| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 07/11/2012 | CN102565459A Transparent illumination device applied to process of detecting micro-pore shape by atomic force microscope |
| 07/05/2012 | US20120172256 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 07/03/2012 | US8214917 Molded microfluidic fluid cell for atomic force microscopy |
| 07/03/2012 | US8212227 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus |
| 06/27/2012 | CN102520212A Device for thinning multi-layer material and method for thinning to-be-detected sample |
| 06/26/2012 | US8205488 Fully digitally controller for cantilever-based instruments |
| 06/26/2012 | US8205487 Probe microscope setup method |
| 06/20/2012 | CN102507985A Incline measuring method for STM (Scanning Tunneling Microscope) with vertical side wall micro structure |
| 06/14/2012 | US20120147722 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material |
| 06/13/2012 | EP2463665A1 Cantilever excitation device and scanning probe microscope |
| 06/13/2012 | CN102495237A In-situ processing test device for material interface |
| 06/06/2012 | CN102486477A Model-based hysteresis feed-forward correction method of piezoelectric ceramic scanner |
| 05/31/2012 | US20120132801 Method and an apparatus of an inspection system using an electron beam |
| 05/30/2012 | EP2457078A1 Nanofluidic cell |
| 05/30/2012 | CN102483428A Method for measuring the force interaction that is caused by a sample |
| 05/29/2012 | US8191168 Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope |
| 05/23/2012 | EP2141481B1 Device and method for acquiring a field by measurement |
| 05/10/2012 | WO2012060033A1 Device for measuring in-liquid electric potential, and atomic force microscope |
| 05/09/2012 | EP2450687A1 Method for determining the spring constant of a cantilever device |
| 05/09/2012 | CN102445567A Monitoring method of environmental magnetic shield of electronic scanning microscope |
| 05/09/2012 | CN102445566A 表面分析器 Surface Analyzer |
| 05/09/2012 | CN101792147B Surface modification method of silica particles and method for displaying latent fingerprints |
| 05/02/2012 | CN102435784A 表面分析器 Surface Analyzer |
| 04/26/2012 | US20120102601 Scanning probe microscope |
| 04/25/2012 | CN202204831U Substrate applicable to suspension state cell atomic force microscope eutopic imaging |
| 04/24/2012 | US8166567 Fast-scanning SPM scanner and method of operating same |
| 04/19/2012 | US20120091338 Environmental cell for a particle-optical apparatus |
| 04/18/2012 | CN102419382A Analysis method for observing shape of powdery sample by scanning electron microscope |
| 04/17/2012 | US8160848 Apparatus for generating coarse-grained simulation image of sample to be measured with a probe of a scanning probe microscope |
| 04/12/2012 | WO2012045986A1 Near-field optical microscope |
| 04/12/2012 | US20120090056 Microcontact prober |
| 04/11/2012 | EP1679541B1 Specimen observation method and microscope, and, for use therein, solid immersion lens and optical contact liquid |
| 04/04/2012 | EP2435829A1 Imaging method and use thereof |
| 04/04/2012 | CN101414128B 电子束曝光系统 Electron beam exposure system |
| 03/29/2012 | WO2011149684A3 Resonance compensation in scanning probe microscopy |
| 03/28/2012 | EP2433145A1 Method and apparatus for carrying out a quantitative spatially resolved local and distribution analysis of chemical elements and in-situ characterization of the ablated surface regions |
| 03/28/2012 | EP1063641B1 Information recording apparatus |
| 03/27/2012 | US8143589 Stable emission gas ion source and method for operation thereof |
| 03/22/2012 | WO2012035826A1 Scanning probe microscope and surface shape measuring method using same |
| 03/21/2012 | EP1779286B1 Laser-based method and system for processing targeted surface material and article produced thereby |
| 03/20/2012 | US8141168 Scanning probe microscope and a method to measure relative-position between probes |
| 03/20/2012 | US8136385 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 03/15/2012 | WO2011116389A3 Low drift scanning probe microscope |
| 03/15/2012 | US20120066800 Fluid delivery for scanning probe microscopy |
| 03/15/2012 | US20120061566 Scanning electron microscope |
| 03/13/2012 | US8134125 Method and apparatus of an inspection system using an electron beam |
| 03/08/2012 | WO2012028822A1 Storage box for afm probes |
| 03/07/2012 | CN101414124B 电子束曝光系统 Electron beam exposure system |
| 03/06/2012 | US8132268 Apparatus and method for the detection of forces in the sub-micronewton range |
| 02/29/2012 | EP2423676A1 Probe apparatus |
| 02/22/2012 | CN101414125B 电子束曝光系统 Electron beam exposure system |
| 02/15/2012 | CN101414126B 电子束曝光系统 Electron beam exposure system |
| 02/08/2012 | EP2416165A1 Method of forming a 3D reconstruction of a sample using a scanning probe microscope |
| 02/08/2012 | EP2416164A2 Band excitation method applicable to scanning probe microscopy |
| 02/08/2012 | CN102346152A Sample failure analysis method |
| 02/02/2012 | DE19802848B4 Verfahren und Vorrichtung zum Testen eines Substrats Method and apparatus for testing a substrate |
| 01/11/2012 | EP2404164A1 A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid |
| 01/10/2012 | US8093558 Environmental cell for a particle-optical apparatus |
| 01/03/2012 | US8091143 Atomic force microscopy probe |
| 01/03/2012 | US8087288 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 12/29/2011 | WO2011160863A1 Scanning probe microscope with nanotome |
| 12/28/2011 | CN101606051B 原子间力显微镜以及采用原子间力显微镜的相互作用力测定方法 Atomic force microscopy and interaction using an atomic force microscope measurement method |
| 12/22/2011 | US20110314577 Method for automatic adjustment of the applied force and control of the force drift in an atomic force microscope during contact mode imaging |
| 12/21/2011 | EP2396664A1 Method for automatic adjustment of the applied force and control of the force drift in an atomic force microscope during contact mode imaging. |
| 12/20/2011 | US8080790 Scanning electron microscope |
| 12/15/2011 | WO2011154877A1 Device for topographical characterisation and chemical mapping of surfaces |
| 12/08/2011 | US20110302676 Method and Device for Examining a Sample with a Probe Microscope |
| 12/07/2011 | EP2392930A1 Scanning probe microscope |
| 12/07/2011 | CN1595302B 彩色调色剂 Color toner |
| 12/07/2011 | CN102269772A 一种纳米微粒浮栅透射电子显微镜观测样品制备方法 A nanoparticle floating gate transmission electron microscopy observation sample preparation method |
| 12/07/2011 | CN102269771A 一种透射电子显微镜观测样品制备方法 An electron microscope sample preparation method for observing transmission |
| 12/06/2011 | US8074293 Defective product inspection apparatus, probe positioning method and probe moving method |
| 12/01/2011 | WO2011149684A2 Resonance compensation in scanning probe microscopy |
| 12/01/2011 | US20110296561 Control system for scanning probe microscope |
| 11/29/2011 | US8069493 Atomic force microscope apparatus |
| 11/29/2011 | US8065908 Scan type probe microscope |
| 11/17/2011 | US20110283428 High frequency deflection measurement of IR absorption |
| 11/16/2011 | CN202041548U Sample table for temperature-change ultrahigh-vacuum tunnel scanning microscope |
| 11/10/2011 | US20110275092 Method for detecting biological markers by an atomic force microscope |
| 11/09/2011 | CN101837943B Sensor for quantitatively measuring mechanical and electrical properties and microstructure and manufacturing method thereof |
| 10/25/2011 | US8046843 Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material |
| 10/25/2011 | US8042383 Digital Q control for enhanced measurement capability in cantilever-based instruments |
| 10/20/2011 | US20110253939 Dye loaded zeolite material |
| 10/18/2011 | US8037739 Method for analyzing sample in liquid |
| 10/13/2011 | WO2011059809A3 Scanning probe microscope having support stage incorporating a kinematic flexure arrangement |
| 10/11/2011 | US8035089 Scanning probe apparatus |
| 10/05/2011 | EP2372743A2 Charged particle beam system with an ion generator |
| 10/04/2011 | US8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope |
| 09/28/2011 | CN101220244B High surface quality GaN wafer and method of fabricating same |
| 09/22/2011 | WO2011116389A2 Low drift scanning probe microscope |
| 09/21/2011 | CN102192850A Solution and method for displaying outline of electrostatics discharge (ESD) positive-negative (PN) junction in power metal oxide semiconductor (MOS) |
| 09/20/2011 | US8022610 Electronic device containing carbon nanotubes |
| 09/15/2011 | DE102010015966A1 Quasi in-situ raster probe microscope i.e. atomic force microscope, for use in e.g. corrosive fluid treatment, has force generating apparatus for closing and sealing chamber and producing force on locking device |
| 09/14/2011 | EP1464618B1 Sharp end, multi-layer carbon nano-tube radial aggregate and method of manufacturing the aggregate |
| 09/14/2011 | CN102183678A Multifunctional electrolytic tank for scanning electrochemical microscope |
| 09/07/2011 | CN102175198A Equal-tension suspension mechanism for contact scanning probe |
| 08/31/2011 | EP1376649B1 Magnetic field applying sample observing system |
| 08/30/2011 | US8008635 Method for sample preparation |
| 08/23/2011 | US8006316 Scanning ion conductance microscopy for the investigation of living cells |
| 08/23/2011 | US8006315 Photon-emission scanning tunneling microscopy |