| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 08/13/2008 | EP1733399B1 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 08/13/2008 | CN100410718C Sample observation method |
| 08/12/2008 | US7411189 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 08/06/2008 | EP1952120A1 Microscope, in particular a scanning probe microscope provided with a programmable logic |
| 08/06/2008 | EP1460410B1 Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
| 08/06/2008 | CN100409000C Method for inspecting electrode surface quality |
| 08/06/2008 | CN100408970C Preparation method of nano multi-step height sample plate |
| 08/05/2008 | US7408835 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 08/05/2008 | US7408175 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 08/05/2008 | US7408172 Charged particle beam apparatus and charged particle beam irradiation method |
| 07/31/2008 | WO2008089950A1 Mems sensor for in situ tem atomic force microscopy |
| 07/31/2008 | WO2008089889A1 Fluid cell for scanning probe microscopy or force spectroscopy |
| 07/30/2008 | EP1950764A1 Fluid cell for raster scanning probe microscopy or force spectroscopy |
| 07/30/2008 | EP1949086A2 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 07/30/2008 | EP1200653B1 Mesotubes and nanotubes |
| 07/29/2008 | US7406021 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein |
| 07/24/2008 | WO2008087852A1 Atomic microscope and interactive force measuring method using atomic microscope |
| 07/22/2008 | US7401503 Method for analysis through layer-by-layer sample removal using a cantilever probe |
| 07/17/2008 | WO2008083694A1 Apparatus and method for investigating biological systems and solid systems |
| 07/16/2008 | CN101221115A Sample pool used for observing protein crystal growth by optical microscope |
| 07/16/2008 | CN101221105A Stress test grid of nano material used for transmission electron microscopy |
| 07/16/2008 | CN101220244A High surface quality GaN wafer and method of fabricating same |
| 07/16/2008 | CN100402978C Tilt error compensation method based on coordinate transformation in micro-nano structure 3-D contour measuring |
| 07/15/2008 | US7399966 Scanning electron microscope |
| 07/10/2008 | WO2008081044A1 Apparatus and method for the detection of forces in the sub-micronewton range |
| 07/10/2008 | US20080163702 Device for Receiving a Test Sample |
| 07/10/2008 | DE10235456B4 Elektronenmikroskopiesystem Electron system |
| 07/08/2008 | US7397031 Method of inspecting a circuit pattern and inspecting instrument |
| 07/03/2008 | WO2008079349A2 Systems and methods for utilizing scanning probe shape characterization |
| 07/03/2008 | US20080158667 Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the method |
| 07/03/2008 | US20080157077 Integrated Circuit and Methods of Measurement And Preparation of Measurement Structure |
| 07/03/2008 | US20080156992 Mobile Cantilever Door-type Container Inspection System |
| 07/03/2008 | US20080156988 Scanning Probe Microscope and Scanning Method |
| 07/02/2008 | CN101210863A Sample preparation method for measuring aluminium electrolysis capacitor electric pole foil microscopic appearance |
| 07/01/2008 | US7395132 Optical metrology model optimization for process control |
| 07/01/2008 | US7394730 Apparatus for patterning recording media |
| 06/26/2008 | US20080154521 Systems and methods for utilizing scanning probe shape characterization |
| 06/26/2008 | US20080149822 Protein Microscope |
| 06/25/2008 | EP1934578A1 Method for examining a measurement object, and apparatus |
| 06/25/2008 | EP1535300A4 Improved method and system for scanning apertureless fluorescence microscope |
| 06/24/2008 | US7391022 Scanning probe microscope |
| 06/19/2008 | US20080141764 Method of observing and method of working diamond stylus for working of atomic force microscope |
| 06/19/2008 | DE102007062269A1 Object e.g. air container, inspecting method for e.g. airport, involves scanning zone part with precision if suspicious zone is in inspected zone, and reconstructing image to estimate presence of dangerous article in suspicious zone |
| 06/18/2008 | CN101201326A Check system for movable boom door type container |
| 06/17/2008 | US7387017 Digital Q control for enhanced measurement capability in cantilever-based instruments |
| 06/12/2008 | WO2007149534A3 Methods of polarization engineering and their applications |
| 06/12/2008 | US20080137064 Sample observation method, microscope, and solid immersion lens; optical contact liquid used in the method |
| 06/12/2008 | US20080135750 High Speed Measurement, Analysis and Imaging Systems and Methods For Length Scales From Meter to Sub-Nanometer |
| 06/04/2008 | EP1927845A1 Cantilever holder and scanning probe microscope including the same |
| 06/04/2008 | CN101191776A Focused ion beam microscope sample stage and method of use thereof |
| 05/29/2008 | US20080122462 Method of inspecting pattern and inspecting instrument |
| 05/29/2008 | US20080121800 Cantilever holder and scanning probe microscope including the same |
| 05/29/2008 | US20080121028 Scanning Probe Microscopy Inspection and Modification System |
| 05/29/2008 | DE102006055528A1 Atomic force microscope for examining sample, has evaluation unit receiving measurement variable i.e. friction between probe tip and sample, as input besides force reciprocal effect for determining artifact |
| 05/28/2008 | CN101187605A Super thin slice surface treatment method for atomic force microscope nanometer positioning |
| 05/28/2008 | CN100390524C Method for preparing film sample for use in transmitted electron microscope |
| 05/22/2008 | WO2008060624A2 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 05/22/2008 | US20080116376 Charged particle beam apparatus |
| 05/21/2008 | EP1520292A4 Software synchronization of multiple scanning probes |
| 05/20/2008 | US7375538 Method of inspecting pattern and inspecting instrument |
| 05/20/2008 | US7375323 Electron beam apparatus with aberration corrector |
| 05/15/2008 | DE102007049322A1 Probenbetriebseinrichtung Samples facility |
| 05/15/2008 | DE102007049321A1 Probenbetriebseinrichtung Samples facility |
| 05/14/2008 | CN201060150Y Example platform |
| 05/13/2008 | US7372050 Method of preventing charging, and apparatus for charged particle beam using the same |
| 05/13/2008 | US7372028 Sample electrification measurement method and charged particle beam apparatus |
| 05/13/2008 | US7372012 Dye loaded zeolite material containing devices |
| 05/08/2008 | US20080105044 Sample operation apparatus |
| 05/08/2008 | US20080105043 Sample Operation Apparatus |
| 05/07/2008 | EP1918673A1 Method and equipment for measuring displacement, stage equipment and probe microscope |
| 04/29/2008 | US7367008 Adjustment of masks for integrated circuit fabrication |
| 04/29/2008 | US7366704 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 04/24/2008 | US20080092640 Surface Position Measuring Method And Surface Position Measuring Device |
| 04/22/2008 | US7363099 Integrated circuit metrology |
| 04/22/2008 | US7360405 Method to transiently detect sample features using cantilevers |
| 04/17/2008 | WO2008027601A3 Band excitation method applicable to scanning probe microscopy |
| 04/17/2008 | US20080087077 Method and apparatus of scanning a sample using a scanning probe microscope |
| 04/16/2008 | EP1912055A1 Method of using an atomic force microscope and microscope |
| 04/16/2008 | CN201047823Y Sample nondestructive approach device facing to nano observation and operation |
| 04/10/2008 | WO2008040989A1 Scanning tunnelling microscope |
| 04/10/2008 | DE102006002461B4 Spiegeloptik für nahfeldoptische Messungen Mirror optics for near-field measurements |
| 04/03/2008 | US20080078933 Electron Beam Exposure or System Inspection Or Measurement Apparatus And Its Method And Height Detection Apparatus |
| 04/01/2008 | US7353475 Electronic design for integrated circuits based on process related variations |
| 04/01/2008 | US7351968 Multi-pixel electron emission die-to-die inspection |
| 04/01/2008 | US7350404 Scanning type probe microscope and probe moving control method therefor |
| 03/27/2008 | WO2008035473A1 Simulator, simulation method and simulation program |
| 03/27/2008 | US20080074656 Defining a pattern on a substrate |
| 03/27/2008 | US20080073518 Optical Fiber Probe, Optical Detection Device, And Optical Detection Method |
| 03/27/2008 | US20080073438 Laser-based method and system for processing targeted surface material and article produced thereby |
| 03/27/2008 | US20080072665 Device and Method for Scanning Probe Microscopy |
| 03/27/2008 | DE102006043352A1 Einrichtung zum Abtasten einer von einer Flüssigkeit bedeckten Probenoberfläche Means for scanning a surface covered by a liquid sample surface |
| 03/20/2008 | WO2008031618A1 Device for scanning a sample surface covered with a liquid |
| 03/20/2008 | US20080067385 Method and apparatus for processing a micro sample |
| 03/13/2008 | WO2008028500A1 Method for testing active compounds |
| 03/13/2008 | US20080061232 Scanning Probe Microscope Fine-Movement Mechanism and Scanning Probe Microscope Using Same |
| 03/06/2008 | WO2008027601A2 Band excitation method applicable to scanning probe microscopy |
| 03/06/2008 | US20080054928 Electric potential difference detection method and scanning probe microscope |
| 03/05/2008 | EP1756595A4 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 03/05/2008 | CN100372794C Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 02/28/2008 | US20080049223 Optical displacement-detecting mechanism and probe microscope using the same |