| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 01/06/2009 | US7473887 Resonant scanning probe microscope |
| 12/31/2008 | EP1556737B1 Methods for fabrication of nanometer-scale engineered structures for mask repair application |
| 12/30/2008 | US7470918 Method and apparatus for processing a micro sample |
| 12/30/2008 | US7469831 Laser-based method and system for processing targeted surface material and article produced thereby |
| 12/25/2008 | US20080315745 Electronic device containing carbon nanotubes and method for manufacturing the same |
| 12/25/2008 | US20080315092 Scanning probe microscopy inspection and modification system |
| 12/24/2008 | WO2008157373A2 Position control for scanning probe spectroscopy |
| 12/24/2008 | WO2008156474A1 High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer |
| 12/24/2008 | DE102007063066A1 Verfahren und Vorrichtung zur Charakterisierung einer Probe mit zwei oder mehr optischen Fallen Method and device for characterization of a sample with two or more optical traps |
| 12/24/2008 | CN101329246A Curved surface composite super resolution current-carrying tube |
| 12/18/2008 | US20080308729 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 12/18/2008 | US20080308726 Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System |
| 12/18/2008 | US20080308718 Position control for scanning probe spectroscopy |
| 12/18/2008 | US20080307864 Scan Type Probe Microscope |
| 12/17/2008 | CN201166633Y Loading network for measuring electrology of transmission electric mirror base on phase-change material |
| 12/17/2008 | CN101326433A Method for examining a measurement object, and apparatus |
| 12/16/2008 | US7465945 Method and apparatus for processing a micro sample |
| 12/11/2008 | WO2008148951A1 Atomic force microscopy probe |
| 12/11/2008 | US20080302964 Method and apparatus for inspecting integrated circuit pattern |
| 12/11/2008 | US20080302960 Probe arrangement |
| 12/09/2008 | CA2331585C Apparatus and method for measuring intermolecular interactions by atomic force microscopy |
| 12/04/2008 | WO2008145110A1 Method and apparatus for characterizing a sample with two or more optical traps |
| 12/04/2008 | WO2008145109A1 Method device for the probe microscopic examination of a sample using luminescent microscopy |
| 12/04/2008 | WO2008145108A1 Method and device for examining a sample with a probe microscope |
| 12/04/2008 | DE102007063065A1 Verfahren und Vorrichtung zum sondenmikroskopischen Untersuchen einer Probe Method and apparatus for probe microscopic examination of a sample |
| 12/03/2008 | EP1779286A4 Laser-based method and system for processing targeted surface material and article produced thereby |
| 12/03/2008 | EP1341183B1 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 12/03/2008 | CN201159705Y Transmission electron microscope carrier net of nano material in-situ stress test |
| 12/03/2008 | CN201159704Y Micro-stretching device of test piece material nano dimension mechanical property test |
| 11/27/2008 | WO2008143817A1 High frequency deflection measurement of ir absorption |
| 11/27/2008 | WO2008115862A3 Fast scanning spm scanner and method of operating same |
| 11/27/2008 | WO2008079349A3 Systems and methods for utilizing scanning probe shape characterization |
| 11/27/2008 | US20080290298 Method and system for treating an interior surface of a workpiece using a charged particle beam |
| 11/26/2008 | CN100437882C 电子束曝光系统 Electron beam exposure system |
| 11/20/2008 | US20080284446 Determination of Field Distribution |
| 11/20/2008 | US20080284422 Method and Device for Analyzing Distribution of Coercive Force in Vertical Magnetic Recording Medium Using Magnetic Force Microscope |
| 11/20/2008 | US20080283755 High frequency deflection measurement of IR absorption |
| 11/19/2008 | EP1570514A4 Integrated circuit and methods of measurement and preparation of measurement structure |
| 11/18/2008 | US7453193 Electronic device containing a carbon nanotube |
| 11/18/2008 | US7451638 Harmonic cantilevers and imaging methods for atomic force microscopy |
| 11/12/2008 | EP1990626A1 Probe arrangement for electrophysiological analysis in an AFM |
| 11/11/2008 | US7449688 Deconvolving far-field images using scanned probe data |
| 11/06/2008 | US20080272338 Bidirectional antennas for light collection and transport using entire spectrum; supramolecular organization; photonic energy harvesting; luminescent devices, optical sensors, light emitters |
| 11/06/2008 | US20080271522 Sample analysis using cantilever probe |
| 11/05/2008 | CN101300480A Scanning probe microscopy method and apparatus utilizing sample pitch |
| 11/04/2008 | US7444857 Software synchronization of multiple scanning probes |
| 10/30/2008 | WO2008128532A2 Nanorobot module automation and exchange |
| 10/30/2008 | US20080265157 Scanning Ion Probe Systems and Methods of Use Thereof |
| 10/29/2008 | CN101294887A SPM high resolution graphics data processing method |
| 10/28/2008 | US7442927 Scanning ion probe systems and methods of use thereof |
| 10/28/2008 | US7442925 Working method using scanning probe |
| 10/28/2008 | US7442923 Scanning electron microscope |
| 10/28/2008 | US7442922 Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
| 10/23/2008 | US20080259356 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 10/23/2008 | US20080258059 Scanning Probe Microscope System |
| 10/22/2008 | CN100427918C Seawater fish ovum electron-microscope scanning sample preparing method |
| 10/21/2008 | US7439506 Method and an apparatus of an inspection system using an electron beam |
| 10/21/2008 | US7439505 Scanning electron microscope |
| 10/21/2008 | US7439504 Pattern inspection method and apparatus using electron beam |
| 10/16/2008 | WO2008123432A1 Device and method for acquiring a field by measurement |
| 10/16/2008 | WO2008079349A9 Systems and methods for utilizing scanning probe shape characterization |
| 10/15/2008 | EP1979913A1 Method for operating a measurement system containing a scanning probe microscope, and measurement system |
| 10/15/2008 | EP1513957A4 Nucleic acid sequencing by signal stretching and data integration |
| 10/14/2008 | US7435959 Microstructured pattern inspection method |
| 10/09/2008 | US20080245141 Digital Q Control for enhanced Measurement Capability in Cantilever-based Instruments |
| 10/08/2008 | EP1978348A1 Scanning probe microscope |
| 10/07/2008 | US7430898 Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
| 10/01/2008 | EP1975598A2 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 09/30/2008 | US7430484 Signal processing method and apparatus for use in real-time subnanometer scale position measurements with the aid of probing sensors and beams scanning periodically undulating surfaces such as gratings and diffraction patterns generated thereby, and the like |
| 09/30/2008 | US7429732 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 09/25/2008 | WO2008115862A2 Fast scanning spm scanner and method of operating same |
| 09/25/2008 | US20080230856 Intermediate probe structures for atomic force microscopy |
| 09/25/2008 | US20080229812 Scanning Probe Microscope |
| 09/25/2008 | DE19732093B4 Korpuskularstrahlgerät Charged particle beam |
| 09/24/2008 | EP1972920A1 Scan type probe microscope |
| 09/18/2008 | WO2008111433A1 Atomic force microscope |
| 09/18/2008 | US20080224374 Sample holding mechanism and sample working/observing apparatus |
| 09/18/2008 | US20080223119 Fast-Scanning SPM Scanner and Method of Operating Same |
| 09/18/2008 | US20080223118 Scanning probe apparatus with in-situ measurement probe tip cleaning capability |
| 09/12/2008 | WO2008107162A1 Arrangement for the testing or/and manipulation of samples |
| 09/11/2008 | US20080217302 Nanospot Welder and Method |
| 09/11/2008 | DE102007010890A1 Anordnung zum Untersuchen oder/und Manipulieren von Proben Arrangement for testing and / or manipulating samples |
| 09/10/2008 | EP1967839A1 Delay time modulated and femtosecond time-resolved, scanning probe microscope apparatus |
| 09/10/2008 | EP1966586A1 Improved photon-emission scanning tunnel microscopy |
| 09/10/2008 | CN100418083C Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 09/04/2008 | US20080216027 Electronic Design for Integrated Circuits Based on Process Related Variations |
| 09/04/2008 | US20080212174 Positioning Mechanism and Microscope Using the Same |
| 09/04/2008 | US20080210864 Local Injector of Spin-Polarized Electrons with Semiconductor Tip Under Light |
| 09/03/2008 | EP1089066B1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder |
| 09/02/2008 | US7421370 Method and apparatus for measuring a characteristic of a sample feature |
| 08/27/2008 | CN101251464A Wireless control system for micro-nano sample in electronic microscope |
| 08/27/2008 | CN101251463A Control system for micro-nano sample in electronic microscope |
| 08/26/2008 | US7417444 Method and apparatus for inspecting integrated circuit pattern |
| 08/21/2008 | WO2008099136A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 08/21/2008 | US20080201091 Sample electrification measurement method and charged particle beam apparatus |
| 08/21/2008 | CA2715504A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 08/20/2008 | CN100412560C Imaging device and method |
| 08/14/2008 | WO2008060624A3 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 08/14/2008 | US20080193752 Near-Field Antenna |
| 08/14/2008 | US20080191151 Method and apparatus for specimen fabrication |