| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 03/05/2015 | US20150067930 Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source |
| 03/05/2015 | US20150067929 Illumination for optical scan and measurement |
| 02/26/2015 | US20150059025 Scanning probe microscope |
| 02/17/2015 | US8959661 Atomic force microscope probe, method for preparing same, and uses thereof |
| 02/17/2015 | US8957370 Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system |
| 02/12/2015 | US20150047078 Scanning probe microscope comprising an isothermal actuator |
| 02/12/2015 | DE102012104749B4 Mehrachsige Aktorvorrichtung Multi-axis actuator device |
| 02/05/2015 | US20150040273 Compound microscope |
| 02/05/2015 | US20150034821 Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system |
| 02/03/2015 | US8950010 Method for measuring a piezoelectric response by means of a scanning probe microscope |
| 01/29/2015 | WO2015011448A1 Adaptive mode scanning probe microscope |
| 01/22/2015 | US20150026846 Variable Density Scanning |
| 01/15/2015 | US20150020243 Scanning mechanism and scanning probe microscope |
| 01/08/2015 | US20150013035 Probe actuation |
| 01/06/2015 | US8925376 Fully digitally controller for cantilever-based instruments |
| 12/30/2014 | US8925111 Scanning probe microscope and method of operating the same |
| 12/25/2014 | US20140380531 Probe-based data collection system with adaptive mode of probing controlled by local sample properties |
| 12/24/2014 | CN103116040B 基于扫描隧道效应的在位测量装置及扫描探针自动对中方法 Based reign measuring device and scanning probe scanning tunneling AF method |
| 12/16/2014 | US8914911 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy |
| 12/16/2014 | US8914909 Frequency measuring and control apparatus with integrated parallel synchronized oscillators |
| 12/16/2014 | US8912707 Friction-driven actuator |
| 12/11/2014 | US20140366228 Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy |
| 12/10/2014 | CN102788888B 扫描探针显微镜进针装置及方法 Scanning probe microscope needle apparatus and method |
| 12/09/2014 | US8910311 Probe assembly for a scanning probe microscope |
| 12/02/2014 | US8904560 Closed loop controller and method for fast scanning probe microscopy |
| 11/25/2014 | US8895923 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing |
| 11/13/2014 | US20140338073 Method and device for controlling a scanning probe microscope |
| 11/11/2014 | US8887311 Scanning probe microscope |
| 11/04/2014 | US8881311 Method and apparatus of physical property measurement using a probe-based nano-localized light source |
| 10/23/2014 | US20140317789 Method for controlling a scanning microscope |
| 10/21/2014 | US8869310 Low drift scanning probe microscope |
| 10/14/2014 | US8860260 High-scan rate positioner for scanned probe microscopy |
| 10/14/2014 | US8857248 Piezoelectric microcantilevers and uses in atomic force microscopy |
| 10/02/2014 | WO2014155983A1 Signal detection circuit and scanning probe microscope |
| 10/02/2014 | US20140298548 Scanning probe microscope |
| 09/25/2014 | WO2014152963A1 Dynamic medical ecosystems modeling |
| 09/25/2014 | US20140289910 Sealed afm cell |
| 09/23/2014 | US8844061 Scanning probe microscope |
| 09/23/2014 | US8841603 Illumination for optical scan and measurement |
| 09/18/2014 | WO2014143727A1 Method and apparatus for adaptive tracking using a scanning probe microscope |
| 09/18/2014 | US20140283228 Dual-Probe Scanning Probe Microscope |
| 09/18/2014 | US20140283227 Method and apparatus for adaptive tracking using a scanning probe microscope |
| 09/17/2014 | EP2776851A1 Method and apparatus of tuning a scanning probe microscope |
| 09/16/2014 | US8839461 Potential measurement device and atomic force microscope |
| 09/11/2014 | US20140259234 Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source |
| 09/09/2014 | CA2491404C Scanning probe microscope |
| 08/19/2014 | US8813261 Scanning probe microscope |
| 08/19/2014 | US8810110 Micro-mechanical component with cantilever integrated electrical functional element |
| 08/13/2014 | CN103986365A 多区驱动的惯性压电马达装置及扫描探针显微镜和控制法 Multi-zone-driven inertial piezoelectric motor means and scanning probe microscopy and Control Act |
| 08/07/2014 | US20140223614 Potential measurement device and atomic force microscope |
| 08/07/2014 | US20140223613 Scanning probe microscope and control method thereof |
| 08/07/2014 | US20140223612 Modular Atomic Force Microscope |
| 08/07/2014 | US20140216935 Dielectrophoretic Tweezers as a Platform for Molecular Force Spectroscopy in a Highly Parallel Format |
| 08/05/2014 | US8796654 Scan device for microscope measurement instrument |
| 07/30/2014 | CN203745360U 基于多角度平面透射镜的微悬臂梁阵列传感器的微悬臂梁偏转扫描系统 Based on the multi-angle planar transmission mirror microcantilever array sensor microcantilever deflection scanning system |
| 07/15/2014 | US8782810 Scanning probe microscope having support stage incorporating a kinematic flexure arrangement |
| 07/10/2014 | US20140196179 Ultra-compact nanocavity-enhanced scanning probe microscopy and method |
| 07/03/2014 | WO2014104892A1 A micromechanical system with a composite beam having an adjustable stiffness |
| 07/02/2014 | EP2749890A1 A composite beam having an adjustable stiffness. |
| 07/02/2014 | CN102084431B 探针检测系统 Probe Detection System |
| 07/01/2014 | US8769711 Method for examining a measurement object, and apparatus |
| 07/01/2014 | US8769710 Atomic force microscope system using selective active damping |
| 07/01/2014 | US8769709 Apparatus and method for analyzing and modifying a specimen surface |
| 07/01/2014 | US8763475 Active damping of high speed scanning probe microscope components |
| 06/24/2014 | US8763160 Measurement of the surface potential of a material |
| 06/19/2014 | WO2014090971A1 Method and device for controlling a scanning probe microscope |
| 06/18/2014 | CN103872943A Double-slider high-precision inertial piezoelectric motor, control method and scanning probe microscope |
| 06/18/2014 | CN103869102A Statistical and classifying method for loads of large regional power grid |
| 06/04/2014 | CN103837472A Micro cantilever beam deflection scanning system and method for micro cantilever beam array sensor based on multi-angle plane transmitting mirrors |
| 05/28/2014 | DE102008020982B4 Probenpositioniervorrichtung und Rastersondenmikroskop mit der Probenpositioniervorrichtung Probenpositioniervorrichtung and scanning probe microscope with the Probenpositioniervorrichtung |
| 05/22/2014 | US20140143912 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing |
| 05/20/2014 | US8732861 Control system for a scanning probe microscope |
| 05/15/2014 | US20140137300 Atomic force microscope system using selective active damping |
| 05/13/2014 | US8726409 Method for driving a scanning probe microscope at elevated scan frequencies |
| 04/17/2014 | WO2014057268A1 Multiple probe actuation |
| 04/10/2014 | WO2014055046A1 Method for performing the local charge transient analysis |
| 04/09/2014 | EP2715767A1 Apparatus and method for investigating an object |
| 04/08/2014 | US8695108 In-liquid potential measurement device and atomic force microscope |
| 04/01/2014 | US8689359 Apparatus and method for investigating surface properties of different materials |
| 04/01/2014 | US8689358 Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers |
| 04/01/2014 | US8686358 Sub-microsecond-resolution probe microscopy |
| 04/01/2014 | CA2631179C Optical device comprising a cantilever and method of fabrication and use thereof |
| 03/26/2014 | EP2710386A1 Device for ultra-precise positioning of an element and positioning system comprising such a device |
| 03/06/2014 | WO2014033452A1 Multiple probe actuation |
| 03/06/2014 | WO2014033430A1 Photothermal actuation of a probe for scanning probe microscopy |
| 03/05/2014 | CN103616532A Independent low-return-difference and high-rescanning probe microscope scanner |
| 03/04/2014 | US8666165 Scanning electron microscope |
| 02/27/2014 | US20140059724 Scanning Probe Microscope |
| 02/20/2014 | US20140051333 Methods and apparatus for nanolapping |
| 02/19/2014 | CN102356325B Apparatus and method for electromechanical positioning |
| 02/13/2014 | WO2014024685A1 Scanning mechanism and scanning probe microscope |
| 02/11/2014 | US8650661 Method and apparatus for characterizing a probe tip |
| 02/04/2014 | US8646109 Method and apparatus of operating a scanning probe microscope |
| 01/30/2014 | DE102010015966B4 Quasi-in-situ-Rastersondenmikroskop (QIS-SPM) mit einer selbsttätig betriebenen Reaktionskammer und Verfahren zum Betrieb Quasi-in-situ scanning probe microscope (SPM QIS) with an automatically operated reaction chamber and method of operating |
| 01/23/2014 | US20140026263 Adaptive mode scanning probe microscope |
| 01/22/2014 | CN103529243A Light beam tracking type atomic force microscope scanning measuring head |
| 01/14/2014 | US8629985 Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope |
| 01/09/2014 | WO2014007633A1 Scanning microscope |
| 01/08/2014 | EP2682944A1 Scanning microscope |
| 01/08/2014 | EP2682759A1 High throughput microscopy device |