| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 07/12/1994 | US5329122 Information processing apparatus and scanning tunnel microscope |
| 07/12/1994 | US5328849 Measuring gases |
| 06/29/1994 | EP0603705A2 Image signal processing apparatus |
| 06/28/1994 | US5324947 Energy-dispersive X-ray detector and method of evacuating same |
| 06/23/1994 | WO1994014304A1 Industrial material processing electron linear accelerator |
| 06/22/1994 | EP0602058A1 Color synthesizing scanning electron microscope |
| 06/21/1994 | US5323376 Atomic scale electronic switch |
| 06/21/1994 | US5323003 Scanning probe microscope and method of observing sample by using such a microscope |
| 06/14/1994 | US5321685 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same |
| 06/14/1994 | US5321262 Electron imaging band pass analyser for a photoelectron spectromicroscope |
| 06/14/1994 | US5319960 For examining surface contours of a specimen |
| 06/07/1994 | US5319207 Imaging system for charged particles |
| 05/31/1994 | US5317533 Integrated mass storage device |
| 05/31/1994 | US5317154 Electron microscope equipped with x-ray analyzer |
| 05/31/1994 | US5317153 Scanning probe microscope |
| 05/31/1994 | US5317141 Apparatus and method for high-accuracy alignment |
| 05/25/1994 | EP0598569A1 Cathodoluminescence detector |
| 05/24/1994 | US5315113 Scanning and high resolution x-ray photoelectron spectroscopy and imaging |
| 05/24/1994 | US5314829 Method for imaging informational biological molecules on a semiconductor substrate |
| 05/17/1994 | US5313451 Information recording/reproducing apparatus with STM cantilever probe having a strain gauge |
| 05/11/1994 | EP0596529A1 Electron lens |
| 05/11/1994 | EP0596494A2 Scanning probe microscope and method of control error correction |
| 04/27/1994 | EP0593835A1 Scanning near-field optical microscope |
| 04/26/1994 | US5306919 Positioning device for scanning probe microscopes |
| 04/26/1994 | US5306918 Installation for the study or the transformation of the surface of samples placed in a vacuum or in a controlled atmosphere |
| 04/12/1994 | US5302831 Dewar construction for cooling radiation detector cold finger |
| 04/07/1994 | DE4312244A1 Multi-laser determn. of semiconductor surface defect concn. - evaluating accumulation atoms from steeply inclined portion, and dislocations from slowly declining portion of emission curve |
| 04/07/1994 | DE4233686A1 Selective optical display or marking of given atoms or mols. - uses electron flow between micro point and sample for detection to give an image signal |
| 04/07/1994 | DE4233399A1 Force microscope with cantilevered point and deflection photodetector - is based on measurement of astigmatism in compact sensor head revolvable into path of optical microscope |
| 04/06/1994 | EP0590308A2 Scanning and hig resoloution x-ray photo electron spectroscopy and imaging |
| 04/05/1994 | US5301117 Method for creating a three-dimensional corporeal model from a very small original |
| 04/05/1994 | US5300775 Method of selecting a spatial energy spread within an electron beam, and an electron beam apparatus suitable for carrying out such a method |
| 03/29/1994 | US5298975 Combined scanning force microscope and optical metrology tool |
| 03/29/1994 | US5298748 Uncooled tunneling infrared sensor |
| 03/29/1994 | US5298747 Scanning interference electron microscopy |
| 03/23/1994 | EP0588512A1 Method of and apparatus for scanning the surface of a workpiece |
| 03/22/1994 | US5296704 For investigating a surface of a sample |
| 03/16/1994 | EP0587459A1 An ultra-low force atomic force microscope |
| 03/16/1994 | EP0587165A2 Information processing apparatus having multiprobe control circuit |
| 03/08/1994 | US5293326 Ultrasonic inspection and imaging instrument |
| 03/08/1994 | US5293042 Servo circuit of scanning probe microscope |
| 03/08/1994 | US5291775 Scanning force microscope with integrated optics and cantilever mount |
| 03/02/1994 | EP0395679B1 Process and arrangement for measuring the variation of a signal at a measuring point of a specimen |
| 02/22/1994 | US5289455 Information recording and/or reproducing apparatus |
| 02/15/1994 | US5286977 Positioning device |
| 02/15/1994 | US5286974 Charged particle energy analyzers |
| 02/15/1994 | US5286651 Determining collective fluid inclusion volatiles compositions for inclusion composition mapping of earth's subsurface |
| 02/02/1994 | EP0581217A1 Near field scanning optical microscope |
| 02/01/1994 | US5283442 Surface profiling using scanning force microscopy |
| 01/29/1994 | CA2101386A1 Fine surface observing apparatus |
| 01/25/1994 | US5281909 Process and system for measuring the course of a signal at a point of measurement on a sample |
| 01/25/1994 | US5281814 System for imaging and detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance by reflection of an AC electrical signal |
| 01/18/1994 | US5280176 X-ray photoelectron emission spectrometry system |
| 01/12/1994 | EP0578228A2 Microactuator |
| 01/11/1994 | US5278704 Information processing apparatus including magnetic material having a predetermined magnetization pattern with respect to a recording medium |
| 01/11/1994 | US5278408 Instrument and method for 3-dimensional atomic arrangement observation |
| 01/11/1994 | US5278407 Secondary-ion mass spectrometry apparatus using field limiting method |
| 01/11/1994 | US5278406 Apparatus for detecting information contained in electrons emitted from sample surface |
| 01/05/1994 | EP0576972A1 Ion scattering spectroscope |
| 01/04/1994 | US5276324 Composite scanning tunneling microscope |
| 12/28/1993 | USRE34489 Atomic force microscope with optional replaceable fluid cell |
| 12/15/1993 | EP0574234A1 Automatic tip approach method and apparatus for scanning probe microscope |
| 12/15/1993 | EP0573891A1 Charged particle beam apparatus and method of operating it |
| 12/15/1993 | EP0573421A1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere. |
| 12/14/1993 | US5270214 Method for sequencing DNA base pairs |
| 12/08/1993 | EP0572972A1 Probe for scanning tunneling microscope and manufacturing method thereof |
| 12/07/1993 | US5268579 Electron beam apparatus for examining an object |
| 12/07/1993 | US5268573 System for detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance |
| 12/07/1993 | US5268571 Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same |
| 11/30/1993 | US5266897 Magnetic field observation with tunneling microscopy |
| 11/30/1993 | US5266809 Imaging electron-optical apparatus |
| 11/30/1993 | US5266802 Electron microscope |
| 11/23/1993 | US5264705 Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage |
| 11/23/1993 | US5264704 High efficiency cathodoluminescence detector with high discrimination against backscattered electrons |
| 11/16/1993 | US5262643 Automatic tip approach method and apparatus for scanning probe microscope |
| 11/16/1993 | US5262642 Scanning tunneling optical spectrometer |
| 11/09/1993 | US5260926 Atomic force microscope with a plurality of cantilevers for recording/reproducing information |
| 11/09/1993 | US5260824 Atomic force microscope |
| 11/09/1993 | US5260648 Process and system for rapid analysis of the spectrum of a signal at one or several points of measuring |
| 11/09/1993 | US5260572 Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning |
| 10/26/1993 | US5256877 Method and apparatus for imaging dislocations in materials using a scanning electron microscope |
| 10/26/1993 | US5256876 Scanning tunnel microscope equipped with scanning electron microscope |
| 10/19/1993 | US5255258 Microprobe, preparation thereof and electronic device by use of said microprobe |
| 10/19/1993 | US5254856 Charged particle beam apparatus having particular electrostatic objective lens and vacuum pump systems |
| 10/19/1993 | US5254854 Scanning microscope comprising force-sensing means and position-sensitive photodetector |
| 10/19/1993 | US5253516 Atomic force microscope for small samples having dual-mode operating capability |
| 10/13/1993 | EP0565227A1 Scanning force microscope |
| 10/12/1993 | US5252835 Machining oxide thin-films with an atomic force microscope: pattern and object formation on the nanometer scale |
| 10/06/1993 | EP0564088A1 Scanning force microscope with integrated optics and cantilever mount |
| 09/28/1993 | US5248912 Integrated scanning tunneling microscope |
| 09/22/1993 | EP0423154B1 Method and apparatus for the examination of structures on membrane surfaces |
| 09/21/1993 | US5247588 Method of image restoration |
| 09/16/1993 | WO1993018525A1 Scanning probe microscope |
| 08/31/1993 | US5241527 Recording and reproducing apparatus and method using a recording layer having a positioning region |
| 08/31/1993 | US5241186 Surface treatment method and apparatus therefor |
| 08/24/1993 | US5237859 Atomic force microscope |
| 08/18/1993 | EP0555492A1 Magnetic electron lens and electron microscope using same |
| 08/11/1993 | EP0428663B1 Process and device for rapid spectral analysis of a signal at one or more measurement points |
| 08/03/1993 | US5233191 Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process |
| 07/27/1993 | US5231286 Scanning probe microscope utilizing an optical element in a waveguide for dividing the center part of the laser beam perpendicular to the waveguide |