Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719)
11/2008
11/20/2008US20080288186 Dynamic-Mode Atomic-Force-Microscope Probe (Tip) Vibration Simulation Method, Program, Recording Medium, And Vibration Simulator
11/19/2008EP1992004A2 Active damping of high speed scanning probe microscope components
11/19/2008EP1991991A2 Method and apparatus for characterizing a probe tip
11/19/2008CN101308079A Spiral type scanning method for scanning detecting probe microscope
11/12/2008EP1989742A1 Control signal for inertial slider
11/12/2008EP1989535A2 Variable density scanning
11/06/2008WO2008133636A1 Driving scanning fiber devices with variable frequency drive signals
11/06/2008US20080271522 Sample analysis using cantilever probe
11/05/2008CN101300480A Scanning probe microscopy method and apparatus utilizing sample pitch
11/04/2008US7446324 Methods utilizing scanning probe microscope tips and products thereof or produced thereby
11/04/2008US7444857 Software synchronization of multiple scanning probes
11/04/2008US7444856 Sensors for electrochemical, electrical or topographical analysis
10/2008
10/30/2008WO2008128532A2 Nanorobot module automation and exchange
10/30/2008US20080265178 Driving scanning fiber devices with variable frequency drive signals
10/28/2008US7441446 Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing
10/28/2008US7441445 Surface information measuring apparatus and surface information measuring method
10/23/2008US20080258059 Scanning Probe Microscope System
10/21/2008US7439505 Scanning electron microscope
10/16/2008US20080253020 Read/Write Tip, Head and Device, and Use Thereof, and Method for Manufacturing Same
10/15/2008EP1979913A1 Method for operating a measurement system containing a scanning probe microscope, and measurement system
10/09/2008US20080245139 Scanning probe microscope and measurement method of same
10/08/2008EP1978348A1 Scanning probe microscope
10/07/2008US7430898 Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique
10/02/2008US20080236259 Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope
10/01/2008EP1896824B1 Higher harmonics atomic force microscope
10/01/2008CN101278357A System and method for inspection of micro and nanomechanical structures
09/2008
09/30/2008US7430484 Signal processing method and apparatus for use in real-time subnanometer scale position measurements with the aid of probing sensors and beams scanning periodically undulating surfaces such as gratings and diffraction patterns generated thereby, and the like
09/30/2008US7429732 Scanning probe microscopy method and apparatus utilizing sample pitch
09/25/2008WO2008115862A2 Fast scanning spm scanner and method of operating same
09/25/2008US20080230696 Surface treatment and surface scanning
09/23/2008US7427744 Piezoelectric actuator and scanning probe microscope using the same
09/18/2008US20080223122 Scanning probe microscope
09/18/2008US20080223120 Higher Harmonics Atomic Force Microscope
09/18/2008US20080223119 Fast-Scanning SPM Scanner and Method of Operating Same
09/18/2008US20080223117 Scanning probe microscope and sample observation method using the same and device manufacturing method
09/17/2008EP1969606A1 Microtips and nanotips, and method for their production
09/16/2008US7425698 Feedback influenced increased-quality-factor scanning probe microscope
09/10/2008EP1966586A1 Improved photon-emission scanning tunnel microscopy
09/10/2008EP1548438B1 Hybridisation detecting method and bioassay device, and bioassay-use substrate
09/04/2008US20080212174 Positioning Mechanism and Microscope Using the Same
09/04/2008US20080210864 Local Injector of Spin-Polarized Electrons with Semiconductor Tip Under Light
09/03/2008EP1963816A1 Optical device comprising a cantilever and method of fabrication and use thereof
09/02/2008US7421370 Method and apparatus for measuring a characteristic of a sample feature
08/2008
08/20/2008EP1957954A1 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography
08/20/2008CN100412560C Imaging device and method
08/14/2008US20080193963 Using force spectroscope to monitor variation of protein activation states pre/post modulator exposure
08/14/2008US20080193752 Near-Field Antenna
08/12/2008US7411189 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
08/07/2008WO2008092824A2 Device and method for the micromechanical positioning and handling of an object
08/07/2008DE102007005293A1 Vorrichtung und Verfahren zum mikromechanischen Positionieren und Manipulieren eines Objektes Apparatus and method for micro-mechanical positioning and manipulation of an object
08/06/2008EP1952120A1 Microscope, in particular a scanning probe microscope provided with a programmable logic
08/05/2008US7408172 Charged particle beam apparatus and charged particle beam irradiation method
07/2008
07/31/2008WO2008089889A1 Fluid cell for scanning probe microscopy or force spectroscopy
07/31/2008WO2007079975A8 Microtips and nanotips, and method for their production
07/30/2008EP1950764A1 Fluid cell for raster scanning probe microscopy or force spectroscopy
07/30/2008EP1949086A2 Scanning probe microscopy method and apparatus utilizing sample pitch
07/24/2008WO2007006834A8 System and method for the inspection of micro and nanomechanical structures
07/23/2008EP0964251B1 Optical waveguide probe and its manufacturing method
07/23/2008CN101226125A Zerofriction inertia step scanister, control method, idem spot scanning double probe microscope
07/22/2008US7401503 Method for analysis through layer-by-layer sample removal using a cantilever probe
07/17/2008WO2008083694A1 Apparatus and method for investigating biological systems and solid systems
07/16/2008CN101221116A Plate type three-dimensional locating/scanning device
07/09/2008CN101216414A Multifunctional optical micro-control device
07/08/2008US7395697 Force method for determining the spring constant of scanning probe microscope cantilevers using MEMS actuators
07/03/2008US20080156988 Scanning Probe Microscope and Scanning Method
07/02/2008EP1938335A1 Reading/writing tip, head and device, and use thereof, and method for making same
07/02/2008EP1938334A2 Oscillator and method of making for atomic force microscope and other applications
06/2008
06/26/2008US20080149822 Protein Microscope
06/25/2008EP1934578A1 Method for examining a measurement object, and apparatus
06/25/2008CN101206170A Sample nondestructive approach method and implementation device facing to nano collimation and operation
06/24/2008US7391022 Scanning probe microscope
06/17/2008US7387035 Method of making a force curve measurement on a sample
06/12/2008US20080134771 Method and Device for Determining Material Properties
06/11/2008EP1929267A2 Method and device for positioning a movable part in a test system
06/05/2008US20080128385 Oscillator and method of making for atomic force microscope and other applications
06/04/2008EP1927845A1 Cantilever holder and scanning probe microscope including the same
05/2008
05/29/2008US20080122462 Method of inspecting pattern and inspecting instrument
05/29/2008US20080121800 Cantilever holder and scanning probe microscope including the same
05/29/2008US20080121028 Scanning Probe Microscopy Inspection and Modification System
05/22/2008US20080116376 Charged particle beam apparatus
05/21/2008EP1520292A4 Software synchronization of multiple scanning probes
05/20/2008US7375538 Method of inspecting pattern and inspecting instrument
05/20/2008US7375324 Stylus system for modifying small structures
05/20/2008US7373806 Scanning probe microscope and scanning method
05/14/2008EP1920249A2 Biomolecule interaction using atomic force microscope
05/13/2008US7372050 Method of preventing charging, and apparatus for charged particle beam using the same
05/13/2008US7372025 Scanning probe microscope using a surface drive actuator to position the scanning tip
05/07/2008EP1918673A1 Method and equipment for measuring displacement, stage equipment and probe microscope
05/07/2008CN101176167A Sensors for electrochemical, electrical or topographical analysis
05/06/2008US7368712 Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography
05/06/2008US7368305 High aspect ratio micromechanical probe tips and methods of fabrication
05/02/2008WO2008049570A1 Scanning probe microscope
05/01/2008US20080098804 Method for rapid seeks to the measurment surface for a scanning probe microscope
04/2008
04/30/2008EP1916511A1 Scanning probe microscope
04/30/2008DE102006004922B4 Miniaturisiertes Federelement und Verfahren zu dessen Herstellung, Balkensonde, Rasterkraftmikroskop sowie Verfahren zu dessen Betrieb Miniaturized spring element and method for its manufacture, probe beam, atomic force microscope and method for its operation
04/23/2008EP1913362A2 Atom probe evaporation processes
04/22/2008US7360405 Method to transiently detect sample features using cantilevers
04/17/2008WO2008027601A3 Band excitation method applicable to scanning probe microscopy
04/17/2008US20080087820 Probe control method for scanning probe microscope
04/17/2008US20080087077 Method and apparatus of scanning a sample using a scanning probe microscope
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