| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 03/30/2010 | US7690046 Drive stage for scanning probe apparatus, and scanning probe apparatus |
| 03/30/2010 | US7687767 Fast scanning stage for a scanning probe microscope |
| 03/25/2010 | WO2009158598A3 Evanescent microwave microscopy probe and methodology |
| 03/23/2010 | US7681439 Measuring apparatus |
| 03/18/2010 | US20100068124 Nanostructure devices and fabrication method |
| 03/17/2010 | CN100594385C 扫描探针显微镜 Scanning probe microscopy |
| 03/11/2010 | US20100064397 Controlled atomic force microscope |
| 03/04/2010 | WO2010022521A1 Method for measuring a piezoelectric response by means of a scanning probe microscope |
| 03/04/2010 | WO2009143522A3 Preamplifying cantilever and applications thereof |
| 03/02/2010 | US7672048 Positioning mechanism and microscope using the same |
| 02/24/2010 | CN100592088C Probe for an atomic force microscope |
| 02/23/2010 | US7665889 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 02/23/2010 | US7665349 Method and apparatus for rapid automatic engagement of a probe |
| 02/09/2010 | US7658097 Method and apparatus of high speed property mapping |
| 02/04/2010 | US20100031403 Heat Coupling Device |
| 01/28/2010 | US20100024082 Atomic force microscope |
| 01/21/2010 | US20100017921 Device and method for the micromechanical positioning and handling of an object |
| 01/14/2010 | US20100011471 Band excitation method applicable to scanning probe microscopy |
| 01/07/2010 | US20100005552 Scanning probe microscope and a method to measure relative position between probes |
| 01/06/2010 | EP2140226A2 Nanorobot module automation and exchange |
| 01/06/2010 | CN100578679C Probe position control system and method |
| 01/05/2010 | US7644447 Scanning probe microscope capable of measuring samples having overhang structure |
| 01/05/2010 | US7642514 Charged particle beam apparatus |
| 12/31/2009 | US20090326383 Systems and methods for hyperspectral imaging |
| 12/30/2009 | EP2137737A2 Fast scanning spm scanner and method of operating same |
| 12/30/2009 | EP2137566A1 Driving scanning fiber devices with variable frequency drive signals |
| 12/29/2009 | US7637960 Short and thin silicon cantilever with tip and fabrication thereof |
| 12/23/2009 | WO2009154765A1 Systems and methods for hyperspectral imaging |
| 12/17/2009 | US20090313729 Scan type probe microscope and cantilever drive device |
| 12/16/2009 | CN100570324C Film single-axis bidirectional decline micro-stretching device and method for measuring film deformation |
| 12/15/2009 | US7631548 Scanning probe microscope |
| 12/15/2009 | US7631547 Scanning probe apparatus and drive stage therefor |
| 12/15/2009 | US7631546 Method and apparatus for monitoring of a SPM actuator |
| 12/10/2009 | WO2009147807A1 Scanner device for scanning probe microscope |
| 12/10/2009 | WO2009147452A1 Method of probe alignment |
| 12/10/2009 | WO2009147450A1 Probe detection system |
| 12/10/2009 | US20090307809 Scanning probe microscope and method for operating the same |
| 12/10/2009 | CA2727118A1 Probe detection system |
| 12/09/2009 | EP2131180A1 Atomic force microscope |
| 12/09/2009 | CN101601099A Device and method for the micromechanical positioning and handling of an object |
| 12/08/2009 | US7628972 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 12/03/2009 | WO2009125138A3 Device for positioning a moveable object of submicron scale |
| 12/03/2009 | US20090300805 Photon-Emission Scanning Tunneling Microscopy |
| 12/03/2009 | US20090300804 Monolithic nanoscale actuation |
| 12/02/2009 | EP2126925A2 Device and method for the micromechanical positioning and handling of an object |
| 11/18/2009 | EP0847590B1 A scanning probe microscope having automatic probe exchange and alignment |
| 11/17/2009 | US7618465 Near-field antenna |
| 11/17/2009 | CA2503953C Probe device |
| 11/12/2009 | WO2009136490A1 Surface object characteristic measurement method and surface object characteristic measurement device |
| 11/10/2009 | US7614288 Scanning probe microscope fine-movement mechanism and scanning probe microscope using same |
| 11/10/2009 | US7614287 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 11/05/2009 | US20090276924 Scanning probe microscope and active damping drive control device |
| 10/29/2009 | WO2009095720A3 Scanning ion conductance microscopy |
| 10/29/2009 | DE102008020982A1 Sample positioning device, particularly for scanning probe microscope, particularly atomic force microscope, comprises sampling table and two sample table drives, where one sample table drive has plunger coil arrangement |
| 10/27/2009 | US7609048 Probe microscope and measuring method using probe microscope |
| 10/27/2009 | US7608842 Driving scanning fiber devices with variable frequency drive signals |
| 10/27/2009 | US7607343 System for nano position sensing in scanning probe microscopes using an estimator |
| 10/20/2009 | US7605368 Vibration-type cantilever holder and scanning probe microscope |
| 10/15/2009 | WO2009125138A2 Device for positioning a moveable object of submicron scale |
| 10/15/2009 | US20090260113 Probe Microscope Setup Method |
| 10/15/2009 | US20090255465 Thermal control of deposition in dip pen nanolithography |
| 10/08/2009 | US20090253589 Method for Testing Active Compounds |
| 10/08/2009 | DE112007001189T5 Verfahren und Einrichtung zur Verwendung in Echtzeit-Nanometer- und Sub-Nanometer-Positionsmessungen Method and apparatus for use in real-nanometer and sub-nanometer position measurements |
| 10/06/2009 | US7596990 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 10/06/2009 | US7596989 Probe for an atomic force microscope |
| 10/01/2009 | US20090246400 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 10/01/2009 | US20090242788 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 09/23/2009 | CN100543447C Re-positioning method for microscope based on atomic force |
| 09/17/2009 | US20090230320 Scanning probe apparatus |
| 09/16/2009 | EP1844475B1 Near-field probe |
| 09/15/2009 | US7588605 Scanning type probe microscope |
| 09/10/2009 | US20090224180 Apparatus and method for processing a wafer |
| 09/09/2009 | CN100538913C Sensor with suspending arm and optical resonator |
| 09/03/2009 | US20090222958 Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument |
| 09/01/2009 | US7581438 Surface texture measuring probe and microscope utilizing the same |
| 08/27/2009 | US20090217425 Driving apparatus |
| 08/27/2009 | US20090212230 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 08/20/2009 | US20090210971 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope |
| 08/20/2009 | US20090207404 System and Method for Surface Inspection of Micro- and Nanomechanical Structures |
| 08/20/2009 | US20090206707 Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those |
| 08/18/2009 | US7574903 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 08/13/2009 | US20090205090 Optical component operating in near-field transmission |
| 08/13/2009 | US20090205089 Method for Examining a Measurement Object, and Apparatus |
| 08/13/2009 | US20090200462 Scanning probe microscope capable of measuring samples having overhang structure |
| 08/06/2009 | WO2009095720A2 Scanning ion conductance microscopy |
| 08/05/2009 | CN101499398A Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus |
| 08/05/2009 | CN100523778C Fully digital controller for cantilever-based instruments |
| 08/04/2009 | US7570061 Cantilever control device |
| 08/04/2009 | US7569817 Scanning probe apparatus |
| 08/04/2009 | US7569077 Probe positional error from comparising image sequence of scans to identify differences between positions of a portion of a reference specimen characteristic in the images; probe moved to target location for spectroscopic analysis, as a function of the determined probe positional error; nanotechnolgy |
| 07/30/2009 | US20090189094 Electron beam writing method, fine pattern writing system, and manufacturing method of uneven pattern carrying substrate |
| 07/30/2009 | DE112006003970T5 Vorrichtung und Verfahren zum Prozessieren eines Wafers Apparatus and method for processing a wafer |
| 07/21/2009 | US7562564 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 07/09/2009 | DE102008003291A1 Near field microscope for optical examination of sample, has point holder arranged axial symmetrically to reflector axis in focus of parabolic reflector and moves in three directions that are independent from each other |
| 07/08/2009 | EP1883849A4 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 07/02/2009 | US20090172846 Nanometric emitter/receiver guides |
| 07/01/2009 | EP2074404A1 Method for testing active compounds |
| 07/01/2009 | EP1994395B1 Method for determining a dopant concentration in a semiconductor sample |
| 07/01/2009 | CN101473384A Method and apparatus for characterizing a probe tip |
| 06/30/2009 | US7553776 Patterned functionalized silicon surfaces |