| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 02/15/2007 | US20070034797 Electron beam apparatus, and inspection instrument and inspection process thereof |
| 02/15/2007 | US20070034336 Method of, and apparatus for, producing near field optical head |
| 02/15/2007 | US20070033991 Tracking qualification and self-optimizing probe microscope and method |
| 02/14/2007 | EP1752756A1 Scanning mechanism for scanning probe microscope |
| 02/14/2007 | CN1912574A Method for expressing nano-steel microstructure |
| 02/14/2007 | CN1912568A Speciment preparing method for studying alumina particle section |
| 02/14/2007 | CN1912540A Tilt error compensation method based on coordinate transformation in micro-nano structure 3-D contour measuring |
| 02/13/2007 | CA2382516C High dynamic range mass spectrometer |
| 02/07/2007 | CN2867337Y Membrane stretch loading device under scanning microscopic environment |
| 02/06/2007 | US7174520 Characterization and verification for integrated circuit designs |
| 02/01/2007 | WO2005114230A3 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 02/01/2007 | US20070023658 Method of inspecting pattern and inspecting instrument |
| 02/01/2007 | US20070023657 Charged particle beam apparatus |
| 02/01/2007 | US20070022804 Scanning probe microscopy inspection and modification system |
| 01/30/2007 | US7170054 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder |
| 01/30/2007 | US7170048 Compound scanning probe microscope |
| 01/25/2007 | WO2007011405A2 Device and method of use for detection and characterization of microorganisms and microparticles |
| 01/25/2007 | US20070018096 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 01/24/2007 | EP1745492A1 Multi-column charged particle optics assembly |
| 01/24/2007 | CN1900687A Realizing method for low value touch interaction interface based on scam probe microscope |
| 01/24/2007 | CN1900686A Sensing method for sample topography and property under nano size |
| 01/23/2007 | US7166839 Apparatus for measuring a three-dimensional shape |
| 01/23/2007 | US7165445 Digital control of quality factor in resonant systems including cantilever based instruments |
| 01/18/2007 | US20070013999 Multiplex near-field microscopy with diffractive elements |
| 01/18/2007 | US20070012095 Scanning probe microscope |
| 01/17/2007 | EP1252634B1 Spectrometer, method of spectroscopic analysis and method of combined surface topography and spectroscopic analysis |
| 01/11/2007 | US20070007142 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 01/03/2007 | EP1739404A1 Nanogap series substance capturing, detecting and identifying method and device |
| 01/03/2007 | EP1335879B1 Dye loaded zeolite material |
| 01/02/2007 | US7155964 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 12/28/2006 | US20060289749 Method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 12/21/2006 | US20060284083 Scanning type probe microscope and probe moving control method therefor |
| 12/20/2006 | EP1733399A1 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 12/20/2006 | EP1161669A4 Deconvolving far-field images using scanned probe data |
| 12/19/2006 | US7151257 Tailoring domain engineered structures in ferroelectric materials |
| 12/19/2006 | US7150185 Optical microcantilever |
| 12/14/2006 | WO2006132075A1 Sample stand arrangement for scanning type probe microscope |
| 12/13/2006 | EP1732084A2 A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 12/13/2006 | CN1877246A A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 12/12/2006 | US7148619 Electronic device containing a carbon nanotube |
| 12/07/2006 | US20060273445 Three-dimensional structure composed of silicon fine wires, method for producing the same, and device including the same |
| 12/06/2006 | CN1875308A Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method |
| 12/05/2006 | US7145140 Method of determining whether a conductive layer of a semiconductor device is exposed through a contact hold |
| 11/30/2006 | WO2006125788A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 11/30/2006 | DE102006006811A1 Bearbeitungsverfahren mit Rastersonde Processing method with scanning probe |
| 11/28/2006 | US7143005 Image reconstruction method |
| 11/28/2006 | US7141800 Non-dispersive charged particle energy analyzer |
| 11/22/2006 | CN1865901A Seawater fish ovum electron-microscope scanning sample preparing method |
| 11/22/2006 | CN1865900A Method for preparing film sample for use in transmitted electron microscope |
| 11/21/2006 | US7137291 Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators |
| 11/16/2006 | WO2005119728A3 Electron stream apparatus and method |
| 11/16/2006 | US20060254348 Scanning probe device and processing method of scanning probe |
| 11/16/2006 | US20060254347 Scanning probe device and processing method by scanning probe |
| 11/16/2006 | US20060254346 Method to transiently detect sample features using cantilevers |
| 11/15/2006 | CN2837830Y Vibration damping bench for ultra-high vacuum tunnel scanning microscope system |
| 11/09/2006 | WO2006118118A1 Scanning mechanism for scanning probe microscope |
| 11/09/2006 | WO2006118117A1 Scanning stage for scanning probe microscope |
| 11/09/2006 | US20060253943 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 11/07/2006 | US7132055 Method of producing near field optical head |
| 11/02/2006 | WO2006116673A1 Mutliplex near-field microscopy with diffractive elements |
| 11/02/2006 | US20060247816 Optical metrology model optimization for process control |
| 11/02/2006 | US20060243908 Method of inspecting a circuit pattern and inspecting instrument |
| 11/02/2006 | US20060243034 Method and apparatus of manipulating a sample |
| 11/01/2006 | CN1854714A Defect analyzing method by microarea coating |
| 10/31/2006 | US7130755 Near-field scanning microwave microscope using dielectric resonator |
| 10/31/2006 | US7130063 Micropattern shape measuring system and method |
| 10/31/2006 | US7129486 Scanning probe with digitized pulsed-force mode operation and real-time evaluation |
| 10/26/2006 | US20060239129 Nanometer scale data storage device and associated positioning system |
| 10/26/2006 | US20060237639 Scanning probe microscope assembly and method for making spectrophotometric, near-filed, and scanning probe measurements |
| 10/25/2006 | CN1281765C Method for preparing specimen in use for researching DNA through microscope in atomic force |
| 10/24/2006 | US7126885 Apparatus for patterning recording media |
| 10/19/2006 | US20060231757 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 10/19/2006 | US20060230818 Planar resonant tunneling sensor and method of fabricating and using the same |
| 10/18/2006 | EP1712893A1 Planar resonant tunneling sensor and method of fabricating and using same |
| 10/18/2006 | CN1280188C Sharp end, multi-layer carbon nano-tube radial aggregate and method of manufacturing the aggregate |
| 10/17/2006 | US7122796 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same |
| 10/17/2006 | US7122795 Detector optics for charged particle beam inspection system |
| 10/12/2006 | WO2006106949A1 Scanning probe microscope, method of measuring sample surface shape, and probe device |
| 10/05/2006 | WO2006103937A1 Scanning probe microscope system |
| 10/05/2006 | US20060219918 Sample electrification measurement method and charged particle beam apparatus |
| 10/05/2006 | US20060219901 Working method using scanning probe |
| 10/05/2006 | US20060219900 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 10/05/2006 | US20060219899 Scanning probe microscope |
| 10/04/2006 | EP1012584A4 Object inspection and/or modification system and method |
| 10/03/2006 | US7117063 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 10/03/2006 | US7116817 Method and apparatus for inspecting a semiconductor device |
| 10/03/2006 | US7116628 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein |
| 10/03/2006 | US7116115 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| 10/03/2006 | US7114405 Probe mounting device for a scanning probe microscope |
| 10/03/2006 | US7114378 Planar resonant tunneling sensor and method of fabricating and using the same |
| 09/28/2006 | US20060216814 Molecule detecting method, molecule counting method, molecule localization detecting method, and molecule detecting device used for them |
| 09/28/2006 | US20060213877 Nanospot welder and method |
| 09/28/2006 | US20060213261 Real Time Detection of Loss of Cantilever Sensing Loss |
| 09/26/2006 | US7112791 Method of inspecting pattern and inspecting instrument |
| 09/21/2006 | DE19802409B4 Anordnung zur Korrektur des Öffnungsfehlers dritter Ordnung einer Linse, insbesondere der Objektivlinse eines Elektronenmikroskops Arrangement for the correction of spherical aberration of the third order of a lens, in particular the objective lens of an electron microscope |
| 09/19/2006 | US7109485 Charged particle beam apparatus |
| 09/19/2006 | US7107826 Scanning probe device and processing method by scanning probe |
| 09/19/2006 | US7107825 Method and apparatus for the actuation of the cantilever of a probe-based instrument |
| 09/14/2006 | DE112004001001T5 Optische Messung von auf Halbleiterwafern gebildeten Strukturen unter Verwendung von Maschinenlernsystemen Optical measurement of formed on semiconductor wafers structures using machine learning systems |
| 09/13/2006 | CN1831513A 扫描探针显微镜 SPM |