Patents
Patents for H01L 45 - Solid state devices specially adapted for rectifying, amplifying, oscillating, or switching without a potential-jump barrier or surface barrier, e.g. dielectric triodes; Ovshinsky-effect devices; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof (8,424)
02/2008
02/19/2008US7332401 Method of fabricating an electrode structure for use in an integrated circuit
02/14/2008US20080035907 Composite Chalcogenide Materials and Devices
02/13/2008CN101123295A A non-crystal sold film material Ag1-x-yGexSey and making method and its application
02/13/2008CN100369141C Sputtering target for phase-change memory, film for phase change memory formed by using the target, and method for producing the target
02/12/2008US7329558 Differential negative resistance memory
02/07/2008US20080029755 Structure for phase change memory and the method of forming same
02/07/2008US20080029754 Variable resistance non-volatile memory devices including a uniformly narrow contact layer and methods of manufacturing same
02/06/2008CN101118922A CuxO resistor memory with upper electrode as protective layer and manufacturing method therefor
02/06/2008CN100367512C Quantum-size electronic devices and operating conditions thereof
02/05/2008US7326952 Elevated pore phase-change memory
02/05/2008US7326951 Chalcogenide random access memory
02/05/2008US7326950 Memory device with switching glass layer
01/2008
01/31/2008US20080026535 Phase-changeable memory device and method of manufacturing the same
01/31/2008US20080026510 Nonvolatile memory cell comprising a reduced height vertical diode
01/30/2008EP1882271A2 Non-volatile memory
01/30/2008CN101116195A Phase change memory cell with high read margin at low power operation
01/30/2008CN101116194A Pillar phase change memory cell
01/30/2008CN101114695A Memory element and method of manufacturing thereof
01/30/2008CN100365815C Non-volatile memory and method for manufacturing same
01/29/2008US7323708 Phase change memory devices having phase change area in porous dielectric layer
01/24/2008WO2008010290A1 Semiconductor device
01/24/2008US20080020508 Reducing oxidation of phase change memory electrodes
01/24/2008US20080019167 Controllable ovonic phase-change semiconductor memory device and methods of programming the same
01/24/2008US20080017953 Memory elements and methods for making same
01/24/2008US20080017912 Non-volatile memory cell with embedded antifuse
01/23/2008EP1881542A1 Phase change memory cell including nanocomposite insulator
01/23/2008EP1881541A2 Phase change memory cell having step-like programming characteristic
01/23/2008EP1881540A2 Phase change memory cell having a step-like programming characteristic
01/23/2008EP1881539A2 Phase change memory cell having a step-like programming characteristic
01/23/2008CN101110468A Phase change memory cell including nanocomposite insulator
01/23/2008CN101110467A Phase change memory cell having step-like programming characteristic
01/23/2008CN101110466A Phase change memory cell having a step-like programming characteristic
01/23/2008CN101110465A Phase change memory cell having a step-like programming characteristic
01/23/2008CN101110464A Heating layer for reducing phase-change memory device unit power consumption and its manufacturing method
01/23/2008CN100364132C Silicon-contained series surfur-family compound phase transformation film material for phase transformation memory
01/23/2008CN100364075C Variable electrical risistance device, producing method of variable resistance memory and memory
01/23/2008CN100364048C Manufacturing method of metal/insulation layer/metal structure
01/17/2008WO2008007481A1 Resistive memory device
01/17/2008US20080013364 Method of making non-volatile memory cell with embedded antifuse
01/17/2008US20080012000 Method and apparatus for forming an integrated circuit electrode having a reduced contact area
01/17/2008US20080011999 Microelectronic Devices Using Sacrificial Layers and Structures Fabricated by Same
01/17/2008US20080011997 Semiconductor device and method of manufacturing the same
01/16/2008EP1879232A2 Low power phase change memory cell having different phase change materials
01/16/2008EP1878065A1 Phase change memory device
01/16/2008EP1878064A1 Method and structure for peltier-controlled phase change memory
01/16/2008CN101106177A Phase-change material layers, methods of forming the same, phase-change memory devices having the same, and methods of forming phase-change memory devices
01/16/2008CN101106176A Method for making a pillar-type phase change memory element
01/16/2008CN101106175A Low power phase change memory cell having different phase change materials
01/16/2008CN101106174A Method for reducing a reset current for resetting a portion of a phase change material in a memory cell of a phase change memory device and the phase change memory device
01/16/2008CN101106173A Method of forming a phase change material layer and a phase change memory device so formed
01/16/2008CN101106172A An erasable and readable inorganic film electrical dual stabilization part and its making method
01/16/2008CN101106171A Non-volatile memory device including variable resistance material
01/15/2008US7319235 Resistive semiconductor element based on a solid-state ion conductor
01/15/2008US7319057 Phase change material memory device
01/10/2008US20080006813 Semiconductor memory device and fabrication method thereof
01/10/2008US20080006812 Programmable metallization cell structures including an oxide electrolyte, devices including the structure and method of forming same
01/09/2008EP1543569B1 Non-volatile memory element and production methods thereof and storage memory arrangements
01/09/2008CN101101966A Phase change film material of silicon-adulterated sulfur series for phase change memory
01/09/2008CN101101965A Phase change film material of silicon-adulterated sulfur series for phase change memory
01/09/2008CN101101964A Non-volatile memory device including a variable resistance material
01/09/2008CN101101963A A high status ratio inorganic film dual stabilization part and its making method
01/09/2008CN101101962A Gallium-adulterated Ga3Sb8Te1 phase change memory unit and its making method
01/09/2008CN101101961A Phase change memory unit with loop phase change material and its making method
01/09/2008CN101101960A A resistance memory for reducing reset operation current
01/09/2008CN101101919A Phase change random memories including a doped phase change layer, and methods of operating the same
01/03/2008WO2008002760A1 Phase change alloy etch
01/03/2008WO2008001712A1 Switching element, semiconductor device, rewritable logical integrated circuit, and memory element
01/03/2008WO2008001411A1 Process for producing semiconductor memory device
01/03/2008US20080001136 Electrically Writeable and Erasable Memory Medium
01/02/2008EP1873832A1 Memory device and semiconductor integrated circuit
01/02/2008CN101097989A Memory cell with memory material insulation and manufacturing method
01/02/2008CN101097988A Variable resistance random access memory device containing n+ interface layer
01/02/2008CN100359666C Method of forming via structures and method of fabricating phase change memory devices incorporating such via structures
01/01/2008US7315469 Control of set/reset pulse in response to peripheral temperature in PRAM device
01/01/2008US7315465 Methods of operating and forming chalcogenide glass constant current devices
12/2007
12/27/2007WO2007148405A1 Semiconductor device
12/27/2007US20070297231 Non-volatile memory structure
12/27/2007US20070297216 Self-assembly of molecular devices
12/27/2007US20070297213 Forming a carbon layer between phase change layers of a phase change memory
12/27/2007DE102004014965B4 Verfahren zum Herstellen einer nichtflüchtigen Speicherzelle A method of manufacturing a non-volatile memory cell
12/26/2007CN101093873A GESBTE thin film manufacturing method, phase-change direct-access storage and manufacturing method therefor
12/26/2007CN101093872A Phase change memory component, and manufacturing method
12/21/2007WO2007146181A2 A method of operating a multi-terminal electronic device
12/21/2007WO2007145710A1 Refreshing a phase change memory
12/21/2007WO2007126690A3 Phase change memory elements using self- aligned phase change material layers and methods of making and using same
12/21/2007WO2006059313A3 Non-volatile memory
12/20/2007DE102004051152B4 NOR-Speicheranordnung von resistiven Speicherelementen NOR memory array of resistive memory elements
12/19/2007CN101090147A Resistor random access memory cell with l-shaped electrode
12/19/2007CN100356607C Production of sulfur compound phase-variable memory
12/19/2007CN100356606C Method for the manufacture of nanometer magnitude unit device in phase-change storage
12/19/2007CN100356567C Phase transformation micro, nano electronic memory device and manufacturing method
12/18/2007US7309616 Laser annealing of complex metal oxides (CMO) memory materials for non-volatile memory integrated circuits
12/13/2007WO2007141865A1 Semiconductor device and its manufacturing method
12/13/2007US20070287219 Resistance variable memory device with sputtered metal-chalcogenide region and method of fabrication
12/12/2007EP1864951A2 Chalcogenide glass constant current device, and its method of fabrication and operation
12/12/2007EP1393377A4 Applications for and tunneling device
12/12/2007CN100355102C Thin-film two-terminal elements, method of production thereof, and liquid crystal display
12/11/2007US7307868 Integrated circuit including memory cell for storing an information item and method
12/11/2007US7307267 Electric device with phase change material and parallel heater
12/06/2007WO2007138703A1 Semiconductor device
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