 05/01/2014 | US20140123347 Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring |
| 04/30/2014 | CN103760383A Atmosphere control system for atomic force microscope |
| 04/22/2014 | US8707461 Scanning method for scanning a sample with a probe |
| 04/17/2014 | WO2014056879A1 Device and method for transferring a sample holder from a transport device to a scanning device |
| 04/16/2014 | CN103728469A Method utilizing high-temperature annealing to represent dislocation in GaN epitaxial layer |
| 04/16/2014 | CN103728468A Method for restraining influence of temperature drifts when scanning probe microscope scans large image |
| 04/10/2014 | WO2014054741A1 Scanning tunneling microscope and observation image display method |
| 03/27/2014 | WO2014045646A1 Scanning probe microscope and method for observing sample using same |
| 03/26/2014 | CN103675358A System and method for ex situ analysis of substrate |
| 03/20/2014 | WO2014041677A1 Force probe, measurement device, and measurement method |
| 03/20/2014 | US20140082776 Fluid Delivery for Scanning Probe Microscopy |
| 03/19/2014 | CN102680741B Metering type scanning electronic microscope imaging control system and scanning imaging method |
| 03/12/2014 | CN203479832U Scanning-transmission-image observing apparatus used for scanning electron microscope |
| 03/12/2014 | CN203479831U A soundproof box for an atomic force microscope |
| 03/12/2014 | CN103630708A Method for distinguishing Si surface from C surface of SiC (silicon carbide) wafer |
| 03/12/2014 | CN101788571B Nanomanipulation method for compounding laser near-field optical tweezers and AFM probe |
| 03/06/2014 | WO2014034489A1 Discharge member for analysis |
| 03/06/2014 | WO2014033844A1 Scanning probe microscope and measuring method using same |
| 03/05/2014 | CN102103148B Sample table for scanning electron microscope in-situ observation of stress corrosion cracking of metal material |
| 03/04/2014 | US8666165 Scanning electron microscope |