| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 11/23/2010 | US7841016 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 11/23/2010 | US7836757 Phase feedback AFM and control method therefor |
| 11/18/2010 | US20100291295 Hydrophilic-defogging and dirtproof film and production process for the same |
| 11/11/2010 | DE102008023766A1 Method for detection of functional structures in biological sample e.g. living cells, involves detecting combination of near field-microscopy in infrared or terahertz range and spectroscopy processes e.g. Raman microscopy, in sample |
| 11/09/2010 | US7831528 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 11/02/2010 | US7825377 Electron beam apparatus with aberration corrector |
| 11/02/2010 | US7825343 Systems and methods for providing information to a customer |
| 10/28/2010 | WO2010123120A1 Immersion measurement probe, cantilever, and immersion measurement method |
| 10/27/2010 | CN101221115B Sample pool used for observing protein crystal growth by optical microscope |
| 10/21/2010 | US20100267164 Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
| 10/20/2010 | EP1181611B2 Scanning device, especially for detecting fluorescent light |
| 10/14/2010 | US20100263098 Method and apparatus for the combined analysis of a sample with objects to be analyzed |
| 10/14/2010 | US20100263097 Method for examining a sample |
| 10/14/2010 | US20100263096 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope |
| 10/13/2010 | CN101861513A Method for examining a sample using a scanning tunneling microscope |
| 10/12/2010 | US7812347 Integrated circuit and methods of measurement and preparation of measurement structure |
| 10/07/2010 | US20100257644 Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe Microscopy |
| 10/06/2010 | CN101855534A Method and apparatus of automatic scanning probe imaging |
| 10/05/2010 | US7810166 Device and method for scanning probe microscopy |
| 10/05/2010 | US7806008 Sample analysis using cantilever probe |
| 09/30/2010 | US20100251437 Method and Apparatus for Characterizing a Sample with Two or More Optical Traps |
| 09/29/2010 | CN101846497A Key size calibration method and device thereof |
| 09/28/2010 | US7804067 Method of observing and method of working diamond stylus for working of atomic force microscope |
| 09/23/2010 | US20100242142 Scanning probe microscope |
| 09/14/2010 | US7795593 Surface contamination analyzer for semiconductor wafers |
| 09/09/2010 | US20100229263 Protein microscope |
| 09/09/2010 | US20100229262 Apparatus and method for examining a specimen by means of probe microscopy |
| 09/07/2010 | US7793356 Signal coupling system for scanning microwave microscope |
| 09/07/2010 | US7791021 method of evaluating each microstructured pattern of a semiconductor by calculating as a dislocation vector the relationship in position between the surface and bottom of the photoresist on the microstructured pattern; method of evaluating exposure accuracy |
| 09/02/2010 | US20100219819 Apparatus and method of obtaining field by measurement |
| 09/01/2010 | CN101819217A Method for inverting micro-nano planar periodic structure |
| 08/31/2010 | US7787133 Optical displacement-detecting mechanism and probe microscope using the same |
| 08/31/2010 | US7786402 Nanospot welder and method |
| 08/24/2010 | US7784107 High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer |
| 08/19/2010 | WO2010092004A1 Method for automatic adjustment of the applied force and control of the force drift in an atomic force microscope during contact mode imaging. |
| 08/18/2010 | EP2219035A1 Method for automatic adjustment of the applied force and control of the force drift in an Atomic Force Microscope during contact mode imaging. |
| 08/18/2010 | EP2218075A1 Device and method for an atomic force microscope for the study and modification of surface properties |
| 08/17/2010 | US7775086 Band excitation method applicable to scanning probe microscopy |
| 08/12/2010 | WO2010089601A1 Control system for a scanning probe microscope |
| 08/12/2010 | US20100205698 Atomic force microscopy probe |
| 08/11/2010 | EP2215637A1 Iterative feedback tuning in a scanning probe microscope |
| 08/10/2010 | US7770474 Sample operation apparatus |
| 08/10/2010 | US7770439 Method and apparatus of scanning a sample using a scanning probe microscope |
| 08/05/2010 | WO2010087114A1 Scanning probe microscope |
| 08/05/2010 | US20100193686 Electron Beam Exposure Or System Inspection Or Measurement Apparatus And Its Method And Height Detection Apparatus |
| 08/04/2010 | CN101793911A Nano indentation system based on scanning electron microscope |
| 08/04/2010 | CN101792147A Surface modification method of silica particles and method for displaying latent fingerprints |
| 08/03/2010 | US7770232 Scanning probe microscope system |
| 08/03/2010 | US7767961 Method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 07/28/2010 | CN101788571A Nanomanipulation method for compounding laser near-field optical tweezers and AFM probe |
| 07/22/2010 | WO2010065131A3 High frequenct deflection measurement of ir absorption |
| 07/21/2010 | EP2208044A2 Method for examining a sample |
| 07/20/2010 | US7757544 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 07/14/2010 | CN101776699A Double-PZT symmetrical integrated large-strain loading device |
| 07/13/2010 | CA2344145C Inventory control |
| 07/01/2010 | DE10000365B4 Spannungskontrastverfahren zum Nachweis von Defekten in einem strukturiertem Substrat Voltage contrast method for detecting defects in a textured substrate |
| 06/29/2010 | US7745784 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus |
| 06/17/2010 | US20100154084 Method and apparatus for performing apertureless near-field scanning optical microscopy |
| 06/16/2010 | EP2195635A2 Method and apparatus of automatic scanning probe imaging |
| 06/10/2010 | WO2010065131A2 High frequenct deflection measurement of ir absorption |
| 06/10/2010 | US20100146673 Apparatus and Method for Investigating Biological Systems and Solid Systems |
| 06/10/2010 | US20100141939 Methods of polarization engineering and their applications |
| 06/10/2010 | US20100140473 Nanorobot module, automation and exchange |
| 06/08/2010 | US7735146 Protein microscope |
| 06/03/2010 | WO2010004275A3 Sample holder |
| 06/01/2010 | US7727481 in particular for preparing a microtome or ultramicrotome, a specimen that is to examined in an AFM. |
| 05/27/2010 | WO2010057351A1 Method for detecting biological markers by an atomic force microscope |
| 05/27/2010 | US20100132076 Fluid Delivery for Scanning Probe Microscopy |
| 05/20/2010 | DE112008001611T5 Positionssteuerung für die Rastersondenspektroskopie Position control for scanning probe spectroscopy |
| 05/19/2010 | EP2187197A1 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program |
| 05/06/2010 | US20100115674 Atomic force microscope apparatus |
| 04/29/2010 | US20100107285 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids |
| 04/27/2010 | US7705299 Scanning ion probe systems and methods of use thereof |
| 04/27/2010 | US7703314 Probe position control system and method |
| 04/22/2010 | US20100100990 High-scan rate positioner for scanned probe microscopy |
| 04/20/2010 | US7700918 Sample electrification measurement method and charged particle beam apparatus |
| 04/20/2010 | US7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 04/07/2010 | CN1558424B Gold thin film substrate making method for scanning probe microscope |
| 04/06/2010 | US7694347 Measuring device with daisy type cantilever wheel |
| 04/06/2010 | US7692144 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus |
| 04/06/2010 | US7691541 Additive and subtractive correction using direct write nanolithography; fine control over lateral dimensions and height |
| 03/25/2010 | US20100071477 Flow Velocity and Pressure Measurement Using a Vibrating Cantilever Device |
| 03/23/2010 | US7684956 Image reconstruction method |
| 03/18/2010 | US20100071099 Atomic force microscope and interaction force measurement method using atomic force microscope |
| 03/17/2010 | EP2163906A1 Method of detecting a movement of a measuring probe and measuring instrument |
| 03/17/2010 | CN100594385C 扫描探针显微镜 Scanning probe microscopy |
| 03/11/2010 | US20100064397 Controlled atomic force microscope |
| 03/02/2010 | US7672048 Positioning mechanism and microscope using the same |
| 02/18/2010 | WO2010019256A1 Transition temperature microscopy |
| 02/18/2010 | US20100042378 Simulator, simulation method and simulation program |
| 02/16/2010 | US7663109 Mobile cantilever door-type container inspection system |
| 02/10/2010 | EP2150799A1 Atomic force microscopy probe |
| 02/10/2010 | EP2150785A1 High frequency deflection measurement of ir absorption |
| 02/04/2010 | US20100031403 Heat Coupling Device |
| 02/03/2010 | CN100587852C Sample platform for scanning force microscope for viewing film sample section |
| 02/03/2010 | CN100587481C Check system for movable boom door type container |
| 02/03/2010 | CN100587458C Stress test grid of nano material used for transmission electron microscopy |
| 01/21/2010 | US20100017924 Method for using an atomic force microscope |
| 01/19/2010 | US7647848 Integrated system for simultaneous inspection and manipulation |
| 01/14/2010 | WO2010004275A2 Sample holder |