| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 12/29/1997 | EP0814494A2 Ion beam machining method and device thereof |
| 12/29/1997 | EP0813675A1 Magnetic modulation of force sensor for ac detection in an atomic force microscope |
| 12/18/1997 | DE19724790A1 Remaining life-time estimation method for motor vehicle drive transmission belt |
| 12/16/1997 | US5698071 Etching aftertreatment under vacuum |
| 12/11/1997 | DE19720708A1 High-speed monitor for study of pattern defect on semiconductor wafer |
| 12/03/1997 | EP0810629A1 Electron beam apparatus |
| 12/03/1997 | EP0809858A1 Scanning probe microscope for use in fluids |
| 11/27/1997 | DE19721313A1 Test specimen critical dimension measurement system for e.g. semiconductor manufacture |
| 11/19/1997 | CN1165323A Automated non-visual method of locating periodically arranged sub-micron objects |
| 11/18/1997 | US5689063 Atomic force microscope using cantilever attached to optical microscope |
| 11/18/1997 | CA2020480C Determining collective fluid inclusion volatiles compositions for inclusion composition mapping of earth's subsurface |
| 10/29/1997 | EP0803227A1 Medical ultrasonic diagnostic imaging system with scanning guide for three dimensional imaging |
| 10/21/1997 | US5680387 Detachable sealed container enclosing an information recording/reproducing probe and a recording medium |
| 10/15/1997 | EP0801310A1 Elementary analysis method by scanning probe microscope and ultra-short pulse high-voltage application method used for said method |
| 10/14/1997 | US5677635 Voltage and displacement measuring apparatus and probe |
| 10/07/1997 | US5675154 Scanning probe microscope |
| 10/07/1997 | US5675148 Scanning reflection electron diffraction microscope |
| 10/07/1997 | US5675145 Scanning probe microscope having an optical system for enabling identification of the scanning region and sample observation during a scanning operation |
| 10/01/1997 | EP0798774A2 An automated non-visual method of locating periodicalliy arranged sub-micron objects |
| 10/01/1997 | EP0798561A1 Analytical method and device for precise analysis with a simple sensor |
| 09/30/1997 | US5672816 Large stage system for scanning probe microscopes and other instruments |
| 09/24/1997 | EP0797117A1 Optical waveguide probe and optical system |
| 09/23/1997 | US5671086 Method and apparatus for accurately manipulating an object during microelectrophoresis |
| 08/27/1997 | EP0791802A1 Scanning type near field interatomic force microscope |
| 08/26/1997 | US5661304 Multi-purpose noninterceptive charged particle beam diagnostic device using diffraction radiation and method for its use |
| 08/26/1997 | CA2047801C Information recording and/or reproducing apparatus |
| 08/05/1997 | US5654547 Method for particle wave reconstruction in a particle-optical apparatus |
| 08/05/1997 | US5654546 For examining the surface properties of a sample surface |
| 08/05/1997 | CA2052882C Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same |
| 07/29/1997 | US5652428 Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere |
| 07/29/1997 | US5652377 Scanning method with scanning probe microscope |
| 07/23/1997 | EP0785441A2 Method of producing clear potential contrast image through scanning with electron beam for diagnosis of semiconductor device and electron beam testing system used therein |
| 07/22/1997 | US5650614 Optical scanning system utilizing an atomic force microscope and an optical microscope |
| 07/17/1997 | WO1997021075A3 Device for testing flat materials |
| 07/09/1997 | EP0408602B1 Focused ion beam imaging and process control |
| 07/08/1997 | US5646731 Interferometric detecting/imaging method based on multi-pole sensing |
| 07/08/1997 | US5645066 Medical ultrasonic diagnostic imaging system with scanning guide for three dimensional imaging |
| 07/02/1997 | EP0781976A2 Method for measuring critical dimension of pattern on sample |
| 07/01/1997 | US5644512 High precision calibration and feature measurement system for a scanning probe microscope |
| 06/24/1997 | CA2053723C Recording/reproducing apparatus such as a memory apparatus |
| 06/17/1997 | US5640539 IC analysis system having charged particle beam apparatus for improved contrast image |
| 06/17/1997 | US5640012 For analysis of an energy spectrum |
| 06/12/1997 | WO1997021075A2 Device for testing flat materials |
| 06/12/1997 | DE19545340A1 Vorrichtung zur Kontrolle von Flächenmassen Apparatus for control of surface mass |
| 06/10/1997 | US5637870 Method of analysis of distribution of concentration of substrate |
| 05/27/1997 | US5633595 IC analysis system and electron beam probe system and fault isolation method therefor |
| 05/27/1997 | US5633455 Method of detecting particles of semiconductor wafers |
| 05/07/1997 | EP0715714B1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 05/06/1997 | US5627815 Precision machining method precision machining apparatus and data storage apparatus using the same |
| 05/06/1997 | US5626812 Method of producing carbon material by bending at least one carbon atom layer of graphite |
| 05/02/1997 | EP0770847A2 Method and device for measuring the distance between a gauge and a measuring surface |
| 04/29/1997 | US5625142 For examining surface contours of a specimen |
| 04/23/1997 | EP0497788B1 Examination of objects of macromolecular size |
| 04/22/1997 | US5623338 For providing near-field measurements of a workpiece |
| 04/22/1997 | US5623295 Information recording reproducing apparatus using probe |
| 04/22/1997 | US5623205 Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field |
| 04/22/1997 | US5622787 Mask for transferring a pattern for use in a semiconductor device and method of manufacturing the same |
| 04/15/1997 | US5621652 System and method for verifying process models in integrated circuit process simulators |
| 04/15/1997 | US5621211 Scanning tunneling atom-probe microscope |
| 04/15/1997 | US5621210 Microscope for force and tunneling microscopy in liquids |
| 04/08/1997 | US5619139 Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof |
| 04/08/1997 | US5619035 System for analyzing surfaces of samples |
| 04/08/1997 | US5619034 Differentiating mass spectrometer |
| 04/01/1997 | US5616921 Method of modifying an integrated circuit specimen |
| 03/25/1997 | US5614833 Method of noncontact testing of an electrical device |
| 03/19/1997 | EP0763847A2 Electron microscope |
| 03/18/1997 | US5612626 System using induced current for contactless testing of wiring networks |
| 03/18/1997 | US5612491 Formation of a magnetic film on an atomic force microscope cantilever |
| 03/11/1997 | US5610898 Information recording/reproducing method for recording and/or reproducing information on information recording carrier by use of probe electrode |
| 03/06/1997 | WO1997008733A1 A scanning probe microscope having automatic probe exchange and alignment |
| 03/06/1997 | WO1997008732A1 Precision-controlled slit mechanism for electron microscope |
| 03/05/1997 | EP0760109A1 Method for particle wave reconstruction in a particle-optical apparatus |
| 02/26/1997 | EP0759537A2 A scanning force microscope with optical device |
| 02/25/1997 | US5606261 Retarding field electron-optical apparatus |
| 02/11/1997 | US5601982 Method and apparatus for determining the sequence of polynucleotides |
| 02/06/1997 | WO1997004452A1 Recording medium, information reproducing device, information recording device, and information recording/reproducing device |
| 02/06/1997 | WO1997004449A1 Nanometer scale data storage device and associated positioning system |
| 01/29/1997 | CN1141501A High speed ashing method |
| 01/22/1997 | EP0754289A1 Cantilever deflection sensor and use thereof |
| 01/15/1997 | EP0753824A1 Recording/reproducing apparatus and method for recording/reproducing information using probe |
| 01/15/1997 | EP0753736A2 Contamination evaluating apparatus |
| 01/07/1997 | US5591970 Charged beam apparatus |
| 12/31/1996 | US5589780 IC Analysis system and electron beam probe system and fault isolation method therefor |
| 12/31/1996 | US5589686 Method of an apparatus for real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
| 12/27/1996 | EP0750298A2 Probe and recording medium for information recording apparatus, and information recording apparatus utilizing the same |
| 12/24/1996 | US5587523 Atomic force microscope employing beam tracking |
| 12/19/1996 | WO1996041362A1 Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes |
| 12/17/1996 | US5585722 Apparatus for measuring physical properties of micro area |
| 12/11/1996 | EP0746857A1 Scanning probe microscope |
| 12/10/1996 | US5583446 For measuring high speed signals with a low speed measurement instrument |
| 12/10/1996 | US5583344 Process method and apparatus using focused ion beam generating means |
| 12/03/1996 | US5581537 Information record/reproducing apparatus and information recording medium |
| 12/03/1996 | US5581193 Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra |
| 12/03/1996 | US5581083 Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like |
| 12/03/1996 | US5581082 Combined scanning probe and scanning energy microscope |
| 11/26/1996 | CA2020635C Obtaining collective fluid inclusion volatiles for inclusion composition mapping of earth's subsurface |
| 11/14/1996 | WO1996035943A1 Data acquisition and control apparatus for scanning probe systems |
| 10/30/1996 | EP0740333A2 High speed ashing method |
| 10/29/1996 | US5569918 Probe holder and probe mounting method for a scanning probe microscope |
| 10/09/1996 | EP0736746A1 Method of using scanning probe microscope permitting cleaning of probe microscope or of probe tip in ambient atmosphere |