| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 09/12/2006 | US7107571 Visual analysis and verification system using advanced tools |
| 09/12/2006 | US7107117 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 09/06/2006 | EP0948741B1 Method and apparatus for high spatial resolution spectroscopic microscopy |
| 08/31/2006 | WO2006090594A1 Inching mechanism for scanning probe microscope and scanning probe microscope employing it |
| 08/31/2006 | WO2006090593A1 Displacement detection mechanism for scanning probe microscope and scanning probe microscope |
| 08/31/2006 | US20060193037 Vacuum chamber with recessed viewing tube and imaging device situated therein |
| 08/30/2006 | EP0979414B1 Multi-probe test head and test method |
| 08/29/2006 | US7098457 Electron beam apparatus and device manufacturing method using same |
| 08/29/2006 | US7098455 Method of inspecting a circuit pattern and inspecting instrument |
| 08/29/2006 | US7098453 Scanning probe microscopy system and method of measurement by the same |
| 08/29/2006 | US7098056 Apparatus, materials, and methods for fabrication and catalysis |
| 08/29/2006 | US7097708 Substituted donor atoms in silicon crystal for quantum computer |
| 08/24/2006 | US20060185424 Integrated measuring instrument |
| 08/22/2006 | US7095020 Sensing mode atomic force microscope |
| 08/16/2006 | EP1543155A4 Methods and compositions for analyzing polymers using chimeric tags |
| 08/15/2006 | US7091504 Electron beam exposure system |
| 08/15/2006 | US7091476 Scanning probe microscope assembly |
| 08/10/2006 | WO2006083006A1 Optical fiber probe, optical detection device, and optical detection method |
| 08/10/2006 | WO2006012124A3 Laser-based method and system for processing targeted surface material and article produced thereby |
| 08/10/2006 | DE102004063980A1 Vorrichtung und Verfahren zur Rastersondenmikroskopie Apparatus and method for scanning probe microscopy |
| 08/08/2006 | US7087899 Sample electrification measurement method and charged particle beam apparatus |
| 08/03/2006 | WO2006081240A1 Protein microscope |
| 08/03/2006 | DE10317894B4 Fokussiersystem für geladene Teilchen, Elektronenmikroskopiesystem und Elektronenmikroskopieverfahren Focusing of charged particles, electron microscopy and electron microscopy system method |
| 07/27/2006 | US20060163479 Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method |
| 07/18/2006 | US7079315 Thermal lens microscope device |
| 07/18/2006 | US7076996 Environmental scanning probe microscope |
| 07/13/2006 | WO2006073068A1 Surface position measuring method and surface position measuring device |
| 07/13/2006 | US20060151699 Method and an apparatus of an inspection system using an electron beam |
| 07/13/2006 | US20060150721 Fluid delivery for scanning probe microscopy |
| 07/12/2006 | EP1679541A1 Specimen observation method and microscope, and, for use therein, solid immersion lens and optical contact liquid |
| 07/11/2006 | US7075092 Charged particle beam microscope with minicolumn |
| 07/11/2006 | US7075078 Scanning electron microscope |
| 07/11/2006 | US7075058 Photothermal imaging scanning microscopy |
| 07/11/2006 | US7073937 Heat emitting probe and heat emitting probe apparatus |
| 07/05/2006 | CN1799045A Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 07/05/2006 | CN1796927A Observation board for position and application of force in micro |
| 06/29/2006 | US20060139026 Magnetic field generator device for magnetic force microscope |
| 06/27/2006 | US7067806 Scanning probe microscope and specimen observation method |
| 06/27/2006 | US7067805 Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method |
| 06/27/2006 | US7066015 Scanning probe microscope |
| 06/27/2006 | US7066014 Method to transiently detect samples in atomic force microscopes |
| 06/20/2006 | US7065423 Optical metrology model optimization for process control |
| 06/14/2006 | EP1669734A1 Scanning type probe microscope and probe moving control method therefor |
| 06/13/2006 | US7061008 Single molecule array on silicon substrate for quantum computer |
| 06/08/2006 | US20060121190 Low-reflection glass article and method for manufacturing |
| 06/01/2006 | WO2006057300A1 Positioning mechanism and microscope using the same |
| 06/01/2006 | WO2006056373A1 Near-field antenna |
| 06/01/2006 | US20060113474 Scanning electron microscope |
| 06/01/2006 | US20060113469 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 05/31/2006 | EP1662246A1 Probe replacing method for scanning probe microscope |
| 05/30/2006 | US7054257 AFM-based data storage and microscopy |
| 05/25/2006 | US20060109480 Surface texture measuring instrument |
| 05/25/2006 | US20060108526 Apparatus for measuring a three-dimensional shape |
| 05/24/2006 | EP1483595A4 High resolution scanning magnetic microscope operable at high temperature |
| 05/24/2006 | DE102004056241A1 Nahfeldantenne Near-field antenna |
| 05/24/2006 | DE102004048971B3 Apparatus for scanning probe microscopy for examining biological systems and which automatically analyzes measurements from the device according to predetermined analysis parameters |
| 05/24/2006 | DE102004043191B4 Rastersondenmikroskop A scanning probe microscope |
| 05/23/2006 | US7049607 Electron beam writing equipment and electron beam writing method |
| 05/23/2006 | US7049591 Scanning electron microscope |
| 05/23/2006 | US7047796 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 05/18/2006 | US20060102840 Scanning electron microscope |
| 05/17/2006 | CN1256752C Method for controlling electrostatic lens and ion implantation device |
| 05/16/2006 | US7046357 Apparatus for microfluidic processing and reading of biochip arrays |
| 05/16/2006 | US7045780 Scanning probe microscopy inspection and modification system |
| 05/11/2006 | US20060097164 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology |
| 05/11/2006 | US20060097162 Apparatus and method for determining surface profiles using a scanning probe microscope |
| 05/11/2006 | US20060097158 Scanning electron microscope |
| 05/11/2006 | DE102004037837B3 Vorrichtung zur Schaffung einer evakuierten Tieftemperaturumgebung für eine Probe und Verwendung der Vorrichtung An apparatus for providing an evacuated cryogenic environment for a sample and using the apparatus |
| 05/10/2006 | EP1540661B1 Sensor with cantilever and optical resonator |
| 05/10/2006 | CN1769837A Surface texture measuring instrument |
| 05/09/2006 | US7042828 Nanometer scale data storage device and associated positioning system |
| 05/09/2006 | US7040147 Method and apparatus for manipulating a sample |
| 05/04/2006 | WO2006046625A1 Measuring device with daisy type cantilever wheel |
| 05/04/2006 | CA2585173A1 Measuring device with daisy type cantilever wheel |
| 05/03/2006 | EP1653477A2 Surface texture measuring instrument |
| 05/03/2006 | EP1218919B1 Electron image detector coupled by optical fibers with absorbing outer cladding to reduce blurring |
| 04/27/2006 | DE10237477B4 Vorrichtung zur Messung von Oberflächendefekten An apparatus for measuring surface defects |
| 04/25/2006 | US7034277 Near-field light-generating element for producing localized near-field light, near-field optical recording device, and near-field optical microscope |
| 04/20/2006 | WO2006040025A1 Device and method for scanning probe microscopy |
| 04/13/2006 | US20060077540 Compound microscope |
| 04/13/2006 | US20060076790 Electrostatically driven carbon nanotube gripping device |
| 04/11/2006 | US7026830 Method and apparatus for inspecting integrated circuit pattern |
| 04/11/2006 | US7026607 Scanning probe microscope |
| 04/06/2006 | US20060071167 Scanning electron microscope |
| 04/06/2006 | US20060071165 Bulk synthesis of long nanotubes of transition metal chalcogenides |
| 04/05/2006 | CN1755345A Micro acting force modeling method based on deformation of nano scanning probe |
| 03/29/2006 | EP1640996A2 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 03/28/2006 | US7019537 Non-destructive determination of machining induced surface defects on metal parts |
| 03/23/2006 | WO2006012124A8 Laser-based method and system for processing targeted surface material and article produced thereby |
| 03/23/2006 | US20060060794 Method of preventing charging, and apparatus for charged particle beam using the same |
| 03/23/2006 | US20060060778 Probe microscope system suitable for observing sample of long body |
| 03/22/2006 | EP1637867A1 Molecule detecting method, molecule counting method, molecule localization detecting method, molecule detection device used for them |
| 03/21/2006 | US7017141 Integrated verification and manufacturability tool |
| 03/21/2006 | US7014743 Separating nanotubes and/or nanowires of different electronic properties into groups (e.g. conductors and semiconductors), by suspending them in a liquid, establishing an asymmetrical alternating-current (AC) between electrodes, causing migration |
| 03/14/2006 | US7012439 Multiple directional scans of test structures on semiconductor integrated circuits |
| 03/14/2006 | US7012252 Method and an apparatus of an inspection system using an electron beam |
| 03/14/2006 | US7012249 High capacity and scanning speed system for sample handling and analysis |
| 03/14/2006 | US7010966 SPM cantilever and fabricating method thereof |
| 03/14/2006 | US7010949 Apparatus for forming optical aperture |
| 03/08/2006 | EP1345696B1 Method and device for manipulating small quantities of liquid |