| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 02/10/1987 | US4642518 Installation of electron beam metalworking |
| 02/03/1987 | US4640626 Method and apparatus for localizing weak points within an electrical circuit |
| 01/21/1987 | EP0209432A1 Electron beam tester for integrated circuits |
| 12/30/1986 | EP0205760A1 Noncontact testing of integrated circuits |
| 12/17/1986 | EP0205185A2 Objective with spectrometer in the electron beam measuring technique |
| 12/17/1986 | EP0205184A2 Low aberration spectrometer objective with a high secondary electrons acceptance |
| 12/09/1986 | US4628258 Method and apparatus for electrical testing of microwired structures with the assistance of particle probes |
| 12/02/1986 | US4626689 Electron beam focusing system for electron microscope |
| 11/26/1986 | EP0202937A2 Surface analysis spectroscopy apparatus |
| 11/25/1986 | US4624835 Microcentrifugation tube for the concentration of samples for electron microscopy |
| 11/20/1986 | EP0201692A1 Method and device making use of it for the processing of a measured voltage with a band-limited processing circuit |
| 10/29/1986 | EP0199585A2 Apparatus for depositing electrically conductive and/or electrically insulating material on a workpiece |
| 10/29/1986 | EP0199573A2 Electronic mosaic imaging process |
| 10/08/1986 | EP0196804A1 Method and apparatus for testing integrated electronic device |
| 09/17/1986 | EP0194323A1 Scanning tunneling microscope |
| 09/02/1986 | US4609867 Method for measuring electrical potentials at buried solid state matter |
| 08/20/1986 | EP0191293A2 Back-scatter electrons detector |
| 08/14/1986 | WO1986004732A1 Secondary ion collection and transport system for ion microprobe |
| 08/12/1986 | US4605194 High-performance vibration filter |
| 07/30/1986 | EP0189137A2 Ultrasonic flaw detecting system |
| 07/30/1986 | EP0188961A1 Apparatus for the very high resolution microanalysis of a solid sample |
| 07/29/1986 | CA1208763A1 Scan line type dynamic observation apparatus |
| 06/18/1986 | EP0184810A2 Method of detecting a focus defect of an electron microscope image |
| 05/28/1986 | EP0182341A2 Method for recording and reproducing electron beam image information |
| 05/06/1986 | US4587458 Controlling current density |
| 05/06/1986 | US4587425 Electron beam apparatus and electron collectors therefor |
| 04/30/1986 | EP0179716A2 A secondary ion mass spectrometer |
| 04/23/1986 | EP0178431A1 Counterfield spectrometer for electron beam measurement |
| 04/16/1986 | EP0177973A2 Method of recording and reproducing images produced by an electron microscope |
| 04/16/1986 | EP0177722A1 Method and arrangement for determining the weak points within an electrical integrated circuit |
| 04/02/1986 | EP0175807A1 Apparatus for the sputtered neutral mass spectrometry |
| 02/26/1986 | EP0172470A1 Method and device for the detection and mapping of measuring points corresponding to a signal of a specific shape |
| 01/28/1986 | US4567369 Correction of astigmatism in electron beam instruments |
| 01/22/1986 | EP0168838A2 Method and apparatus for recording and reproducing electron microscope image |
| 01/14/1986 | US4564758 Process and device for the ionic analysis of an insulating sample |
| 01/08/1986 | EP0166912A1 Method for electrically testing microwirings using particle probes |
| 01/08/1986 | EP0166814A1 Method and device for detecting and displaying a measuring point which carries a voltage of at least one certain frequency |
| 12/31/1985 | US4562352 Analyzing apparatus capable of analyzing a surface at a high resolution |
| 12/03/1985 | US4556794 Secondary ion collection and transport system for ion microprobe |
| 11/19/1985 | US4554455 Potential analyzer |
| 10/23/1985 | EP0159214A1 Electron beam installation for the working of metals |
| 10/08/1985 | US4546254 Charged particle energy analyzer |
| 09/26/1985 | WO1985004250A1 Method and apparatus for precision sem measurements |
| 09/25/1985 | EP0155700A2 Apparatus for quantitative secondary ion mass spectrometry |
| 06/25/1985 | US4525652 Auxiliary-voltage source for supplying electric circuits which are at a high potential |
| 04/30/1985 | US4514682 Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe |
| 04/30/1985 | US4514634 Electron beam focussing |
| 04/09/1985 | US4510387 Ion micro-analysis |
| 04/09/1985 | US4510386 Thinning of specimens for examination under the electron microscope |
| 04/02/1985 | US4508967 Electronic optical apparatus comprising pyrolytic graphite elements |
| 03/05/1985 | US4503329 Ion beam processing apparatus and method of correcting mask defects |
| 10/23/1984 | US4479060 Apparatus for irradiation with charged particle beams |
| 10/10/1984 | EP0121309A2 Scan line type dynamic observation apparatus |
| 10/02/1984 | US4475044 Apparatus for focus-deflecting a charged particle beam |
| 09/11/1984 | US4471302 Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe |
| 08/14/1984 | US4465935 Electrically conductive sample support-mounting for secondary ion mass spectrometer analysis |
| 08/07/1984 | US4464571 Opposing field spectrometer for electron beam mensuration technology |
| 08/07/1984 | US4463763 Ultrasonic compound scanning diagnostic apparatus |
| 07/24/1984 | CA1171366A1 Phase separation of hydrocarbon liquids using liquid vortex |
| 07/17/1984 | US4460866 Method for measuring resistances and capacitances of electronic components |
| 05/09/1984 | EP0107772A1 Method of measuring the electric potential on a buried solid-state substance |
| 05/08/1984 | US4447731 Exterior view examination apparatus |
| 05/08/1984 | US4447724 Apparatus for the chemical analysis of samples |
| 05/08/1984 | US4447374 Preparing replica film of specimen for electron microscopy |
| 04/10/1984 | US4442354 Method of analyzing for a component in a sample |
| 04/03/1984 | US4440475 Electron probe microanalyzer comprising an observation system having double magnification |
| 03/20/1984 | US4438336 Corpuscular radiation device for producing an irradiation pattern on a workpiece |
| 03/13/1984 | US4437009 Scanning electron microscope or similar equipment |
| 02/22/1984 | EP0100785A1 High-performance vibration filter |
| 02/02/1984 | WO1984000443A1 Electron beam apparatus and electron collectors therefor |
| 01/24/1984 | US4427891 Variable temperature stage device for electron microscope |
| 11/22/1983 | US4417203 System for contactless electrical property testing of multi-layer ceramics |
| 11/08/1983 | US4414474 Corrector for axial aberrations in electron optic instruments |
| 10/18/1983 | US4410272 Optical spectroscope for scanning electron microscope |
| 09/20/1983 | US4405861 Secondary-electron detector for analyzing irradiated samples for scanning electron microscopes and microprobes |
| 08/17/1983 | EP0086120A1 Electron-optical apparatus comprising pyrolytic graphite elements |
| 08/04/1983 | WO1983002572A1 Sputter initiated resonance ionization spectrometry |
| 08/03/1983 | EP0084850A2 Apparatus for irradiation with charged particle beams |
| 07/26/1983 | US4395731 Television microscope surgical method and apparatus therefor |
| 07/12/1983 | US4393311 Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles |
| 07/12/1983 | US4393309 Method and apparatus for controlling the objective lens in a scanning electron microscope or the like |
| 07/05/1983 | US4392058 Electron beam lithography |
| 06/07/1983 | US4387304 Phase dependent SEM IC chip testing with voltage contrast |
| 05/24/1983 | US4385317 Specimen image display apparatus |
| 05/10/1983 | US4383172 Method and apparatus for measuring coating thicknesses on continuously moving material |
| 04/06/1983 | EP0075949A2 Ion beam processing apparatus and method of correcting mask defects |
| 04/06/1983 | EP0075716A1 Opposing field spectrometer for electron beam measuring |
| 04/06/1983 | EP0075709A2 Spectrometer for detecting secondary electrons produced by an electron probe from a target |
| 03/22/1983 | CA1143333A1 Corona discharge device |
| 01/26/1983 | EP0070351A2 Conductive sample holder for analysis in the secondary ion mass spectrometry |
| 12/08/1982 | EP0066070A1 Method and apparatus for contactless electrical testing |
| 11/09/1982 | US4358732 Synchronized voltage contrast display analysis system |
| 10/19/1982 | US4354852 Phase separation of hydrocarbon liquids using liquid vortex |
| 10/13/1982 | EP0062097A1 Method of displaying the logic status of several neighbouring modes in integrated circuits in a logic picture by using a pulsed-electron probe |
| 08/10/1982 | US4343993 Scanning tunneling microscope |
| 06/15/1982 | US4335189 Resolution standard for scanning electron microscope comprising palladium spines on a metal substrate |
| 06/15/1982 | US4334844 Replica film of specimen for electron microscopy apparatus |
| 04/07/1982 | EP0048862A1 Method of measuring resistances and capacities of electronic components |
| 03/24/1982 | EP0048013A1 Ultrasonic diagnostic apparatus |
| 03/16/1982 | US4320298 Warhead detector |