| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 06/24/2009 | CN101467021A Optical component operating in near-field transmission |
| 06/23/2009 | US7550750 Method and apparatus for processing a micro sample |
| 06/17/2009 | CN101458203A Double probe same-point measurement scanning probe microscope |
| 06/16/2009 | US7547882 Scan data collection for better overall data accurancy |
| 06/09/2009 | US7545508 Interferometric apparatus utilizing a cantilever array to measure a surface |
| 06/04/2009 | WO2009070119A1 Iterative feedback tuning in a scanning probe microscope |
| 06/04/2009 | US20090140685 Method and Device for Positioning a Movable Part in a Test System |
| 06/04/2009 | US20090140162 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 06/04/2009 | US20090140142 Scanning probe microscope and measuring method thereby |
| 06/04/2009 | US20090139315 Non-destructive ambient dynamic mode afm amplitude versus distance curve acquisition |
| 06/04/2009 | DE112007001684T5 Rastersondenmikroskop und Verfahren zum Messen der Relativposition zwischen Sonden A scanning probe microscope and method for measuring the relative position between probes |
| 06/03/2009 | EP2064534A2 Band excitation method applicable to scanning probe microscopy |
| 06/02/2009 | US7541062 can turn deposition on or off while the tip maintains contact with the surface; control the ink deposition rate and limit the amount of excess ink diffusion; thermosensitive patterning compound is octadecylphosphonic acid, or 10-undecenyl tricholorosilane; ink deposition depend on heating or cooling |
| 05/28/2009 | US20090138996 Microtips and nanotips, and method for their production |
| 05/27/2009 | EP2063450A1 Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus |
| 05/27/2009 | EP2063449A1 Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus |
| 05/27/2009 | EP2063250A1 Atomic force microscope |
| 05/26/2009 | US7538470 Monolithic nanoscale actuation |
| 05/21/2009 | US20090133168 Scanning probe microscope |
| 05/21/2009 | US20090133167 Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus |
| 05/20/2009 | EP2060901A1 Scan type probe microscope and active damping drive control device |
| 05/19/2009 | US7533561 Oscillator for atomic force microscope and other applications |
| 05/07/2009 | US20090119808 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 05/06/2009 | EP1481279A4 Multi-detector microscopic inspection system |
| 05/06/2009 | CN100485311C Fine adjustment arrangement for detecting scanning probe microscope |
| 05/05/2009 | US7528947 Nanoparticles functionalized probes and methods for preparing such probes |
| 04/28/2009 | US7525088 Optically controllable device |
| 04/28/2009 | US7524534 coating microscope tips with patterning compounds and using the coated tip to apply the compounds to substrate so as to produce a desired patterns; nanolithography |
| 04/23/2009 | WO2009018575A3 Fast-scanning spm and method of operating same |
| 04/23/2009 | WO2007024711A3 Oscillator and method of making for atomic force microscope and other applications |
| 04/23/2009 | WO2007022013A3 Tracking qualification and self-optimizing probe microscope and method |
| 04/22/2009 | CN101413865A Accurate positioning method based on atomic force microscope |
| 04/21/2009 | US7521695 Scanning electron microscope |
| 04/16/2009 | US20090100554 Method for determining a dopant concentration in a semiconductor sample |
| 04/08/2009 | CN100477067C Software synchronization of multiple scanning probes |
| 04/07/2009 | US7514679 Scanning probe microscope for measuring angle and method of measuring a sample using the same |
| 04/07/2009 | US7513142 Tracking qualification and self-optimizing probe microscope and method |
| 04/01/2009 | EP2043131A2 Minute sample processing method |
| 04/01/2009 | EP2041546A1 Scanning probe microscope and method for operating the same |
| 03/31/2009 | US7511828 Three-dimensional shape measuring unit, processing unit, and semiconductor device manufacturing method |
| 03/31/2009 | US7509844 Atomic force microscope technique for minimal tip damage |
| 03/25/2009 | EP2040265A2 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 03/25/2009 | EP1381851B1 High spatial resolution X-ray microanalysis in a particle-optical apparatus |
| 03/25/2009 | CN101395676A Method for operating a measurement system containing a scanning probe microscope, and measurement system |
| 03/24/2009 | US7507957 Probe microscope system suitable for observing sample of long body |
| 03/24/2009 | US7507320 Electroplating a small quantity of noble metal on the apex of a single crystal metal wire that has been etched to form a tip in low concentration noble metal electrolyte in a base aqueous liquid; annealing in vacuum or in inert gas ambient to diffuse the additional electroplated noble metal atoms |
| 03/19/2009 | WO2009018460A3 High-bandwidth actuator drive for scanning probe microscopy |
| 03/19/2009 | US20090077696 Methods, Systems and Computer Program Products for Measuring Critical Dimensions of Fine Patterns Using Scanning Electron Microscope Pictures and Secondary Electron Signal Profiles |
| 03/10/2009 | US7501615 Flexure assembly for a scanner |
| 03/04/2009 | EP2029998A1 Controlled atomic force microscope |
| 03/04/2009 | CN101379383A Miniaturized spring element and method for producing the spring element |
| 03/03/2009 | US7498589 Scanning probe microscope |
| 02/26/2009 | WO2008092824A3 Device and method for the micromechanical positioning and handling of an object |
| 02/25/2009 | EP2027450A1 Optical component operating in near field transmission |
| 02/12/2009 | WO2008157373A3 Position control for scanning probe spectroscopy |
| 02/12/2009 | US20090041333 Scanning electron microscope |
| 02/11/2009 | EP2023373A2 Charged particle beam apparatus and irradiation method |
| 02/11/2009 | EP1929267B1 Method and device for positioning a movable part in a test system |
| 02/05/2009 | WO2009018575A2 Fast-scanning spm and method of operating same |
| 02/05/2009 | WO2009018460A2 High-bandwidth actuator drive for scanning probe microscopy |
| 02/05/2009 | WO2008128532A3 Nanorobot module automation and exchange |
| 02/05/2009 | US20090032706 Fast-Scanning SPM and Method of Operating Same |
| 02/05/2009 | US20090032703 High-bandwidth actuator drive for scanning probe microscopy |
| 02/03/2009 | US7485856 Scanning probe microscopy inspection and modification system |
| 01/29/2009 | WO2008147120A3 Automatic landing method and apparatus for scanning probe microscope using the same |
| 01/29/2009 | US20090025465 Miniaturized Spring Element and Method for Producing the Spring Element |
| 01/27/2009 | US7481099 Micromotion device and scanning probe microscope |
| 01/22/2009 | US20090022456 Optical fiber probe tips and methods for fabricating same |
| 01/20/2009 | US7478552 Optical detection alignment/tracking method and apparatus |
| 01/07/2009 | CN101341388A Optical apparatus comprising cantilever, method for manufacturing and using the same |
| 01/07/2009 | CN100449257C A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 01/06/2009 | US7472585 Method for rapid seeks to the measurement surface for a scanning probe microscope |
| 01/02/2009 | DE102007031112A1 Vorrichtung und Verfahren zur Untersuchung von Oberflächeneigenschaften verschiedenartiger Materialien Device and method for the examination of surface properties of various materials |
| 01/01/2009 | US20090002714 Optical Device Comprising a Cantilever and Method of Fabrication and Use Thereof |
| 01/01/2009 | US20090000363 Materials and Methods for Identifying Biointeractive Nanostructures and/or Nanoparticles |
| 01/01/2009 | US20090000362 Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer |
| 12/31/2008 | WO2009000885A1 Apparatus and method for investigating surface properties of different materials |
| 12/30/2008 | US7470918 Method and apparatus for processing a micro sample |
| 12/25/2008 | US20080315092 Scanning probe microscopy inspection and modification system |
| 12/24/2008 | WO2008157373A2 Position control for scanning probe spectroscopy |
| 12/24/2008 | DE102007063066A1 Verfahren und Vorrichtung zur Charakterisierung einer Probe mit zwei oder mehr optischen Fallen Method and device for characterization of a sample with two or more optical traps |
| 12/23/2008 | US7468512 Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles |
| 12/18/2008 | US20080308726 Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System |
| 12/18/2008 | US20080308718 Position control for scanning probe spectroscopy |
| 12/17/2008 | CN101326433A Method for examining a measurement object, and apparatus |
| 12/16/2008 | US7465945 Method and apparatus for processing a micro sample |
| 12/10/2008 | CN201163262Y Double-probe same-point measurement scanning probe microscope |
| 12/10/2008 | CN101322030A Biomolecule interaction using atomic force microscope |
| 12/04/2008 | WO2008147120A2 Automatic landing method and apparatus for scanning probe microscope using the same |
| 12/04/2008 | WO2008145110A1 Method and apparatus for characterizing a sample with two or more optical traps |
| 12/04/2008 | WO2008145109A1 Method device for the probe microscopic examination of a sample using luminescent microscopy |
| 12/04/2008 | WO2008145108A1 Method and device for examining a sample with a probe microscope |
| 12/04/2008 | US20080296489 Atom Probe Evaporation Processes |
| 12/04/2008 | DE102007063065A1 Verfahren und Vorrichtung zum sondenmikroskopischen Untersuchen einer Probe Method and apparatus for probe microscopic examination of a sample |
| 12/03/2008 | CN101317080A Method and device for positioning a movable part in a test system |
| 11/27/2008 | WO2008115862A3 Fast scanning spm scanner and method of operating same |
| 11/27/2008 | US20080289404 Molecule Measuring Device and Molecule Measuring Method |
| 11/26/2008 | EP1994395A1 Method for determining a dopant concentration in a semiconductor sample |
| 11/26/2008 | CN101313206A Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 11/25/2008 | US7456400 Scanning probe microscope and scanning method |