Patents
Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719)
02/2011
02/02/2011CN101403679B Double-step jigsaw puzzle scanner of scanning probe microscope
02/02/2011CN101206170B Sample nondestructive approach method and implementation device facing to nano collimation and operation
01/2011
01/26/2011CN1967687B Read-in and read device of millimicro data using cantilever structure and its manufacturing method
01/26/2011CN101960287A Fast-scanning spm and method of operating same
01/25/2011US7876113 Method of inspecting pattern and inspecting instrument
01/20/2011US20110016592 Iterative feedback tuning in a scanning probe microscope
01/19/2011CN101949957A Method for precisely moving nanowire by taking semi-conductor nanowire as probe
01/19/2011CN101949956A Scanning method for measuring solid particle membrane with scanning electron microscope
01/18/2011US7874016 Scanning probe microscope and scanning method
01/13/2011US20110010809 Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope
01/13/2011DE102009029831A1 Vorrichtung und Verfahren für die Mehr-Photonen-Fluoreszenzmikroskopie zur Gewinnung von Informationen aus biologischem Gewebe Apparatus and method for multi-photon fluorescence microscopy for obtaining information from biological tissue
01/13/2011DE102009010096B4 Rastersonden-Antriebseinheit Scanning probe drive unit
01/11/2011US7868308 Electron beam writing method, fine pattern writing system, and manufacturing method of uneven pattern carrying substrate
01/06/2011US20110004967 Band excitation method applicable to scanning probe microscopy
01/04/2011US7865966 Method and apparatus of automatic scanning probe imaging
12/2010
12/30/2010US20100333240 Fully Digitally Controller for Cantilever-Based Instruments
12/30/2010US20100330345 Methods utilizing scanning probe microscope tips and products thereof or produced thereby
12/29/2010WO2010150756A1 Scanning probe microscope and probe proximity detection method therefor
12/29/2010EP2265925A2 Device for positioning a moveable object of submicron scale
12/29/2010EP1305816B1 Collection of secondary electrons through the objective lens of a scanning electron microscope
12/15/2010CN101915858A Feedback-controlled torsion pendulum weak force scanning and detecting instrument
12/14/2010US7853422 Dynamic-mode atomic-force-microscope probe (Tip) vibration simulation method, program, recording medium, and vibration simulator
12/09/2010US20100313312 Method and Apparatus for Characterizing a Probe Tip
12/09/2010US20100313311 Scanning probe in pulsed-force mode, digital and in real time
12/09/2010US20100312495 Intermodulation scanning force spectroscopy
12/07/2010US7849515 Nanotweezer and scanning probe microscope equipped with nanotweezer
11/2010
11/23/2010US7841016 Local injector of spin-polarized electrons with semiconductor tip under light excitation
11/23/2010US7841015 Method for determining a dopant concentration in a semiconductor sample
11/11/2010DE102008057100A1 Investigation unit for optical microscope for performing near-field optical microscopy, has holding device and near-field probe that produces optical near field by illuminating with excitation light for investigation of sample
11/10/2010CN1991333B Zero-Abbe error measuring system and its method
11/03/2010EP2245470A1 Optical detection system for micromechanical cantilevers, especially in scanning probe microscopes
11/03/2010CN101226125B Zerofriction inertia step scanister, control method, idem spot scanning double probe microscope
11/02/2010US7825378 Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
10/2010
10/26/2010US7823215 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents
10/21/2010US20100269231 Compressed scan systems
10/20/2010EP1850972B1 Thermal control of deposition in dip pen nanolithography
10/19/2010US7814775 Apparatus for controlling Z-position of probe
10/13/2010EP2238428A2 Scanning ion conductance microscopy
10/12/2010US7810382 Method and device for determining material properties
10/07/2010US20100257642 Probe microscope and measurement method using the same
10/07/2010US20100257641 Real-time, active picometer-scale alignment, stabilization, and registration in one or more dimensions
10/05/2010US7810166 Device and method for scanning probe microscopy
10/05/2010US7806008 Sample analysis using cantilever probe
09/2010
09/30/2010US20100251438 Microscopy control system and method
09/30/2010US20100251437 Method and Apparatus for Characterizing a Sample with Two or More Optical Traps
09/23/2010WO2010105592A1 Apparatus and method for electromechanical positioning
09/23/2010US20100242142 Scanning probe microscope
09/23/2010DE102009008251A1 Flexibel verschiebbare Kopplungseinrichtung für die akustisch angeregte Rasterkraftmikroskopie mit akustischer Anregung der Probe Flexible movable coupling means for acoustically excited atomic force microscopy with acoustic excitation of the sample
09/16/2010US20100230608 Safe motion
09/16/2010DE102009010096A1 Scanning probe drive unit for moving probe of scanning probe microscope, particularly scanning force microscope, has probe mounting bracket for fixing probe holder with probe, where probe holder actuator is provided for moving probe holder
09/16/2010DE102005038245B4 Vorrichtung zur Schwingungsanregung eines einseitig in einem Rasterkraftmikroskop befestigten Federbalkens Device for oscillation excitation of a cantilevered in an atomic force microscope cantilever
09/15/2010CN101833018A Scanning probe surface measurement system and measurement method based on optical fiber sensor
09/09/2010US20100229263 Protein microscope
09/08/2010CN101308079B Spiral type scanning method for scanning detecting probe microscope
08/2010
08/26/2010US20100218285 Scanning probe microscope capable of measuring samples having overhang structure
08/24/2010US7781764 Nanometric device for the measurement of the conductivity and quantum effects of individual molecules and methods for the manufacture and use thereof
08/17/2010US7775086 Band excitation method applicable to scanning probe microscopy
08/12/2010WO2010089601A1 Control system for a scanning probe microscope
08/12/2010US20100205697 Approach method for probe and sample in scanning probe microscope
08/11/2010EP2215637A1 Iterative feedback tuning in a scanning probe microscope
08/11/2010CN1769860B Surface texture measuring probe and microscope utilizing the same
08/11/2010CN101221116B Plate type three-dimensional locating/scanning device
08/10/2010US7770439 Method and apparatus of scanning a sample using a scanning probe microscope
08/05/2010WO2010087889A1 Scanning probe microscope with independent force control and displacement measurements
08/03/2010US7770232 Scanning probe microscope system
08/03/2010US7770231 Fast-scanning SPM and method of operating same
08/03/2010US7767961 Method for determining material interfacial and metrology information of a sample using atomic force microscopy
07/2010
07/28/2010EP2211187A1 Method of actuating a system, apparatus for modifying a control signal for actuation of a system and method of tuning such an apparatus
07/27/2010US7765606 Scanning probe apparatus
07/22/2010US20100186132 Probe assembly for a scanning probe microscope
07/21/2010CN201532396U Nonloss automatic approximation device facing nanometer observation and nanometer operation
07/15/2010US20100180354 Three-Dimensional Nanoscale Metrology using FIRAT Probe
07/13/2010US7752897 Molecule measuring device and molecule measuring method
07/08/2010US20100175154 Apparatus for Controlling Z-Position of Probe
07/01/2010US20100170015 Scanning probe microscope capable of measuring samples having overhang structure
06/2010
06/29/2010US7748052 Scanning probe microscope and method of operating the same
06/24/2010WO2010069085A1 Scanning probe microscope with current controlled actuator
06/23/2010EP2199769A2 Force measuring device
06/17/2010US20100154085 Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It
06/17/2010US20100154084 Method and apparatus for performing apertureless near-field scanning optical microscopy
06/16/2010EP2195635A2 Method and apparatus of automatic scanning probe imaging
06/15/2010US7735358 Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
06/10/2010US20100146673 Apparatus and Method for Investigating Biological Systems and Solid Systems
06/10/2010US20100140473 Nanorobot module, automation and exchange
06/08/2010US7735146 Protein microscope
06/03/2010WO2009143522A4 Preamplifying cantilever and applications thereof
05/2010
05/20/2010DE112008001611T5 Positionssteuerung für die Rastersondenspektroskopie Position control for scanning probe spectroscopy
05/18/2010US7716970 Scanning probe microscope and sample observation method using the same
05/13/2010US20100117486 Positioning apparatus and method
05/12/2010EP2183569A2 Fast-scanning spm and method of operating same
05/12/2010DE102006021289B4 Verfahren und Vorrichtung zur Bestimmung einer Winkelteilung Method and apparatus for determining an angular pitch
05/12/2010CN101706513A Piezoelectric ceramic scanatron driver
05/11/2010US7712354 Method and apparatus for controlling Z-position of probe
04/2010
04/29/2010DE102005043974B4 Mikromechanischer Abtastsensor A micromechanical scanning sensor
04/28/2010EP2179266A1 Miniaturized spring element and method for producing the latter
04/27/2010US7703314 Probe position control system and method
04/15/2010WO2010040185A1 A positioning system and method
04/15/2010CA2776784A1 A positioning system and method
04/07/2010EP2171425A1 Apparatus and method for investigating surface properties of different materials
03/2010
03/30/2010US7690047 Scanning probe apparatus
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