| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 08/23/2011 | US8001830 High frequency deflection measurement of IR absorption |
| 08/17/2011 | CN201936840U 一种用于扫描电镜分析的样品座 A sample holder for scanning electron microscope analysis |
| 08/17/2011 | CN101408496B Method for performing biological mark detection by atomic force microscope |
| 08/16/2011 | CA2411198C Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 08/04/2011 | WO2011092225A1 Electronic control and amplification device for a piezoelectric local probe for measuring force beneath a particle beam |
| 07/21/2011 | US20110174974 Method and apparatus for processing a microsample |
| 07/14/2011 | US20110173729 Method for Automatically Loading a Probe Assembly |
| 07/13/2011 | EP2342532A1 Modular atomic force microscope |
| 07/12/2011 | US7977632 Scanning electron microscope |
| 07/05/2011 | US7975316 Atomic force microscope and interaction force measurement method using atomic force microscope |
| 06/30/2011 | US20110162117 Device for scanning a sample surface covered with a liquid |
| 06/29/2011 | EP2339358A1 Automatic analysis of bio-molecules |
| 06/29/2011 | CN102109771A Method for detecting semiconductor device |
| 06/28/2011 | US7969650 Multiplex near-field microscopy with diffractive elements |
| 06/22/2011 | CN102103148A Sample table for scanning electron microscope in-situ observation of stress corrosion cracking of metal material |
| 06/16/2011 | DE102009057746A1 Nanopositionierer Nanopositioner |
| 06/15/2011 | EP2333565A1 Three-dimensional base setting method for image data |
| 06/15/2011 | CN102095897A Method for preparing macromolecular samples of scanning electron microscope |
| 06/15/2011 | CN101251463B Control system for micro-nano sample in electronic microscope |
| 06/14/2011 | US7962867 Electronic design for integrated circuits based on process related variations |
| 06/09/2011 | US20110138505 Scanning probe microscopy employing correlation pattern recognition |
| 06/07/2011 | US7958563 Method for using an atomic force microscope |
| 05/31/2011 | US7954165 Scanning probe microscope |
| 05/31/2011 | US7952074 Method and apparatus for inspecting integrated circuit pattern |
| 05/25/2011 | CN102072971A Method for preparing lipid bilayer membrane in liquid phase in situ |
| 05/19/2011 | US20110114476 Method and apparatus for specimen fabrication |
| 05/18/2011 | CN101377460B Method for analyzing specimen in liquid |
| 05/17/2011 | US7943552 Coding system comprising semiconductors and which utilizes spectral emissions for determining the source, location and/or identity of items or components |
| 05/12/2011 | US20110113516 Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer |
| 05/12/2011 | US20110113515 Scanning Probe Microscope |
| 05/11/2011 | CN102054723A Method for detecting doping defects of MOS (Metal Oxide Semiconductor) device |
| 05/11/2011 | CN102053169A Method for manufacturing failure analysis sample in interconnection structure |
| 05/10/2011 | US7937991 Fully digitally controller for cantilever-based instruments |
| 05/05/2011 | US20110104830 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 05/04/2011 | CN201819918U Sample stage allowing TEM samples to be picked up conveniently |
| 05/04/2011 | CN102043070A Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument |
| 05/04/2011 | CN101354326B Method for observing tungsten material product microscopic structure |
| 05/04/2011 | CN101191776B Focused ion beam microscope sample stage and method of use thereof |
| 05/03/2011 | US7934417 Scanning probe microscope |
| 04/28/2011 | US20110099673 Stage for scanning probe microscopy and sample observation method |
| 04/19/2011 | US7930766 Fluid delivery for scanning probe microscopy |
| 04/19/2011 | US7928378 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| 04/19/2011 | US7926328 Sample manipulating apparatus |
| 04/14/2011 | WO2011007168A3 Microspectroscopy apparatus and method |
| 04/13/2011 | CN201796050U Sample table capable of stretching and compacting samples for scanning electron microscope |
| 04/05/2011 | US7921466 Method of using an atomic force microscope and microscope |
| 03/31/2011 | US20110078834 Temperature-Dependent Nanoscale Contact Potential Measurement Technique and Device |
| 03/30/2011 | CN101995489A Method for inspecting inclusion of steel for low temperature pressure vessel |
| 03/29/2011 | US7914702 Bidirectional antennas for light collection and transport using entire spectrum; supramolecular organization; photonic energy harvesting; luminescent devices, optical sensors, light emitters |
| 03/16/2011 | EP2296027A1 Optical microscope |
| 03/16/2011 | CN201765251U Flexible long sample analyzing platform for scanning electron microscope |
| 03/10/2011 | WO2011026464A1 Method for measuring the force interaction that is caused by a sample |
| 03/03/2011 | WO2010012423A8 A probe arrangement for exchanging in a controllable way liquids with micro-sized samples of material like biological cells |
| 03/03/2011 | US20110055985 Device and method for an atomic force microscope for the study and modification of surface properties |
| 03/03/2011 | US20110048115 Method for analyzing sample in liquid |
| 03/01/2011 | US7897936 Method and apparatus for specimen fabrication |
| 02/23/2011 | EP2287624A2 Scanning Probe System |
| 02/16/2011 | EP1235251B1 Electron beam apparatus |
| 02/15/2011 | US7888639 Method and apparatus for processing a micro sample |
| 02/10/2011 | WO2011016256A1 Cantilever excitation device and scanning probe microscope |
| 02/10/2011 | DE19816914B4 Abtastmikroskop Scanning tunneling microscope |
| 02/08/2011 | US7886366 Cantilever device and cantilever controlling method |
| 02/02/2011 | CN201732097U Sample stage with bending function for scanning electron microscope |
| 02/02/2011 | CN201732096U Sample stage with tension and compression functions for scanning electron microscope |
| 02/02/2011 | CN201732095U Sample stage capable of stretching and compressing sample for scanning electron microscope |
| 01/27/2011 | WO2011009209A1 Nanofluidic cell |
| 01/27/2011 | DE112008003233T5 Intermodulationsrasterkraftspektroskopie Intermodulation atomic force spectroscopy |
| 01/27/2011 | CA2768873A1 Nanofluidic cell |
| 01/26/2011 | CN101294887B Spm high resolution graphics data processing method |
| 01/25/2011 | US7876113 Method of inspecting pattern and inspecting instrument |
| 01/20/2011 | US20110016592 Iterative feedback tuning in a scanning probe microscope |
| 01/19/2011 | CN101952706A Scanning type probe microscope |
| 01/19/2011 | CN101949956A Scanning method for measuring solid particle membrane with scanning electron microscope |
| 01/19/2011 | CN101414536B 电子束曝光系统 Electron beam exposure system |
| 01/18/2011 | US7874016 Scanning probe microscope and scanning method |
| 01/12/2011 | CN201707351U Safety protective device of scanning electron microscope capable of preventing samples to be measured from being scraped |
| 01/11/2011 | US7870616 Probe arrangement |
| 01/11/2011 | US7866205 Sample operation apparatus |
| 01/06/2011 | US20110004967 Band excitation method applicable to scanning probe microscopy |
| 01/04/2011 | US7865966 Method and apparatus of automatic scanning probe imaging |
| 01/04/2011 | US7861577 Electric potential difference detection method and scanning probe microscope |
| 12/30/2010 | US20100333240 Fully Digitally Controller for Cantilever-Based Instruments |
| 12/29/2010 | EP2267189A1 High surface quality gan wafer and method of fabricating same |
| 12/29/2010 | EP1305816B1 Collection of secondary electrons through the objective lens of a scanning electron microscope |
| 12/29/2010 | CN101210863B Sample preparation method for measuring aluminium electrolysis capacitor electric pole foil microscopic appearance |
| 12/23/2010 | WO2010146773A1 Microcontact prober |
| 12/22/2010 | EP2263070A1 Synchronized imaging by way of an optical method and atomic force microscopy |
| 12/22/2010 | CN201681093U Take and put device of sample support and scanning electron microscopy |
| 12/21/2010 | US7856665 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 12/16/2010 | US20100314541 Microstructured pattern inspection method |
| 12/15/2010 | CN101109675B Virus example and its preparing method used for AFM research |
| 12/09/2010 | US20100313311 Scanning probe in pulsed-force mode, digital and in real time |
| 12/09/2010 | US20100312495 Intermodulation scanning force spectroscopy |
| 12/08/2010 | CN101907585A Quantitative measurement method for acicular ferrite of pipeline steel |
| 12/07/2010 | US7849515 Nanotweezer and scanning probe microscope equipped with nanotweezer |
| 12/07/2010 | US7847926 Defining a pattern on a substrate |
| 12/02/2010 | US20100306887 Molded microfluidic fluid cell for atomic force microscopy |
| 12/02/2010 | US20100306886 Probe Microscope |
| 11/25/2010 | WO2010133196A1 Method and apparatus for carrying out a quantitative spatially resolved local and distribution analysis of chemical elements and in-situ characterization of the ablated surface regions |
| 11/25/2010 | US20100294929 Sample Electrification Measurement Method and Charged Particle Beam Apparatus |