| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 10/19/2005 | EP1513954A4 Device and method of use for detection and characterization of pathogens and biological materials |
| 10/19/2005 | CN1685195A Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
| 10/18/2005 | US6956212 Electron microscope observation system and observation method |
| 10/18/2005 | US6956211 Charged particle beam apparatus and charged particle beam irradiation method |
| 10/18/2005 | US6956210 Methods for preparing samples for atom probe analysis |
| 10/13/2005 | WO2005095922A1 Nanogap series substance capturing, detecting and identifying method and device |
| 10/13/2005 | US20050223785 Scanning probe device and processing method by scanning probe |
| 10/12/2005 | CN1682315A Sensor with suspending arm and optical resonator |
| 10/11/2005 | US6954267 Device for measuring surface defects |
| 10/11/2005 | US6953944 Scanning device and method including electric charge movement |
| 10/11/2005 | US6953939 Testing apparatus using scanning electron microscope |
| 10/11/2005 | US6953927 Method and system for scanning apertureless fluorescence microscope |
| 10/06/2005 | US20050217354 Scanning probe microscope |
| 10/05/2005 | EP1582856A1 Scanning type probe microscope, and method of observing changes in molecular structure |
| 10/05/2005 | EP1342049B1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 10/04/2005 | US6952651 Measuring the distance between labeled nucleotides, such as nucleotides labeled with bulky groups |
| 10/04/2005 | US6952492 Method and apparatus for inspecting a semiconductor device |
| 10/04/2005 | US6951695 Lapping, mechanical polishing, and reducing internal stress of a gallium, aluminum and indium nitride wafer by thermal annealing or chemical etching; crystallographic plane surfaces |
| 10/04/2005 | US6951130 Software synchronization of multiple scanning probes |
| 10/04/2005 | US6951129 Scanning probe microscope with improved probe head mount |
| 09/29/2005 | US20050214509 Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 09/29/2005 | US20050214452 Method and apparatus for depositing material with high resolution |
| 09/29/2005 | US20050212529 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 09/29/2005 | US20050211927 Method and apparatus for processing a micro sample |
| 09/29/2005 | US20050211921 Electron beam exposure system |
| 09/29/2005 | US20050210966 Scanning probe microscope and measuring method by means of the same |
| 09/29/2005 | DE102004012520A1 Punktquelle für Elektronen-Feldemissionen mit lokaler Abschirmung Point source for electron field emission with local shielding |
| 09/27/2005 | US6950385 Information recording apparatus |
| 09/27/2005 | US6950179 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/27/2005 | US6949744 Electron microscopy system, electron microscopy method and focusing system for charged particles |
| 09/22/2005 | US20050206877 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/22/2005 | US20050205805 Scratch repairing processing method and scanning probe microscope (SPM) used therefor |
| 09/22/2005 | US20050205783 Electron beam apparatus and device manufacturing method using same |
| 09/22/2005 | US20050205782 Method and an apparatus of an inspection system using an electron beam |
| 09/22/2005 | DE102004058483A1 Vorrichtung zur Untersuchung von Produkten auf Fehler, Messfühler-Positionierverfahren und Messfühler-Bewegungsverfahren An apparatus for investigating products for errors, sensor-positioning method and probe-moving method |
| 09/21/2005 | CN1672011A 扫描探针显微镜 SPM |
| 09/20/2005 | US6946657 Electron microscopy system |
| 09/20/2005 | US6946656 Sample electrification measurement method and charged particle beam apparatus |
| 09/20/2005 | US6946655 Spot grid array electron imaging system |
| 09/20/2005 | US6946654 Collection of secondary electrons through the objective lens of a scanning electron microscope |
| 09/20/2005 | US6945100 Scanning probe microscope with improved probe tip mount |
| 09/15/2005 | WO2005086172A1 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 09/15/2005 | WO2005085801A1 Method and apparatus for detection of biomolecular interaction using near-field light |
| 09/15/2005 | US20050200841 Detection of defects in patterned substrates |
| 09/15/2005 | US20050199828 Method and apparatus for processing a micro sample |
| 09/15/2005 | US20050199047 Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
| 09/14/2005 | EP1575058A1 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 09/14/2005 | EP1573299A2 Fully digital controller for cantilever-based instruments |
| 09/13/2005 | US6943352 Particle detectors |
| 09/13/2005 | US6943351 Multi-column charged particle optics assembly |
| 09/13/2005 | US6943350 Methods and apparatus for electron beam inspection of samples |
| 09/13/2005 | US6943349 Multi beam charged particle device |
| 09/13/2005 | US6943043 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 09/09/2005 | WO2005083717A1 Scanning probe microscope |
| 09/08/2005 | US20050194534 Method of operating a probe microscope |
| 09/08/2005 | DE102004043191A1 Rastersondenmikroskop A scanning probe microscope |
| 09/07/2005 | EP1571691A2 Point source for electron field emission with local shielding. |
| 09/07/2005 | EP1570514A2 Integrated circuit and methods of measurement and preparation of measurement structure |
| 09/07/2005 | EP1569733A2 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 09/07/2005 | CN1666312A Software synchronization of multiple scanning probes |
| 09/06/2005 | US6940069 Pattern inspection method and apparatus using electron beam |
| 09/01/2005 | WO2004095500A8 Vacuum chamber with recessed viewing tube and imaging device situated therein |
| 09/01/2005 | US20050190684 Nanometer scale data storage device and associated positioning system |
| 09/01/2005 | US20050190439 Thermal lens microscope device |
| 09/01/2005 | US20050189491 Deconvolving far-field images using scanned probe data |
| 09/01/2005 | US20050189490 Scanning probe microscopy and method of measurement by the same |
| 09/01/2005 | US20050188752 Digital control of quality factor in resonant systems including cantilever based instruments |
| 08/31/2005 | CN1662662A Nucleic acid sequencing by signal stretching and data integration |
| 08/30/2005 | US6936981 Retarding electron beams in multiple electron beam pattern generation |
| 08/30/2005 | US6936826 Vibration-isolating coupling including an elastomer diaphragm for scanning electron microscope and the like |
| 08/30/2005 | US6936819 semiconductor wafer chips; scanning electron microscope |
| 08/30/2005 | US6936818 Charged particle beam apparatus |
| 08/30/2005 | US6936816 High contrast inspection and review of magnetic media and heads |
| 08/30/2005 | US6935167 Harmonic cantilevers and imaging methods for atomic force microscopy |
| 08/25/2005 | US20050184237 Charged particle beam apparatus |
| 08/23/2005 | US6933499 Electron microscope, method for operating the same, and computer-readable medium |
| 08/23/2005 | US6932919 Dye loaded zeolite material |
| 08/18/2005 | US20050182595 Micropattern shape measuring system and method |
| 08/18/2005 | US20050178966 Light weight portable scanning electron microscope |
| 08/18/2005 | US20050178965 Scanning electron microscope |
| 08/17/2005 | EP1563275A2 Nanomotion sensing system and method |
| 08/17/2005 | CN1656236A Device and method of use for detection and characterization of pathogens and biological materials |
| 08/17/2005 | CN1656035A Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 08/16/2005 | US6930502 Method using conductive atomic force microscopy to measure contact leakage current |
| 08/16/2005 | US6930479 High resolution scanning magnetic microscope operable at high temperature |
| 08/16/2005 | US6930309 Dual-energy electron flooding for neutralization of charged substrate |
| 08/16/2005 | US6930308 SEM profile and surface reconstruction using multiple data sets |
| 08/16/2005 | US6929934 apparatus for imaging an object, comprising a probe via which an assay component may be delivered; a sensor to detect ion current; and means for controlling the position of the probe relative to the object in response to the ion current |
| 08/16/2005 | US6928863 Apparatus and method for isolating and measuring movement in a metrology apparatus |
| 08/11/2005 | US20050172703 Scanning probe microscopy inspection and modification system |
| 08/09/2005 | US6927391 Method and apparatus for processing a micro sample |
| 08/02/2005 | US6924494 Method of exposing a target to a charged particle beam |
| 08/02/2005 | US6924489 Device for reducing the impact of distortions in a microscope |
| 08/02/2005 | US6924484 Void characterization in metal interconnect structures using X-ray emission analyses |
| 08/02/2005 | US6924482 Method of inspecting pattern and inspecting instrument |
| 08/02/2005 | US6924481 Scanning microscope with brightness control |
| 07/28/2005 | US20050161600 Sample electrification measurement method and charged particle beam apparatus |
| 07/28/2005 | US20050160802 SPM cantilever and fabricating method thereof |
| 07/27/2005 | EP1556881A2 Electron beam exposure system |
| 07/27/2005 | EP1556737A2 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication |