| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 01/14/2010 | US20100011472 Apparatus And Method For The Detection Of Forces In The Sub-Micronewton Range |
| 01/14/2010 | US20100011471 Band excitation method applicable to scanning probe microscopy |
| 01/12/2010 | US7646494 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 01/07/2010 | US20100005552 Scanning probe microscope and a method to measure relative position between probes |
| 01/06/2010 | EP2141481A1 Device and method for acquiring a field by measurement |
| 01/06/2010 | EP2140226A2 Nanorobot module automation and exchange |
| 01/06/2010 | CN100578679C Probe position control system and method |
| 01/05/2010 | US7642514 Charged particle beam apparatus |
| 12/31/2009 | US20090324450 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material |
| 12/30/2009 | WO2009157096A1 Stage for scanning probe microscopy and sample observation method |
| 12/30/2009 | EP2137737A2 Fast scanning spm scanner and method of operating same |
| 12/29/2009 | US7638767 Scanning electron microscope |
| 12/17/2009 | DE102004058483B4 Vorrichtung zur Untersuchung von Produkten auf Fehler, Messfühler-Positionierverfahren und Messfühler-Bewegungsverfahren An apparatus for investigating products for errors, sensor-positioning method and probe-moving method |
| 12/16/2009 | CN101606051A Atomic microscope and interactive force measuring method using atomic microscope |
| 12/15/2009 | US7631548 Scanning probe microscope |
| 12/15/2009 | US7631547 Scanning probe apparatus and drive stage therefor |
| 12/09/2009 | EP2131180A1 Atomic force microscope |
| 12/03/2009 | US20090300805 Photon-Emission Scanning Tunneling Microscopy |
| 12/02/2009 | EP2128624A2 Ultrasensitive non-isotopic water-soluble nanocrystals |
| 12/02/2009 | EP1451848B1 Device and method for reducing the impact of distortions in a microscope |
| 11/25/2009 | EP1110232B1 Automated set up of an energy filtering transmission electron microscope |
| 11/18/2009 | EP2120037A1 Measuring probe for a scanning microscope and method of operation thereof |
| 11/18/2009 | EP2120036A1 Measuring probe having one or more support elements for a measuring instrument |
| 11/18/2009 | EP0847590B1 A scanning probe microscope having automatic probe exchange and alignment |
| 11/17/2009 | US7618465 Near-field antenna |
| 11/17/2009 | US7617720 Surface position measuring method and surface position measuring device |
| 11/11/2009 | EP2115423A1 Apparatus and method for the detection of forces in the sub-micronewton range |
| 11/11/2009 | EP1366347B1 Ultrasensitive non-isotopic water-soluble nanocrystals |
| 11/10/2009 | US7615738 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
| 11/10/2009 | US7614288 Scanning probe microscope fine-movement mechanism and scanning probe microscope using same |
| 11/10/2009 | US7614287 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 11/05/2009 | US20090276181 Method of Measuring an Anisotropic Surface Diffusion Tensor or Surface Energy Anisotropies |
| 11/04/2009 | EP2113924A2 Method for measuring an anisotropic surface diffusion tensor or surface energy anisotropies |
| 10/29/2009 | WO2009130832A1 Noncontact scanning probe microscope |
| 10/28/2009 | CN100554926C Method for making super-low carbon steel gold-phase sample and displaying its tissue |
| 10/27/2009 | US7609048 Probe microscope and measuring method using probe microscope |
| 10/27/2009 | US7607342 Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument |
| 10/22/2009 | WO2008099136A8 Flow velocity and pressure measurement using a vibrating cantilever device |
| 10/22/2009 | US20090263024 Apparatus for data analysis |
| 10/22/2009 | US20090262994 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 10/21/2009 | EP2110843A1 Stable emission gas ion source and method of operation thereof |
| 10/21/2009 | EP2109760A1 Flow velocity and pressure measurement using a vibrating cantilever device |
| 10/20/2009 | US7606403 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 10/15/2009 | US20090260114 Scanning ion conductance microscopy for the investigation of living cells |
| 10/15/2009 | US20090260113 Probe Microscope Setup Method |
| 10/15/2009 | US20090260112 Stable Emission Gas Ion Source and Method for Operation Thereof |
| 10/13/2009 | CA2422115C Thermal lens microscope device |
| 10/08/2009 | US20090253589 Method for Testing Active Compounds |
| 10/08/2009 | DE112007001189T5 Verfahren und Einrichtung zur Verwendung in Echtzeit-Nanometer- und Sub-Nanometer-Positionsmessungen Method and apparatus for use in real-nanometer and sub-nanometer position measurements |
| 10/07/2009 | EP1012779B1 Method and system for lithographic mask inspection |
| 10/01/2009 | US20090242763 Environmental Cell for a Particle-Optical Apparatus |
| 09/30/2009 | EP2105944A1 Environmental cell for a particle-optical apparatus |
| 09/30/2009 | EP2105943A2 Environmental cell for a particle-optical apparatus |
| 09/30/2009 | CN101545874A Environmental cell for a particle-optical apparatus |
| 09/22/2009 | US7591858 Mirror optic for near-field optical measurements |
| 09/17/2009 | US20090230984 Defective product inspection apparatus, probe positioning method and probe moving method |
| 09/17/2009 | US20090230320 Scanning probe apparatus |
| 09/16/2009 | EP2101165A1 Method for creating and/or detecting a pyroelectric response, detector comprising a pyroelectric material and apparatus for investigating a sample comprising a pyroelectric material |
| 09/16/2009 | EP1844475B1 Near-field probe |
| 09/15/2009 | US7588605 Scanning type probe microscope |
| 09/15/2009 | CA2390536C Method for inspecting electrode surface quality |
| 09/10/2009 | US20090229019 Method of Using an Atomic Force Microscope and Microscope |
| 09/10/2009 | US20090224170 Scanning electron microscope |
| 09/10/2009 | DE102008011993A1 Synchronisierte Bildgebung mittels optischer Verfahren und Rasterkraftmikroskopie Synchronized imaging using optical methods and atomic force microscopy |
| 09/09/2009 | CN100538913C Sensor with suspending arm and optical resonator |
| 09/08/2009 | US7586084 Optical fiber probe, optical detection device, and optical detection method |
| 09/03/2009 | WO2009106602A1 Synchronized imaging by way of an optical method and atomic force microscopy |
| 08/26/2009 | CN101517393A Scanning ion conductance microscopy for the investigation of living cells |
| 08/25/2009 | US7580125 Liquid cell |
| 08/25/2009 | US7578853 Scanning probe microscope system |
| 08/25/2009 | US7578176 Systems and methods for utilizing scanning probe shape characterization |
| 08/20/2009 | US20090210971 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope |
| 08/19/2009 | EP2090880A1 Pump probe measuring device, and scanning probe microscope apparatus using the device |
| 08/18/2009 | US7574932 Sample holding mechanism and sample working/observing apparatus |
| 08/13/2009 | US20090205089 Method for Examining a Measurement Object, and Apparatus |
| 08/12/2009 | EP2088615A1 Charged particle beam device |
| 08/06/2009 | US20090198635 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 08/05/2009 | CN100523778C Fully digital controller for cantilever-based instruments |
| 08/04/2009 | US7569817 Scanning probe apparatus |
| 08/04/2009 | US7569112 Scanning probe apparatus with in-situ measurement probe tip cleaning capability |
| 08/04/2009 | US7569077 Probe positional error from comparising image sequence of scans to identify differences between positions of a portion of a reference specimen characteristic in the images; probe moved to target location for spectroscopic analysis, as a function of the determined probe positional error; nanotechnolgy |
| 07/30/2009 | WO2009093284A1 Scanning type probe microscope |
| 07/28/2009 | US7566888 Method and system for treating an interior surface of a workpiece using a charged particle beam |
| 07/28/2009 | US7566873 High-resolution, low-distortion and high-efficiency optical coupling in detection system of electron beam apparatus |
| 07/23/2009 | WO2009062631A3 Method for examining a sample by scanning tunneling microscopy using a contrast agent |
| 07/22/2009 | CN100516821C Realizing method for low value touch interaction interface based on scam probe microscope |
| 07/21/2009 | US7562564 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 07/14/2009 | US7560921 Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope |
| 07/09/2009 | DE102008003291A1 Near field microscope for optical examination of sample, has point holder arranged axial symmetrically to reflector axis in focus of parabolic reflector and moves in three directions that are independent from each other |
| 07/08/2009 | CN100511567C Transmission electron microscope slide glass for nano material in-situ structure property test |
| 07/07/2009 | US7556968 Scanning probe microscope and molecular structure change observation method |
| 07/01/2009 | EP2074404A1 Method for testing active compounds |
| 06/30/2009 | US7553334 Defective product inspection apparatus, probe positioning method and probe moving method |
| 06/25/2009 | US20090158828 Scanning Probe Microscope |
| 06/23/2009 | US7550750 Method and apparatus for processing a micro sample |
| 06/18/2009 | WO2009074617A1 Device and method for an atomic force microscope for the study and modification of surface properties |
| 06/18/2009 | WO2009036365A3 Method and apparatus of automatic scanning probe imaging |
| 06/18/2009 | DE102007060460A1 Vorrichtung und Verfahren zur Untersuchung und Modifikation von Oberflächeneigenschaften verschiedener Materialien Device and method for the examination and modification of surface properties of various materials |
| 06/17/2009 | EP1417448A4 Scanning interferometry with reference signal |
| 06/17/2009 | CN100501322C Surface texture measuring device |