| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 11/21/2006 | US7138627 Nanotube probe and method for manufacturing same |
| 11/21/2006 | US7137292 Active cantilever for nanomachining and metrology |
| 11/16/2006 | WO2006120012A1 Method for determining the state of activation of a protein |
| 11/16/2006 | WO2006097800A3 Method and device for determining material properties |
| 11/16/2006 | WO2005119728A3 Electron stream apparatus and method |
| 11/16/2006 | US20060254346 Method to transiently detect sample features using cantilevers |
| 11/16/2006 | DE102005022178A1 Positioning device e.g. for microscope, uses actuators mounted on support element and with given direction of expansion |
| 11/15/2006 | EP1722374A1 Method for determining the state of activation of a protein |
| 11/09/2006 | WO2006118118A1 Scanning mechanism for scanning probe microscope |
| 11/09/2006 | WO2006118117A1 Scanning stage for scanning probe microscope |
| 11/09/2006 | WO2006117525A2 Positioning apparatus and method |
| 11/09/2006 | US20060253943 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 11/02/2006 | WO2006116738A1 Optical fiber probe tips and methods for fabricating same |
| 11/02/2006 | WO2006116673A1 Mutliplex near-field microscopy with diffractive elements |
| 11/02/2006 | US20060243036 Atomic force microscope with probe with improved tip movement |
| 11/02/2006 | US20060243034 Method and apparatus of manipulating a sample |
| 10/31/2006 | US7130755 Near-field scanning microwave microscope using dielectric resonator |
| 10/31/2006 | US7129486 Scanning probe with digitized pulsed-force mode operation and real-time evaluation |
| 10/26/2006 | US20060238206 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts |
| 10/19/2006 | US20060231757 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 10/19/2006 | US20060231753 Computer Program Products for Measuring Critical Dimensions of Fine Patterns Using Scanning Electron Microscope Pictures and Secondary Electron Signal Profiles |
| 10/19/2006 | US20060230819 System for Sensing a Sample |
| 10/18/2006 | EP1712892A2 Near field optics for electromagnetic radiation in the infrared spectrum |
| 10/17/2006 | US7123790 Scanning method and apparatus |
| 10/12/2006 | WO2006106949A1 Scanning probe microscope, method of measuring sample surface shape, and probe device |
| 10/12/2006 | WO2006106818A1 Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
| 10/12/2006 | US20060229842 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 10/12/2006 | DE102006015473A1 Detecting submicroscopic structures involves arranging semiconducting substrate in Atomic Force Microscopes working areas, coarse positioning substrate so each sensor is in surface sub-region, moving substrate to sense sub-regions linewise |
| 10/10/2006 | US7119645 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 10/10/2006 | US7119332 Method of fabricating probe for scanning probe microscope |
| 10/05/2006 | WO2006103937A1 Scanning probe microscope system |
| 10/05/2006 | US20060219904 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 10/05/2006 | US20060219900 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 10/05/2006 | US20060219899 Scanning probe microscope |
| 10/05/2006 | DE10307561B4 Meßanordnung zur kombinierten Abtastung und Untersuchung von mikrotechnischen, elektrische Kontakte aufweisenden Bauelementen Measuring arrangement for combined sampling and analysis of micro-technical, electrical contacts having components |
| 10/04/2006 | EP1012584A4 Object inspection and/or modification system and method |
| 10/03/2006 | US7115881 Positioning and motion control by electrons, ions, and neutrals in electric fields |
| 09/28/2006 | WO2006102600A2 Materials and methods for identifying biointeractive nanostructures and/or nanoparticles |
| 09/28/2006 | US20060213261 Real Time Detection of Loss of Cantilever Sensing Loss |
| 09/28/2006 | US20060213259 Sensors for electrochemical, electrical or topographical analysis |
| 09/27/2006 | EP1705475A2 Optical waveguide probe and its manufacturing method |
| 09/26/2006 | US7111504 Atomic force microscope |
| 09/21/2006 | WO2006098123A1 Scanning probe microscope and its measuring method |
| 09/21/2006 | WO2006097800A2 Method and device for determining material properties |
| 09/21/2006 | US20060207318 System for Sensing a Sample |
| 09/21/2006 | DE102005010363A1 Abbildender Mikrowellen-Prober The imaging microwave Prober |
| 09/20/2006 | CN1276314C Electronic photographic ring band, processing box and electronic photographic apparatus |
| 09/19/2006 | US7109485 Charged particle beam apparatus |
| 09/14/2006 | WO2006029292A3 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 09/13/2006 | CN1831513A 扫描探针显微镜 SPM |
| 09/08/2006 | WO2006092109A1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip |
| 09/06/2006 | CN1273820C Light-spot tracking device for needle tip scanning |
| 09/05/2006 | US7100430 Dual stage instrument for scanning a specimen |
| 08/31/2006 | WO2006090594A1 Inching mechanism for scanning probe microscope and scanning probe microscope employing it |
| 08/31/2006 | WO2006090593A1 Displacement detection mechanism for scanning probe microscope and scanning probe microscope |
| 08/31/2006 | US20060191329 Dynamic activation for an atomic force microscope and method of use thereof |
| 08/29/2006 | US7096711 Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby |
| 08/22/2006 | US7095020 Sensing mode atomic force microscope |
| 08/22/2006 | US7093509 Scanning probe microscopy apparatus and techniques |
| 08/15/2006 | US7091517 Patterned functionalized silicon surfaces |
| 08/15/2006 | US7091498 Rotating specimen holder |
| 08/15/2006 | US7091485 Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles |
| 08/10/2006 | DE102004063980A1 Vorrichtung und Verfahren zur Rastersondenmikroskopie Apparatus and method for scanning probe microscopy |
| 08/09/2006 | EP0839311B1 Inter-atomic measurement technique |
| 08/09/2006 | CN2804851Y High precision atomic force microscope |
| 08/03/2006 | WO2006081240A1 Protein microscope |
| 08/03/2006 | WO2006080257A1 Cantilever control device |
| 08/03/2006 | US20060174384 Scan data collection for better overall data accurancy |
| 08/02/2006 | EP1685391A2 An oscillating probe with a virtual probe tip |
| 08/01/2006 | US7084661 Scanning kelvin microprobe system and process for analyzing a surface |
| 07/27/2006 | US20060162455 Method and device for measuring vibration frequency of multi-cantilever |
| 07/26/2006 | EP1185869B1 Ligand-anchor conjugates for producing a biosensor layer |
| 07/06/2006 | WO2005059514A3 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture |
| 06/28/2006 | EP1583845A4 Method and apparatus for molecular analysis in small sample volumes |
| 06/27/2006 | US7067806 Scanning probe microscope and specimen observation method |
| 06/27/2006 | US7066014 Method to transiently detect samples in atomic force microscopes |
| 06/20/2006 | US7064341 Coated nanotube surface signal probe |
| 06/15/2006 | US20060123895 Drive head and personal atomic force microscope having the same |
| 06/14/2006 | EP1669734A1 Scanning type probe microscope and probe moving control method therefor |
| 06/14/2006 | DE102005051581A1 Abtastmechanismus für ein Rastersondenmikroskop, sowie Rastersondenmikroskop hiermit Scanning for a scanning probe microscope, scanning probe microscope, and hereby |
| 06/01/2006 | WO2006057300A1 Positioning mechanism and microscope using the same |
| 06/01/2006 | WO2006056373A1 Near-field antenna |
| 06/01/2006 | US20060113472 Scanning probe microscope and scanning method |
| 06/01/2006 | US20060113469 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 05/31/2006 | EP1662246A1 Probe replacing method for scanning probe microscope |
| 05/31/2006 | CN1781158A Scanning probe microscope using a surface drive actuator to position the scanning probe tip |
| 05/31/2006 | CN1779435A Re-positioning method for microscope based on atomic force |
| 05/30/2006 | US7053369 Scan data collection for better overall data accuracy |
| 05/26/2006 | WO2006054771A1 Nano tweezers and scanning probe microscope having the same |
| 05/25/2006 | US20060108523 Scanning mechanism for scanning probe microscope and scanning probe microscope |
| 05/24/2006 | DE102004056241A1 Nahfeldantenne Near-field antenna |
| 05/24/2006 | DE102004048971B3 Apparatus for scanning probe microscopy for examining biological systems and which automatically analyzes measurements from the device according to predetermined analysis parameters |
| 05/23/2006 | US7047796 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 05/18/2006 | WO2006052105A1 Method for adhering nanostructures to end of probe of microscope and microscope having probe made by the same method |
| 05/18/2006 | WO2006051983A1 Surface status measuring method, surface status measuring device, microscope and information processor |
| 05/18/2006 | US20060102840 Scanning electron microscope |
| 05/16/2006 | US7045780 Scanning probe microscopy inspection and modification system |
| 05/16/2006 | US7044007 Force scanning probe microscope |
| 05/11/2006 | WO2006049120A1 Dynamic mode atomic force microscope probe vibration simulation method, program, recording medium, and vibration simulator |
| 05/11/2006 | WO2004098384A3 Parallel analysis of molecular interactions |