| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 04/10/1991 | EP0421437A2 Scanning tunneling microscope having proper servo control function |
| 04/10/1991 | EP0421355A2 Scanning tunneling microscope |
| 04/10/1991 | EP0421354A2 Scanning tunneling microscope |
| 04/10/1991 | EP0366746A4 A variable temperature scanning tunneling microscope |
| 04/04/1991 | WO1991004507A1 Examination of objects of macromolecular size |
| 04/02/1991 | US5004927 Process for forming a fine pattern having a high aspect ratio |
| 04/02/1991 | US5004920 Method of preparing membrane filters for transmission electron microscopy |
| 04/02/1991 | US5003815 Spectroscopic apparatus |
| 03/26/1991 | US5003172 Examining object |
| 03/21/1991 | WO1991003733A1 Method and apparatus for imaging dislocations in materials using a scanning electron microscope |
| 03/13/1991 | EP0416882A2 Information storage, accessing and processing |
| 03/12/1991 | US4999495 Scanning tunneling microscope |
| 03/12/1991 | US4998788 Reflection electron holography apparatus |
| 03/06/1991 | EP0415762A2 High speed information system utilizing scanning tunneling microscopy in conjunction with a modulated light source |
| 03/06/1991 | EP0415672A2 Method for exploring the earth's subsurface |
| 03/01/1991 | CA2022213A1 High speed information system utilizing scanning tunneling microscopy in conjunction with a modulated light source |
| 02/12/1991 | US4992728 Electrical probe incorporating scanning proximity microscope |
| 02/12/1991 | US4992662 Scanning |
| 02/12/1991 | US4992659 Near-field lorentz force microscopy |
| 01/30/1991 | EP0410618A2 Method for visualizing the base sequence of nucleic acid polymers |
| 01/30/1991 | EP0410131A1 Near-field Lorentz force microscopy |
| 01/29/1991 | US4988872 Electron probe microanalyzer having wavelength-dispersive x-ray spectrometer and energy-dispersive x-ray spectrometer |
| 01/29/1991 | US4988871 Gas partial pressure sensor for vacuum chamber |
| 01/16/1991 | EP0408062A2 Surface treatment method and apparatus therefor |
| 01/16/1991 | EP0407460A1 An integrated mass storage device. |
| 01/15/1991 | US4985627 Spin-polarized scanning tunneling microscope |
| 01/09/1991 | EP0406413A1 Scanning type tunnel microscope |
| 01/08/1991 | US4983833 Device for the detecting of charged secondary particles |
| 01/08/1991 | US4983540 Ultrafine ion beam, semiconductors, optoelectronic integrated circuits |
| 01/02/1991 | EP0404799A1 Integrated scanning tunneling microscope. |
| 01/01/1991 | US4982090 Method and apparatus for the quantitative, depth differential analysis of solid samples with the use of two ion beams |
| 12/25/1990 | US4980639 Method and apparatus for testing integrated electronic device |
| 12/18/1990 | US4978908 Scanning electron microscope based parametric testing method and apparatus |
| 12/13/1990 | WO1990015340A1 Process and device for rapid spectral analysis of a signal at one or more measurement points |
| 12/12/1990 | EP0401852A2 Surface microscope |
| 12/12/1990 | EP0401658A1 Scanning tunneling microscope with arrangements for detecting electrons coming from the sample |
| 12/11/1990 | US4977328 Method of detecting a marker provided on a specimen |
| 12/05/1990 | EP0400541A1 Atomic probe type microscope apparatus |
| 12/04/1990 | US4975578 Method and apparatus for determining distribution of mass density |
| 11/27/1990 | US4973842 Lens system for a photo ion spectrometer |
| 11/22/1990 | EP0397799A1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same. |
| 11/20/1990 | US4972142 Automatic frequency follow-up in particle beam metrology upon employment of a modulated primary beam |
| 11/14/1990 | EP0396843A2 Gas partial pressure sensor for vacuum chamber |
| 11/13/1990 | US4969978 Electrolytic cells |
| 11/06/1990 | US4968390 Electrodeposition using scanning electrochemical microscope |
| 11/06/1990 | CA1275801C Optical proximity imaging method and apparatus |
| 10/31/1990 | EP0394995A2 Information record/reproducing apparatus and information recording medium |
| 10/31/1990 | EP0394962A2 Atomic force microscope |
| 10/30/1990 | US4967078 Rutherford backscattering surface analyzer with 180-degree deflecting and focusing permanent magnet |
| 10/24/1990 | EP0393305A2 Method and apparatus for determining distribution of mass density |
| 10/24/1990 | EP0275306B1 Multipurpose gaseous detector device for electron microscopes |
| 10/10/1990 | EP0391040A2 Absorption microcopy and/or spectroscopy with scanning microscopy control |
| 10/09/1990 | US4962516 Method and apparatus for state analysis |
| 10/09/1990 | US4962480 Memory reading apparatus |
| 10/03/1990 | EP0390118A2 Field emission scanning electron microsope and method of controlling beam aperture angle |
| 10/03/1990 | EP0389952A2 A photoelectron microscope |
| 10/02/1990 | US4961003 Scanning electron beam apparatus |
| 09/25/1990 | US4959544 Energy analyzer |
| 09/19/1990 | EP0388023A2 Atomic force microscope with optional replaceable fluid cell |
| 09/18/1990 | US4958079 Detector for scanning electron microscopy apparatus |
| 09/07/1990 | WO1990010304A1 Method and apparatus for specific spectroscopic atomic imaging using complementary wavelength specific photon biasing with electronic and temperature biasing on a scanning tunneling microscope |
| 09/05/1990 | EP0385553A1 Method of detecting a marker provided on a specimen |
| 09/04/1990 | US4954712 Specimen retaining ring system for an electron microscope |
| 08/29/1990 | EP0384809A1 Process and apparatus for inspecting the crystallographic quality of objects with a monocrystalline structure by generation of Kikuchi pseudolines in a surrounding atmosphere |
| 08/28/1990 | US4952857 Scanning micromechanical probe control system |
| 08/22/1990 | EP0383182A2 Probe unit |
| 08/07/1990 | US4947042 Tunnel unit and scanning head for scanning tunneling microscope |
| 08/01/1990 | EP0379739A2 Device for determining the point of impact on a target of a charged-particles beam |
| 07/31/1990 | US4945236 Direct imaging type SIMS instrument having TOF mass spectrometric mode |
| 07/18/1990 | EP0378237A2 Reflection electron holography apparatus |
| 07/17/1990 | US4942300 Electron beam image recording using stimulable phosphor sheet of reduced thickness and/or with no protective layer |
| 07/17/1990 | US4942299 Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy |
| 07/17/1990 | US4941753 Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control |
| 07/04/1990 | EP0376045A2 Method and apparatus for processing a fine pattern |
| 07/03/1990 | US4939364 Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method |
| 07/03/1990 | US4939363 Scanning tunneling microscope |
| 06/20/1990 | EP0373742A2 Tunnel unit and scanning head for scanning tunneling microscope |
| 06/19/1990 | US4935634 Atomic force microscope with optional replaceable fluid cell |
| 06/19/1990 | US4935625 Electron holography apparatus |
| 06/12/1990 | US4933552 For analyzing a sample |
| 05/30/1990 | EP0370323A2 High resolution image compression methods and apparatus |
| 05/30/1990 | EP0370276A1 Device for detecting charged secondary particles |
| 05/29/1990 | US4929836 Focusing in instruments, such as SEMs and CRTs |
| 05/29/1990 | US4929041 Cathodoluminescence system for use in a scanning electron microscope including means for controlling optical fiber aperture |
| 05/22/1990 | US4928016 Magazine for accommodating recording medium for electron microscope |
| 05/15/1990 | US4926054 Objective lens for focusing charged particles in an electron microscope |
| 05/09/1990 | EP0366746A1 A variable temperature scanning tunneling microscope |
| 05/08/1990 | US4924093 In a scintillation counting method |
| 05/08/1990 | US4924091 Scanning ion conductance microscope |
| 04/11/1990 | EP0362498A1 Inspection system utilizing retarding field back scattered electron collection |
| 04/04/1990 | EP0361932A2 Scanning tunnel-current-detecting device and method |
| 04/03/1990 | US4914293 Microscope apparatus |
| 04/03/1990 | US4912822 Method of making an integrated scanning tunneling microscope |
| 03/27/1990 | US4912405 Magnetic lens and electron beam deflection system |
| 03/27/1990 | US4912327 Pulsed microfocused ion beams |
| 03/27/1990 | US4912326 Direct imaging type SIMS instrument |
| 03/13/1990 | US4908519 Loading mechanism and support structure having improved vibration damping useful in scanning tunneling microscopy |
| 03/06/1990 | US4907287 Image correction system for scanning electron microscope |
| 03/06/1990 | US4907195 Method of and system for atomic scale recording of information |
| 03/06/1990 | US4906840 Integrated scanning tunneling microscope |