Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719)
11/2012
11/21/2012CN102788889A Needle inserting method for atomic force microscope
11/21/2012CN102788888A Probe inserting device of scanning probe microscope and method thereof
11/21/2012CN101395676B Method for operating a measurement system containing a scanning probe microscope, and measurement system
11/14/2012CN101379383B Miniaturized spring element and method for producing the spring element
11/13/2012US8312561 Device and method for the micromechanical positioning and handling of an object
11/13/2012US8312560 Multifunctional scanning probe microscope
11/07/2012CN101458203B Double probe same-point measurement scanning probe microscope
11/06/2012US8302456 Active damping of high speed scanning probe microscope components
11/01/2012US20120273692 Method and apparatus for processing a microsample
10/2012
10/23/2012USRE43757 Rotational stage for high speed, large area scanning in focused beam systems
10/23/2012US8296857 Scanning probe microscope with current controlled actuator
10/23/2012US8296856 Control system for scanning probe microscope
10/18/2012US20120266336 Fully Digitally Controller for Cantilever-Based Instruments
10/17/2012EP2510560A1 Nanopositioner
10/16/2012US8291511 Apparatus and method for investigating biological systems and solid systems
10/11/2012US20120260374 Scanning thermal twisting atomic force microscopy
10/10/2012EP2507642A2 Method and apparatus of operating a scanning probe microscope
10/09/2012US8286261 Scanning probe in pulsed-force mode, digital and in real time
10/09/2012US8286260 Protein microscope
10/09/2012US8284406 Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope
10/04/2012DE112010004305T5 Verschleissfreie Behandlung einer Materialoberfläche mit einem Rastersondenmikroskop Wear-treatment of a material surface with a scanning probe microscope
10/03/2012EP1587113B1 Stylus system for modifying small structures
09/2012
09/26/2012CN101473384B Method and apparatus for characterizing a probe tip
09/06/2012US20120227138 Displacement detection mechanism and scanning probe mircoscope using the same
09/05/2012EP2494367A2 Scanning probe microscope having support stage incorporating a kinematic flexure arrangement
09/05/2012CN102654516A Displacement detection mechanism and scanning probe mircoscope using the same
08/2012
08/30/2012WO2012115653A1 Atomic force microscopy controller and method
08/29/2012EP2491407A1 Alignment and anti-drift mechanism
08/29/2012CN101300480B Scanning probe microscopy method and apparatus utilizing sample pitch
08/29/2012CN101061059B Nano tweezers and scanning probe microscope having the same
08/28/2012US8256017 Using optical deflection of cantilevers for alignment
08/22/2012EP2488880A1 Devices, systems, and methods for evaluating an environmental impact of a facility
08/22/2012CN1979126B Method and device for analysis of a sample
08/21/2012US8250667 Iterative feedback tuning in a scanning probe microscope
08/16/2012DE102011004214A1 Vorrichtung und Verfahren zum Analysieren und Verändern einer Probenoberfläche Apparatus and method for analyzing and modifying a sample surface
08/15/2012CN102640007A Scanning probe microscope having support stage incorporating a kinematic flexure arrangement
08/14/2012US8244471 Oilfield analysis system and method
08/09/2012WO2012104625A1 Adaptive mode scanning probe microscope
08/09/2012US20120204295 Fast-scanning spm scanner and method of operating same
08/09/2012CA2825038A1 Adaptive mode scanning probe microscope
08/07/2012US8234913 Higher harmonics atomic force microscope
08/02/2012US20120193090 Downhole sensor assembly
08/01/2012EP2480132A1 Optical probe system with increased scanning speed
08/01/2012EP1441215B1 Optical scanning type observation device
07/2012
07/25/2012CN102608359A Nanomanipulator
07/18/2012CN1624452B Scanning probe microscope and scanning method
07/18/2012CN101960287B Fast-scanning spm and method of operating same
07/17/2012US8222618 Method and apparatus for processing a microsample
07/11/2012CN102565458A Push-pull two-dimensional micro-movement/positioning device
07/10/2012US8217367 Scanner device for scanning probe microscope
07/04/2012CN102548471A Optical probe system with increased scanning speed
06/2012
06/27/2012CN101499398B Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
06/26/2012US8205488 Fully digitally controller for cantilever-based instruments
06/26/2012US8205487 Probe microscope setup method
06/14/2012US20120151637 Scanning type probe microscope
06/13/2012EP1856701B1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip
05/2012
05/31/2012US20120137394 Atomic Force Microscope Manipulation of Living Cells
05/30/2012CN1963451B Vibration-type cantilever holder and scanning probe microscope
05/29/2012US8187673 Methods utilizing scanning probe microscope tips and products thereof or produced thereby
05/24/2012US20120131702 Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
05/18/2012WO2012063356A1 Control device for analysis device and control program for analysis device
05/17/2012US20120124706 Scanning probe microscope and method for detecting proximity of probes thereof
05/15/2012US8179019 Positioning apparatus and method
05/03/2012US20120110707 Metrology Probe and Method of Configuring a Metrology Probe
05/02/2012EP2447723A1 Scanning probe microscope and probe proximity detection method therefor
04/2012
04/24/2012US8166567 Fast-scanning SPM scanner and method of operating same
04/24/2012US8161805 Method and apparatus for obtaining quantitative measurements using a probe based instrument
04/17/2012US8160848 Apparatus for generating coarse-grained simulation image of sample to be measured with a probe of a scanning probe microscope
04/04/2012EP2435837A2 Metrology probe and method of configuring a metrology probe
03/2012
03/29/2012US20120079632 Method to measure 3 component of the magnetic field vector at nanometer resolution using scanning hall probe microscopy
03/29/2012US20120079631 Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy
03/29/2012US20120079630 Sub-microsecond-resolution probe microscopy
03/28/2012CN102393474A Method for scanning nano-scale sharp sample
03/22/2012WO2012035826A1 Scanning probe microscope and surface shape measuring method using same
03/20/2012US8141168 Scanning probe microscope and a method to measure relative-position between probes
03/15/2012WO2012033131A1 Surface treatment device using scanning probe microscope
03/15/2012US20120066799 Method for driving a scanning probe microscope at elevated scan frequencies
03/14/2012EP2428804A1 A method for driving a scanning probe microscope at elevated scan frequencies
03/14/2012EP1880467B1 Positioning apparatus and method
03/14/2012CN102375076A Scanning device
02/2012
02/29/2012EP2423676A1 Probe apparatus
02/22/2012CN101278357B 用于对微机械及纳米机械结构进行检验的系统及方法 System and method for micro-mechanical and nano-mechanical structure inspection
02/16/2012US20120042422 Variable pixel density imaging
02/15/2012CN102356325A Apparatus and method for electromechanical positioning
02/08/2012EP2416164A2 Band excitation method applicable to scanning probe microscopy
02/02/2012US20120030846 Atomic Force Microscopy System and Method for Nanoscale Measurement
02/02/2012US20120030845 Scanning probe microscope
02/02/2012US20120027947 Nanotipped device and method
02/02/2012DE19802848B4 Verfahren und Vorrichtung zum Testen eines Substrats Method and apparatus for testing a substrate
02/01/2012CN102338811A Real-time feedback method based on probability estimation in nanometer operating task space
01/2012
01/26/2012WO2012010738A1 Microscopy device comprising a tuning-fork probe and a control unit for a nanosensor based on a tuning fork
01/25/2012EP2409164A1 Apparatus and method for electromechanical positioning
01/18/2012CN202119795U High voltage amplifier for driving piezoelectric ceramics scanner
01/11/2012EP2404164A1 A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid
12/2011
12/29/2011US20110321203 Planar positioning device and inspection device provided with the same
12/29/2011US20110321202 Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers
12/22/2011US20110314576 Non-linearity determination of positioning scanner of measurement tool
12/21/2011CN102288589A 单个荧光探针的定位方法、装置及超分辨成像方法、系统 Single fluorescent probe positioning method, apparatus and method for super-resolution imaging system
12/13/2011US8077588 Driving apparatus
12/08/2011US20110302676 Method and Device for Examining a Sample with a Probe Microscope
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