| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 04/24/2013 | CN103069279A Low drift scanning probe microscope |
| 04/24/2013 | CN103063881A Scanning method for scanning sample with probe |
| 04/24/2013 | CN103063880A Method of temperature drift estimating and compensating in scanning probe microscopy |
| 04/17/2013 | CN102043070B Amplitude-modulated dynamometric gradometer for feeding back fixed amplitudes as well as scanning force microscopy and frequency measurement instrument |
| 04/11/2013 | WO2013051094A1 Scanning probe microscope |
| 04/11/2013 | WO2013050770A1 Method of investigating a sample surface by scanning probe microscopy which adjusts probe misalignments |
| 04/10/2013 | EP2577326A2 Resonance compensation in scanning probe microscopy |
| 04/10/2013 | EP2577325A1 Device for topographical characterisation and chemical mapping of surfaces |
| 04/10/2013 | CN101776699B Double-PZT symmetrical integrated large-strain loading device |
| 04/09/2013 | US8418261 Stage for scanning probe microscopy and sample observation method |
| 04/09/2013 | US8415613 Method and apparatus for characterizing a sample with two or more optical traps |
| 04/04/2013 | WO2013047538A1 Ac magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 04/04/2013 | WO2013047537A1 Dc magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 03/27/2013 | CN102998319A Method for studying microstructure of clonorchis sinensis egg in gallstone |
| 03/21/2013 | WO2013038659A1 Potential-measuring device, and atomic force microscope |
| 03/20/2013 | CN102981022A Method of determining a spring constant of a cantilever and scanning probe microscope using the method |
| 03/15/2013 | DE202013002076U1 Sensoreinrichtung zum Erkennen von polarisierbaren Partikeln Sensor means for detecting particles polarizable |
| 03/07/2013 | US20130061356 Active Damping of High Speed Scanning Probe Microscope Components |
| 03/06/2013 | EP2565902A2 Electron beam exposure system |
| 02/19/2013 | CA2787916A1 Method and system for measuring amplitude and phase difference between two sinusoidal signals |
| 02/14/2013 | US20130042375 Control system for a scanning probe microscope |
| 02/12/2013 | US8371184 Flow velocity and pressure measurement using a vibrating cantilever device |
| 02/12/2013 | US8371182 Mounting systems for a surface forces apparatus |
| 02/06/2013 | CN202720241U Fiber ejecting device based on scanning electron microscope environment |
| 02/05/2013 | US8370960 Modular atomic force microscope |
| 02/05/2013 | US8368017 Method for the operation of a measurement system with a scanning probe microscope and a measurement system |
| 01/31/2013 | WO2012116168A3 Integrated microscope and related methods and devices |
| 01/31/2013 | US20130031680 Semi-auto scanning probe microscopy scanning |
| 01/23/2013 | EP2548033A2 Low drift scanning probe microscope |
| 01/23/2013 | CN101861513B Method for examining a sample using a scanning tunneling microscope |
| 01/10/2013 | US20130014296 Probe assembly for a scanning probe microscope |
| 01/09/2013 | CN102866264A Fiber push-out device based on scanning electron microscope environment |
| 01/09/2013 | CN102866048A Preparation method of metallographic display sample of Ti-Cu laminar composite |
| 01/09/2013 | CN102866047A Method for preparing metallographic display sample made of Ti-Al laminated composite material |
| 01/03/2013 | US20130007929 Frequency Measuring and Control Apparatus with Integrated Parallel Synchronized Oscillators |
| 01/01/2013 | US8347410 Method for examining a sample |
| 01/01/2013 | US8347409 Resonance compensation in scanning probe microscopy |
| 01/01/2013 | US8342008 Scanning probe microscope |
| 12/27/2012 | WO2012149449A3 Cleaning station for atomic force microscope |
| 12/27/2012 | US20120327429 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope |
| 12/26/2012 | CN102841220A Clay scanning electron micrograph segmentation method based on porosity |
| 12/26/2012 | CN101949956B Scanning method for measuring solid particle membrane with scanning electron microscope |
| 12/11/2012 | US8332960 Device for scanning a sample surface covered with a liquid |
| 12/05/2012 | EP2529239A1 Electronic control and amplification device for a piezoelectric local probe for measuring force beneath a particle beam |
| 11/28/2012 | CN102175198B Equal-tension suspension mechanism for contact scanning probe |
| 11/28/2012 | CN101414129B 电子束曝光系统 Electron beam exposure system |
| 11/27/2012 | US8321960 Scanning probe microscope |
| 11/21/2012 | CN1706002B Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 11/21/2012 | CN101819217B Method for inverting micro-nano planar periodic structure |
| 11/21/2012 | CN101395676B Method for operating a measurement system containing a scanning probe microscope, and measurement system |
| 11/14/2012 | EP2523207A2 Electron beam generator |
| 11/14/2012 | CN202533454U Ultrasonic single molecular sample preparation device |
| 11/14/2012 | CN102778588A Laser detecting device for high-speed atomic force microscope and detecting method thereof |
| 11/14/2012 | CN102778467A Method for detecting harmful substances of asbestos |
| 11/13/2012 | US8312561 Device and method for the micromechanical positioning and handling of an object |
| 11/13/2012 | US8308968 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 11/06/2012 | US8304724 Microstructured pattern inspection method |
| 11/06/2012 | US8302456 Active damping of high speed scanning probe microscope components |
| 11/01/2012 | WO2012149449A2 Cleaning station for atomic force microscope |
| 11/01/2012 | US20120273692 Method and apparatus for processing a microsample |
| 10/31/2012 | CN102192850B Solution and method for displaying outline of electrostatics discharge (ESD) positive-negative (PN) junction in power metal oxide semiconductor (MOS) |
| 10/30/2012 | US8300919 Apparatus for data analysis |
| 10/23/2012 | US8296856 Control system for scanning probe microscope |
| 10/18/2012 | US20120266336 Fully Digitally Controller for Cantilever-Based Instruments |
| 10/17/2012 | CN102183678B Multifunctional electrolytic tank for scanning electrochemical microscope |
| 10/17/2012 | CN102054723B Method for detecting doping defects of MOS (Metal Oxide Semiconductor) device |
| 10/16/2012 | US8291511 Apparatus and method for investigating biological systems and solid systems |
| 10/16/2012 | US8288154 Motion sensor for monitoring migration, vibrational movement, oscillations and fluctuation in semen, ear cilia, bacteria and kinesins |
| 10/10/2012 | CN202486157U Phase-locked amplifier for scanning probe microscopy |
| 10/10/2012 | CN101517393B Scanning ion conductance microscopy for the investigation of living cells |
| 10/09/2012 | US8286261 Scanning probe in pulsed-force mode, digital and in real time |
| 10/09/2012 | US8286260 Protein microscope |
| 10/09/2012 | US8284406 Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope |
| 10/03/2012 | CN1662662B Nucleic acid sequencing by signal stretching and data integration |
| 10/03/2012 | CN101414534B 电子束曝光系统 Electron beam exposure system |
| 09/19/2012 | CN102680742A Method for labeling atomic force nano-probe sample and method for manufacturing integrated circuit |
| 09/19/2012 | CN102680741A Metering type scanning electronic microscope imaging control system and scanning imaging method |
| 09/05/2012 | CN101793911B Nano indentation system based on scanning electron microscope |
| 09/04/2012 | CA2563843C Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope |
| 08/30/2012 | WO2012116168A2 Integrated microscope and related methods and devices |
| 08/29/2012 | CN101952706B Scanning type probe microscope |
| 08/29/2012 | CN101300480B Scanning probe microscopy method and apparatus utilizing sample pitch |
| 08/23/2012 | US20120216322 Digital Q control for enhanced measurement capability in cantilever-based instruments |
| 08/22/2012 | CN1979126B Method and device for analysis of a sample |
| 08/21/2012 | US8250667 Iterative feedback tuning in a scanning probe microscope |
| 08/21/2012 | US8248599 Methods of polarization engineering and their applications |
| 08/15/2012 | CN102640007A Scanning probe microscope having support stage incorporating a kinematic flexure arrangement |
| 08/09/2012 | US20120204295 Fast-scanning spm scanner and method of operating same |
| 08/01/2012 | EP2482080A1 Scanning probe microscope combined with a device for modification of the object surface |
| 08/01/2012 | CN102621437A Method for initiatively testing invalidation positioning of voltage contrast ratio |
| 07/26/2012 | WO2012098349A1 Lab on a chip device |
| 07/25/2012 | CN102608360A Representation method for cell microdomain flexibility |
| 07/19/2012 | US20120185977 Tip-mounted nanowire light source instrumentation |
| 07/18/2012 | EP2477037A1 Optical component for integrating the optical microscopy into the atomic force microscopy maintaining maximal performance of the atomic force microscopy. |
| 07/18/2012 | CN102590558A Movable temperature control system for environmental scanning electron microscope |
| 07/18/2012 | CN101713788B Method for testing electromechanical properties of nano-wire/micron-scale wire in condition of in-situ bending |
| 07/17/2012 | US8222905 Determination of field distribution |
| 07/17/2012 | US8222618 Method and apparatus for processing a microsample |
| 07/17/2012 | US8222592 Dye loaded zeolite material |
| 07/11/2012 | EP2473858A1 Method for measuring the force interaction that is caused by a sample |