| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 06/10/2009 | EP2067016A1 Device for scanning a sample surface covered with a liquid |
| 06/10/2009 | CN100498208C Microscopic positioning stress applied observation board |
| 06/09/2009 | US7545592 Flying height measurement method and system |
| 06/09/2009 | US7545508 Interferometric apparatus utilizing a cantilever array to measure a surface |
| 06/04/2009 | WO2009070119A1 Iterative feedback tuning in a scanning probe microscope |
| 06/04/2009 | WO2009068568A1 Intermodulation scanning force spectroscopy |
| 06/04/2009 | DE112007001684T5 Rastersondenmikroskop und Verfahren zum Messen der Relativposition zwischen Sonden A scanning probe microscope and method for measuring the relative position between probes |
| 06/03/2009 | EP2065696A1 Simulator, simulation method and simulation program |
| 06/03/2009 | EP2064534A2 Band excitation method applicable to scanning probe microscopy |
| 06/03/2009 | CN100494970C Method for observing microscopic structure of stainless steel |
| 05/28/2009 | WO2009066555A1 Scan probe microscope and probe unit for scan probe microscope |
| 05/28/2009 | US20090138994 Optical measuring head positioned to correspond to the cantilever array for measuring movement of the cantilever, whereby measuring variations in vibration frequency and/or amplitude of the cantilevers according to the rotation the disk-like base plate:biological sampling; medical diagnosis; MERSA |
| 05/22/2009 | WO2009062631A2 Method for examining a sample by scanning tunneling microscopy using a contrast agent |
| 05/21/2009 | US20090133168 Scanning probe microscope |
| 05/20/2009 | EP2060898A2 Method and system for sample preparation |
| 05/20/2009 | EP1606598A4 Raman imaging and sensing apparatus employing nanoantennas |
| 05/19/2009 | US7535817 Nanometer scale data storage device and associated positioning system |
| 05/19/2009 | US7534999 can simultaneously perform atomic-level configuration observation and elemental analysis; chemical state analysis of surface atoms |
| 05/14/2009 | US20090126051 Method and System for Sample Preparation |
| 05/14/2009 | DE19911944B4 Vorrichtung zum Abbilden eines Bereichs einer Probe An apparatus for imaging a region of a sample |
| 05/07/2009 | WO2009012765A3 Measurement probe apparatus for a probe microscope, measurement cell and scanning probe microscope |
| 05/07/2009 | US20090119807 Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope |
| 05/07/2009 | US20090116024 Method for obtaining a high resolution image |
| 05/06/2009 | EP1481279A4 Multi-detector microscopic inspection system |
| 05/06/2009 | EP1029340B1 Apparatus and method for secondary electron emission microscope |
| 04/30/2009 | WO2009053020A1 Method and apparatus for analysis of force traces |
| 04/30/2009 | WO2009036365A9 Method and apparatus of automatic scanning probe imaging |
| 04/29/2009 | EP2053379A1 Method and apparatus for analysis of force traces |
| 04/23/2009 | WO2007022013A3 Tracking qualification and self-optimizing probe microscope and method |
| 04/23/2009 | US20090106868 Atomic force microscope tip shape determination tool |
| 04/22/2009 | CN101414536A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414535A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414534A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414533A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414129A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414128A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414127A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414126A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414125A 电子束曝光系统 Electron beam exposure system |
| 04/22/2009 | CN101414124A 电子束曝光系统 Electron beam exposure system |
| 04/21/2009 | US7523027 Visual inspection and verification system |
| 04/21/2009 | US7521695 Scanning electron microscope |
| 04/15/2009 | EP2047231A1 Scanning ion conductance microscopy for the investigation of living cells |
| 04/15/2009 | CN101408496A Method for performing biological mark detection by atomic force microscope |
| 04/08/2009 | EP2045818A1 Method for using an atomic force microscope |
| 04/08/2009 | CN100477067C Software synchronization of multiple scanning probes |
| 04/07/2009 | US7513142 Tracking qualification and self-optimizing probe microscope and method |
| 04/02/2009 | US20090084952 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 04/01/2009 | EP2043131A2 Minute sample processing method |
| 04/01/2009 | EP1523652B1 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology |
| 03/31/2009 | US7511828 Three-dimensional shape measuring unit, processing unit, and semiconductor device manufacturing method |
| 03/25/2009 | EP2038894A2 Methods of polarization engineering and their applications |
| 03/25/2009 | EP1381851B1 High spatial resolution X-ray microanalysis in a particle-optical apparatus |
| 03/25/2009 | CN101395676A Method for operating a measurement system containing a scanning probe microscope, and measurement system |
| 03/24/2009 | US7507957 Probe microscope system suitable for observing sample of long body |
| 03/24/2009 | US7507591 Methods of measurement and preparation of measurement structure of integrated circuit |
| 03/19/2009 | WO2009036365A2 Method and apparatus of automatic scanning probe imaging |
| 03/19/2009 | WO2009008915A3 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids |
| 03/19/2009 | US20090077697 Method and apparatus of automatic scanning probe imaging |
| 03/18/2009 | EP2036096A1 High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer |
| 03/17/2009 | US7503206 Fluid delivery for scanning probe microscopy |
| 03/12/2009 | US20090070904 Oscillating scanning probe microscope |
| 03/10/2009 | US7502659 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 03/05/2009 | WO2008156474A9 High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer |
| 03/05/2009 | US20090057556 Method and apparatus of an inspection system using an electron beam |
| 03/04/2009 | EP2029998A1 Controlled atomic force microscope |
| 03/04/2009 | CN101377460A Method for analyzing specimen in liquid |
| 03/04/2009 | CN100465356C A GaN wafer with high surface quality and a production method thereof |
| 03/03/2009 | US7498589 Scanning probe microscope |
| 03/03/2009 | US7498564 Resonant scanning near-field optical microscope |
| 02/26/2009 | US20090050822 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus |
| 02/24/2009 | US7496250 Optical microcantilever |
| 02/24/2009 | US7494575 Method for manufacturing a split probe |
| 02/19/2009 | WO2009004107A3 Digital interface device for incorporating the image mode into a single-molecule force-clamp spectroscope |
| 02/17/2009 | US7491933 Electron beam apparatus |
| 02/12/2009 | WO2008157373A3 Position control for scanning probe spectroscopy |
| 02/12/2009 | US20090041333 Scanning electron microscope |
| 02/12/2009 | US20090039274 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 02/12/2009 | US20090039259 Scanning electron microscope |
| 02/11/2009 | EP2023373A2 Charged particle beam apparatus and irradiation method |
| 02/05/2009 | WO2008128532A3 Nanorobot module automation and exchange |
| 02/05/2009 | DE102007034853A1 Verfahren und Vorrichtung zur verbesserten mikrofluidischen Versorgung von Proben und Messeinrichtung Method and apparatus for improved microfluidic supply of samples and measuring device |
| 02/04/2009 | EP1243915B1 Apparatus for evaluating electrical characteristics |
| 02/03/2009 | US7485856 Scanning probe microscopy inspection and modification system |
| 01/29/2009 | WO2009012766A1 Method and apparatus for the combined analysis of a sample with objects to be analysed |
| 01/29/2009 | WO2009012765A2 Measurement probe apparatus for a probe microscope, measurement cell and scanning probe microscope |
| 01/29/2009 | DE102007034854A1 Verfahren und Vorrichtung zur automatisierten Messung und Kombination von Bildaufnahme und Kraftmessung Method and apparatus for automated measurement and combination of imaging and force measurements |
| 01/28/2009 | CN101354331A Method for detecting second-phase particle in molybdenum alloy thread |
| 01/28/2009 | CN101354326A Method for observing tungsten material product microscopic structure |
| 01/22/2009 | US20090020699 Microstructured pattern inspection method |
| 01/21/2009 | EP2017610A1 Ionizing method and device by electrospray |
| 01/20/2009 | US7478552 Optical detection alignment/tracking method and apparatus |
| 01/15/2009 | WO2009008915A2 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids |
| 01/14/2009 | CN201181274Y Wireless controlling mechanism for micro-nano sample under electronic microscope |
| 01/14/2009 | CN201181273Y Controlling mechanism for micro-nano sample under electronic microscope |
| 01/08/2009 | WO2009004107A2 Digital interface device for incorporating the image mode into a single-molecule force-clamp spectroscope |
| 01/08/2009 | US20090008551 Electron beam apparatus with aberration corrector |
| 01/07/2009 | EP2012109A1 Method for obtaining a high resolution image |
| 01/07/2009 | CN100449257C A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 01/06/2009 | US7474410 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |