| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 05/11/2006 | US20060097163 Scanning probe microscope using a surface drive actuator to position the scanning tip |
| 05/11/2006 | US20060097162 Apparatus and method for determining surface profiles using a scanning probe microscope |
| 05/11/2006 | US20060097158 Scanning electron microscope |
| 05/11/2006 | US20060097142 Flexure assembly for a scanner |
| 05/11/2006 | DE102004037837B3 Vorrichtung zur Schaffung einer evakuierten Tieftemperaturumgebung für eine Probe und Verwendung der Vorrichtung An apparatus for providing an evacuated cryogenic environment for a sample and using the apparatus |
| 05/10/2006 | EP1655265A2 Single-atom tip and preparation method thereof |
| 05/10/2006 | EP1540661B1 Sensor with cantilever and optical resonator |
| 05/10/2006 | CN1769860A Surface texture measuring probe and microscope utilizing the same |
| 05/09/2006 | US7040147 Method and apparatus for manipulating a sample |
| 05/04/2006 | US20060090550 Surface texture measuring probe and microscope utilizing the same |
| 05/03/2006 | EP1653478A2 Surface texture measuring probe and microscope utilizing the same |
| 05/03/2006 | EP1653213A1 Scanning-type probe microscope |
| 05/02/2006 | US7036357 Dynamic activation for an atomic force microscope and method of use thereof |
| 04/20/2006 | WO2006040025A1 Device and method for scanning probe microscopy |
| 04/20/2006 | US20060081040 Surface information measuring apparatus and surface information measuring method |
| 04/13/2006 | US20060076790 Electrostatically driven carbon nanotube gripping device |
| 04/13/2006 | US20060075626 Electroplating a small quantity of noble metal on the apex of a single crystal metal wire that has been etched to form a tip in low concentration noble metal electrolyte in a base aqueous liquid; annealing in vacuum or in inert gas ambient to diffuse the additional electroplated noble metal atoms |
| 04/12/2006 | EP1644937A1 Probe for an atomic force microscope |
| 04/11/2006 | US7026607 Scanning probe microscope |
| 04/11/2006 | US7024925 3-axis straight-line motion stage and sample test device using the same |
| 04/06/2006 | WO2006036217A2 Thermal control of deposition in dip pen nanolithography |
| 04/05/2006 | EP1643510A1 Atomic force microscope |
| 04/05/2006 | CN1755346A 原子力显微镜 AFM |
| 03/30/2006 | WO2006034470A2 Sensors for electrochemical, electrical or topographical analysis |
| 03/30/2006 | US20060065047 Atomic force microscope |
| 03/29/2006 | EP1640996A2 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 03/28/2006 | US7017398 Active probe for an atomic force microscope and method for use thereof |
| 03/23/2006 | US20060063153 Interaction detecting method and bioassay device, and bioassay-use substrate |
| 03/23/2006 | US20060060794 Method of preventing charging, and apparatus for charged particle beam using the same |
| 03/23/2006 | US20060060778 Probe microscope system suitable for observing sample of long body |
| 03/21/2006 | US7013717 Manual control with force-feedback for probe microscopy-based force spectroscopy |
| 03/16/2006 | WO2006029292A2 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 03/08/2006 | EP1631967A1 Scanning probe microscope using a surface drive actuator to position the scanning probe tip |
| 03/08/2006 | CN1745179A Method and apparatus for molecular analysis in small sample volumes |
| 03/07/2006 | US7009414 Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope |
| 03/07/2006 | US7009178 Scanning electron microscope |
| 03/07/2006 | US7007408 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 03/02/2006 | US20060043289 Environmental cell for a scanning probe microscope |
| 03/02/2006 | US20060043286 Balanced momentum probe holder |
| 03/02/2006 | US20060043257 Method and apparatus for calibration of near-field scanning optical microscope tips for laser machining |
| 03/01/2006 | CN1742197A Fully digital controller for cantilever-based instruments |
| 02/23/2006 | WO2006019130A1 Probe scan control method and probe scan control device for scanning probe microscope |
| 02/23/2006 | WO2005050666A3 An oscillating probe with a virtual probe tip |
| 02/23/2006 | US20060040057 Thermal control of deposition in dip pen nanolithography |
| 02/23/2006 | US20060038133 Rotating specimen holder |
| 02/23/2006 | DE102005037570A1 Rastermikroskop und Lasermikroskop Scanning microscope and laser microscope |
| 02/21/2006 | US7002151 Scanning electron microscope |
| 02/21/2006 | US7002138 Flexure assembly for a scanner |
| 02/16/2006 | US20060035234 detecting molecules and molecular interaction events, retrieving and analyzing analytes, and delivering substances to cells or tissues using probes of the invention |
| 02/16/2006 | US20060033918 Scanning microscope and laser microscope |
| 02/16/2006 | US20060032296 Software synchronization of multiple scanning probes |
| 02/15/2006 | EP1625349A2 Spring constant calibration device |
| 02/14/2006 | US6998228 Generation of solid support for use in the detection of preferential targets in sample; obtain surface, deposit preferential material on surface, form support |
| 02/09/2006 | WO2006012881A1 Process and device for creating an evacuated, deep-temperature environment for a sample |
| 02/09/2006 | US20060027739 Scanning probe microscope and method |
| 02/08/2006 | EP1622500A2 Parallel analysis of molecular interactions |
| 02/07/2006 | US6993959 System and method for the analysis of atomic force microscopy data |
| 02/02/2006 | WO2006011348A1 Molecule measuring device and molecule measuring method |
| 02/02/2006 | US20060022138 Electron beam apparatus, and inspection instrument and inspection process thereof |
| 01/26/2006 | WO2006008550A1 Optically controllable device |
| 01/26/2006 | US20060016251 Topography and recognition imaging atomic force microscope and method of operation |
| 01/25/2006 | EP1619165A2 Electrostatically driven carbon nanotube gripping apparatus |
| 01/19/2006 | US20060013528 Scanning method and apparatus |
| 01/19/2006 | US20060011830 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/19/2006 | US20060011467 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/05/2006 | US20060000263 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 12/28/2005 | EP1609164A1 Resistive cantilever spring for probe microscopy |
| 12/22/2005 | WO2004104516A8 Spring constant calibration device |
| 12/22/2005 | US20050280174 Surface treatment and surface scanning |
| 12/22/2005 | US20050279158 Atomic force microscope and corrector thereof and measuring method |
| 12/21/2005 | EP1607786A1 Microscope and sample observing method |
| 12/20/2005 | US6977376 Method of prevention charging, and apparatus for charged particle beam using the same |
| 12/15/2005 | WO2005119728A2 Electron stream apparatus and method |
| 12/15/2005 | WO2005119697A1 Tip structure for scanning devices, method of its preparation and devices thereon |
| 12/15/2005 | WO2005119206A1 Method and device for controlling photo-excitation q value of vibrator |
| 12/15/2005 | WO2005119205A1 Instrument for electrical characterisation on a nanometric scale |
| 12/15/2005 | WO2005119204A1 Probe head manufacturing method |
| 12/08/2005 | US20050269915 Long-stroke, high-resolution nanopositioning mechanism |
| 12/08/2005 | US20050269511 Probe driving method, and probe apparatus |
| 12/08/2005 | US20050269510 Electrical scanning probe microscope apparatus |
| 12/08/2005 | US20050269509 Method for manufacturing single wall carbon nanotube tips |
| 12/08/2005 | US20050269495 Compound scanning probe microscope |
| 12/07/2005 | CN1230669C Scanning probe-needle microscope |
| 12/06/2005 | US6972562 Near-field magneto-optical microscope |
| 12/01/2005 | WO2005114230A2 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 12/01/2005 | US20050266586 Stylus system for modifying small structures |
| 12/01/2005 | US20050264825 Sensor with cantilever and optical resonator |
| 12/01/2005 | US20050262931 System for sensing a sample |
| 12/01/2005 | US20050262930 Scanning probe microscopy apparatus and techniques |
| 11/24/2005 | US20050260775 Physical nano-machining with a scanning probe system for integrated circuit modification |
| 11/17/2005 | US20050253083 Charged particle beam apparatus and charged particle beam irradiation method |
| 11/17/2005 | US20050252282 Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby |
| 11/15/2005 | US6965112 Specimen holder, observation system, and method of rotating specimen |
| 11/10/2005 | US20050250224 Method of inspecting pattern and inspecting instrument |
| 11/09/2005 | CN2739617Y Biological full-internal reflective near-field scanning microscope |
| 11/03/2005 | WO2005104138A1 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 11/03/2005 | WO2005103604A2 Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing spm probes |
| 11/03/2005 | US20050246129 Near-field scanning microwave microscope using dielectric resonator |
| 11/03/2005 | US20050242283 Scanning probe microscope and specimen surface structure measuring method |
| 11/03/2005 | US20050241374 High Aspect Ratio Tip Atomic Force Microscopy Cantilevers and Method of Manufacture |