| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 10/08/1996 | US5563415 Magnetic lens apparatus for a low-voltage high-resolution electron microscope |
| 10/08/1996 | US5563411 Scanning photoelectron microscope |
| 10/03/1996 | WO1996030927A1 Combined scanning probe and scanning energy microscope |
| 10/03/1996 | CA2213970A1 Combined scanning probe and scanning energy microscope |
| 10/01/1996 | US5560244 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 09/26/1996 | DE19611779A1 Raster scan microscope with probe holding system for detachable holding of probe |
| 09/24/1996 | US5559330 Scanning tunneling microscope |
| 09/24/1996 | US5559329 Apparatus for use in measuring properties |
| 09/24/1996 | US5559328 Apparatus for analyzing samples |
| 09/19/1996 | WO1996028837A1 Hybrid control system for scanning probe microscopes |
| 09/19/1996 | WO1996028751A1 Method for particle wave reconstruction in a particle-optical apparatus |
| 09/19/1996 | WO1996028706A1 Magnetic modulation of force sensor for ac detection in an atomic force microscope |
| 09/17/1996 | US5557452 Confocal microscope system |
| 09/17/1996 | US5557156 Scan control for scanning probe microscopes |
| 09/12/1996 | WO1996027895A1 Electrochemical identification of molecules in a scanning probe microscope |
| 09/12/1996 | WO1996027894A1 A stress cell for a scanning probe microscope |
| 08/28/1996 | EP0729006A2 Information processing apparatus with probe undergoing circular motion |
| 08/27/1996 | USRE35317 Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
| 08/21/1996 | EP0727660A2 Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same |
| 08/21/1996 | EP0727659A2 Method and apparatus for analyzing minute foreign substances, and process for manufacturing semiconductor or LCD elements |
| 08/15/1996 | WO1996024946A1 Scanning probe microscope for use in fluids |
| 08/15/1996 | WO1996024819A1 Cantilever deflection sensor and use thereof |
| 08/15/1996 | WO1996024689A1 Method and apparatus for determining the sequence of polynucleotides |
| 08/14/1996 | EP0726444A1 Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof |
| 08/13/1996 | US5546374 Information recording and/or reproducing apparatus using probe |
| 08/08/1996 | WO1996024026A1 Tapping atomic force microscope with phase or frequency detection |
| 08/06/1996 | US5543614 Scanning probe microscope capable of suppressing probe vibration caused by feedback control |
| 07/30/1996 | US5540229 System and method for viewing three-dimensional echographic data |
| 07/23/1996 | US5539203 Single ion implantation system |
| 07/23/1996 | US5539197 Scanning near-field optical microscope having a medium denser than air in the gap between the probe chip and the sample being measured |
| 07/16/1996 | US5537372 High density data storage system with topographic contact sensor |
| 07/10/1996 | EP0721101A2 Method and apparatus for identifying and characterizing a material |
| 07/09/1996 | US5535185 Information recording/reproduction apparatus using probe |
| 07/09/1996 | US5533387 Method of evaluating silicon wafers |
| 07/04/1996 | WO1996020406A1 Elementary analysis method by scanning probe microscope and ultra-short pulse high-voltage application method used for said method |
| 07/02/1996 | US5532494 Treatment and observation apparatus using scanning probe |
| 06/25/1996 | US5530253 Sample stage for scanning probe microscope head |
| 06/18/1996 | US5528156 IC analysis system and electron beam probe system and fault isolation method therefor |
| 06/18/1996 | US5528033 To measure critical dimensions of a submicron device |
| 06/12/1996 | EP0715714A1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 06/11/1996 | US5525806 Focused charged beam apparatus, and its processing and observation method |
| 06/05/1996 | EP0715147A2 Microscope with aligning function |
| 05/21/1996 | US5519212 Tapping atomic force microscope with phase or frequency detection |
| 05/14/1996 | US5517033 Apparatus for improved image resolution in electron microscopy |
| 05/14/1996 | US5517027 Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
| 05/14/1996 | US5515719 Controlled force microscope for operation in liquids |
| 05/07/1996 | US5513518 For generating a signal corresponding to a scanned sample |
| 04/23/1996 | US5510615 Scanning probe microscope apparatus for use in a scanning electron microscope |
| 04/23/1996 | US5510614 Solid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatus |
| 04/16/1996 | US5508805 Interferometer, optical scanning type tunneling microscope and optical probe |
| 04/16/1996 | US5508517 Scanning probe type microscope apparatus |
| 04/09/1996 | US5506400 Scanning type probe microscope |
| 04/02/1996 | US5504366 System for analyzing surfaces of samples |
| 04/02/1996 | US5504340 Process method and apparatus using focused ion beam generating means |
| 04/02/1996 | US5503010 Directional atomic force microscope and method of observing a sample with the microscope |
| 03/26/1996 | US5502710 Image information processing apparatus |
| 03/20/1996 | EP0702204A2 A method of evaluating silicon wafers |
| 03/19/1996 | US5500535 Stress cell for a scanning probe microscope |
| 03/19/1996 | US5500527 Electron/ion microscope with improved resolution |
| 03/13/1996 | EP0701102A1 Scanning near-field optic/atomic-force microscope with observing function in liquid |
| 03/12/1996 | US5498550 Immunoassay |
| 03/05/1996 | US5497007 Method for automatically establishing a wafer coordinate system |
| 03/05/1996 | US5496999 Scanning probe microscope |
| 02/27/1996 | US5495109 Electrochemical identification of molecules in a scanning probe microscope |
| 02/15/1996 | DE4428526A1 Acoustic vibration based solid body measuring method for force spectrum determn. |
| 02/08/1996 | WO1996003641A1 Scanning probe microscope assembly |
| 02/06/1996 | US5489774 Combined atomic force and near field scanning optical microscope with photosensitive cantilever |
| 02/06/1996 | US5489339 Microelectronic processing machine |
| 01/30/1996 | US5488602 Information record/reproducing apparatus and information recording medium |
| 01/23/1996 | US5486769 Method and apparatus for measuring quantitative voltage contrast |
| 01/09/1996 | US5483064 Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy |
| 01/09/1996 | US5482002 Microprobe, preparation thereof and electronic device by use of said microprobe |
| 01/09/1996 | US5481908 Resonance contact scanning force microscope |
| 01/02/1996 | US5481528 Information processor and method using the information processor |
| 01/02/1996 | US5481521 Information recording and reproducing apparatus utilizing a tunneling current or interatomic forces |
| 12/26/1995 | US5479013 For examining a surface of a sample |
| 12/12/1995 | US5475319 Method of measuring electric charge of semiconductor wafer |
| 12/12/1995 | US5475318 Microprobe |
| 12/12/1995 | US5475316 Transportable image emission microscope |
| 12/12/1995 | US5475218 Instrument and method for 3-dimensional atomic arrangement observation |
| 12/05/1995 | US5473157 Variable temperature near-field optical microscope |
| 11/28/1995 | US5471458 Multi-probe information recording/reproducing apparatus including a probe displacement control circuit |
| 11/28/1995 | US5471064 Precision machining method, precision machining apparatus and data storage apparatus using the same |
| 11/28/1995 | US5470707 Hydrogen bond labeling and base sequence determination methods for DNA or RNA |
| 11/21/1995 | US5468959 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 11/21/1995 | US5467642 Scanning probe microscope and method of control error correction |
| 11/14/1995 | US5466935 Programmable, scanned-probe microscope system and method |
| 11/07/1995 | US5463897 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 10/31/1995 | US5463221 Electron beam measuring apparatus |
| 10/25/1995 | EP0406413B1 Scanning type tunnel microscope |
| 10/24/1995 | US5461605 Information recording/reproducing method, recording carrier and apparatus for recording and/or reproducing information on information recording carrier by use of probe electrode |
| 10/03/1995 | US5455420 Scanning probe microscope apparatus for use in a scanning electron |
| 10/03/1995 | CA2066343C Information processor |
| 09/27/1995 | EP0674170A1 Inter-atomic measurement techniques |
| 09/26/1995 | US5453970 Molecular memory medium and molecular memory disk drive for storing information using a tunnelling probe |
| 09/26/1995 | US5453616 Probe microscope having error correction piezoelectric scanner |
| 09/20/1995 | EP0672332A1 Industrial material processing electron linear accelerator |
| 09/19/1995 | US5451794 Electron beam current measuring device |
| 09/12/1995 | US5449914 Imaging electron energy filter |
| 09/12/1995 | US5449901 Fine surface observing apparatus |