| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 04/10/2008 | WO2007101133A3 Active damping of high speed scanning probe microscope components |
| 04/10/2008 | WO2007075908A3 Atom probe test standards and associated methods |
| 04/03/2008 | US20080078932 Scanning probe microscope capable of measuring samples having overhang structure |
| 04/02/2008 | EP1362230A4 Balanced momentum probe holder |
| 04/01/2008 | US7350404 Scanning type probe microscope and probe moving control method therefor |
| 03/27/2008 | US20080073520 Tip structure for scanning devices, method of its preparation and devices thereon |
| 03/27/2008 | US20080073519 Scanning probe microscope for measuring angle and method of measuring a sample using the same |
| 03/27/2008 | US20080072665 Device and Method for Scanning Probe Microscopy |
| 03/25/2008 | US7348571 Scanning mechanism for scanning probe microscope and scanning probe microscope |
| 03/20/2008 | US20080067385 Method and apparatus for processing a micro sample |
| 03/19/2008 | EP1685391A4 An oscillating probe with a virtual probe tip |
| 03/18/2008 | US7344832 Method and apparatus for molecular analysis in small sample volumes |
| 03/13/2008 | WO2008029562A1 Atomic force microscope |
| 03/13/2008 | WO2008029561A1 Scan type probe microscope and active damping drive control device |
| 03/13/2008 | WO2008028500A1 Method for testing active compounds |
| 03/13/2008 | US20080061232 Scanning Probe Microscope Fine-Movement Mechanism and Scanning Probe Microscope Using Same |
| 03/12/2008 | EP1898204A1 Scan type probe microscope and cantilever drive device |
| 03/12/2008 | EP1896824A1 Higher harmonics atomic force microscope |
| 03/11/2008 | US7340944 Oscillator and method of making for atomic force microscope and other applications |
| 03/06/2008 | WO2008027601A2 Band excitation method applicable to scanning probe microscopy |
| 03/06/2008 | WO2007135483A3 Biomolecule interaction using atomic force microscope |
| 03/06/2008 | WO2007133585A3 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 03/05/2008 | EP1756595A4 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 03/04/2008 | US7337656 Surface characteristic analysis apparatus |
| 02/28/2008 | US20080048115 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 02/28/2008 | US20080048114 Scanning Type Probe Microscope |
| 02/28/2008 | US20080047335 Measuring apparatus |
| 02/28/2008 | US20080047334 Scanning Microscope With Shape Correction Means |
| 02/27/2008 | EP1892727A1 Measuring apparatus |
| 02/27/2008 | EP1850972A4 Thermal control of deposition in dip pen nanolithography |
| 02/26/2008 | US7334460 Method and apparatus of manipulating a sample |
| 02/26/2008 | US7334459 Atomic force microscope and corrector thereof and measuring method |
| 02/21/2008 | US20080042074 Charged particle beam apparatus and charged particle beam irradiation method |
| 02/20/2008 | EP1889031A1 Nanometric emitter/receiver guides |
| 02/20/2008 | EP1292361B1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 02/19/2008 | US7333191 Scanning probe microscope and measurement method using the same |
| 02/14/2008 | WO2008017322A1 Thermal coupling apparatus |
| 02/12/2008 | US7329868 Charged particle beam apparatus |
| 02/07/2008 | DE102007032175A1 Piezoelektrischer Aktuator und Abtastmikroskop, das einen solchen verwendet A piezoelectric actuator and scanning microscope that uses such a |
| 02/06/2008 | EP1883932A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 02/06/2008 | EP1883849A2 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents |
| 01/31/2008 | WO2008013268A1 Scanning type probe microscope, and its probe relative-position measuring method |
| 01/31/2008 | WO2008011903A1 Apparatus and method for processing a wafer |
| 01/31/2008 | WO2008011879A1 Device and method for a probe microscopic examination of a sample |
| 01/31/2008 | WO2008011849A1 Method for operating a measuring arrangement having a scanning probe microscope device and a measuring arrangement |
| 01/31/2008 | WO2007016299A3 Atom probe evaporation processes |
| 01/31/2008 | US20080023626 Piezoelectric actuator and scanning probe microscope using the same |
| 01/31/2008 | DE112006000452T5 Rastersondenmikroskop und Messverfahren damit Scanning probe microscope and measuring procedures so |
| 01/29/2008 | US7323684 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 01/24/2008 | WO2006124572A3 Dual wavelength polarized near-field imaging apparatus |
| 01/24/2008 | US20080018993 Self-aligning scanning probes for a scanning probe microscope |
| 01/24/2008 | US20080017609 Probe Head Manufacturing Method |
| 01/23/2008 | EP1881317A1 Scanning probe microscope system |
| 01/23/2008 | EP1880467A2 Positioning apparatus and method |
| 01/23/2008 | EP1427983A4 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 01/23/2008 | CN101110277A Self-aligning scanning probes for a scanning probe microscope |
| 01/23/2008 | CN101109680A Film single-axis bidirectional decline micro-stretching device and method for measuring |
| 01/17/2008 | WO2008006229A1 Scanning probe microscope and method for operating the same |
| 01/17/2008 | US20080011067 Fully digitally controller for cantilever-based instruments |
| 01/17/2008 | US20080011046 Displacement Method for Determining the Spring Constant of Scanning Probe Microscope Cantileers using MEMS Actuators |
| 01/17/2008 | US20080011044 Force method for Determining the Spring Constant of Scanning Probe Microscope Cantilevers using MEMS Actuators |
| 01/17/2008 | DE112006000456T5 Abtastsondenmikroskop-Feinbewegungsmechanismus und Abtastsondenmikroskop, welches dergleichen verwendet Scanning probe fine movement mechanism and scanning probe microscope which utilizes the like |
| 01/17/2008 | DE112006000419T5 Abtastsondenmikroskop-Versatzerfassungsmechanismus und Abtastsondenmikroskop, welches dergleichen verwendet Scanning probe displacement detection mechanism and scanning probe microscope, which uses like |
| 01/16/2008 | EP1877753A2 Method and device for determining material properties |
| 01/15/2008 | US7319527 Sensor with cantilever and optical resonator |
| 01/15/2008 | US7318907 Apparatus for use in the detection of preferential particles in sample |
| 01/09/2008 | EP1876437A1 Scanning stage for scanning probe microscope |
| 01/09/2008 | EP1653478B1 Surface texture measuring probe and microscope utilizing the same |
| 01/03/2008 | US20080000292 System for Nano Position Sensing in Scanning Probe Microscopes using an Estimator |
| 01/03/2008 | US20080000291 Method and apparatus for monitoring movement of a SPM actuator |
| 01/01/2008 | US7313948 Real time detection of loss of cantilever sensing loss |
| 12/27/2007 | WO2007109777A3 Stiffness tomography by atomic force microscopy |
| 12/27/2007 | US20070295920 Optically Controllable Device |
| 12/21/2007 | WO2007144313A1 Optical component operating in near field transmission |
| 12/21/2007 | WO2007041556A3 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 12/20/2007 | US20070294042 Cantilever Control Device |
| 12/20/2007 | US20070290130 Scanning probe microscope |
| 12/18/2007 | US7309863 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 12/13/2007 | WO2007098237A3 Method and apparatus for characterizing a probe tip |
| 12/13/2007 | US20070285078 Probe microscope and measuring method using probe microscope |
| 12/11/2007 | US7307370 Long-stroke, high-resolution nanopositioning mechanism |
| 12/06/2007 | US20070278896 monolithic nanoscale actuation |
| 12/06/2007 | US20070278405 Multi-tip surface cantilever probe |
| 12/06/2007 | US20070278177 Processing method using atomic force microscope microfabrication device |
| 12/06/2007 | US20070277599 Atomic force microscope technique for minimal tip damage |
| 12/05/2007 | CN101083151A Probe position control system and method |
| 12/04/2007 | US7305319 Methods and systems for three-dimensional motion control and tracking of a mechanically unattached magnetic probe |
| 11/29/2007 | WO2007135483A2 Biomolecule interaction using atomic force microscope |
| 11/29/2007 | WO2007135345A1 Controlled atomic force microscope |
| 11/29/2007 | US20070272005 Probe position control system and method |
| 11/29/2007 | CA2653116A1 Controlled atomic force microscope |
| 11/28/2007 | EP1860424A1 Self-aligning scanning probes for scanning probe microscope |
| 11/27/2007 | US7301146 Probe driving method, and probe apparatus |
| 11/22/2007 | WO2007133585A2 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 11/22/2007 | WO2007024711A9 Oscillator and method of making for atomic force microscope and other applications |
| 11/22/2007 | US20070267580 Drive stage for scanning probe apparatus, and scanning probe apparatus |
| 11/22/2007 | US20070266780 Scanning Probe Microscope |
| 11/21/2007 | EP1856701A1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip |
| 11/21/2007 | CN100350249C Interaction detecting method and bioassay device, and bioassay-use substrate |
| 11/15/2007 | WO2006034470A3 Sensors for electrochemical, electrical or topographical analysis |