| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 01/03/2014 | WO2014003557A1 High throughput microscopy device |
| 01/03/2014 | WO2014003547A1 High throughput scanning probe microscopy device |
| 01/02/2014 | US20140007307 Method of preparing and imaging a lamella in a particle-optical apparatus |
| 01/02/2014 | US20140007306 Apparatus and method for analyzing and modifying a specimen surface |
| 01/02/2014 | DE102013106816A1 Scanning sample lithography device for reading and writing of structures in nanometer range, has peak portion that is calibrated to substrate described, adjusted and aligned relative to each other |
| 01/01/2014 | EP2680012A1 High throughput scanning probe microscopy device |
| 12/31/2013 | US8618520 Method and apparatus for processing a micro sample |
| 12/25/2013 | CN103472853A Controller and control method based on FPGA (Field Programmable Gate Array) of scanning ionic conductivity microscope |
| 12/19/2013 | US20130340125 Band excitation method applicable to scanning probe microscopy |
| 12/19/2013 | DE112011104969T5 Rasterkraftmikroskopie-Steuerung und -Verfahren Atomic force microscopy control and procedures |
| 12/12/2013 | US20130333076 Atomic force microscopy controller and method |
| 12/11/2013 | EP2670703A1 Adaptive mode scanning probe microscope |
| 12/11/2013 | CN103443631A Preamplifying cantilever and applications thereof |
| 12/04/2013 | CN103429526A 自适应模式扫描探针显微镜 Adaptive mode scanning probe microscopy |
| 12/03/2013 | US8601608 Cantilever for scanning probe microscope and scanning probe microscope equipped with it |
| 11/27/2013 | CN203310859U In-situ measurement device based on scanning tunneling effect |
| 11/27/2013 | CN203310858U Measuring system based on detection of reference model having nanometer surface microstructure |
| 11/21/2013 | US20130312143 Scanning ion conductance microscopy using surface roughness for probe movement |
| 11/19/2013 | US8590061 Optimal excitation force design indentation-based rapid broadband nanomechanical spectroscopy |
| 10/24/2013 | US20130283486 Atomic Force Microscope Manipulation of Living Cells |
| 10/22/2013 | US8566038 Compositions and methods for analyzing immobilized nucleic acids |
| 10/15/2013 | US8555711 Material property measurements using multiple frequency atomic fore microscopy |
| 10/09/2013 | EP2646838A2 Method and apparatus of using peak force tapping mode to measure physical properties of a sample |
| 10/09/2013 | EP1520292B1 Software synchronization of multiple scanning probes |
| 10/03/2013 | WO2013148320A1 Non-vector space sensing and control systems and methods for video rate imaging and manipulation |
| 09/26/2013 | US20130254948 Scanning Method for Scanning a Sample with a Probe |
| 09/24/2013 | US8539854 Microrobots with large actuation volumes, and controllers, systems, and methods |
| 09/18/2013 | CN103308725A Method of analyzing dendritic segregation in low-carbon high-manganese steel continuously-cast billets |
| 09/11/2013 | CN103293339A Combined piezoelectric tube scanner formed by double nested piezoelectric tube scanners for scanning together |
| 09/03/2013 | US8528110 Probe detection system |
| 08/22/2013 | DE10110933B4 Mikrosonde und Abtastsondenvorrichtung mit der Mikrosonde Microprobe and Abtastsondenvorrichtung with the microprobe |
| 08/15/2013 | US20130212749 Scanning Probe Microscope and Surface Shape Measuring Method Using Same |
| 08/08/2013 | WO2013116553A1 Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy |
| 08/08/2013 | WO2013114100A1 Beam scanning system |
| 08/08/2013 | WO2013114099A1 Probe actuation |
| 08/08/2013 | US20130205454 Scanning probe microscope |
| 08/06/2013 | US8499621 Scanning probe microscopy inspection and modification system |
| 07/30/2013 | US8499360 Atomic force microscopes and methods of measuring specimens using the same |
| 07/23/2013 | US8495761 Planar positioning device and inspection device provided with the same |
| 07/23/2013 | US8495760 Atomic force microscope manipulation of living cells |
| 07/23/2013 | US8495759 Probe aligning method for probe microscope and probe microscope operated by the same |
| 07/16/2013 | US8489356 Variable density scanning |
| 07/09/2013 | US8484757 Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope |
| 07/03/2013 | CN103185811A Atomic force microscope probe expanding working method |
| 07/02/2013 | US8479310 Dynamic probe detection system |
| 07/02/2013 | US8479308 Scanning probe microscope and method for detecting proximity of probes thereof |
| 06/27/2013 | DE102010026703B4 Vorrichtung zum Scannen von verschiedenartigen Oberflächen und Verwendung der Vorrichtung Apparatus for scanning different types of surfaces and use of the apparatus |
| 06/25/2013 | US8474060 Scanning probe microscope with compact scanner |
| 06/20/2013 | WO2013087726A1 Method and device for controlling a scanning probe microscope |
| 06/19/2013 | CN101322030B Biomolecule interaction using atomic force microscope |
| 06/12/2013 | CN102608359B Nanomanipulator |
| 06/06/2013 | US20130145505 Near field optical microscope with optical imaging system |
| 05/29/2013 | CN103123362A Atomic force microscope (AFM) probe rapid positioning method for cell mechanical property detection |
| 05/28/2013 | US8448502 Band excitation method applicable to scanning probe microscopy |
| 05/28/2013 | US8448501 Multiple frequency atomic force microscopy |
| 05/22/2013 | CN103116040A On-site measuring device and scanning probe automatic centering method based on scanning tunneling effects |
| 05/22/2013 | CN101833018B Scanning probe surface measurement system and measurement method based on optical fiber sensor |
| 05/16/2013 | WO2013071244A1 Method and apparatus of tuning a scanning probe microscope |
| 05/14/2013 | US8443459 Fast-scanning SPM scanner and method of operating same |
| 05/09/2013 | US20130117895 Quantitative measurements using multiple frequency atomic force microscopy |
| 05/07/2013 | US8438661 Scanning probe microscope |
| 05/02/2013 | US20130110262 Automatic tuning of atomic force microscope |
| 05/02/2013 | DE102012217192A1 Automatische Abstimmung eines Atomkraftmikroskops Automatic tuning of an atomic force microscope |
| 05/02/2013 | DE102009008251B4 Flexibel verschiebbare Kopplungseinrichtung für die akustisch angeregte Rasterkraftmikroskopie mit akustischer Anregung der Probe Flexible movable coupling means for acoustically excited atomic force microscopy with acoustic excitation of the sample |
| 04/25/2013 | WO2013057426A1 Device for measuring an atomic force |
| 04/24/2013 | CN101413865B Accurate positioning method based on atomic force microscope |
| 04/23/2013 | US8424364 Active scanner bow compensator |
| 04/17/2013 | CN101949957B Method for precisely moving nanowire by taking semi-conductor nanowire as probe |
| 04/11/2013 | WO2013052111A1 Method and device for moving a sensor close to a surface |
| 04/09/2013 | US8415613 Method and apparatus for characterizing a sample with two or more optical traps |
| 03/27/2013 | CN102998483A Atomic force microscope system with quartz tuning fork |
| 03/19/2013 | US8402561 MEMS actuator device with integrated temperature sensors |
| 03/19/2013 | US8402560 Scanning probe microscope with drift compensation |
| 03/12/2013 | US8397311 Metrology probe and method of configuring a metrology probe |
| 03/07/2013 | US20130061356 Active Damping of High Speed Scanning Probe Microscope Components |
| 02/27/2013 | EP2561522A1 Contactless linear actuator comprising a flexible guiding means and application thereof to a displacement table |
| 02/21/2013 | DE102005003684B4 Feinjustierungsmechanismus zur Rastersondenmikroskopie Fine adjustment mechanism for scanning probe microscopy |
| 02/19/2013 | US8381311 Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system |
| 02/14/2013 | US20130042375 Control system for a scanning probe microscope |
| 02/13/2013 | CN101915858B Feedback-controlled torsion pendulum weak force scanning and detecting instrument |
| 02/05/2013 | US8370961 Providing a topographic signal of sample using atomic force microscope |
| 02/05/2013 | US8368017 Method for the operation of a measurement system with a scanning probe microscope and a measurement system |
| 01/23/2013 | EP2548306A2 Frequency measuring and control apparatus with integrated parallel synchronized oscillators |
| 01/10/2013 | US20130014295 Method for positioning an atomic force microscopy tip in a cell |
| 01/01/2013 | US8347411 Scanning probe microscope and method for operating the same |
| 01/01/2013 | US8347409 Resonance compensation in scanning probe microscopy |
| 12/27/2012 | US20120331592 Interatomic force measurements using passively drift compensated non-contact in situ calibrated atomic force microscopy - quantifying chemical bond forces between electronic orbitals by direct force measurements at subatomic lateral resolution |
| 12/27/2012 | US20120327429 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope |
| 12/26/2012 | CN101949956B Scanning method for measuring solid particle membrane with scanning electron microscope |
| 12/25/2012 | US8341760 Scanning probe microscope |
| 12/11/2012 | US8332961 Platinum silicide tip apices for probe-based technologies |
| 12/06/2012 | WO2012163518A1 Apparatus and method for investigating an object |
| 12/06/2012 | DE102012104749A1 Mehrachsige Aktorvorrichtung Multi-axis actuator device |
| 12/05/2012 | EP2529239A1 Electronic control and amplification device for a piezoelectric local probe for measuring force beneath a particle beam |
| 12/05/2012 | CN101706513B Piezoelectric ceramic scanatron driver |
| 12/04/2012 | US8327460 Probe microscope and measurement method using the same |
| 11/27/2012 | US8321959 Cantilevers with integrated piezoelectric actuators for probe microscopy |
| 11/22/2012 | WO2012156932A1 Device for ultra-precise positioning of an element and positioning system comprising such a device |
| 11/22/2012 | DE102011050493A1 Vorrichtung und Verfahren zur Detektion der Auslenkung elastischer Elemente Apparatus and method for detecting the deflection of elastic members |
| 11/21/2012 | CN202548150U Nanomanipulator |