G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices

Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691)
12/2004
12/28/2004	US6834537 Optical microcantilever
12/23/2004	US20040256552 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
12/21/2004	US6834158 Pinhole defect repair by resist flow
12/21/2004	US6833719 Apparatus for evaluating electrical characteristics
12/21/2004	US6833550 Electron microscope
12/21/2004	US6833546 Scanning electron microscope
12/16/2004	WO2002071031B1 Total release method for sample extraction from a charged particle instrument
12/16/2004	US20040253816 High resolution patterning method
12/16/2004	US20040250608 Removable probe sensor assembly and scanning probe microscope
12/09/2004	US20040248318 Apparatus for microfluidic processing and reading of biochip arrays
12/09/2004	US20040245224 Nanospot welder and method
12/09/2004	US20040244672 Substituted donor atoms in silicon crystal for quantum computer
12/08/2004	EP1484768A1 Non-destructive determination of machining induced surface defects on metal parts by evanescent microwave microscopy
12/08/2004	EP1483595A2 High resolution scanning magnetic microscope operable at high temperature
12/07/2004	US6828804 Method of measuring electrical capacitance
12/07/2004	US6828800 Single-molecule detector
12/07/2004	US6828571 Apparatus and methods of controlling surface charge and focus
12/07/2004	US6828554 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same
12/02/2004	WO2004023490A3 Fluid delivery for scanning probe microscopy
12/02/2004	US20040243320 Visual inspection and verification system
12/02/2004	US20040240493 Ultraviolet laser-generating device and defect inspection apparatus and method therefor
12/02/2004	US20040239318 High resolution scanning magnetic microscope operable at high temperature
12/02/2004	US20040238740 Scanning device and method including electric charge movement
12/02/2004	US20040238739 Portable scanning electron microscope
12/01/2004	EP1481279A2 Multi-detector microscopic inspection system
11/2004
11/30/2004	US6825468 Fine stencil structure correction device
11/30/2004	US6825467 Apparatus for scanning a crystalline sample and associated methods
11/25/2004	WO2004102601A2 Nanopost welder and method
11/25/2004	US20040232321 Scanning near-field optical microscope
11/23/2004	US6822260 Linewidth measurement structure with embedded scatterometry structure
11/23/2004	US6822246 Ribbon electron beam for inspection system
11/23/2004	US6822232 Electronic microscope observation system and observation method
11/18/2004	WO2004099712A2 Nanomanipulation on a sample surface using atomic force microscopy
11/18/2004	US20040227525 Non-destructive determination of machining induced surface defects on metal parts
11/18/2004	US20040227100 Vibration-Isolating Coupling Including An Elastomer Diaphragm For Scanning Electron Microscope And The Like
11/18/2004	US20040227081 Electron beam apparatus
11/18/2004	US20040227080 Particle detectors
11/18/2004	US20040227076 Scanning probe microscope
11/18/2004	DE10317894A1 Fokussiersystem für geladene Teilchen, Elektronenmikroskopiesystem und Elektronenmikroskopieverfahren Focusing of charged particles, electron microscopy and electron microscopy system method
11/16/2004	US6819649 Electroluminescent multilayer optical information storage medium with integrated readout and compositions of matter for use therein
11/16/2004	US6818907 Surface plasmon enhanced illumination system
11/16/2004	US6818891 Sensing mode atomic force microscope
11/11/2004	WO2004097890A2 Objective lens arrangement for use in a charged particle beam column
11/11/2004	WO2004057303A3 Fully digital controller for cantilever-based instruments
11/11/2004	US20040222377 Patterned wafer inspection method and apparatus therefor
11/10/2004	EP1474546A2 High resolution patterning method
11/10/2004	CN1545485A Substituted donor atoms in silicon crystal for quantum computer
11/09/2004	US6816806 Method of characterizing a semiconductor surface
11/09/2004	US6816451 Recovering recorded information from an optical disk
11/09/2004	US6815678 Raster electron microscope
11/09/2004	US6815676 Material defect evaluation apparatus using positron and its evaluation method
11/04/2004	WO2004095500A2 Vacuum chamber with recessed viewing tube and imaging device situated therein
11/04/2004	WO2004038504A3 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication
11/04/2004	US20040219445 Heat coupling of a recording media to heat source; patterning; computer control
11/04/2004	US20040218507 AFM-based data storage and microscopy
11/04/2004	US20040217304 Method of exposing a target to a charged particle beam
11/04/2004	US20040217298 Inventory control
11/04/2004	US20040217288 Microstructured pattern inspection method
11/04/2004	US20040217287 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus
11/04/2004	US20040216518 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
11/04/2004	US20040216517 Augmenting reality system for real-time nanomanipulation using atomic force microscopy
11/02/2004	US6812462 Dual electron beam instrument for multi-perspective
11/02/2004	US6812461 Photocathode source for e-beam inspection or review
11/02/2004	US6812460 Nano-manipulation by gyration
11/02/2004	US6810721 Submerged sample observation apparatus and method
10/2004
10/28/2004	WO2004092712A1 Molecule detecting method, molecule counting method, molecule localization detecting method, molecule detection device used for them
10/28/2004	US20040213443 Model-based fusion of scanning probe microscopic images for detection and identificaton of molecular structures
10/28/2004	US20040211919 Convergent charged particle beam apparatus and inspection method using same
10/28/2004	US20040211913 Objective lens arrangement for use in a charged particle beam column
10/28/2004	US20040211899 Sample electrification measurement method and charged particle beam apparatus
10/28/2004	DE202004012130U1 Quadrupole measuring device, for measurements at a probe surface under ultra-high vacuum conditions, has moveable electrode carrier supporting four convex electrodes, which is driven by single piezo-actuator
10/27/2004	CN1541287A High surface quality GaN wafer and method of fabricating same
10/26/2004	US6810354 Image reconstruction method
10/26/2004	US6809324 Scanning device, especially for detecting fluorescent light
10/26/2004	US6809322 Environmental scanning electron microscope
10/26/2004	US6809319 Electron beam writing equipment and electron beam writing method
10/26/2004	US6809316 Electrospray ionization mass analysis apparatus and system thereof
10/26/2004	US6809306 Scanning unit and scanning microscope having the same
10/21/2004	US20040206903 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
10/21/2004	US20040206166 Fully digital controller for cantilever-based instruments
10/20/2004	EP1469503A2 Electron microscopy system and method and focusing system for charged particles
10/20/2004	EP1469306A1 Inspection device using scanning electron microscope
10/20/2004	EP1468437A2 Electrostatic manipulating apparatus
10/19/2004	US6805390 Nanotweezers and nanomanipulator
10/19/2004	CA2188848C Analytical method and device for precise analysis with a simple sensor
10/14/2004	WO2004067162A3 Apparatus for microfluidic processing and reading of biochip arrays
10/14/2004	US20040200960 High contrast inspection and review of magnetic media and heads
10/14/2004	DE10297054T5 Messkopf für ein Rasterkraftmikroskop und weitere Anwendungen Probe for an atomic force microscope and other applications
10/12/2004	US6803584 Electron beam control device
10/12/2004	US6803573 Scanning electron microscope
10/12/2004	US6803572 Apparatus and methods for secondary electron emission microscope with dual beam
10/12/2004	US6803571 Method and apparatus for dual-energy e-beam inspector
10/12/2004	US6803570 Electron transmissive window usable with high pressure electron spectrometry
10/12/2004	US6802549 Nanotweezers and nanomanipulator
10/07/2004	WO2004052489A3 Methods for assembly and sorting of nanostructure-containing materials and related articles
10/07/2004	US20040195523 Device for reducing the impact of distortions in a microscope
10/07/2004	US20040195522 Charged particle beam microscope with minicolumn
10/06/2004	EP1464618A1 Sharp end, multi-layer carbon nano-tube radial aggregate and method of manufacturing the aggregate
10/06/2004	CN1535470A Adjustable conductance limiting aperture for ion implanters
10/05/2004	US6799464 Macroscopic model of scanning force microscope

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