| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 02/28/2008 | US20080048699 Defective product inspection apparatus, probe positioning method and probe moving method |
| 02/28/2008 | US20080048115 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 02/28/2008 | US20080048114 Scanning Type Probe Microscope |
| 02/28/2008 | US20080047334 Scanning Microscope With Shape Correction Means |
| 02/27/2008 | CN101131908A Transmission electron microscope slide glass for nano material in-situ structure property test |
| 02/26/2008 | US7334460 Method and apparatus of manipulating a sample |
| 02/21/2008 | WO2008019679A1 Apparatus and a method for examining a specimen with a probe microscope |
| 02/21/2008 | US20080042074 Charged particle beam apparatus and charged particle beam irradiation method |
| 02/19/2008 | US7333191 Scanning probe microscope and measurement method using the same |
| 02/14/2008 | WO2008017322A1 Thermal coupling apparatus |
| 02/12/2008 | US7329889 Electron beam apparatus and method with surface height calculator and a dual projection optical unit |
| 02/12/2008 | US7329868 Charged particle beam apparatus |
| 02/07/2008 | WO2008015428A1 Scanning ion conductance microscopy for the investigation of living cells |
| 02/06/2008 | EP1883932A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 01/31/2008 | WO2008013268A1 Scanning type probe microscope, and its probe relative-position measuring method |
| 01/31/2008 | WO2008011849A1 Method for operating a measuring arrangement having a scanning probe microscope device and a measuring arrangement |
| 01/29/2008 | USRE40039 Aromatic polyamide resin moldings, production methods thereof, and magnetic recording medium produced therefrom |
| 01/29/2008 | US7325206 Electronic design for integrated circuits based process related variations |
| 01/29/2008 | US7323684 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 01/24/2008 | US20080017809 Scanning Probe Microscope System |
| 01/23/2008 | EP1881317A1 Scanning probe microscope system |
| 01/23/2008 | EP1427983A4 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 01/23/2008 | EP1404902A4 High surface quality gan wafer and method of fabricating same |
| 01/23/2008 | CN101109675A Virus example and its preparing method used for AFM research |
| 01/22/2008 | US7321125 Transverse magnetic field voltage isolator |
| 01/17/2008 | WO2007011405A3 Device and method of use for detection and characterization of microorganisms and microparticles |
| 01/17/2008 | US20080011852 Laser-based method and system for processing targeted surface material and article produced thereby |
| 01/17/2008 | US20080011067 Fully digitally controller for cantilever-based instruments |
| 01/17/2008 | DE112006000456T5 Abtastsondenmikroskop-Feinbewegungsmechanismus und Abtastsondenmikroskop, welches dergleichen verwendet Scanning probe fine movement mechanism and scanning probe microscope which utilizes the like |
| 01/17/2008 | DE112006000419T5 Abtastsondenmikroskop-Versatzerfassungsmechanismus und Abtastsondenmikroskop, welches dergleichen verwendet Scanning probe displacement detection mechanism and scanning probe microscope, which uses like |
| 01/15/2008 | US7319528 Surface texture measuring instrument |
| 01/15/2008 | US7319527 Sensor with cantilever and optical resonator |
| 01/15/2008 | US7318907 Apparatus for use in the detection of preferential particles in sample |
| 01/10/2008 | WO2008003796A1 Method for using an atomic force microscope |
| 01/09/2008 | EP1876437A1 Scanning stage for scanning probe microscope |
| 01/03/2008 | WO2004053920A3 Humidified imaging with an environmental scanning electron microscope |
| 01/01/2008 | US7315367 Defining a pattern on a substrate |
| 01/01/2008 | US7313948 Real time detection of loss of cantilever sensing loss |
| 12/27/2007 | WO2007149534A2 Methods of polarization engineering and their applications |
| 12/27/2007 | WO2007109777A3 Stiffness tomography by atomic force microscopy |
| 12/21/2007 | WO2007041556A3 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 12/20/2007 | US20070290697 Microstructured pattern inspection method |
| 12/18/2007 | US7309863 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 12/13/2007 | US20070285078 Probe microscope and measuring method using probe microscope |
| 12/06/2007 | WO2007121208A3 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 12/05/2007 | CN101083151A Probe position control system and method |
| 12/04/2007 | US7305015 Ultraviolet laser-generating device and defect inspection apparatus and method therefor |
| 11/29/2007 | WO2007135345A1 Controlled atomic force microscope |
| 11/29/2007 | US20070272005 Probe position control system and method |
| 11/29/2007 | CA2653116A1 Controlled atomic force microscope |
| 11/27/2007 | US7301336 Magnetic field generator device for calibration of magnetic force microscope |
| 11/27/2007 | US7301146 Probe driving method, and probe apparatus |
| 11/22/2007 | US20070266780 Scanning Probe Microscope |
| 11/20/2007 | US7297946 Automated nanoassembly |
| 11/20/2007 | US7297945 Defective product inspection apparatus, probe positioning method and probe moving method |
| 11/20/2007 | US7297568 Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same |
| 11/13/2007 | US7295495 XY platform device with nanoscale precision |
| 11/13/2007 | US7294835 Scanning electron microscope |
| 11/08/2007 | WO2007127817A1 Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument |
| 11/07/2007 | CN100347842C Integrated circuit and method of measurement and preparation of measurement structure |
| 11/01/2007 | US20070253001 Three-Dimensional Shape Measuring Unit, Processing Unit, and Semiconductor Device Manufacturing Method |
| 11/01/2007 | US20070251305 Method and Apparatus for Reducing Lateral Interactive Forces During Operation of a Probe-Based Instrument |
| 10/30/2007 | US7289215 Image control in a metrology/inspection positioning system |
| 10/30/2007 | US7288774 Transverse magnetic field voltage isolator |
| 10/30/2007 | US7288348 Color toner |
| 10/25/2007 | WO2007121208A2 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 10/23/2007 | US7285792 Scratch repairing processing method and scanning probe microscope (SPM) used therefor |
| 10/18/2007 | WO2007117179A1 Method for obtaining a high resolution image |
| 10/18/2007 | WO2007116254A1 Method and apparatus for use in real-time nanometer and subnanometer position measurements |
| 10/17/2007 | EP1845361A1 Surface position measuring method and surface position measuring device |
| 10/17/2007 | EP1844475A1 Near-field antenna |
| 10/17/2007 | EP1844313A1 Optical fiber probe, optical detection device, and optical detection method |
| 10/16/2007 | US7282722 Charged particle beam apparatus and charged particle beam irradiation method |
| 10/11/2007 | US20070239308 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 10/11/2007 | US20070234786 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 10/04/2007 | US20070233413 Signal processing method and apparatus for use in real-time subnanometer scale position measurements with the aid of probing sensors and beams scanning periodically undulating surfaces such as gratings and diffraction patterns generated thereby, and the like |
| 10/04/2007 | US20070231795 Methods and apparatus for nucleic acid sequencing by signal stretching and data integration |
| 10/04/2007 | US20070227273 Integrated system for simultaneous inspection and manipulation |
| 10/03/2007 | EP1177153B1 Bulk synthesis of long nanotubes of transition metal chalcogenides |
| 09/27/2007 | WO2007109777A2 Stiffness tomography by atomic force microscopy |
| 09/27/2007 | US20070225851 Optical metrology model optimization for process control |
| 09/27/2007 | US20070222991 Image control in a metrology/inspection positioning system |
| 09/27/2007 | US20070221846 Scanning electron microscope |
| 09/27/2007 | US20070220958 Optical detection alignment/tracking method and apparatus |
| 09/25/2007 | US7273686 Toner |
| 09/20/2007 | US20070215804 Quantum Beam Aided Atomic Force Microscopy and Quantum Beam Aided Atomic Force Microscope |
| 09/20/2007 | US20070215803 Method and an apparatus of an inspection system using an electron beam |
| 09/20/2007 | DE10190535B4 Emissionselektronenmikroskop Emission electron microscope |
| 09/19/2007 | CN101040346A Device and method for scanning probe microscopy |
| 09/18/2007 | US7271882 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/13/2007 | US20070211986 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 09/11/2007 | US7268356 Method and apparatus for specimen fabrication |
| 09/06/2007 | US20070208533 Image reconstruction method |
| 09/06/2007 | US20070205707 Electronic device containing a carbon nanotube |
| 08/29/2007 | EP1826551A1 Positioning mechanism and microscope using the same |
| 08/29/2007 | CN101025391A Method for making super-low carbon steel gold-phase sample and displaying its tissue |
| 08/28/2007 | US7261941 Sharp end, multi-layer carbon nano-tube radial aggregate and method of manufacturing the aggregate |
| 08/28/2007 | US7261352 Electrostatically driven carbon nanotube gripping device |
| 08/28/2007 | US7260980 Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
| 08/23/2007 | US20070194235 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |